JPS59226807A - Linear displacement measuring instrument - Google Patents

Linear displacement measuring instrument

Info

Publication number
JPS59226807A
JPS59226807A JP10144783A JP10144783A JPS59226807A JP S59226807 A JPS59226807 A JP S59226807A JP 10144783 A JP10144783 A JP 10144783A JP 10144783 A JP10144783 A JP 10144783A JP S59226807 A JPS59226807 A JP S59226807A
Authority
JP
Japan
Prior art keywords
main scale
scale
holding member
frame
linear displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10144783A
Other languages
Japanese (ja)
Other versions
JPH0244367B2 (en
Inventor
Soji Ichikawa
宗次 市川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsutoyo Manufacturing Co Ltd
Original Assignee
Mitsutoyo Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsutoyo Manufacturing Co Ltd filed Critical Mitsutoyo Manufacturing Co Ltd
Priority to JP10144783A priority Critical patent/JPS59226807A/en
Priority to US06/616,181 priority patent/US4569137A/en
Publication of JPS59226807A publication Critical patent/JPS59226807A/en
Publication of JPH0244367B2 publication Critical patent/JPH0244367B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0011Arrangements for eliminating or compensation of measuring errors due to temperature or weight
    • G01B5/0014Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/347Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
    • G01D5/34707Scales; Discs, e.g. fixation, fabrication, compensation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Optical Transform (AREA)

Abstract

PURPOSE:To hold a scale at right angles regardless of the curvature of a frame body and to measure with high precision by adhering a scale holding member which has guide surfaces and a projection to the frame body, and pressing and adhering a main scale to the member with a rubber rod. CONSTITUTION:The main scale holding member 30 which has the two guide surfaces 30A and 30B and guide projection 30c is adhered and fixed to the frame body 14 at specific pitch with an elastic adhesive 32. Then, the main scale 10 while pressed against the guide surface 30A with the rubber rod 12 is adhered fixedly to the holding member with an elastic adhesive 34. Consequently, even if there is a slight error in the bending angle theta of the member 30, the bottom surface of the scale 10 abuts on the guide surface 30B securely, and even if the frame body 14 curves, the scale 10 is held at right angles and the difference in thermal expansion between the frame body 14 and scale 10 is absorbed, so taking a high-precision measurement.

Description

【発明の詳細な説明】 本発明は、直線型変位測定機に係り、特に、比較的短尺
のメインスケールを備えた直線型変位測定機に用いるの
に好適な、相対変位を測定されるべき2つの被測定物の
一方に連結される枠体と、該枠体に保持された、該枠体
と熱膨張係数が異なる材料からなるメインスケールと、
前記被測定物の他方に連結され、メインスケールに沿っ
て移動されるインデックススケールとを有し、前記メイ
ンスケールとインデックススケールの相対移動から前記
2つの被測定物間の相対変位を測定するようにした直線
型変位測定機の改良に関(る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a linear displacement measuring machine, and particularly to a linear displacement measuring machine having a relatively short main scale. a frame body connected to one of the two objects to be measured; a main scale held by the frame body and made of a material having a coefficient of thermal expansion different from that of the frame body;
an index scale connected to the other of the objects to be measured and moved along the main scale, and configured to measure relative displacement between the two objects to be measured from relative movement of the main scale and the index scale. Concerning the improvement of the linear displacement measuring machine.

一般に物体の長さ等を測定する測定機において、その本
体に対する測定子の移動量、コラムに対するスライダー
の移動量等のように、相対移動するものの移動量を測定
づる場合、一方にメインスケールを保持した枠体、他方
にインデックススケールを含む検出器を固定し、枠体と
検出器の相対変位量を、例えば光学的方法や電磁的方法
によって読取るようにした変位測定機が知られている。
Generally speaking, in a measuring machine that measures the length of an object, when measuring the amount of movement of something that moves relative to the body, such as the amount of movement of the probe relative to the main body, the amount of movement of the slider relative to the column, etc., the main scale is held on one side. A displacement measuring device is known in which a frame body is fixed to the other side, and a detector including an index scale is fixed to the other side, and the amount of relative displacement between the frame body and the detector is read by, for example, an optical method or an electromagnetic method.

このような変位測定機、特に、透過型の変位検出装置を
備えた直線型変位測定機においては、一般に、形状が複
雑となる枠体が、検出部のシール性、不燃性及び軽量化
等のため、アルミニウム押出型材で形成され、又、該枠
体に保持されるメインスケールがガラスで形成されてい
るため、温度変化時に熱膨張量に差が生じ、メインスケ
ールが変形して測定精度が低下したり、或いは、甚しい
場合には、メインスケールが破壊されることがあるとい
う問題点を有していた。
In such displacement measuring machines, especially in linear displacement measuring machines equipped with a transmission-type displacement detecting device, the frame body is generally complicated in shape, and is designed to improve sealability, nonflammability, and weight reduction of the detection part. Because the main scale is made of extruded aluminum, and the main scale held in the frame is made of glass, there is a difference in the amount of thermal expansion when the temperature changes, causing the main scale to deform and reduce measurement accuracy. However, in severe cases, the main scale may be destroyed.

従って従来から、例えば第1図に示す如く、メインスケ
ール10の直交する2面を、ゴム棒12により枠体14
のガイド面14A、14Bに押圧した状態で、弾性接着
剤16等を用いて、メインスケール10を枠体14に直
接接着固定して、メインスケール10を弾性的に保持づ
るようにしていた。
Therefore, conventionally, for example, as shown in FIG.
The main scale 10 is directly adhesively fixed to the frame 14 using an elastic adhesive 16 or the like while being pressed against the guide surfaces 14A and 14B of the frame 14, so that the main scale 10 is elastically held.

第1図において、20は、前記メインスケール10の表
面上を摺動する摺動駒22により、前記メインスケール
10と所定の位置関係を保持した状態で、前記メインス
ケール10の長手方向に移動するようにされたスライダ
ー、24は、該スライダー20のメインスケール目盛面
10Aに対向した面に固定された、メインスケール10
と同様な縦縞状の目盛が形成されたインデックススケー
ル、26.28は、それぞれ前記メインスケール10及
びインデックススケール24を挾んだ状態で前記スライ
ダー20に固定された、発光素子及び受光素子である。
In FIG. 1, 20 is moved in the longitudinal direction of the main scale 10 while maintaining a predetermined positional relationship with the main scale 10 by a sliding piece 22 that slides on the surface of the main scale 10. The slider 24 configured as shown in FIG.
The index scales 26 and 28 on which vertical striped scales similar to those shown in FIG.

しかしながら、前記枠体14を形成(るアルミニウム押
出型材は、その製造方法からして、既に、例えばその長
さ300mm当り0.03111m程度、即ち、例えば
1μmの目盛分解能の30倍程度の曲り、捩れやうねり
等が不規則に発生しており、これを矯正してメインスケ
ール10と同程度の高y1度に仕上げることは実際上困
難である。又、使用状態においては、温度変化に伴って
熱的な変形も発生(る。従って従来においては、例えば
1μm程度の目盛分解能を得るべく、メインスケール1
0をいかに高精度に仕上げ加工しても、このメインスケ
ール10を枠体14に接着固定する際に、メインスケー
ル10が枠体14の曲り等になじんで変形してしまい、
目盛が拡大、縮少されて、測定精度が大幅に低下してし
まうという問題点があった。
However, due to the manufacturing method used to form the frame 14, the extruded aluminum material is already subject to bending and twisting of, for example, about 0.03111 m per 300 mm of length, that is, about 30 times the scale resolution of 1 μm. It is difficult in practice to correct these irregularities and achieve a finish with a high y1 degree comparable to that of main scale 10.In addition, during use, heat may be generated due to temperature changes. Therefore, in the past, in order to obtain a scale resolution of about 1 μm, for example, the main scale 1
No matter how precisely the main scale 10 is finished and processed, when the main scale 10 is fixed to the frame 14 with adhesive, the main scale 10 will adapt to the bending of the frame 14 and deform.
There was a problem in that the scale was enlarged or reduced, resulting in a significant drop in measurement accuracy.

今、メインスケール10が枠体14の曲りの影響を受け
て曲った場合の測定精度に対する影響を推定してみると
、例えば、第2図に示す如く、目盛10Bをメインスケ
ール10の中立軸Aに対して対称に形成した場合は、メ
インスケール10の曲りが、矢印Bに示す如く、その高
さ方向に発生した時には、誤差を生じることはない。し
かしながら、通常、目盛10Bが形成された目盛面10
Aは、メインスケール10の中立面Cとは一致しないた
め、第3図に示す如く、メインスケール10の曲りが、
その厚さ方向に発生した時には、その曲りの半径をR,
誤差を評価するべき単位区間の見込み角度を△θ、曲り
発生前の長さ、即ち中立面Cの長さをし、目盛面10A
の長さをLOとプると、両者の誤差εは、次式で近似的
に表わされる。
Now, when estimating the effect on measurement accuracy when the main scale 10 is bent due to the bending of the frame 14, for example, as shown in FIG. If the main scale 10 is formed symmetrically with respect to the main scale 10, no error will occur when the main scale 10 bends in the height direction as shown by the arrow B. However, normally, the scale face 10 on which the scale 10B is formed
Since A does not coincide with the neutral plane C of the main scale 10, the curvature of the main scale 10 is as shown in FIG.
When the bend occurs in the thickness direction, the radius of the bend is R,
The expected angle of the unit section for which the error should be evaluated is △θ, the length before the bending occurs, that is, the length of the neutral plane C, and the scale plane 10A
When the length of is taken as LO, the error ε between the two is approximately expressed by the following equation.

ε=Lo −L        、、、  (1)LO
−← (R+j/2)  △ θ     、、、(2
ンL今RΔθ        、、、(3)ここで、t
はメインスケール10の厚さである。
ε=Lo −L , (1) LO
−← (R+j/2) △ θ ,,,(2
(3) Here, t
is the thickness of the main scale 10.

ところで、中立面Cの中央部の最大変形量δは次式で近
似的に表わされる。
By the way, the maximum deformation amount δ at the center of the neutral plane C is approximately expressed by the following equation.

δ= R−RCO3(Δθ/2) 牟R[1−(1−(1/2 +  )X(Δθ/2) 
 2 )] =R(Δθ)2/8 =LΔθ/8         、、、(4)従って、
前記誤差εは、このδを用いることによって、次式で表
わされる。
δ= R-RCO3(Δθ/2) R[1-(1-(1/2 +)X(Δθ/2)
2)] =R(Δθ)2/8 =LΔθ/8, (4) Therefore,
The error ε is expressed by the following equation using this δ.

ε:(t/2)八〇 ÷(t /2) X (8δ/L) ÷4(δ/L       、、、(5)従って、メイ
ンスケール10の誤差評価単位区間の長さLが300 
mm、厚さ【が5mm、δが0.06+nmの時、誤差
εは約4μmとなる。よって、例えば全長900mmの
メインスケールの場合には12μmの誤差が発生するこ
とになり、1μm以下の測定精度を要求される直線型変
位測定機においては、致命的な欠陥となってしまう。
ε: (t/2) 80 ÷ (t / 2)
mm, thickness [is 5 mm, and δ is 0.06+nm, the error ε is about 4 μm. Therefore, for example, in the case of a main scale with a total length of 900 mm, an error of 12 μm will occur, which is a fatal defect in a linear displacement measuring machine that requires measurement accuracy of 1 μm or less.

このような問題を軽減するべく、メインスケール10を
枠体14に接着固定づる際に、テストインジケータや電
気マイクロメータ等を用いて、例えば、メインスケール
10の2面に電気マイクロメータ等を当接させ、長手方
向に渡って精度を測定し、その凸凹に合わせてメインス
ケール10と枠体14の間にシムを挿入することによっ
て、メインスケール10の位置出しを行うことも考えら
れるが、これは極めて能率が悪いだけでなく、正確な位
置出しが非常に困難であるという問題点を有していた。
In order to alleviate such problems, when fixing the main scale 10 to the frame 14 by adhesive, for example, use a test indicator, an electric micrometer, etc., and touch the electric micrometer, etc. to two sides of the main scale 10. It is also possible to position the main scale 10 by measuring the accuracy in the longitudinal direction and inserting shims between the main scale 10 and the frame 14 according to the irregularities, but this is not possible. This method not only has extremely low efficiency, but also has problems in that accurate positioning is extremely difficult.

本発明は、前記従来の問題点を解消するべくなされたも
ので、枠体の曲り等にかかわらずメインスケールを真直
に保持すると共に、メインスケールと枠体の熱膨張量の
差を吸収することができ、従って、高精度の測定を行う
ことができる直線型変位測定機を提供することを目的と
する。
The present invention has been made to solve the above-mentioned conventional problems, and has the objective of holding the main scale straight regardless of bending of the frame, and absorbing the difference in thermal expansion between the main scale and the frame. Therefore, an object of the present invention is to provide a linear displacement measuring device that can perform highly accurate measurements.

本発明は、相対変位を測定されるべき2つの被測定物の
一方に連結される枠体と、該枠体に保持された、該枠体
と熱膨張係数が異なる材料からなるメインスケールと、
前記被測定物の他方に連結され、メインスケールに沿っ
て移動されるインデックススケールとを有し、前記メイ
ンスケールとインデックススケールの相対移動から前記
2つの被測定物間の相対変位を測定するようにした直線
型変位測定機において、前記メインスケールの交差する
2面に対応覆る2つのガイド面を有するメインスケール
保持部材を、前記ガイド面の真直性を維持した状態で、
前記枠体の長手方向に所定ピッチで接着固定覆ると共に
、前記メインスケールを、押圧手段により前記メインス
ケール保持部材のガイド面に押圧した状態で、前記メイ
ンスケール保持部材に接着固定するようにして、前記目
的を達成したものである。
The present invention includes: a frame connected to one of two objects to be measured whose relative displacement is to be measured; a main scale held by the frame and made of a material having a coefficient of thermal expansion different from that of the frame;
an index scale connected to the other of the objects to be measured and moved along the main scale, and configured to measure relative displacement between the two objects to be measured from relative movement of the main scale and the index scale. In the linear displacement measuring device, a main scale holding member having two guide surfaces corresponding to and covering two intersecting surfaces of the main scale is provided, while maintaining the straightness of the guide surfaces.
Covering the frame with adhesive and fixing at a predetermined pitch in the longitudinal direction of the frame, and adhesively fixing the main scale to the main scale holding member while being pressed against the guide surface of the main scale holding member by a pressing means, The above objective has been achieved.

本発明によれば、メインスケールが、その交差Jる2面
に対応づる2つのガイド面を有し、該ガイド面の真直性
を維持した状態で、枠体に接着固定されたメインスケー
ル保持部材に接着固定されているので、枠体の曲り等に
かかわらず、メインスケールを真直に保持することがで
きる。又、前記メインスケール保持部材が、枠体の長手
方向に所定ピッチで接着固定されているので、メインス
ケールと枠体の熱膨張量の差が容易に吸収される。
According to the present invention, the main scale has two guide surfaces corresponding to the two intersecting surfaces thereof, and the main scale holding member is adhesively fixed to the frame while maintaining the straightness of the guide surfaces. The main scale can be held straight regardless of the bending of the frame. Furthermore, since the main scale holding members are adhesively fixed at predetermined pitches in the longitudinal direction of the frame, the difference in thermal expansion between the main scale and the frame can be easily absorbed.

又、本発明の実施態様は、前記ガイド面のメインスケー
ル厚さ方向中央部に、ガイド突起を形成    1する
ようにして、メインスケール保持部材の形状精度が高く
ない場合でも、メインスケールをその中立面で安定して
保持できるようにしたものである。
Further, in an embodiment of the present invention, a guide protrusion is formed in the central part of the guide surface in the thickness direction of the main scale, so that even if the shape accuracy of the main scale holding member is not high, the main scale can be held therein. This allows it to be held stably on an elevated surface.

更に、本発明の他の実施態様は、前記押圧手段を弾性部
材とし、該弾性部材のメインスケールへの当接面積が、
該メインスケールの前記メインスケール保持部材への当
接面積より小となるようにし゛C1不釣合なモーメント
が発生づるのを防止するようにしたものである。
Furthermore, in another embodiment of the present invention, the pressing means is an elastic member, and the contact area of the elastic member to the main scale is
The area of contact between the main scale and the main scale holding member is made smaller than that of the main scale to prevent an unbalanced moment from being generated.

又、本発明の更に他の実施態様は、前記メインスケール
保持部材のガイド面長さとメインスケール保持部材配設
間隔の比を、1ニア〜1:11として、搬送時に粗雑に
取り扱った場合でも、メインスケールの位置ずれ等の不
具合が生じないようにしたものである。
Further, in still another embodiment of the present invention, the ratio of the guide surface length of the main scale holding member to the main scale holding member arrangement interval is set to 1 to 1:11, so that even when the main scale holding member is roughly handled during transportation, This is to prevent problems such as misalignment of the main scale.

以下図面を参照して本発明の実施例を詳IIIに説明す
る。
Embodiments of the present invention will be described in detail below with reference to the drawings.

本実施例は、@4図及び第5図に示す如く、相対変位を
測定されるべき2つの被測定物の一方、例えば工作機械
のベットに固定される、例えばアルミニウム押°出型材
からなる枠体14と、該枠体14に保持された、該枠体
14と熱膨張係数が異なる材料、例えばガラスからなる
メインスケール10と、前記被測定物の他方、例えば被
加工物或いは工具に連結され、メインスケール10に沿
つ゛C移動されるインデックススケール(図示省略)等
を有し、前記メインスケール10とインデックススケー
ルの相対移動から前記2つの被測定物間の相対変位を測
定刃るようにした直線型変位測定機において、前記メイ
ンスケール10の直交する2面に対応する2つのガイド
面30A、30Bを右するメインスケール保持部113
0を、前記ガイド面30A、30Bの真直性を維持した
状態で、弾性接着剤32により前記枠体14の長手方向
に所定ピッチで接着固定すると共に、前記メインスケー
ル10を、押圧手段であるゴム棒12により前記メイン
スケール保持部材30のガイド面30Aに押圧した状態
で、弾性接着剤34により前記メインスケール保持部材
30に接着固定するようにしたものである。
As shown in Figures 4 and 5, this embodiment uses one of the two objects whose relative displacement is to be measured, for example, a frame made of an aluminum extrusion that is fixed to the bed of a machine tool. A main scale 10 held by the frame body 14 and made of a material having a coefficient of thermal expansion different from that of the frame body 14, such as glass, is connected to the other object to be measured, such as a workpiece or a tool. , an index scale (not shown) that is moved along the main scale 10, and the relative displacement between the two objects to be measured can be measured from the relative movement between the main scale 10 and the index scale. In the linear displacement measuring device, a main scale holding section 113 holds two guide surfaces 30A and 30B corresponding to two orthogonal surfaces of the main scale 10.
0 is adhesively fixed at a predetermined pitch in the longitudinal direction of the frame body 14 with an elastic adhesive 32 while maintaining the straightness of the guide surfaces 30A and 30B, and the main scale 10 is attached to a rubber plate serving as a pressing means. The rod 12 is pressed against the guide surface 30A of the main scale holding member 30, and the elastic adhesive 34 is used to adhesively fix the main scale holding member 30 to the main scale holding member 30.

前記メインスケール保持部材30は、第6図に詳細に示
す如く、略り字形状とされ、その一方のガイド面30B
のメインスケール厚さ方向中央部に、ガイド突起30C
が形成されている。これは、前記メインスケール保持部
材30の折り曲げ角度θに若干の誤差があっても、メイ
ンスケール10の底面が確実にガイド面30Bに当接す
るようにするためである。なお、メインスケール保持部
材30の折り曲げを高精度で行える場合には、このガイ
ド突起30Cを省略することも可能である。
As shown in detail in FIG. 6, the main scale holding member 30 has an abbreviated shape, with one guide surface 30B.
There is a guide protrusion 30C in the center of the main scale in the thickness direction.
is formed. This is to ensure that even if there is a slight error in the bending angle θ of the main scale holding member 30, the bottom surface of the main scale 10 will surely come into contact with the guide surface 30B. Note that if the main scale holding member 30 can be bent with high precision, the guide protrusion 30C may be omitted.

前記ゴム棒12のメインスケール10への当接面積は、
前記メインスケール10のメインスケール保持部材30
への当接面積よりも小となるようにされている。これは
、不釣合なモーメントが発生するのを防止するためであ
る。
The contact area of the rubber rod 12 to the main scale 10 is:
Main scale holding member 30 of the main scale 10
The area of contact is smaller than that of the contact area. This is to prevent an unbalanced moment from occurring.

前記メインスケール保持部材30のガイド面長さ1とメ
インスケール保持部材前段間隔Pの比は、1ニア〜1:
11の範囲とされでいる。これは、メインスケール10
と枠体14の熱膨11sIの差を吸収して、熱応力によ
るメインスケール10の破損を防止づると共に、測定時
の温度変化による測定値のヒステリシスを軽減し、更に
、運搬時の粗雑な取り扱いによるメインスケール位置ず
れ等の不具合を防止づるためのものである。
The ratio of the guide surface length 1 of the main scale holding member 30 to the main scale holding member front stage interval P is 1 near to 1:
It is said to be in the range of 11. This is the main scale 10
It absorbs the difference in thermal expansion 11sI between the frame body 14 and the frame body 14, thereby preventing damage to the main scale 10 due to thermal stress, reducing hysteresis in measured values due to temperature changes during measurement, and further preventing rough handling during transportation. This is to prevent problems such as misalignment of the main scale due to

即ち、出願人が既に特願昭57−57604で提案して
いるように、メインスケール10が、例えば1500m
m 〜4500nv程度の長尺スケールCある場合には
、メインスケール10の長手方向に、メインスケール1
0、枠体14及び弾性接合部材の材質並びにメインスケ
ール10の長さによって決定されるピッチ及び長さの弾
性部材非接合部を設け、温度変化時に弾性接合部側を介
してメインスケール10に加わる熱応力を軽減覆ること
によって、熱応力によるメインスケール10の破損を防
止すると共に、測定時の温度変化による測定値のヒスプ
リシスを軽減づることか可能である従って、前記メイン
スケール10が、例えば1500mm以上の長尺物であ
る場合には、前記メインスケール保持部<430のガイ
ド1IIi長さ1とメインスケール保持部材配設1i1
1隔Pの比を1=15〜1:20の範囲とすることがで
きる。一方メインスケール10の長さが、例えば150
0+nm以下の比較的短いものである場合には、軽く、
持運び易いので、運搬時に粗雑に扱われや1いため、梱
包落下に対づる配置を充分に行い、例えば、最大許容外
力を、長尺スケールの場合の12G程度に対して、短尺
スケールの場合には、20〜50G程度に高める8独が
ある。
That is, as the applicant has already proposed in Japanese Patent Application No. 57-57604, the main scale 10 is, for example, 1500 m long.
If there is a long scale C of about m ~ 4500 nv, the main scale 1 is placed in the longitudinal direction of the main scale 10.
0. An elastic member non-joint part is provided with a pitch and length determined by the materials of the frame 14 and the elastic joint member and the length of the main scale 10, and when the temperature changes, the elastic member is applied to the main scale 10 through the elastic joint part side. Reducing thermal stress By covering the main scale 10, it is possible to prevent damage to the main scale 10 due to thermal stress and to reduce hysteresis in measured values due to temperature changes during measurement. In the case of a long object, the guide 1IIi length 1 of the main scale holding part < 430 and the main scale holding member arrangement 1i1
The ratio of 1 interval P can be in the range of 1=15 to 1:20. On the other hand, the length of the main scale 10 is, for example, 150 mm.
If it is relatively short, 0+nm or less, it is light;
Since it is easy to carry, it is less likely to be handled roughly during transportation, so the arrangement should be made to prevent the packaging from falling, and for example, the maximum allowable external force should be set at around 12G for a long scale, whereas for a short scale, the There is an 8-double that raises it to about 20-50G.

発明者が、有効長が夫々160CHnm、1800mm
、2000mm、2200mm、2400vn、260
0mm、2800mm、3000mmであるメインスケ
ール10を有りる直線型変位測定機について、直径3m
mのニトリルゴム(硬度60)製ゴム棒12を、1妾合
部長さが15±2m+n、非接合部艮ざが135n+m
となるように等ピッチで配置して実験したところ、下記
第1表に示でような実験結果が得られ、いずれも充分で
あることが確認できた。
The inventor said that the effective length is 160CHnm and 1800mm, respectively.
, 2000mm, 2200mm, 2400vn, 260
For a linear displacement measuring machine with main scale 10 of 0 mm, 2800 mm, and 3000 mm, the diameter is 3 m.
m rubber rod 12 made of nitrile rubber (hardness 60), one mating part has a length of 15 ± 2 m + n, and the unjoined part has a width of 135 n + m.
When an experiment was conducted by arranging them at equal pitches, the experimental results shown in Table 1 below were obtained, and it was confirmed that all of them were sufficient.

Cコー10べ〕ρくメ\/%:/+:=M1表におイテ
、F<+/2)は、温度が70℃変化した場合のメイン
スケール1oの最大張力(単位kg:規格値330kg
/mn+) 、agmax ハ、同じくメインスケール
1oの最大応力(単位kg/man2:規格値3 kc
l/1111112) 、(l rmaXハゴム棒12
の最大応力(t2−42kg/n+m2:NA4flr
M0.8−/nu++2) 、λ(1〉は、同じく枠体
14とメインスケール10の熱膨張量の差(単位mm)
、λ′(1)は、同じくメインスケール1oのゴム棒1
2の張力による伸び(単位μm)、λ−一(1)は、ゴ
ム棒12の伸び(単位im)、λ(1))は、温度に対
するヒステリシスの@(単位μm ) 、nは、最大許
容外力(単位G)である。
C Cor 10 Be] ρ kume\/%:/+:=M1 table, F<+/2) is the maximum tension of the main scale 1o when the temperature changes by 70°C (unit: kg: standard value) 330kg
/mn+), agmax C, also the maximum stress of main scale 1o (unit: kg/man2: standard value 3 kc
l/1111112), (l rmaX rubber rod 12
Maximum stress (t2-42kg/n+m2: NA4flr
M0.8-/nu++2), λ(1> is the difference in thermal expansion between the frame 14 and the main scale 10 (unit: mm)
, λ' (1) is also the rubber rod 1 of the main scale 1o.
2 (unit: μm), λ-1 (1) is the elongation of the rubber rod 12 (unit: im), λ(1)) is the hysteresis against temperature (unit: μm), n is the maximum allowable It is an external force (unit: G).

第1表から明らかなように、最大許容外力2゜G〜50
Gが確保され、温度に対するヒステリシスの鯖も、16
00mmの場合で4.4μmと比較的小さく、しかも、
梱包の費用が大幅に改善されることがわかる。
As is clear from Table 1, the maximum allowable external force is 2°G ~ 50
G is secured, and the hysteresis against temperature is also 16
In the case of 00mm, it is relatively small at 4.4μm, and
It can be seen that packaging costs are significantly improved.

又、同様にして温度に対づるヒステリシスの量を計算し
たところ、メインスケールの有効長が1000mmであ
る場合のヒステリシスの量は1.7μm、有効長が12
00mmのである場合のヒステリシスの量は2.5μm
1有効長が1400mmである場合のヒステリシスの鑓
は3.4μmであり、問題のない量であった。
In addition, when the amount of hysteresis with respect to temperature was calculated in the same way, the amount of hysteresis was 1.7 μm when the effective length of the main scale was 1000 mm, and the effective length was 12
00mm, the amount of hysteresis is 2.5μm
When one effective length was 1400 mm, the hysteresis value was 3.4 μm, which was a problem-free amount.

本実施例におけるメインスケール10の枠体14に対す
る取付けは、具体的には、例えば、次のようにして行わ
れる。即ち、まず、少なくとも前記メインスケール保持
部tJ30の配設位置に対応して設けられた、メインス
ケール10の直交する2而に対応する形状の磁石部分を
含む位置出し治具に、磁性体からなるメインスケール保
持部材30を、所定ピッチで吸引固定づる。次いで、前
記位置出し治具に吸引固定されたメインスケール保持部
+J 30に、前記枠体14を、弾性接着剤32により
接着固定する。更に、的記位置出し治具をはずして、そ
の代りに、メインスケール10を、弾性接着剤34によ
りメインスケール保持部U30に接着固定する。これに
よって、ガイド面30A、30Bの真直性を維持した状
態で、メインスケール保持部材30を容易に枠体14に
接着固定することができる。
Specifically, the attachment of the main scale 10 to the frame body 14 in this embodiment is performed, for example, as follows. That is, first, a positioning jig made of a magnetic material is attached to a positioning jig including a magnet portion having a shape corresponding to two perpendicular points of the main scale 10, which is provided corresponding to at least the arrangement position of the main scale holding part tJ30. The main scale holding member 30 is suctioned and fixed at a predetermined pitch. Next, the frame body 14 is adhesively fixed with an elastic adhesive 32 to the main scale holding part +J 30 which is suction-fixed to the positioning jig. Further, the target positioning jig is removed and, instead, the main scale 10 is adhesively fixed to the main scale holding portion U30 using an elastic adhesive 34. Thereby, the main scale holding member 30 can be easily adhesively fixed to the frame 14 while maintaining the straightness of the guide surfaces 30A and 30B.

本実施例においては、枠体14とメインスケール保持部
材30の接着、及び、メインスケール保持部材30とメ
インスケール1oの接着に際して、いずれも弾性接着剤
32.34を用いているので、メインスケール10と枠
体14間の熱膨張量の差を吸収づる効果が特に高い。な
お、前記接着剤の種類はこれに限定されず、例えば、い
ずれが一方、或いは、両方とも弾性を持たない接着剤を
用いることも可能である。
In this embodiment, elastic adhesives 32 and 34 are used to bond the frame 14 and the main scale holding member 30, and to bond the main scale holding member 30 and the main scale 1o. The effect of absorbing the difference in thermal expansion between the frame body 14 and the frame body 14 is particularly high. Note that the types of adhesives are not limited to these, and for example, it is also possible to use adhesives in which one or both of the adhesives do not have elasticity.

前記実施例においては、本発明が、アルミニウム製の枠
体とガラス製のメインスケールが用いられた直線型変位
測定機に適用されていたが、本発明の適用範囲はこれに
限定されず、他の拐買からなる枠体ヤメインスケールを
用いた直線型変位測定機にも@様に適用できることは明
らかである。
In the above embodiments, the present invention was applied to a linear displacement measuring machine that used an aluminum frame and a glass main scale, but the scope of the present invention is not limited to this, and other It is clear that the method can also be applied to a linear displacement measuring machine using a frame body main scale made of

以上説明した通り、本発明によれば、枠体の曲り等にか
かわらずメインスケールを真直に保持すると共に、メイ
ンスケールと枠体の熱膨張量の差を吸収プることができ
る。従って、高い測定精度を得ることができるという優
れた効果を有する。
As described above, according to the present invention, the main scale can be held straight regardless of bending of the frame, and the difference in thermal expansion between the main scale and the frame can be absorbed. Therefore, it has an excellent effect of being able to obtain high measurement accuracy.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、従来の直線型変位測定機の一例におけるメイ
ンスケールの保持1造を示J断面図、第2図は、メイン
スケールにおける目盛形成位置と曲りの方向の関係の例
を示す正面図、第3図は、メインスケールの厚さ方向の
曲りによって発生覆る測定誤差を計樟するだめの平面図
、第4図は。 本発明に係る@線型変位測定機の実施例におけるメイン
スクール保持構造を示づ断面図、第5図は、第4図のV
−v線に沿う断面図、第6図は、前記実施例で用いられ
ているメインスケール保持部Hの形状を示づ断面図であ
る。 10・・・メインスケール、  12・・・ゴム捧、1
4・・・枠体、   24・・・インデックススケール
、30・・・メインスケール保持部材、 30A、30B・・・ガイド面、30G・・・ガイド突
起、32.34・・・弾性接着剤、 P・・・メインスケール保持部材配設間隔。 代理人   高 矢  論 (ばか1名)
Fig. 1 is a J cross-sectional view showing the holding structure of the main scale in an example of a conventional linear displacement measuring machine, and Fig. 2 is a front view showing an example of the relationship between the scale forming position and the bending direction on the main scale. , FIG. 3 is a plan view of a device for measuring measurement errors caused by bending of the main scale in the thickness direction, and FIG. A sectional view showing the main school holding structure in the embodiment of the linear displacement measuring machine according to the present invention, FIG.
FIG. 6 is a cross-sectional view taken along line -v, showing the shape of the main scale holding part H used in the embodiment. 10...main scale, 12...rubber, 1
4... Frame body, 24... Index scale, 30... Main scale holding member, 30A, 30B... Guide surface, 30G... Guide protrusion, 32.34... Elastic adhesive, P ...Main scale holding member arrangement interval. Agent Takaya Ron (1 idiot)

Claims (4)

【特許請求の範囲】[Claims] (1)相対変位を測定されるべき2つの被測定物の一方
に連結される枠体と、該枠体に保持された、該枠体と熱
膨張係数が異なる材料からなるメインスケールと、前記
被測定物の他方に連結され、メインスケールに沿って移
動されるインデックススケールとを有し、前記メインス
ケールとインデックススケールの相対移動から前記2つ
の被測定物間の相対変位を測定するようにした直線型変
位測定機において、前記メインスケールの交着する2面
に対応する2つのガイド面を有するメインスケール保持
部材が、前記ガイド面の真直性を維持した状態で、前記
枠体の長手方向に所定ピッチで接着固定されると共に、
前記メインスケールが、押圧手段により前記メインスケ
ール保持部材のガイド面に押圧された状態で、前記メイ
ンスケール保持部材に接着固定されていることを特徴と
する直線型変位測定機。
(1) a frame connected to one of two objects to be measured whose relative displacement is to be measured; a main scale held by the frame and made of a material having a coefficient of thermal expansion different from that of the frame; and an index scale connected to the other of the objects to be measured and moved along the main scale, and the relative displacement between the two objects to be measured is measured from the relative movement of the main scale and the index scale. In the linear displacement measuring device, a main scale holding member having two guide surfaces corresponding to two intersecting surfaces of the main scale extends in the longitudinal direction of the frame while maintaining the straightness of the guide surfaces. In addition to being adhesively fixed at a predetermined pitch,
A linear displacement measuring device, wherein the main scale is adhesively fixed to the main scale holding member while being pressed against a guide surface of the main scale holding member by a pressing means.
(2)前記ガイド面のメインスケール厚さ方向中央部に
、ガイド突起が形成されている特許請求の範囲第1項記
載の直線型変位測定機。
(2) The linear displacement measuring device according to claim 1, wherein a guide protrusion is formed at the center of the guide surface in the thickness direction of the main scale.
(3)前記押圧手段が弾性部材とされ、該弾性部材のメ
インスケールへの当接面積が、該メインスケールの前記
メインスケール保持部材への当接面積より小となるよう
にされている特許請求の範囲第1項記載の直線型変位測
定係。
(3) A patent claim in which the pressing means is an elastic member, and the area of contact of the elastic member with the main scale is smaller than the area of contact of the main scale with the main scale holding member. Linear displacement measurement unit as described in item 1.
(4)前記メインスケール保持部材のガイド面長さとメ
インスケール保持部伺配設間隔の比が1ニア〜1:11
とされている特許請求の範囲第1項記載の直線型変位測
定機。
(4) The ratio of the length of the guide surface of the main scale holding member to the spacing between the main scale holding parts is 1 near to 1:11.
A linear displacement measuring device according to claim 1.
JP10144783A 1983-06-07 1983-06-07 Linear displacement measuring instrument Granted JPS59226807A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP10144783A JPS59226807A (en) 1983-06-07 1983-06-07 Linear displacement measuring instrument
US06/616,181 US4569137A (en) 1983-06-07 1984-06-01 Linear scale type displacement measuring device and main scale attaching method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10144783A JPS59226807A (en) 1983-06-07 1983-06-07 Linear displacement measuring instrument

Publications (2)

Publication Number Publication Date
JPS59226807A true JPS59226807A (en) 1984-12-20
JPH0244367B2 JPH0244367B2 (en) 1990-10-03

Family

ID=14300941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10144783A Granted JPS59226807A (en) 1983-06-07 1983-06-07 Linear displacement measuring instrument

Country Status (1)

Country Link
JP (1) JPS59226807A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0353109A (en) * 1989-07-21 1991-03-07 Sony Magnescale Inc Scale device
JPH0499014U (en) * 1991-01-31 1992-08-27
JP2000161940A (en) * 1998-11-25 2000-06-16 Dr Johannes Heidenhain Gmbh Length measuring apparatus
JP2007132810A (en) * 2005-11-10 2007-05-31 Samutaku Kk Linear encoder
JP2017173058A (en) * 2016-03-22 2017-09-28 株式会社ミツトヨ Scale holding structure of linear displacement measuring apparatus

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53140056A (en) * 1977-03-22 1978-12-06 Heidenhain Gmbh Dr Johannes Length measuring apparatus installed in casing with londitudinally sliding scale
JPS5448574A (en) * 1977-08-04 1979-04-17 Heidenhain Gmbh Dr Johannes Measuring instrument
JPS56112604A (en) * 1980-02-12 1981-09-05 Mitsutoyo Mfg Co Ltd Linear-scale type measuring apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53140056A (en) * 1977-03-22 1978-12-06 Heidenhain Gmbh Dr Johannes Length measuring apparatus installed in casing with londitudinally sliding scale
JPS5448574A (en) * 1977-08-04 1979-04-17 Heidenhain Gmbh Dr Johannes Measuring instrument
JPS56112604A (en) * 1980-02-12 1981-09-05 Mitsutoyo Mfg Co Ltd Linear-scale type measuring apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0353109A (en) * 1989-07-21 1991-03-07 Sony Magnescale Inc Scale device
JPH0499014U (en) * 1991-01-31 1992-08-27
JP2000161940A (en) * 1998-11-25 2000-06-16 Dr Johannes Heidenhain Gmbh Length measuring apparatus
JP4525991B2 (en) * 1998-11-25 2010-08-18 ドクトル・ヨハネス・ハイデンハイン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング Length measuring device
JP2007132810A (en) * 2005-11-10 2007-05-31 Samutaku Kk Linear encoder
JP2017173058A (en) * 2016-03-22 2017-09-28 株式会社ミツトヨ Scale holding structure of linear displacement measuring apparatus

Also Published As

Publication number Publication date
JPH0244367B2 (en) 1990-10-03

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