JPS59193331A - Mounting jig for vibration test - Google Patents

Mounting jig for vibration test

Info

Publication number
JPS59193331A
JPS59193331A JP58068203A JP6820383A JPS59193331A JP S59193331 A JPS59193331 A JP S59193331A JP 58068203 A JP58068203 A JP 58068203A JP 6820383 A JP6820383 A JP 6820383A JP S59193331 A JPS59193331 A JP S59193331A
Authority
JP
Japan
Prior art keywords
jig
specimen
test piece
vibration
sealing member
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58068203A
Other languages
Japanese (ja)
Inventor
Shinji Fukuda
真二 福田
Jiro Okamoto
岡本 二朗
Zenji Sakai
酒井 善治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KOKUSAI KIKAI SHINDO KENKYUSHO KK
IMV Corp
Original Assignee
KOKUSAI KIKAI SHINDO KENKYUSHO KK
IMV Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KOKUSAI KIKAI SHINDO KENKYUSHO KK, IMV Corp filed Critical KOKUSAI KIKAI SHINDO KENKYUSHO KK
Priority to JP58068203A priority Critical patent/JPS59193331A/en
Publication of JPS59193331A publication Critical patent/JPS59193331A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M7/00Vibration-testing of structures; Shock-testing of structures
    • G01M7/02Vibration-testing by means of a shake table
    • G01M7/027Specimen mounting arrangements, e.g. table head adapters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To enable positive transmission by a simple construction vibration of a vibrating bench to a test piece, by forming a vacuum chamber between the test piece and a jig proper and by suction-fastening the test piece to the jig proper. CONSTITUTION:A mounting jig 11 consists of a jig proper 14 and an elastic sealing member 15 formed with a rubber sheat, etc., and on the top surface of jig proper 14 is provided with dents 16..., and a through-hole 17 is bored in the sealing member 15 in an opposed manner. A vacuum chamber 18 is constituted by the dent 16 and a small hole 17a and it is connected to a pressure reducing apparatus, such as a vacuum pump, etc. through a pressure reducing passage 19. A test piece 13 is fixed in a mounting hole 17b of sealing member 15 and when pressure is reduced by a reducing unit, then the test piece 13 is suction-fixed onto the jig proper 14. In case when a mass of test piece 13 is relatively small, vibration is transmitted positively to the test piece 13 without absorption of vibration of the vibration bench 6 by the sealing member 15.

Description

【発明の詳細な説明】 本発明は振動発生機に、電子部品等の質量の小さい供試
体を取付けるだめの取付治具に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a mounting jig for mounting a small-mass specimen such as an electronic component to a vibration generator.

従来、振動発生機にて振動試験をする場合、供試体はボ
ルト等の締付具を介して振動台に固定されている。従っ
てその取付作業及び取外作業にはいちいち締付具の締緩
操作を要し、時間が掛かると共に煩雑であシ、自動化が
困難であった。
Conventionally, when performing a vibration test using a vibration generator, a specimen is fixed to a vibration table via fasteners such as bolts. Therefore, the installation and removal operations require tightening and loosening of the fasteners each time, which is time consuming and complicated, and is difficult to automate.

本発明はとのような点を解決し、振動台への供試体の取
付作業及び取外作業を容易迅速に行なうことが出来ると
共に、確実に振動台の振動を供試体に伝達出来る取付治
具に関する。そこで、本発明の特徴とする処は、供試体
と該供試体が取付けられる治具本体との間に負王室を形
成し、該供試体を治具本体に吸着固定することによって
振動体の振動を該供試体に伝達するようにした点にある
The present invention solves the problems mentioned above, and provides a mounting jig that can easily and quickly attach and detach a specimen to a vibration table, and can reliably transmit the vibrations of the vibration table to the specimen. Regarding. Therefore, the present invention is characterized by forming a negative ring between the specimen and the jig body to which the specimen is attached, and by adsorbing and fixing the specimen to the jig body, the vibration of the vibrating body is reduced. is transmitted to the specimen.

以下、図示の実施例に基づき本発明を詳説する二鎖1図
に於て振動発振機の全体を例示し、(1)は空気バネ等
の防振部材(図示省略)を介して床面上に載置される基
台である。該基台(])は一対の支持腕(2) (2)
を一体として有し、との支持腕(2) (2)に両端が
揺動自在に枢支されたトラニオン軸(3)によって、励
磁コイル(4)・・・が巻設された外容器体(5)が傾
動可能に枢支される。
In the following, the entire vibration oscillator is illustrated in Figure 1, which explains the present invention in detail based on the illustrated embodiment, and (1) is connected to the floor surface via a vibration isolating member (not shown) such as an air spring. This is the base that is placed on the. The base (]) has a pair of support arms (2) (2)
an outer container body, in which an excitation coil (4) is wound around a trunnion shaft (3) whose both ends are swingably supported by a supporting arm (2) (2). (5) is pivotably supported.

(6)はこの外容器体(5)の内部に取付けられた振動
台であって、軸心(7)方向に往復動可能なように該振
動台(6)の大半乃至全体が内布状ときれる。具体的に
は、振動台(6)は上方の支持装置(8)、下方の支持
装置(9)及び下端の支持装置(10によって上下方向
に往復振動するように支持されている。
(6) is a vibration table installed inside the outer container body (5), and most or all of the vibration table (6) has an inner cloth shape so that it can reciprocate in the direction of the axis (7). I can hear it. Specifically, the vibration table (6) is supported by an upper support device (8), a lower support device (9), and a lower end support device (10) so as to reciprocate in the vertical direction.

しかして、(11)は取付治具であって、第2図に示す
如く振動台(6)の上面にボルト等の締伺具αつ・・・
にて固着され、供試体04・・・、例えば図示のIC等
の電子部品が取付けられる。
(11) is a mounting jig, and as shown in FIG.
The specimen 04..., for example, electronic components such as the illustrated IC are attached thereto.

具体的には、取付治具Oυは治具本体(14)とシート
状のゴム等からなる弾性シール部材卵とから構成され、
該治具本体04)の上面所定部位には複数の凹所06)
・・・が凹設されると共に、該凹所0・・・・に対応す
るようにシール部材051.には貫通孔α力が開設され
る。
Specifically, the mounting jig Oυ is composed of a jig main body (14) and an elastic sealing member made of sheet-like rubber or the like,
A plurality of recesses 06) are provided at predetermined portions on the upper surface of the jig body 04).
... are recessed, and seal members 051. A through hole α force is opened.

この貫通孔0′7)は、シール部材Q51の下半部位で
は前記凹所0Oとほぼ同径の小孔部(17a)とされ、
且つシール部材(+51の上半部位では前記供試体03
を収納載置状として嵌込む載置孔部(17b)が前記小
孔部(]、7 a )に連通状として開設され、該載置
孔部(17b)は前記供試休園よりも僅かに大きく設定
される。
This through hole 0'7) is a small hole portion (17a) having approximately the same diameter as the recess 0O in the lower half portion of the sealing member Q51,
In addition, the sealing member (in the upper half part of +51, the above-mentioned specimen 03
A mounting hole portion (17b) into which the sample is inserted as a storage mounting shape is opened as a communication shape with the small hole portion (], 7a), and the mounting hole portion (17b) is slightly smaller than the sample closed area. It is set large.

そして、治具本体0.4)上面にこのシール部材0.5
1が載設されて、上記凹所00と前記小孔部(17a)
とで負圧室[181が形成され、複数の負圧室08)・
・・は治具本体0滲内に網目状に張シ巡らさ第1た減圧
用連絡路q(2)を介して真空ポンプ0])又はブロア
等の減圧装置に連絡される。
Then, this sealing member 0.5 on the top surface of the jig body 0.4)
1 is placed on the recess 00 and the small hole (17a).
A negative pressure chamber [181 is formed with a plurality of negative pressure chambers 08) and
... is connected to a vacuum pump 0) or a pressure reducing device such as a blower through a first pressure reducing communication path q(2) which is stretched in a mesh pattern within the jig body 0.

そして、図例の如く直方体型のモ・−ルド部(イ)とそ
の左右側面から突設された複数対のリード線部(2])
・・・とから成る電子部品(供試体<13+ )を、リ
ード線部Cυ・・・を上方に向けた状態で7一ル部材G
51の載置孔部(j7b)に収納載置状として単利け、
減圧装置にて減圧すれば、供試体(14と治具本体Q4
)との間に形成された負圧室08)が負圧状態となり、
モールド部(イ)を載置孔部(17b)の下面に吸着状
態として、供試体u3が治具本体14)に吸着固定され
る。その結果、振動台(6)の振動が該供試体品に確実
に伝達されることとなる。なお、実施例の如く供試体0
3の質量が比較的小をい場合、7一ル部材09を介して
供試体q4が取付けられても、シール部材Q51が振動
台(6)の振動を吸収することなく確実に供試体G島へ
と振動が伝達される。
As shown in the figure, there is a rectangular parallelepiped mold part (A) and multiple pairs of lead wire parts (2) protruding from the left and right sides of the mold part (A).
An electronic component (specimen <13+) consisting of
It is stored in the mounting hole (j7b) of 51 as a simple profit,
If the pressure is reduced with the decompression device, the specimen (14 and the jig body Q4)
) is in a negative pressure state,
The mold part (a) is suctioned to the lower surface of the mounting hole part (17b), and the specimen u3 is suctioned and fixed to the jig main body 14). As a result, the vibration of the vibration table (6) is reliably transmitted to the specimen. In addition, as in the example, the specimen 0
3 has a relatively small mass, even if the specimen q4 is attached via the 7-ru member 09, the sealing member Q51 will not absorb the vibration of the vibration table (6) and will securely attach the specimen q4 to the specimen G island. Vibration is transmitted to.

第3図と第4図に示すものは他の実施例であって、図例
の如く平面矩形状の凹所(イ)を凹設した治具本体04
)と、該治具本体04)の周縁部(イ)上面に対応して
取付けられる矩形環状のシール部材Q51とから取付治
具0υが構成される。
What is shown in FIGS. 3 and 4 is another embodiment, in which a jig body 04 is provided with a rectangular recess (A) as shown in the figure.
) and a rectangular annular seal member Q51 attached to the peripheral edge (a) of the jig main body 04) in correspondence with the upper surface thereof.

治具本体04)はその周縁部(イ)を図例の如く所定間
隔をもって凹設し、複数の孔部(財)・−・を形成して
該孔部■・・・を連絡路u印に連結する。
The jig main body 04) has its peripheral edge (A) recessed at predetermined intervals as shown in the figure, forming a plurality of holes, and forming the holes ■... with a connecting path U mark. Connect to.

また、シール部材α9は前記孔部(ハ)・・・に対応し
て貫通孔(17+・・・を開設し、該貫通孔αη・・・
によって形成きれる空所な負圧室α8)と成す。
Further, the sealing member α9 has through holes (17+) corresponding to the holes (c), and the through holes αη...
A negative pressure chamber α8) is formed by the following steps.

しかして、プリント基板(ハ)に多数の電子部品(IC
)が配設された供試、体a子は、該供試体α3の周縁部
が貫通孔α力・・・を閉塞するようにシール部材0i5
)に載置状として取伺けられ、図外の真空ポンプ又はブ
ロア等の減圧装置によって前記負圧室α訃・・が負圧さ
れて供試体α4が治具本体0aに吸着固定される。
However, there are many electronic components (IC) on the printed circuit board (c).
) is arranged with a sealing member 0i5 so that the peripheral edge of the specimen α3 closes the through hole α...
), the negative pressure chamber α is brought under negative pressure by a pressure reducing device such as a vacuum pump or a blower (not shown), and the specimen α4 is fixed to the jig main body 0a by suction.

第5図に示すものは別の実施例であって、治具本体aa
は図例の如く複数段の段付凹所(イ)を凹設し、最上段
部(26a)には、プリント基板(ハ)に多数の電子部
品(IQが配設てれた供試体04が、該供試体α急の周
縁部を載置状として取付けられる。
What is shown in FIG. 5 is another embodiment, in which the jig body aa
As shown in the figure, a plurality of stepped recesses (A) are provided, and the uppermost part (26a) contains the specimen 04 in which a large number of electronic components (IQ) are arranged on a printed circuit board (C). However, the specimen α is mounted with its sharp peripheral edge placed on it.

また、中段部(26b)には、多数の貫通孔(イ)、・
・・を開設したすのこ状の弾性体(ハ)が嵌込状として
載置され、供試体Q3裏面に弾性体翰の上面を当接状と
して配置される。この弾性体(ハ)は例えば第7図のよ
うに角柱状の空所を有する貫通孔(イ)・・・とじ又も
良く、また、第8図のように蜂巣状の貫通孔曽・・・や
、さらには第9図のように円柱状の貫通孔(5)・・・
とするも好ましい。いずれにしても各貫通孔(5)・・
・は独立状に形成される。
In addition, the middle part (26b) has a large number of through holes (a),
A slatted elastic body (c) with openings is placed as a fitting, and is placed on the back surface of the specimen Q3 with the upper surface of the elastic body hanging in contact. This elastic body (c) has, for example, a through hole (b) with a prismatic void as shown in Fig. 7, which has good binding, and a honeycomb-shaped through hole (b) as shown in Fig. 8.・Or even a cylindrical through hole (5) as shown in Figure 9...
It is also preferable to do so. In any case, each through hole (5)...
・ are formed independently.

しかして、最下段部(26C) H1連絡路q9を介し
て図外の減圧装置に連結され、供試体a3裏面にて上面
を閉塞された弾性体(社)の貫通孔翰・・・と、最下段
部(26G)にて形成てれた空所とで負圧室(18)を
構成し、振動体(6)の振動を供試体0.3に伝達すべ
く上記減圧装置の負圧操作により供試体(13)を治具
本体04)に吸着固定する。
Therefore, the lowermost part (26C) is connected to a decompression device (not shown) via the H1 connection path q9, and the through-hole of the elastic body is closed on the back surface of the specimen a3. A negative pressure chamber (18) is configured with the cavity formed at the lowest stage (26G), and the negative pressure operation of the pressure reducing device is performed to transmit the vibration of the vibrating body (6) to the specimen 0.3. The specimen (13) is suctioned and fixed to the jig main body 04).

この際、供試体(13]の種類によっては、第6図に示
すように供試体03を構成する電子部品(IC)のリー
ド線部(2])の先端が、貫通孔(ハ)を形成する仕切
壁−に当たって、該仕切壁(イ)上端を下方に押圧彎曲
する場合がある。その結果、この抑圧彎曲部(ト)では
閉塞状態が確保されず、この区域での吸着機能が阻害さ
れることとなるが、隣接する他の仕切壁翰が供試体03
裏面に当接されているから、第7図のように閉塞状態に
ない区域(×印)があっても閉塞区域(○印)Kで吸着
機能が確保され、全体として供試体03が治具本体α滲
に吸着固定てれることと々る。
At this time, depending on the type of specimen (13), the tip of the lead wire portion (2]) of the electronic component (IC) constituting specimen 03 may form a through hole (C) as shown in Figure 6. In some cases, the upper end of the partition wall (a) is pressed downward and curved when it hits the partition wall.As a result, a closed state is not maintained in this suppressing curved part (g), and the suction function in this area is inhibited. However, the other adjacent partition wall is specimen 03.
Since it is in contact with the back surface, even if there is an area (x mark) that is not in a closed state as shown in Fig. 7, the suction function is ensured in the closed area (○ mark) K, and the specimen 03 as a whole is fixed to the jig. There are many things that can be fixed to the main body by adsorption.

なお、本発明は図示の実施例に限定されず、その要旨を
変更しない範囲で設計変更自由なことは勿論であって、
例えば、シール部材Q51の代替としてグリス状の粘性
密封剤を負圧室α8)を構成する治具本体α冶上面に塗
布して、載置状として取付けられる供試体α3裏面にて
孔部(ハ)・・・を閉塞して吸着固定機能を確保するも
好ましい。また、供試体α4の種類も図例に限らず他の
あらゆるものが使用可能であり、さらには、治具本体(
14・負圧室α8)・弾性体(ハ)等の形状構造も同二
機能を有する限り変更可能である。
It should be noted that the present invention is not limited to the embodiments shown in the drawings, and the design may be changed without changing the gist of the invention.
For example, as a substitute for the sealing member Q51, a grease-like viscous sealant may be applied to the upper surface of the jig main body α constituting the negative pressure chamber α8), and then the hole (hole) )... It is also preferable to secure the adsorption and fixing function by closing the... In addition, the type of specimen α4 is not limited to the example shown in the figure, and any other type can be used.Furthermore, the jig body (
14. The shape and structure of the negative pressure chamber α8), the elastic body (c), etc. can also be changed as long as they have the same dual functions.

このように本発明の図示の実施例の効果によれば、シー
ル部材Q51を介して治具本体(14)に供試体α3を
取付けるから、間隙なく密着出来、吸着固定機能が優れ
たものとなると共に、質量の比較的小きい供試体a4の
耐振試験が容易迅速となる。また、第5図の弾性体−に
よって、供試体αふの裏面に突起がある場合でも確実に
治具本体u4Jに吸着固定出来る。
According to the illustrated embodiment of the present invention, the specimen α3 is attached to the jig main body (14) through the sealing member Q51, so that it can be closely attached without any gaps and has an excellent suction and fixing function. At the same time, the vibration resistance test of the specimen a4, which has a relatively small mass, becomes easy and quick. Moreover, the elastic body shown in FIG. 5 allows the sample α to be reliably fixed to the jig main body u4J by suction even if there is a protrusion on the back surface.

本発明は以上詳述した構成にて所期の目的を有効達成し
た。特に、供試体α4と治具本体aaとの間に負圧室C
181を形成して該供試体αaを治具本体α4)K吸着
固定するようにしたから、簡単な構造でありながら、安
定して治具本体04)に供試体(13を固定出来、振動
台(6)の振動を確実に供試体α3へと伝達することが
可能となる。壕だ、供試体03の取付作業は負圧室α8
)を負圧操作することで簡単に治具本体σ滲へ取付可能
となると共に、取外作業に於ては負圧を解除すれば足シ
、その着脱操作を短時間に容易迅速に行なうことが出来
る。さらには、大量の供試体(13を振動試験する場合
でも、治具本体(]4)へのセツティング時間が短縮さ
れて流れ作業のように自動化が図れるから、全数検査も
容易となる。
The present invention has effectively achieved its intended purpose with the configuration detailed above. In particular, a negative pressure chamber C between the specimen α4 and the jig main body aa
181 and fixed the specimen αa by suction to the jig body α4), it is possible to stably fix the specimen (13) to the jig body α4) with a simple structure. It becomes possible to reliably transmit the vibration of (6) to the specimen α3.
) can be easily attached to the jig main body by applying negative pressure, and when removing the jig, releasing the negative pressure allows the attachment and detachment to be performed quickly and easily. I can do it. Furthermore, even when carrying out a vibration test on a large number of specimens (13), the time required to set them on the jig body (4) can be shortened and automation can be achieved like assembly-line work, making 100% inspection easier.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す一部断面正面図、第2
図は断面正面図、第3図は他の実施例の断面正面図、第
4図は同平面図、第5図は別の実施例の断面正面図、第
6図は取付状態を説明する要部拡大断面正面図、第7図
と第8図と第9図は夫々弾性体の形状を説明する拡大平
面図である。 (6)・・・振動台、α急・・・供試体、(1■・・・
治具本体、α8・・・負圧室。 特 許 出 願 人   株式会社 国際機械振動研究
所1
FIG. 1 is a partially sectional front view showing one embodiment of the present invention, and FIG.
The figure is a sectional front view, FIG. 3 is a sectional front view of another embodiment, FIG. 4 is a plan view of the same, FIG. 5 is a sectional front view of another embodiment, and FIG. FIG. 7, FIG. 8, and FIG. 9 are enlarged plan views illustrating the shape of the elastic body, respectively. (6)... Shaking table, α-quick... specimen, (1■...
Jig body, α8...Negative pressure chamber. Patent applicant International Mechanical Vibration Research Institute 1

Claims (1)

【特許請求の範囲】[Claims] / 供試体α4と該供試体α島が取付けられる治具本体
(14)との間に負圧室08)を形成し、該供試体α3
を治具本体0aに吸着固定することによって振動台(6
)の振動を該供試体α3に伝達するようにしたことを特
徴とする振動試験用取付治具。
/ A negative pressure chamber 08) is formed between the specimen α4 and the jig main body (14) to which the specimen α island is attached, and the specimen α3
The vibration table (6
) is transmitted to the specimen α3.
JP58068203A 1983-04-18 1983-04-18 Mounting jig for vibration test Pending JPS59193331A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58068203A JPS59193331A (en) 1983-04-18 1983-04-18 Mounting jig for vibration test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58068203A JPS59193331A (en) 1983-04-18 1983-04-18 Mounting jig for vibration test

Publications (1)

Publication Number Publication Date
JPS59193331A true JPS59193331A (en) 1984-11-01

Family

ID=13366997

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58068203A Pending JPS59193331A (en) 1983-04-18 1983-04-18 Mounting jig for vibration test

Country Status (1)

Country Link
JP (1) JPS59193331A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6214034A (en) * 1985-07-11 1987-01-22 Shinken:Kk Multidirectional vibration tester
EP0425127A2 (en) * 1989-10-27 1991-05-02 Hughes Aircraft Company Improved vibration testing system
KR100671733B1 (en) 2005-11-16 2007-01-19 경신공업 주식회사 Jig for shaking test of fuse with relay box
CN103234721A (en) * 2013-04-16 2013-08-07 沈阳兴华航空电器有限责任公司 Universal adjustable mounting platform for vibration tests
CN103698097A (en) * 2013-12-02 2014-04-02 北京无线电测量研究所 Laminated high-frequency vibration test clamp

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6214034A (en) * 1985-07-11 1987-01-22 Shinken:Kk Multidirectional vibration tester
EP0425127A2 (en) * 1989-10-27 1991-05-02 Hughes Aircraft Company Improved vibration testing system
JPH03154839A (en) * 1989-10-27 1991-07-02 Hughes Aircraft Co Improved vibration test system
KR100671733B1 (en) 2005-11-16 2007-01-19 경신공업 주식회사 Jig for shaking test of fuse with relay box
CN103234721A (en) * 2013-04-16 2013-08-07 沈阳兴华航空电器有限责任公司 Universal adjustable mounting platform for vibration tests
CN103698097A (en) * 2013-12-02 2014-04-02 北京无线电测量研究所 Laminated high-frequency vibration test clamp

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