JPS5926005A - Detection of beam position in multibeam scanner - Google Patents

Detection of beam position in multibeam scanner

Info

Publication number
JPS5926005A
JPS5926005A JP13652082A JP13652082A JPS5926005A JP S5926005 A JPS5926005 A JP S5926005A JP 13652082 A JP13652082 A JP 13652082A JP 13652082 A JP13652082 A JP 13652082A JP S5926005 A JPS5926005 A JP S5926005A
Authority
JP
Japan
Prior art keywords
beams
detected
scanning direction
main scanning
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13652082A
Other languages
Japanese (ja)
Other versions
JPH0357452B2 (en
Inventor
Yoshiaki Matsunaga
松永 佳昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Minolta Co Ltd
Original Assignee
Minolta Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minolta Co Ltd filed Critical Minolta Co Ltd
Priority to JP13652082A priority Critical patent/JPS5926005A/en
Publication of JPS5926005A publication Critical patent/JPS5926005A/en
Publication of JPH0357452B2 publication Critical patent/JPH0357452B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Dot-Matrix Printers And Others (AREA)
  • Laser Beam Printer (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Facsimile Scanning Arrangements (AREA)

Abstract

PURPOSE:To detect exactly the positions of respective beams by disposing photodetection parts for detecting the positions of respective beams with deviations in the main scanning direction on the scanning lines of the beams and lighting, detecting and putting out the beams in order of the beams detected from the side where the scanning is started. CONSTITUTION:Plural photodetectors E1-E5 are disposed for plural overlapping beams B1-B5 with deviations from each other in the main scanning direction on the scanning lines of the respective beams. A detector M consisting of such photodetectors is disposed on the lateral side of a photosensitive drum 6 which is the plane to be scanned. The intervals between the respective photodetection parts in the main scanning direction are required to give no influence on the photodetection parts for the beams before the beams are lighted. When the first beams B1 is first lighted and B1 is detected in the photodetector E1, B1 is put out, then the beam B2 is lighted at the prescribed timing and when the beam B2 is detected in the photodetector E2, the beam B2 is put out. Thereafter, the similar operations are continued. As a result, the positions of the respective beams are exactly detected even if the beams overlap on the plane to be scanned.

Description

【発明の詳細な説明】 本発明は、変調8J’能な複数のビームをポリゴンミラ
ー等の走食装置を用いて偏向させて被走査向上を同時に
走査するマルチビーム走査装置に関するものであり、さ
らに詳しくは、被走査面上、で印字開始位置を決めるた
めの信号(以下、SUS信号という。)を検知するビー
ム位置検知ノj法に係わる。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a multi-beam scanning device that simultaneously scans an area to be scanned by deflecting a plurality of beams capable of modulating 8J' using a scanning device such as a polygon mirror. Specifically, the present invention relates to a beam position detection method that detects a signal (hereinafter referred to as SUS signal) for determining a printing start position on a scanned surface.

ト記マルチビーム走査装置はシンクルビーム走査装置に
比ベポリコンミラ−の回転数を低減することかできるの
で耐久性や振dotの而から利点か大きい。しかし、S
O5信号の検知については各ビーム相互の関係か加わる
ので非常に難しくなる。
The multi-beam scanning device mentioned above has great advantages in terms of durability and vibration dots because it can reduce the number of rotations of the polygon mirror compared to the shingle beam scanning device. However, S
Detection of the O5 signal becomes extremely difficult due to the relationship between each beam.

一つの方法として、ビーム発生装置の相互位置を正確に
決めておいて各ビームのうちの1つのビーム位置のみを
検出し、他のビームの位置は検知されたビームの位置を
補正してSO5信号とするやり方か考えられる。
One method is to accurately position the beam generators relative to each other so that only one beam position of each beam is detected, and the positions of the other beams are corrected to the SO5 signal. I can think of a way to do this.

例えは、第1図に示すように1()oIIl1間隔て発
光部をもつ半導体レーザー(1)を主走査方向に対して
θ頌春けて設置し、第2図に示す焦点II′IJ+JI
l’、 5 mmのコリメータレンズ(2)、ポリゴン
ミラー(3)及び焦点距離500胴 のfθレンズ(4
)とで被走査面上に投影する場合を考えると、100μ
!nのビーム間隔に対し被走査向上で十′309μmの
誤差を許容するとしても、ビームは100倍に拡大され
るので半導体レーザー(1)を顔部ける角度θを サー(1)の各発光部を階段状にすらず場合は±0;3
μinの精度ですらさねはならない。このような面精度
での半導体レーザーの配置或いは、装作は非常に難しい
ものである。
For example, as shown in FIG. 1, a semiconductor laser (1) having light emitting parts spaced apart by 1()oIIl1 is installed at an angle of θ with respect to the main scanning direction, and a focal point II′IJ+JI shown in FIG.
l', a 5 mm collimator lens (2), a polygon mirror (3), and an fθ lens (4) with a focal length of 500 mm.
) on the scanned surface, 100μ
! Even if an error of 10'309 μm is allowed in scanning improvement for a beam spacing of If it is not even step-like, ±0; 3
Even the precision of μin must be met. It is extremely difficult to arrange or mount a semiconductor laser with such surface precision.

上記方法の変形として、第3図に示すように被走査面り
でのビームの相互位置を各ビーム毎に設けたミラー(5
1+51 +5)で、i+、”ll ’l昏することか
考えられる。
As a modification of the above method, as shown in FIG. 3, a mirror (5
1+51 +5), i+, ``ll 'l can be considered.

即ち、各ミラー(5) (51(51を主走査方向と枢
持な軸のまわりに回動してビーム間隔を調整するととも
に副走査方向と平行な軸のまわりに回動して各ビームの
主走査方向の位置を調整するのである。
That is, each mirror (5) (51 (51) is rotated around an axis that is central to the main scanning direction to adjust the beam interval, and at the same time, the beam interval is adjusted by rotating around an axis parallel to the sub-scanning direction. The position in the main scanning direction is adjusted.

しかし、この方法もミラーf51 +5+ +5)の調
整という新たなへIM整要素が加わるうえにその調整か
J(′常に微妙なものであり、実際には難しい方法であ
る。
However, this method also adds a new IM adjustment element of adjusting the mirror f51 +5+ +5), and the adjustment is always delicate, and is actually a difficult method.

そこで各ビーム毎に別々にビーム位置を検知することが
考えられるが、通常のレーザービームプリンタでは走査
線の間にすきまかできないようにするために被走査面上
てはビームかオーバーラツプするように設定されている
(弔4図)。例えはピーク・間隔を+00μ川とした場
合、中心強度の1/e2て定義したビーム径を被走査面
]゛、て2 fl FIμm Jhj度になるように設
定する^1ぐである。しかしこのようなオーバルラップ
は、各ビーム毎に設けられた検知装置か他のビームをも
・寧知してしまい誤輔作の一因となる。
Therefore, it is possible to detect the beam position for each beam separately, but in normal laser beam printers, the beams are set to overlap on the scanned surface in order to prevent gaps between scanning lines. (Funeral figure 4). For example, if the peak interval is +00μ, the beam diameter defined as 1/e2 of the center intensity is set so that the scanned surface is 2 fl FI μm Jhj degrees. However, such an oval wrap causes the detection device provided for each beam to detect other beams as well, contributing to erroneous operation.

本発明はこのような点に槻みてなされたものであり、マ
ルチビーム走rj装置のビーム位置1金知をビームかオ
ーバーラツプしているにもかが1コらす各ビームf祥に
積1廷よく検知てきるビーム位置検知方法を提供するこ
とを目的とする。
The present invention has been made in view of the above points, and it is possible to overlap the beam position 1 of the multi-beam running RJ device with one beam and one beam at each beam f position. It is an object of the present invention to provide a beam position detection method that can detect the beam position well.

1、述の目0ζJは、各ビームの位置を検知するための
複数の受光部を各ビームの定配m、1て七走査方回にず
らして配置し、ビームの点幻、対応する受光部によるビ
ームの検知、ビームの消却をjL: ft 1i41始
側から検知されるビームの順におこなう口とによって達
成される。即ち、ビームの点灯は受光部にビームがさし
かがる萌におこなわれ、このビームが検知されるとこの
ビームを消灯するとともに次のビームを所定のタイミン
クで点幻し、以ド舶次各ビームに対して点灯、検知、消
却をおこなうのである。
1. In order to detect the position of each beam, a plurality of light-receiving parts for detecting the position of each beam are arranged at a fixed distribution m of each beam, and are shifted in seven scanning directions. This is achieved by detecting the beam and extinguishing the beam in the order of the detected beam from the start side. In other words, the beam is turned on when the beam approaches the light receiving part, and when this beam is detected, this beam is turned off and the next beam is turned on at a predetermined timing. It lights up, detects, and extinguishes the beam.

コノヨうに制御することによって各ビームの位置を正(
11fに検出することができる。
By controlling the position of each beam in a positive manner (
11f.

以丁、図面を参照して本発明の各実施例を悦、明する。Embodiments of the present invention will now be described with reference to the drawings.

第5図の実施例は複数のオーバーラツプするビームB+
 、j3z、B3.B4,13s  に対し複数の受光
素子?:+。
The embodiment of FIG. 5 has multiple overlapping beams B+
, j3z, B3. Multiple light receiving elements for B4,13s? :+.

E2.Es、E4.Esを各ビームの走査線1.て!1
.いに主走督方向にすらして配置したものである。この
ような受光素子からなる検知装置N1は便宜上第;3図
に示すように被走査面である感光ドラム(6)の側方に
配置される。
E2. Es, E4. Let Es be the scanning line 1. of each beam. hand! 1
.. It was placed in the direction of the main runner. For convenience, the detection device N1 comprising such a light-receiving element is arranged on the side of the photosensitive drum (6), which is the surface to be scanned, as shown in FIG.

各受光部の主走査方向の間隔は受光部の主走査方向の大
きさ、ビームの大きさ、走査方向の位置誤差等からビー
ムを点月したとき前のビームに対する受光部に影響しな
いことが必誂である。
The spacing in the main scanning direction between each light receiving section must be determined from the size of the light receiving section in the main scanning direction, the size of the beam, positional error in the scanning direction, etc., so that when the beam is applied, it does not affect the light receiving section for the previous beam. It is custom made.

また、受光部の大きさは、副走査庁向には入射光計をで
きるたけ多くとるためビームの入きさを充分カバーする
大きさであることか望しく、主走査方+riJには第6
図(と示すようにビームかカウスビームでありスレッン
ヨールド1’hをピークの中間にとるのがもっとも誤差
の影響を受けにくぃ)Jめビームの大きさの半分以十は
必要である。
In addition, the size of the light receiving part is preferably large enough to cover the beam depth in order to take as many incident light meters as possible for the sub-scanning direction, and for the main scanning direction + ri
(As shown in the figure, it is best to use a beam or a Causs beam and set the threshold 1'h in the middle of the peak to be least affected by errors.) It is necessary to have at least half the size of the J-th beam.

・君5図の実施例において各ビームの消す1は1371
ス1に示すようにおこなわれる。即ち、最初のビームB
】かます点口され、このビームB1か受光素子1′、1
に検知されるとビームB+は消月され、次にビーム13
2  か所定のタイミンクで点灯され、このビームI%
2 が受光素子1・、2に検知されるとビーム132は
消灯され、以ドこれを順次ビームBsまて続ける。
・In the example of Figure 5, the number of 1 erased by each beam is 1371
This is done as shown in step 1. That is, the first beam B
] This beam B1 is transmitted to the light receiving elements 1', 1.
When detected, beam B+ is extinguished, and then beam 13 is detected.
Two places are lit at a specified timing, and this beam I%
2 is detected by the light-receiving elements 1 and 2, the beam 132 is turned off, and the beam 132 continues to be transmitted sequentially to the beam Bs.

これによって各受光素子E1〜E5がらは検知信号Sl
、S2.S3.S4.S5  か各ビーム位置に対応し
て出力される。そして、ビーム1も1は検知信号S1が
ら時間11  後、ビーム132は検知信号S2がら時
間J2後というように各ビーム毎に一定時間遅延して印
字開始位ifをそろえ印字をおこなう。
As a result, each light receiving element E1 to E5 receives a detection signal Sl.
, S2. S3. S4. S5 is output corresponding to each beam position. Then, beam 1 is delayed by a certain period of time for each beam, such as time 11 after detection signal S1, beam 132 after time J2 from detection signal S2, and printing is performed by aligning the printing start positions if.

・右8図の実施例は1つの受光素子Eoを用い、この受
光素子EOを主十kJj向にすらされた開111A+。
- The embodiment shown in Figure 8 on the right uses one light-receiving element Eo, and the light-receiving element EO is oriented in the main direction of 111A+.

A2.A3.z\4 、A5 、A6  を開けたスク
リーンSPで覆ったものである。この場合も制御はつ1
,7図に示したようにおこなう。但し、検知信号81〜
S6は1つの受光素子Eoから出力される。尚、本発明
においてビームB+〜136は第8図に示すように主7
:L青方向に若干ずれていてもよい。
A2. A3. z\4, A5, and A6 are covered with an open screen SP. In this case as well, the control is 1
, as shown in Figure 7. However, the detection signal 81~
S6 is output from one light receiving element Eo. In the present invention, the beams B+ to 136 are connected to the main beam 7 as shown in FIG.
:L May be slightly shifted in the blue direction.

イト5図のビームのオーバーラツプ状態を見ると判るよ
うに、隣り同士のビームはオーバーラツプしているか離
れたビーム同士はオーバーラツプしていない。
As can be seen from the overlapping state of the beams in Figure 5, adjacent beams overlap or distant beams do not overlap.

そこでビームをグループに分は受光素子を複数段に並べ
ることか考えられる。
Therefore, it may be possible to arrange the light receiving elements in multiple stages to group the beams.

第9 P;AはL記の考察に蛾ついた実施例で、ビーム
B+、j3z、B3に対する受光素子El、l、2.E
3とビームIS4,135136に対する受光素子E4
,1“B5. E6とに分け、夫々を副走査方向に2段
に並へたものである。
9th P: A is an example based on the consideration of L, in which light receiving elements El, l, 2 . E
3 and light receiving element E4 for beam IS4, 135136
, 1"B5.E6, and arranged in two stages in the sub-scanning direction.

第10図はこれをさらに進暦させ、ビームB+、B2゜
IS3に対して1つの受光素子EAをビームB4 、 
lSs 、 IS6に列して別の1つの受光素子EBを
主走査H向に対して傾けて設け、これら吸光素子EA 
、 ト、Bを各ビームに対する開LIA+〜A6を有す
るスクリーンSl’て摺ノつたものである。この際、ス
クリーンSPは各慴尤素子母に設けてもよい。
In Fig. 10, this is further advanced, and one light-receiving element EA is used for beams B+, B2°IS3, and beams B4,
Another light-receiving element EB is provided in line with ISs and IS6, tilted with respect to the main scanning direction H, and these light-absorbing elements EA
, G, and B are printed on a screen S1' having openings LIA+ to A6 for each beam. At this time, the screen SP may be provided on each base element.

第11図の実施例は1つの受光素子IZ(]を用い、こ
れを覆うスクリーンspに2段に並んた開11AI、A
2゜A3.A4及びAs 、A6 、A7 、A8を設
けたものである。この場合各段の開1」は互いに副走査
方向から卵、て屯ならないように配置し、また、受光素
子としては+、p、:答件のよいものを用いる。
The embodiment shown in FIG. 11 uses one light-receiving element IZ(), and apertures 11AI and A are arranged in two stages on the screen sp that covers it.
2゜A3. A4, As, A6, A7, and A8 are provided. In this case, the openings 1 in each stage are arranged so that they do not overlap each other from the sub-scanning direction, and the light-receiving elements that have good +, p, and : responses are used.

上述の通り本発明は、変、、lAl af能な複数のビ
ームて被走査tfri十を同時に走査するマルチビーム
走査装置において、各ビームの位置を検知するための複
数の受光部を各ビームの走査線上で)ミ走査H回にずら
して配置し、ビームの点月、対応する受光部によるビー
ムの検知、ビームの消却を走査開始イ則から不英知され
るビームの川向におこなうものであるから、ビームが被
走査面上でオーバーラツプするにもかかわらず各ビーム
の位置を市確に検知することができるものである。
As described above, the present invention provides a multi-beam scanning device that simultaneously scans an object to be scanned with a plurality of variable beams, in which a plurality of light receiving sections for detecting the position of each beam are scanned by each beam. This is because the beams are shifted by H times (on the line), and the beam is focused, the beam is detected by the corresponding light receiving part, and the beam is extinguished in the direction of the beam, which is unknown from the scanning start rule. Even though the beams overlap on the scanned surface, the position of each beam can be accurately detected.

また、共通の受光素子を各ビームの走査線上主走査方向
にすらして開1−1を設けたスクリーンで覆う・ように
すれは受光素子の数を減らすことができる。
Further, the number of light receiving elements can be reduced by covering a common light receiving element with a screen provided with an opening 1-1 along the scanning line of each beam in the main scanning direction.

さらにまた、各ビームをグループに分は夫々のグループ
に対する受光部を副走査方向に複数段にζ1νべれは多
くのビームを用いる場合でも検知装置をコンパクトに構
成することができる。
Furthermore, if each beam is divided into groups and the light receiving section for each group is arranged in multiple stages in the sub-scanning direction, the detection device can be constructed compactly even when many beams are used.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は複数の発光部をもっ半導体レーサーを示す図、
第2.3図はマルチビーム走査装置のビーム位置検知の
一例として本発明者により提案検討された方法を説明す
る図、第4図は複数のビームの発光部と被走査面」−に
おける相互の関係を説明する図、tlGs、s、9.1
o、11図は本発明各実施例のビームと受光部との関係
を説明する図、・窮6図はビームと受光素f出力の関係
を説明する図、第7図は本発明のビーム位置検知方法の
制伺jを説明する図である。 1・・・半導体レーザー  IS・・・ビーム2・・・
コリメーターレンズ 1“、・・・−¥ 光4 J’3
・・・ポリゴンミラー   A・開18」4・・・fθ
レンズ     N1・・検知装置5・・・ミラー  
      5・検知+、j弓。 6 ・感光ドラム    S ll  スクリーン出:
i1!1人 ミノルタカメラ株式ノア\社第1図 第2図 第4図 棲走食面支           あL−IP第5図 Eノ 笛8図 第7図 第6図
Figure 1 is a diagram showing a semiconductor racer with multiple light emitting parts.
Figure 2.3 is a diagram explaining a method proposed and considered by the present inventor as an example of beam position detection in a multi-beam scanning device, and Figure 4 shows mutual interaction between the light emitting parts of multiple beams and the scanned surface. Diagram explaining the relationship, tlGs,s, 9.1
Figures o and 11 are diagrams explaining the relationship between the beam and the light-receiving section in each embodiment of the present invention, Figure 6 is a diagram explaining the relationship between the beam and the output of the light-receiving element f, and Figure 7 is the beam position of the present invention. FIG. 3 is a diagram illustrating the limitations of a detection method. 1... Semiconductor laser IS... Beam 2...
Collimator lens 1",...-¥ Light 4 J'3
・・・Polygon mirror A・Open 18'' 4...fθ
Lens N1...Detection device 5...Mirror
5. Detection +, j bow. 6 ・Photosensitive drum S ll Screen output:
i1! 1 person Minolta Camera Co., Ltd. Noah\sha Figure 1 Figure 2 Figure 4 Erosion and eclipse support A L-IP Figure 5 E no whistle Figure 8 Figure 7 Figure 6

Claims (1)

【特許請求の範囲】[Claims] 1 変調可能な複数のビームで被走査rli上を同時に
走査するマルチビーム走査装置において、各ビームの位
置を検知するための複数の受光部を各ビームの走査線上
で主走査方向にすらして配置し、ビームの点灯、対応す
る受光部によるビームの検知、ビームの消灯を走査開始
側から検知されるビームの順におこなうことを特徴とす
るビーム位置検知方法。
1. In a multi-beam scanning device that simultaneously scans the scanned rli with multiple modulated beams, multiple light receiving units for detecting the position of each beam are arranged on the scanning line of each beam in the main scanning direction. A beam position detection method characterized in that the beam is turned on, the beam is detected by a corresponding light receiving section, and the beam is turned off in the order of the beams detected from the scan start side.
JP13652082A 1982-08-04 1982-08-04 Detection of beam position in multibeam scanner Granted JPS5926005A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13652082A JPS5926005A (en) 1982-08-04 1982-08-04 Detection of beam position in multibeam scanner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13652082A JPS5926005A (en) 1982-08-04 1982-08-04 Detection of beam position in multibeam scanner

Publications (2)

Publication Number Publication Date
JPS5926005A true JPS5926005A (en) 1984-02-10
JPH0357452B2 JPH0357452B2 (en) 1991-09-02

Family

ID=15177093

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13652082A Granted JPS5926005A (en) 1982-08-04 1982-08-04 Detection of beam position in multibeam scanner

Country Status (1)

Country Link
JP (1) JPS5926005A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60230761A (en) * 1984-04-28 1985-11-16 Nec Corp Printing position adjusting circuit
US6005243A (en) * 1997-03-03 1999-12-21 Ricoh Company, Ltd. Synchronous adjustment method, apparatus, and computer program product in a multiple beam optical system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57102609A (en) * 1980-12-18 1982-06-25 Canon Inc Method and device for scanning using plural number of beams

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57102609A (en) * 1980-12-18 1982-06-25 Canon Inc Method and device for scanning using plural number of beams

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60230761A (en) * 1984-04-28 1985-11-16 Nec Corp Printing position adjusting circuit
US6005243A (en) * 1997-03-03 1999-12-21 Ricoh Company, Ltd. Synchronous adjustment method, apparatus, and computer program product in a multiple beam optical system

Also Published As

Publication number Publication date
JPH0357452B2 (en) 1991-09-02

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