JPS5922382A - Semiconductor laser device - Google Patents

Semiconductor laser device

Info

Publication number
JPS5922382A
JPS5922382A JP57131187A JP13118782A JPS5922382A JP S5922382 A JPS5922382 A JP S5922382A JP 57131187 A JP57131187 A JP 57131187A JP 13118782 A JP13118782 A JP 13118782A JP S5922382 A JPS5922382 A JP S5922382A
Authority
JP
Japan
Prior art keywords
heating element
semiconductor laser
fixed
temperature
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57131187A
Other languages
Japanese (ja)
Inventor
Yoshinori Sugiura
義則 杉浦
Junji Ichikawa
市川 潤二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP57131187A priority Critical patent/JPS5922382A/en
Publication of JPS5922382A publication Critical patent/JPS5922382A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/024Arrangements for thermal management
    • H01S5/02453Heating, e.g. the laser is heated for stabilisation against temperature fluctuations of the environment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/06804Stabilisation of laser output parameters by monitoring an external parameter, e.g. temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/0683Stabilisation of laser output parameters by monitoring the optical output parameters

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Optical Head (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To prevent the fluctuation of an oscillation wavelength in a semiconductor laser element based on an ambient temperature change by providing a heating element heating the laser element at a fixed temperature from an outer circumference. CONSTITUTION:A thermal good conductive material 10 having electric insulating property is arranged on the outside of a cylindrical body 4-4 while being fast stuck and fixed to the cylindrical body, and the heating element 11 is set up fast stuck and fixed on the outside of the thermal good conductive material 10. A self-temperature control heating element manufactured by an equipment such as a positive temperature characteristic thermistor is used as the heating element 11. A heat-insulating material 12 for reducing the inflow of heat from the circumference and the outflow of heat to the circumference is mounted so as to cover all of the heating element 11 and a substrate 4-1. When fixed voltage V0 is applied in a fixed power region in the positive temperature characteristic thermistor, currents I1 flow when an ambient temperature is T1, and power consumption reaches V0XI1. When the ambient temperature rises to T2, currents I0 decrease, power consumption reduces to V0XI0, and the heating element is operated so that the temperature of the device is kept constant automatically.

Description

【発明の詳細な説明】 本発明はレーザな発生するレーザ発生装置に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a laser generator that generates laser light.

従来より、光通信等の分野で、半導体レーザ素子を光源
として用いることは広(行なわれている。
Conventionally, semiconductor laser elements have been widely used as light sources in fields such as optical communications.

かかる場合において、半導体レーザの光出力を一定パワ
ーに保つ、所謂Auto Power 0ontrol
(以下APOと呼ぶ)を採用する事が多い。
In such a case, so-called Auto Power Control is used to maintain the optical output of the semiconductor laser at a constant power.
(hereinafter referred to as APO) is often adopted.

第1図はこの方法を説明したもので、半導体レーザ素子
lより出射した半導体レーザの光出力は光検出器2で受
けられ、アンプ3で増幅された後レーザドライブ回路4
ヘフイード・バックされ、常に光検出器2の出力が一定
に゛なる様に制御さ、れる。かかる方法は環境温度変化
、素子の劣化等−忙対して、半導体レーザ素子の光出力
が変化する事を補正する方法として広く用いられている
FIG. 1 explains this method, in which the optical output of the semiconductor laser emitted from the semiconductor laser element 1 is received by a photodetector 2, amplified by an amplifier 3, and then a laser drive circuit 4.
The output of the photodetector 2 is controlled so that the output is always constant. This method is widely used as a method for correcting changes in the optical output of a semiconductor laser device due to environmental temperature changes, device deterioration, etc.

しかしながら、半導体レーザ素子を画像記録等に用いる
場合は、装置圧使われる感光体の感度の波長依存性が大
きな問題となる。通常のHe−Neレーザのような短い
波長のレーザを用いた装置では、レーザ波長近傍におけ
る感光体の分光感度はフラットのものが多く、従来のA
PO方式を採用することも可能である。
However, when a semiconductor laser element is used for image recording or the like, the wavelength dependence of the sensitivity of the photoreceptor used in the device poses a major problem. In devices using a short wavelength laser such as a normal He-Ne laser, the spectral sensitivity of the photoreceptor near the laser wavelength is often flat, and the conventional A
It is also possible to adopt the PO method.

一方半導体レーザは波長が8000λ前後比eNeレー
ザに比べると近赤外領域にある為、通常使われる感光体
では感度が低い。この為半導体レーデをこのような画像
記録装置に用いる場合は感光体を増感して使5事が多い
。しかし増感しても画質の安定性、感光体の耐久等から
、半導体レーザ波長域でも分光感度をフラットする事が
出来ず、第2図aの様に波長九対して依存性を有す。
On the other hand, a semiconductor laser has a wavelength of around 8000λ, which is in the near-infrared region compared to an eNe laser, so the sensitivity of a commonly used photoreceptor is low. For this reason, when a semiconductor radar is used in such an image recording apparatus, the photoreceptor is often sensitized. However, even with sensitization, it is not possible to flatten the spectral sensitivity even in the semiconductor laser wavelength range due to image quality stability, photoreceptor durability, etc., and the spectral sensitivity is dependent on wavelength 9 as shown in Figure 2a.

それ故、使用する半導体レーザ素子の波長により光量を
コントロールする必要があり、半導体レーデな動作中波
長変動が生ずると従来のAPO方式では良い画像は得ら
れない。
Therefore, it is necessary to control the amount of light depending on the wavelength of the semiconductor laser element used, and if wavelength fluctuations occur during operation of the semiconductor laser, good images cannot be obtained with the conventional APO method.

一例を述べると、半導体レーザは2.5〜3.0^の波
長の温度係数があり、30℃の温度変化があるとM a
 x、90λの波長変化が生ずる。この為感光体の感度
の波長依存性が高ければ高い程、得られる画像は悪くな
る。
To give an example, a semiconductor laser has a wavelength temperature coefficient of 2.5 to 3.0^, and if there is a temperature change of 30°C, M a
x, a wavelength change of 90λ occurs. Therefore, the higher the wavelength dependence of the sensitivity of the photoreceptor, the worse the obtained image becomes.

本発明は半導体レーザ素子の環境温度変化に基づくレー
ザ発振波長の移動を防止するために、半導体レーザ素子
を一定温度に加熱する発熱要素として、一定の電圧を印
加することによって自分自身で温度制御を行う自己温度
制御発熱素子を用いることKより、上述の如き従来の欠
点を取り除いたものである。
In order to prevent the laser oscillation wavelength from shifting due to changes in the ambient temperature of the semiconductor laser element, the present invention uses a heating element that heats the semiconductor laser element to a constant temperature to control the temperature itself by applying a constant voltage. By using a self-temperature-controlled heating element, the above-mentioned drawbacks of the conventional method are eliminated.

以下実施例に基づいて、本発明の説明を行なう。The present invention will be explained below based on Examples.

第3図は本発明の一実施例を示すもので、半導体レーザ
装置9から発せられたレーザは、コリメータレンズ5に
よりコリメートされ、回転多面鏡6によって反射され、
結像レンズ7により結像されて、感光ドラム8上を走査
する。このとき半導体レー°ア装置内の半導体レーザ素
子に電流変調を与えること九より、感光ドラム8上には
、画像・ぐターンが形成される。
FIG. 3 shows an embodiment of the present invention, in which a laser beam emitted from a semiconductor laser device 9 is collimated by a collimator lens 5, reflected by a rotating polygon mirror 6,
The image is formed by the imaging lens 7 and scanned on the photosensitive drum 8. At this time, an image is formed on the photosensitive drum 8 by applying current modulation to the semiconductor laser element in the semiconductor laser device.

第4図は本発明による半導体レーザ装置の断面図を示す
ものである。4−1は円盤状の金属基板であり、この金
属基板4−1上には銅等の良熱導体の金属ブロック4−
2が固定されており、この金属ブロックの端部に半導体
レーツ″素子4−3が固定されている。かかる金属ブロ
ック4−2及び半導体レーザ素子は底板4−5及び円筒
状の筒体4−4から成る封止容器で囲み、かつ、この封
止容器と前記基板4−1とを密着固定することにより、
半導体レーザ素子4−3と外部環境とを遮断している。
FIG. 4 shows a cross-sectional view of a semiconductor laser device according to the present invention. 4-1 is a disk-shaped metal board, and on this metal board 4-1 is a metal block 4- made of a good heat conductor such as copper.
2 is fixed, and a semiconductor laser device 4-3 is fixed to the end of this metal block.The metal block 4-2 and the semiconductor laser device are connected to a bottom plate 4-5 and a cylindrical body 4- 4, and by closely fixing the sealed container and the substrate 4-1,
The semiconductor laser element 4-3 is isolated from the external environment.

なお前記底板4−5の一部にはガラス等の透光性部材よ
り成る窓4−6を底板4−5&C気密状態で固定して設
け、前記半導体レーデ素子4−3より出射したレーザを
容器外に導出するものである。
A window 4-6 made of a translucent material such as glass is provided in a part of the bottom plate 4-5 and fixed in an airtight manner to the bottom plate 4-5 and C, so that the laser emitted from the semiconductor radar element 4-3 can be passed through the container. It is something that is derived outside.

前期筒状体4−4の外側には、該筒状体と密着固定して
、電気絶縁性のある熱良導材10が配置されていて、前
記熱良導材10の外側に密着固定して発熱要素11を・
設ける。発熱要素11は例えば正温度特性サーミスタで
出来た自己温度制御発熱素子である。12は周囲からの
熱の流入及び周囲への熱の流出を少なくするための断熱
材であり、前記発熱要素11及び前−り基層4−1を全
て覆う如く設けて成るものである。13は発熱要素に−
定の電圧を印加するための電源である。正温度特性ザー
ミスタは定電力領域においては、一定の電圧Voを印加
すると周囲温度T1であるとき■1の電流が流れ、消費
電力は■X I、となる。周囲温度T。
A thermally conductive material 10 having electrical insulation properties is disposed on the outside of the cylindrical body 4-4 in close contact with the cylindrical body. and heat generating element 11.
establish. The heating element 11 is a self-temperature-controlled heating element made of, for example, a positive temperature coefficient thermistor. Reference numeral 12 denotes a heat insulating material for reducing the inflow of heat from the surroundings and the outflow of heat to the surroundings, and is provided so as to completely cover the heat generating element 11 and the front base layer 4-1. 13 is the heat generating element -
This is a power supply for applying a constant voltage. In a positive temperature characteristic thermistor, in a constant power region, when a constant voltage Vo is applied, a current of ■1 flows when the ambient temperature is T1, and the power consumption becomes ■XI. Ambient temperature T.

と高くなると、電流ムは減少して、消費電力は先×ちと
減少し、自動的に一定温度になるような動作する。
When the temperature increases, the current decreases, power consumption decreases, and the temperature automatically becomes constant.

以上の如(構成するならば周囲温度が30℃変化した場
合でも半導体レーザ素子の周囲は5°C程度の変化にす
ることが可能となる。それによって第2図で示すような
分光感度特性を有するドラムに於いても従来はイロ間の
波長移動が生じたものがイス間の波長移動となって分光
感度の変化量がわずかとなる。
If configured as described above, even if the ambient temperature changes by 30°C, the area around the semiconductor laser element can change by about 5°C.Thereby, the spectral sensitivity characteristics shown in Figure 2 can be changed. Conventionally, even in the case of the drum, wavelength shift between colors occurs, but wavelength shift occurs between chairs, and the amount of change in spectral sensitivity becomes small.

このよ5に本発明は半導体レーザ素子の温度変化による
波長移動を防止するために、環境温度に無関係に常に高
品質なレーザな出射するζb4可能とした。なお上記実
施例において断熱材12は必ずしも必要とせず必要に応
じて省いて使用することも可能である。
In this manner, the present invention makes it possible to always emit high-quality laser beams ζb4 regardless of the environmental temperature in order to prevent wavelength shift due to temperature changes in the semiconductor laser element. In the above embodiment, the heat insulating material 12 is not necessarily required and can be omitted if necessary.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の半導体レーザ素子の光量制御回路図、第
2図は感光体の波長依存特性図、第3図は画像記録装置
の斜視図、第4図は半導体レーザ装置の断面図である。 ここで4−1は基板、4−3は半導体レーザ素子、4−
4は筒状体、4−5は底板、4−6は窓、11は発熱要
素である。 第1図 第2図 第3図 2654図
Fig. 1 is a light amount control circuit diagram of a conventional semiconductor laser device, Fig. 2 is a wavelength dependence characteristic diagram of a photoreceptor, Fig. 3 is a perspective view of an image recording device, and Fig. 4 is a cross-sectional view of the semiconductor laser device. . Here, 4-1 is a substrate, 4-3 is a semiconductor laser element, and 4-
4 is a cylindrical body, 4-5 is a bottom plate, 4-6 is a window, and 11 is a heat generating element. Figure 1 Figure 2 Figure 3 Figure 2654

Claims (1)

【特許請求の範囲】 1 半導体レーザ素子を保護するケースを設けて該ケー
スの外周に発熱要素を固定し、該発熱要素により前記半
導体レーザ素子を加熱することを特徴とする半導体レー
ザ装置。 2、特許請求の範囲第1項において前記発熱要素を自己
温度制御発熱素子で構成したことを特徴とする半導体レ
ーザ装置。 3 特許請求の範囲¥iSI項において前記発熱要素を
断熱部材で包んだことを特徴とする半導体レーザ装置。
[Scope of Claims] 1. A semiconductor laser device characterized in that a case for protecting a semiconductor laser element is provided, a heat generating element is fixed to the outer periphery of the case, and the semiconductor laser element is heated by the heat generating element. 2. A semiconductor laser device according to claim 1, wherein the heating element is a self-temperature-controlled heating element. 3. A semiconductor laser device according to claim ¥iSI, characterized in that the heat generating element is wrapped in a heat insulating member.
JP57131187A 1982-07-29 1982-07-29 Semiconductor laser device Pending JPS5922382A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57131187A JPS5922382A (en) 1982-07-29 1982-07-29 Semiconductor laser device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57131187A JPS5922382A (en) 1982-07-29 1982-07-29 Semiconductor laser device

Publications (1)

Publication Number Publication Date
JPS5922382A true JPS5922382A (en) 1984-02-04

Family

ID=15052046

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57131187A Pending JPS5922382A (en) 1982-07-29 1982-07-29 Semiconductor laser device

Country Status (1)

Country Link
JP (1) JPS5922382A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994010728A1 (en) * 1992-10-24 1994-05-11 Ok Kyung Cho Modified semiconductor laser diode with integrated temperature control
EP2073325A1 (en) * 2007-12-18 2009-06-24 HILTI Aktiengesellschaft Optoelectric assembly with frequency-doubled solid state laser

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5368588A (en) * 1976-12-01 1978-06-19 Hitachi Ltd Semiconductor laser device
JPS5453336A (en) * 1977-10-06 1979-04-26 Jiyunichi Narita Surface heating element
JPS55144679A (en) * 1979-04-28 1980-11-11 Murata Manufacturing Co Heating unit
JPS5551858B2 (en) * 1977-04-30 1980-12-26
JPS56157134A (en) * 1980-05-09 1981-12-04 Hitachi Ltd One-body type microwave transmitter and receiver

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5368588A (en) * 1976-12-01 1978-06-19 Hitachi Ltd Semiconductor laser device
JPS5551858B2 (en) * 1977-04-30 1980-12-26
JPS5453336A (en) * 1977-10-06 1979-04-26 Jiyunichi Narita Surface heating element
JPS55144679A (en) * 1979-04-28 1980-11-11 Murata Manufacturing Co Heating unit
JPS56157134A (en) * 1980-05-09 1981-12-04 Hitachi Ltd One-body type microwave transmitter and receiver

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994010728A1 (en) * 1992-10-24 1994-05-11 Ok Kyung Cho Modified semiconductor laser diode with integrated temperature control
US5680410A (en) * 1992-10-24 1997-10-21 Kim; Yoon-Ok Modified semiconductor laser diode having an integrated temperature control element
EP2073325A1 (en) * 2007-12-18 2009-06-24 HILTI Aktiengesellschaft Optoelectric assembly with frequency-doubled solid state laser

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