JPS5942434A - Apparatus for introducing sample of plasma emission spectrochemical analysis device - Google Patents
Apparatus for introducing sample of plasma emission spectrochemical analysis deviceInfo
- Publication number
- JPS5942434A JPS5942434A JP15290182A JP15290182A JPS5942434A JP S5942434 A JPS5942434 A JP S5942434A JP 15290182 A JP15290182 A JP 15290182A JP 15290182 A JP15290182 A JP 15290182A JP S5942434 A JPS5942434 A JP S5942434A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- heater
- plasma
- vaporizer
- graphite
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
Abstract
Description
【発明の詳細な説明】
本発明はプラズマ発光分析装置のための試料導入装置に
関するものであシ、特に微量試料を効率的にプラズマに
導入するための新規な改良である。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a sample introduction device for a plasma emission spectrometer, and in particular is a novel improvement for efficiently introducing a minute amount of sample into plasma.
従来用いられてきたこの種の装置としては、タングステ
ンのヒータから試料を蒸発気化させてプラズマに導くも
のが代表的であった。このような装置は、水質試料、塩
酸溶液、希硝酸溶液、有機溶媒試料に対しては効果的な
試料導入がなしえたが、濃硝酸溶液あるいはフッ化水素
酸溶液では、ヒータであるタングステンがこれらの酸と
反応をおこしてしまう欠点があった。これらの酸はおよ
そあらゆる金属と反応するため、黒鉛以外のヒータ材質
では上記の欠点を克服することはできない。A typical device of this kind that has been used in the past has been one in which a tungsten heater evaporates the sample and introduces it into plasma. These devices can effectively introduce samples for water samples, hydrochloric acid solutions, dilute nitric acid solutions, and organic solvent samples; however, for concentrated nitric acid solutions or hydrofluoric acid solutions, the tungsten heater The disadvantage was that it reacted with the acid. Since these acids react with almost all metals, heater materials other than graphite cannot overcome the above disadvantages.
ヒータ材質を黒鉛とする場合は、タングステンと比べて
熱容量が大きいために急速な昇温全望むことが困難とz
b、ヒータ上で種々の化学干渉が生ずる。When graphite is used as the heater material, it is difficult to achieve rapid temperature rise due to its larger heat capacity than tungsten.
b. Various chemical interferences occur on the heater.
本発明は以上の欠点をすみやかに除去するためのきわめ
て効果的な手段を提供するものであシ、タングステンヒ
ータ上に黒鉛の薄板を設けて試料溶液とヒータの直接的
な接触を断った構成をとっている。以下図面と共に本発
明による試料導入装置について詳細に説明する。The present invention provides an extremely effective means for quickly eliminating the above-mentioned drawbacks, and has a structure in which a thin graphite plate is provided on the tungsten heater to cut off direct contact between the sample solution and the heater. I'm taking it. The sample introduction device according to the present invention will be described in detail below with reference to the drawings.
第1図において符号1で示されるものは試料の気化器で
あp1内部にチタン電極2を介して第2図の形状金有す
るタングステンヒータ3が設けられている。4は四方コ
ックであシ、これを切り換えることにより気化器1で生
ずる溶媒蒸気を排気し、また試料蒸気をプラズマ5aに
導入する。5は高周波プラズマトーチであり、6.7は
Ar(アルゴン)pHs(水素)の流量を制御する流量
計である。タングステンヒータ3は第3図のように、試
料をのせるくぼみ3aの底面に厚さ0,1謔の熱分解黒
鉛薄板8を設けた構成よシなっている。The reference numeral 1 in FIG. 1 is a sample vaporizer, and a tungsten heater 3 having the shape shown in FIG. 2 is provided inside p1 with a titanium electrode 2 interposed therebetween. Reference numeral 4 is a four-way cock, and by switching it, the solvent vapor generated in the vaporizer 1 is exhausted and the sample vapor is introduced into the plasma 5a. 5 is a high frequency plasma torch, and 6.7 is a flow meter that controls the flow rate of Ar (argon) pHs (hydrogen). As shown in FIG. 3, the tungsten heater 3 has a structure in which a thin pyrolytic graphite plate 8 with a thickness of 0.1 mm is provided on the bottom surface of a recess 3a in which a sample is placed.
このようなヒータを第1図のような構成にくみいれた本
発明による試料導入装置を作動させる場合について以下
に述べる。試料5μlをマイクロピペットによシ気化器
1内のヒータ6の黒鉛8上に滴下し、80℃から180
℃の温度で加熱して溶媒を蒸発する。加熱温度は溶媒の
種類によシ異なる。蒸発した溶媒蒸気は四方コック4を
介して排気される。四方コック4金切り換えたのち、ヒ
ータ5’12600℃に加熱すると黒鉛8上の試料は伝
導熱とヒータ壁からの輻射熱によシ気化し、プラズマ5
a内に導入される。なお、ここでいう黒鉛は、熱分解黒
鉛のほかタンタル処理黒鉛、ランタン処理黒鉛、ジルコ
ニウム処理黒鉛なども含む。The case where the sample introduction device according to the present invention incorporating such a heater in the configuration shown in FIG. 1 is operated will be described below. 5 μl of the sample was dropped onto the graphite 8 of the heater 6 in the vaporizer 1 using a micropipette, and the temperature was increased from 80°C to 180°C.
Evaporate the solvent by heating at a temperature of °C. The heating temperature varies depending on the type of solvent. The evaporated solvent vapor is exhausted through the four-way cock 4. After changing the four-way cock to 4 gold, heating the heater 5' to 12,600℃, the sample on the graphite 8 is vaporized by conduction heat and radiant heat from the heater wall, and plasma 5 is heated.
introduced into a. Note that graphite here includes not only pyrolytic graphite but also tantalum-treated graphite, lanthanum-treated graphite, zirconium-treated graphite, and the like.
本発明は以上のように、ヒータと試料溶液が黒鉛薄板に
より直接の接触を妨げられているため、強酸によるヒー
タの破損消耗がない。また、これら黒鉛薄板への試料の
しみこみは表面から60μ以下であるため薄板の厚みを
0.1+m程度にすることができ、熱溶量の差による昇
温速度の低下は大きな問題とならな(/″1゜本発明は
、従来のタングステンヒータの緒特性を損うことなく、
全溶媒に対して適用できる試料導入系である。As described above, in the present invention, direct contact between the heater and the sample solution is prevented by the thin graphite plate, so there is no damage or wear and tear on the heater due to strong acid. In addition, since the sample seeps into these thin graphite plates at a depth of 60 μm or less from the surface, the thickness of the thin plate can be reduced to about 0.1+m, and the decrease in heating rate due to the difference in the amount of heat melt does not pose a major problem ( /''1゜The present invention does not impair the characteristics of conventional tungsten heaters,
This is a sample introduction system that can be applied to all solvents.
図面・は本発明の実施例の1つを示すものである。
第1図は本発明の試料導入装置の構成図である。
第2図はここで用いられたヒータの概念図であシ、第3
図は断面図である。
1・・・・・・試料気化器
2・・・・・・チタン電極
6・・・・・・タングステンヒータ
3a・・・ヒータくほみ
4・・・・・・四方コック
5・・・・・・プラズマトーチ
5a・・・高周波プラズマ
6.7・・・流量計
8・・・・・・黒鉛薄板
以 上
出願人 株式会社第二精工合The drawings show one embodiment of the present invention. FIG. 1 is a block diagram of a sample introduction device of the present invention. Figure 2 is a conceptual diagram of the heater used here, and Figure 3 is a conceptual diagram of the heater used here.
The figure is a sectional view. 1... Sample vaporizer 2... Titanium electrode 6... Tungsten heater 3a... Heater 4... Four-way cock 5... ...Plasma torch 5a...High frequency plasma 6.7...Flowmeter 8...Graphite thin plate or more Applicant Daini Seiko Go Co., Ltd.
Claims (1)
ラズマトーチ部と、試料を高温に加熱して短時間内に気
化するための気化装置と、前記プラズマトーチと前記気
化装置の間に設けられた四方コックと、前記気化装置か
ら前記プラズマ) −チまで試料蒸気を運ぶキャリヤガ
スを制御する流量計とからなる試料導入装置において、
前記気化装置内に設けられたタングステンヒータ上に黒
鉛薄板を設けたことを特徴とするプラズマ発光分析装置
のための試料導入装置。a plasma torch section that emits plasma induced and excited by high frequency; a vaporizer for heating a sample to a high temperature and vaporizing it within a short time; and a four-way cock provided between the plasma torch and the vaporizer. , the vaporizer to the plasma) - a flow meter for controlling a carrier gas that carries the sample vapor from the vaporizer to the plasma),
A sample introduction device for a plasma emission spectrometer, characterized in that a graphite thin plate is provided on a tungsten heater provided in the vaporization device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15290182A JPS5942434A (en) | 1982-09-02 | 1982-09-02 | Apparatus for introducing sample of plasma emission spectrochemical analysis device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15290182A JPS5942434A (en) | 1982-09-02 | 1982-09-02 | Apparatus for introducing sample of plasma emission spectrochemical analysis device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5942434A true JPS5942434A (en) | 1984-03-09 |
JPS6259251B2 JPS6259251B2 (en) | 1987-12-10 |
Family
ID=15550606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15290182A Granted JPS5942434A (en) | 1982-09-02 | 1982-09-02 | Apparatus for introducing sample of plasma emission spectrochemical analysis device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5942434A (en) |
-
1982
- 1982-09-02 JP JP15290182A patent/JPS5942434A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6259251B2 (en) | 1987-12-10 |
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