JPS5941711U - thickness measuring device - Google Patents
thickness measuring deviceInfo
- Publication number
- JPS5941711U JPS5941711U JP13809982U JP13809982U JPS5941711U JP S5941711 U JPS5941711 U JP S5941711U JP 13809982 U JP13809982 U JP 13809982U JP 13809982 U JP13809982 U JP 13809982U JP S5941711 U JPS5941711 U JP S5941711U
- Authority
- JP
- Japan
- Prior art keywords
- measuring device
- thickness measuring
- optical
- measured
- reference plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は本考案装置の模式的断面図、第２図は本案装置
を用いて被測定物の厚み測定を実施している状態を示す
模式的断面図、第３図は本案装置を被測定物の搬送系の
中途に設ける場合の実施状態を示す模式的説明図、第４
図はその場合におけるＨＭＤ出力、基準板の位置及び変
位計による出力の経時的変化を示すグラフ、第５図は従
来の光学変位計を用いた非接触式厚み測定装置の模式的
断面図である。
Ｗ・・・・・・被測定物、１，２・・・・・・光学ヘッ
ド、３・・・・・・架台部、４ａ・・・・・・基準板、
５・・・・・・校正箱。Fig. 1 is a schematic sectional view of the device of the present invention, Fig. 2 is a schematic sectional view showing the state in which the device of the present invention is used to measure the thickness of an object to be measured, and Fig. 3 is a schematic sectional view of the device of the present invention being used to measure the thickness of an object to be measured. Schematic explanatory diagram showing the implementation state when provided in the middle of the object conveyance system, No. 4
The figure is a graph showing changes over time in the HMD output, the position of the reference plate, and the output from the displacement meter in that case, and Figure 5 is a schematic cross-sectional view of a non-contact thickness measuring device using a conventional optical displacement meter. . W: Object to be measured, 1, 2: Optical head, 3: Frame section, 4a: Reference plate,
5... Calibration box.
Claims (1)
学式変位計の光学ヘッドと、両光学へ・シトが発する光
ビームの通過域への出し入れが可能な校正用基準板とを
備えたことを特徴とする厚み測定装置。The optical heads of two optical displacement meters are placed opposite each other at a distance that allows the object to be measured, and a calibration reference plate that can be inserted into and removed from both optical systems and the passage area of the light beam emitted by the sensor. A thickness measuring device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13809982U JPS5941711U (en) | 1982-09-10 | 1982-09-10 | thickness measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13809982U JPS5941711U (en) | 1982-09-10 | 1982-09-10 | thickness measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5941711U true JPS5941711U (en) | 1984-03-17 |
Family
ID=30309972
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13809982U Pending JPS5941711U (en) | 1982-09-10 | 1982-09-10 | thickness measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5941711U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01127613U (en) * | 1988-02-15 | 1989-08-31 | ||
| JPH04116407A (en) * | 1990-09-07 | 1992-04-16 | Nippon Steel Corp | Automatic plate-thickness measuring apparatus |
-
1982
- 1982-09-10 JP JP13809982U patent/JPS5941711U/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01127613U (en) * | 1988-02-15 | 1989-08-31 | ||
| JPH04116407A (en) * | 1990-09-07 | 1992-04-16 | Nippon Steel Corp | Automatic plate-thickness measuring apparatus |
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