JPS5938646A - Electrode apparatus for measuring ion concentration - Google Patents
Electrode apparatus for measuring ion concentrationInfo
- Publication number
- JPS5938646A JPS5938646A JP57149703A JP14970382A JPS5938646A JP S5938646 A JPS5938646 A JP S5938646A JP 57149703 A JP57149703 A JP 57149703A JP 14970382 A JP14970382 A JP 14970382A JP S5938646 A JPS5938646 A JP S5938646A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- ion
- temperature
- temp
- comparison
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/4035—Combination of a single ion-sensing electrode and a single reference electrode
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- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Molecular Biology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、イオン電極を使用して、イオン活潰（濃度）
を測定する装置の改良に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention uses an ion electrode to determine the concentration of ions.
This invention relates to improvements in devices for measuring .
周知のように、イオン電極はネルンストの式で示される
ように、発生電位は湿度の影響を受は変動する。よって
測定を行なう場合は常時電極温度の変動に注意する必要
がある。As is well known, the generated potential of an ion electrode is influenced by humidity and fluctuates as shown by the Nernst equation. Therefore, when performing measurements, it is necessary to always pay attention to fluctuations in the electrode temperature.
温度の影響を除くには恒温槽を使用して被検液温、すな
わち電極の湿度を一定に保つ方法と、温度補（’ｒｔ素
子および湿度補償回路を用いて特性の補償を行なう方法
とがある。In order to eliminate the influence of temperature, there are two methods: one is to use a constant temperature bath to keep the temperature of the test liquid constant, that is, the humidity of the electrode, and the other is to compensate the characteristics using a temperature compensation ('rt) element and a humidity compensation circuit. be.
第１図は一般的な湿度補償回路を例示したものである。FIG. 1 illustrates a general humidity compensation circuit.
このし１においては、等温交点電位（湿度が変化しても
、発生電位が変化しない濃度に対応する電位）をバイア
ス電位で千Ｊち消し、増幅器の人力電位差を（１７（ｍ
Ｖ）になるようにし、温度変化があったとき、電極の濃
度−発生電位の特′姓傾斜（感度）の変化を増幅器の利
得を変化させることによって補ｉｌＥ Ｌ、温度補償を
行なっているものである。In this case 1, the isothermal intersection potential (the potential corresponding to the concentration where the generated potential does not change even if the humidity changes) is canceled by the bias potential by 1,000 J, and the manual potential difference of the amplifier is (17 (m
V), and when there is a temperature change, the change in the characteristic slope (sensitivity) of the electrode concentration-generated potential is compensated for by changing the gain of the amplifier. It is.
実際には、イオンｉｌｉ極の濃度−発生７１１位の関係
、を各湿度について実測し、湿度特性および等温交点を
求めて補償回路を膜用するが、一般にイオン電極では電
極個々に特性のバラツキがあり、ｊ、ｉ′Ｌ−の特性補
償回路で補正しようとずれば、その特性が公差内に入る
電極全選択しなければならない。In reality, the relationship between the concentration of the ion electrode and the generated 711 position is actually measured for each humidity, and a compensation circuit is used to find the humidity characteristics and isothermal intersection, but in general, with ion electrodes, there are variations in the characteristics of each electrode. If the deviation is to be corrected using the characteristic compensation circuit for j, i'L-, all electrodes whose characteristics fall within the tolerance must be selected.
しかもイオン電極は、長期間の使用、妨害イオンの影響
等により温度特性が変化することがある。□この場合は
理論値により設定された補正回路を月１いると、−１−
分な補償がなされず、測定誤差を生ずるという問題点が
ある。Moreover, the temperature characteristics of the ion electrode may change due to long-term use, the influence of interfering ions, etc. □In this case, if you use the correction circuit set according to the theoretical value once a month, -1-
There is a problem in that sufficient compensation is not performed, resulting in measurement errors.
−・方恒湿槽を用いて、一定温度の下で測定する場合は
、上述の電極個々の特性のバラツキ、温度補償の精度を
考慮することなく測定ができるが、実験室内で、一定の
試料を測定する場合は良いが、濃度１１ＪＡ度の変化を
伴なう試料、室外の測定などには不向で、強いて行なえ
ば恒温装置が犬ノ１１りになり、構成も複雑且つ高価に
なる。- When measuring at a constant temperature using a humidity chamber, measurements can be made without considering the variations in the characteristics of individual electrodes and the accuracy of temperature compensation. However, it is not suitable for measuring samples whose concentration changes by 11 JA degrees, or for outdoor measurements.
本発明は、イオン電極による測定上の上述の問題点に鑑
み、温度補償法と恒温法の双方の特長を生カシ、その解
決を図ったもので、イオン電極のみを恒）品化し、比較
電極の７ｉｊ位の温度特性を、イオン電極とは別個に温
度補償窓Ｐにより補償することにより、簡易な装置で精
度の良い測定を１−１丁能にしたものである。In view of the above-mentioned problems in measurements using ion electrodes, the present invention aims to solve the problems by combining the features of both the temperature compensation method and the constant temperature method. By compensating for the temperature characteristics of about 7ij using a temperature compensation window P separately from the ion electrode, accurate measurement can be performed with a simple device in one unit.
第２図は、従来の恒温化による電極装置の一例を、第３
図は本発明による電極装置の一実施例を示す。Figure 2 shows an example of a conventional constant temperature electrode device.
The figure shows an embodiment of an electrode device according to the invention.
第２図の装置では、イオン電極３と、比較電極ケとをイ
オン電極セル／及び比較電極セル乙にそれぞれ挿入し、
両セル／、乙を導９４・５て林、続した系全体を恒温装
置λ中に収納しなければならないため、恒温化を必要と
する容積が大きく、一定湿度に到達するまで多くの時間
を要し、また、恒温を保持するのも容易ではない。In the apparatus shown in FIG. 2, the ion electrode 3 and the comparison electrode are inserted into the ion electrode cell/and the comparison electrode cell B, respectively.
Since the entire system, in which both cells and O are connected to each other, must be housed in a constant temperature device λ, the volume that requires constant temperature is large, and it takes a long time to reach a constant humidity. Moreover, it is not easy to maintain a constant temperature.
本発明では第３図に示すように、イオン？［ｊ ％ ３
と、比較電極りとを、イオン電極セル／と比較電断セル
乙にそれぞれ入れ、双方のセルを導管りで接続した測定
系は、第１図のものと同じであるが、イオン電極セル／
のみは、その外周部を恒温装置Ｍｔ呵で似い、恒温化す
るようにしである。一方比較電極セル乙は、イオン電極
セル／と導管３で結合されているが、恒温装置外にあり
、従ってその温度は周囲温度等により変化する。よって
、比較電極セル６内に温度ｉ′ｉｆｆ償素子７全素子、
第１１図に示すような補償回路を用いて、比較電極グの
電位の温度特性のみを補償し、常時一定の電位を保持さ
せるようにする。In the present invention, as shown in FIG. [j % 3
The measurement system is the same as that shown in Fig. 1, in which the ion electrode cell and the comparison electrode are respectively placed in the ion electrode cell/ and the comparison cell B and both cells are connected by a conduit, but the ion electrode cell/
The outer periphery of the chisel is equipped with a constant temperature device Mt2 to keep the temperature constant. On the other hand, the comparison electrode cell B is connected to the ion electrode cell B through the conduit 3, but is located outside the constant temperature device, and therefore its temperature changes depending on the ambient temperature and the like. Therefore, in the comparison electrode cell 6, all the temperature i'iff compensation elements 7,
A compensation circuit as shown in FIG. 11 is used to compensate only the temperature characteristics of the potential of the comparison electrode so that a constant potential is maintained at all times.
温度補償素子７は、比較電極ダのなるべく近傍に設ける
ことが望ましく、比較電極内の内部電極の近傍へ組み込
むことができれば一層良い結果が得られる。It is desirable to provide the temperature compensation element 7 as close to the comparison electrode as possible, and even better results can be obtained if it can be incorporated near the internal electrode within the comparison electrode.
この装置では、イオン電極セル／側と、比較電４ｉ１ｉ
ｊ セ／ｌ／乙側とに温度の差を生ずることがあるが、
それぞれ別個に温度の影響を除いたことになるため、両
者を恒温化したものと同一の効果を得られるほか、イオ
ン電極、比較電極の各個の特性差の影響を除去できるの
で、更に良い精度を得ることができる。In this device, the ion electrode cell/side and the comparison voltage 4i1i
j There may be a difference in temperature between the C/L/B side,
Since the influence of temperature has been removed for each separately, it is possible to obtain the same effect as when both are kept at a constant temperature.In addition, the influence of the differences in the characteristics of the ion electrode and reference electrode can be removed, resulting in even better accuracy. Obtainable.
このようにイオン電極のみを恒温化し、比較電極を別個
に温度補償することにより、下記のような利点を生ずる
。By keeping only the ion electrode at a constant temperature and separately temperature-compensating the reference electrode in this way, the following advantages are brought about.
（１）恒温装置が小型になり、従って温度平衡が速く、
しかも装置が簡単で低価格である。(1) The constant temperature device has become smaller, so temperature equilibrium is faster,
Furthermore, the device is simple and inexpensive.
（２） 従来、イオン濃度１１１Ｕ定用電極装置に温
度醋Ｎｌを行なう場合、温度特性、等ン晶交点を求め、
これにより温度補償回路を設８１する必要があったが、
本発明ではこの作業を要しない。(2) Conventionally, when performing temperature Nl on an ion concentration 111U constant electrode device, the temperature characteristics and the isometric intersection point were determined,
This necessitated the installation of a temperature compensation circuit81, but
The present invention does not require this operation.
（３） イオン電Ｊｉ＋５ｉ、は、温度補償を行なわな
いため、淘りａ特性のバラツキを問題にする必要がない
。(3) Since the ion electric current Ji+5i does not perform temperature compensation, there is no need to consider variations in the selection a characteristics as a problem.
（４）比較電極の電位の温度特性は、非常に安定してお
り、従って比軸電極のみの湿度補償回路は容易に設計す
ることができる。(4) The temperature characteristics of the potential of the comparison electrode are very stable, so a humidity compensation circuit using only the ratio-axis electrode can be easily designed.
第１図は従来の温度補償回路を設けたイオン濃度測定装
置の一例を示す系統図、
第２図は恒活）検力式による従来のイオン濃度ｆ１１１
ｊ定用電極装置の一例を示す図、
第３図は本発明によるイオン濃度測定用？１ｉ ４１ｉ
装置の一実施例のｊＩＩ造図、
第７図は本発明によるイオン濃度測定用′＋’ｌＸ Ｊ
ｉｇλ装置を用いた測定装置の系統図である。
／・・イオン電極セル、λ・・恒温装置、３・・イオン
電極、グ・・比較電極、Ｓ・・導管、乙・・比較電極セ
ル、７・・温度補償素子。
出願人 東亜電波工業株式会社
代理人 弁理１：中何勝成Figure 1 is a system diagram showing an example of an ion concentration measuring device equipped with a conventional temperature compensation circuit.
Figure 3 shows an example of an electrode device for measuring ion concentration according to the present invention. 1i 41i
Fig. 7 is a diagram of an embodiment of the device for measuring ion concentration according to the present invention.
FIG. 2 is a system diagram of a measuring device using an igλ device. /... Ion electrode cell, λ... Constant temperature device, 3... Ion electrode, G... Reference electrode, S... Conduit, B... Reference electrode cell, 7... Temperature compensation element. Applicant: Toa Denpa Kogyo Co., Ltd. Attorney 1: Katsunari Nakama
Claims (1)
比較電極セルに挿入し、イオン電極セルと比較電極セル
とを導管で接続し、イオン電極セルのみに恒温装置を設
け、比較電極セル又は比較電極セル内に温度補償素子を
配置したこｋを特徴とするイオン濃度測定用電極装置。(1) Insert the ion electrode into the ion electrode cell and the comparison electrode into the comparison electrode cell, connect the ion electrode cell and the comparison electrode cell with a conduit, install a constant temperature device only in the ion electrode cell, and insert the reference electrode cell or the comparison electrode cell. An electrode device for measuring ion concentration, characterized in that a temperature compensating element is arranged within an electrode cell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57149703A JPS5938646A (en) | 1982-08-27 | 1982-08-27 | Electrode apparatus for measuring ion concentration |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57149703A JPS5938646A (en) | 1982-08-27 | 1982-08-27 | Electrode apparatus for measuring ion concentration |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5938646A true JPS5938646A (en) | 1984-03-02 |
Family
ID=15480966
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57149703A Pending JPS5938646A (en) | 1982-08-27 | 1982-08-27 | Electrode apparatus for measuring ion concentration |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5938646A (en) |
-
1982
- 1982-08-27 JP JP57149703A patent/JPS5938646A/en active Pending
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