JPS59185045A - Optical pickup device - Google Patents

Optical pickup device

Info

Publication number
JPS59185045A
JPS59185045A JP58058493A JP5849383A JPS59185045A JP S59185045 A JPS59185045 A JP S59185045A JP 58058493 A JP58058493 A JP 58058493A JP 5849383 A JP5849383 A JP 5849383A JP S59185045 A JPS59185045 A JP S59185045A
Authority
JP
Japan
Prior art keywords
prism
reflected
critical angle
face
incident
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58058493A
Other languages
Japanese (ja)
Inventor
Ikuo Minamino
郁夫 南野
Yasuaki Morimoto
寧章 森本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP58058493A priority Critical patent/JPS59185045A/en
Publication of JPS59185045A publication Critical patent/JPS59185045A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/08Disposition or mounting of heads or light sources relatively to record carriers

Landscapes

  • Optical Head (AREA)

Abstract

PURPOSE:To prevent a reflected light from being returned to a semiconductor laser by making a ray reflected on a recording face incident to a reflected face of a prism in an angle approximate to a critical angle or larger and further making a ray from a light source incident to the reflecting face of the prism at the critical angle or below. CONSTITUTION:The ray from the semiconductor laser 10 is made incident to the reflecting face 12 of the prism 11 at an angle causing less reflection. The ray transmitted through the prism 11 and an objective lens 13 and reflected on the recording face 14 passes again through the objective lens 13 and is made incident to the prism 11. This ray is set so as to be made incident to the reflecting face 12 in the vicinity of the critical angle. The light reflected from the replecting face 12 of the prism 11 is made incident to a photodetector 15. The emitted light from a semiconductor laser 10 is made incident to the reflecting face 12 of the prism 11 at a critical angle or little smaller, and the reflected light from the recording face 14 is prevented from being returned to the semiconductor laser 10 and a focus error signal is obtained at the same time by means of the critical angle method by making the irradiated light of the semiconductor laser 10 incident to the reflecting face 12 of the prism 11 at an angle slightly smaller than the critical angle and making the reflected light from the recording face 14 to the reflecting face 12 of the prism 11 at the critical angle.

Description

【発明の詳細な説明】 本発明は光、ディスク等記録媒体上に光学的構造変化で
情報を記録した記録媒体から情報を光学的に読取る装置
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for optically reading information from a recording medium, such as an optical disc, on which information is recorded by optical structural changes.

従来のこの種の装置を第1図について説明する。A conventional device of this type will be described with reference to FIG.

第1図において半導体レーザlよシ出射した光線はコリ
メータレンズ2を通過しビームスプリッタ−3で反射し
4分の1波長板4.対物レンズ5を通過し、記録面6で
反射し、再び対物レンズ5゜4分の1波長板4を通過し
、さらにビームスプリッタ−3を通過し、臨界角プリズ
ム70反射面8で反射し光検出器に入射する。つまフ、
従来の光ピツクアップ装置では記録面6からの反射光を
半導体レーザに戻らないようにするために4分の1波長
板4とビームスプリッタ−3が必要で光学部品が多くな
るという欠点があった。そのため、コストが高く、また
光ピツクアップ全体の質重が犬きくなシ、外乱に弱く、
また高速でアクセスすることが困難であシ、光ピックア
ップ組み立て時の調節か所が多くなるという欠点もあっ
た。本発明は、4分の1波長板4及びビームスプリッタ
−3を用いずに反射光が半導体レーザに戻らない光学系
の構成を提供することを目的とする。
In FIG. 1, a light beam emitted from a semiconductor laser l passes through a collimator lens 2, is reflected by a beam splitter 3, and is reflected by a quarter-wave plate 4. The light passes through the objective lens 5, is reflected by the recording surface 6, passes again through the objective lens 5° and the quarter-wave plate 4, further passes through the beam splitter 3, and is reflected by the critical angle prism 70 and the reflecting surface 8. incident on the detector. Tsumufu,
The conventional optical pickup device has the disadvantage that a quarter wavelength plate 4 and a beam splitter 3 are required to prevent the reflected light from the recording surface 6 from returning to the semiconductor laser, which increases the number of optical components. Therefore, the cost is high, the overall quality of the optical pickup is poor, and it is susceptible to external disturbances.
Another disadvantage is that it is difficult to access at high speed, and there are many adjustments to be made when assembling the optical pickup. An object of the present invention is to provide an optical system configuration in which reflected light does not return to the semiconductor laser without using the quarter-wave plate 4 and the beam splitter 3.

第2図は本発明の一実施例を示した説明図である。半導
体レーザ10からの光線はプリズム11の反射面12に
対し反射の少ない角度で入射するようになされている。
FIG. 2 is an explanatory diagram showing an embodiment of the present invention. The light beam from the semiconductor laser 10 is made to be incident on the reflective surface 12 of the prism 11 at an angle with little reflection.

プリズム11を通過し対物レンズ13を通過し記録面1
4で反射した光線は再び対物レンズ13を通過しプリズ
ム11に入射する。この光線はプリズム11の反射面1
2に対し臨界角付近で入射するように設定しである。プ
リズムl]の反射面12ヲ反射した光は光検出器15に
入射する。従来の光ピツクアップ装置では記録面からの
反射光を半導体レーザ1に戻らないようにするために4
分の1波長板4とビームスプリッタ3を用いていたが、
本発明では半導体レーザlOの出射光をプリズムIIの
反射面12に対して臨界角よシも少し小さい角度で入射
し、記録面14からの反射光はプリズム11の反射面1
2に対して臨界角で入射するようにしておくことで、4
分の1波長板4とビームスプリッタ−3を用いずに半導
体レーザ1()に記録面14からの反射光が戻らないよ
うにすることと臨界角法でフォーカスエラー信号を得る
ことが同時にできるのである。
The recording surface 1 passes through the prism 11 and the objective lens 13.
The light beam reflected by the lens 4 passes through the objective lens 13 again and enters the prism 11. This ray is reflected by the reflective surface 1 of the prism 11.
It is set so that the incident angle is near the critical angle with respect to 2. The light reflected from the reflective surface 12 of the prism l enters the photodetector 15. In the conventional optical pickup device, in order to prevent the reflected light from the recording surface from returning to the semiconductor laser 1,
A half-wave plate 4 and a beam splitter 3 were used, but
In the present invention, the emitted light from the semiconductor laser IO is incident on the reflective surface 12 of the prism II at an angle slightly smaller than the critical angle, and the reflected light from the recording surface 14 is incident on the reflective surface 12 of the prism 11.
By making it incident at a critical angle with respect to 2, 4
It is possible to simultaneously prevent the reflected light from the recording surface 14 from returning to the semiconductor laser 1 () without using the half-wave plate 4 and the beam splitter 3, and to obtain the focus error signal using the critical angle method. be.

第3図は本発明の別の実施例を示した説明図である。記
録面かからの反射光がプリズム17の反射面18に対し
常に臨界角以上に彦るように設定しておくことでフォー
カスのズレが生じた一時も半導体レーザ16に記録面2
0からの反射光が戻らないようにすることができる。こ
のような方法で本発明を用いる場合は別にフォーカスエ
ラー信号を得るためのものが必要である。第3図には光
線が反射面22に臨界角で入射するように設定しである
臨界角プリズム21を用いた臨界角法を用いる場合を示
した。
FIG. 3 is an explanatory diagram showing another embodiment of the present invention. By setting the setting so that the reflected light from the recording surface always returns to the reflective surface 18 of the prism 17 by a critical angle or more, even if a focus shift occurs, the semiconductor laser 16 will not be able to reach the recording surface 18.
The reflected light from 0 can be prevented from returning. When using the present invention in such a method, a separate device for obtaining a focus error signal is required. FIG. 3 shows a case where a critical angle method is used using a critical angle prism 21 which is set so that a light beam is incident on a reflecting surface 22 at a critical angle.

以上述べたように本発1%[よる光ピツクアップ装置に
おいては、従来必要であった4分の1波長板4及びビー
ムスプリッタ−3のふたつの光学部品を必要とせず、光
ピツクアップ装置のコストを下げることができ、光ピツ
クアップ装置全体の質量を小さくすることが実現できる
のである。しかも、質量が小さいため外乱に強く、高速
アクセスが容易になシ、光学部品が少なくなるため、光
ピツクアップ装置の組み立て調整が容易になるのである
As mentioned above, the optical pickup device based on the present 1% laser beam eliminates the need for two optical components, the quarter-wave plate 4 and the beam splitter 3, which were required in the past, and reduces the cost of the optical pickup device. This makes it possible to reduce the mass of the entire optical pickup device. Moreover, since the mass is small, it is resistant to external disturbances, high-speed access is facilitated, and the number of optical components is reduced, making it easier to assemble and adjust the optical pickup device.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の光ピツクアップ装置の説明図、第2図は
本発明の光ピツクアップ装置の一実施例の説明図、第3
図は本発明の光ピツクアップ装置の別の一実施例の説明
図である。 1・Hl・16・−半導体レーザ 2・・コリメータレ
ンズ 3 r @ビームスフリツター 4−−4分の1
波長板 5 、13 、19・φ対物レンズ 6゜13
 、19・・記録面 7,21・・臨界角プリズム8 
、12 、18 、22−・反射面、11 、17・・
プリズム9寥す、23・・光検出器。 以   上 出願人 株式会社第二精工舎 代理人 弁理士最 上  務 第1図           第2図 第3(2]
FIG. 1 is an explanatory diagram of a conventional optical pickup device, FIG. 2 is an explanatory diagram of an embodiment of the optical pickup device of the present invention, and FIG.
The figure is an explanatory diagram of another embodiment of the optical pickup device of the present invention. 1.Hl.16.-Semiconductor laser 2..Collimator lens 3 r @beam fritter 4--1/4
Wave plate 5, 13, 19・φ Objective lens 6°13
, 19... Recording surface 7, 21... Critical angle prism 8
, 12 , 18 , 22-・Reflecting surface, 11 , 17 ・・
9 prisms, 23...photodetector. Applicant Daini Seikosha Co., Ltd. Agent Patent Attorney Mogami Figure 1 Figure 2 Figure 3 (2)

Claims (1)

【特許請求の範囲】[Claims] 光源と前記光源からの光線を通過させるプリズムと前記
プリズムを通過した光線を記録面に照射させるレンズと
前記記録面で反射し前記レンズを通過し前記プリズムで
反射した光線を入射する光検出器とからなる光ピツクア
ップ装置において、前記記録面を反射した光線が前記プ
リズムの反射面に臨界角近傍又はそれ以上で入射し、さ
らに前記光源からの光線が前記プリズムの反射面に臨界
角以下で入射することを特徴とする光ピツクアップ装置
a light source, a prism through which the light beam from the light source passes, a lens through which the light beam that has passed through the prism is irradiated onto a recording surface, and a photodetector through which the light beam reflected by the recording surface, passed through the lens, and reflected by the prism is incident. In the optical pickup device, a light beam reflected from the recording surface is incident on the reflective surface of the prism at an angle near or above a critical angle, and a light beam from the light source is incident on the reflective surface of the prism at an angle less than or equal to the critical angle. An optical pickup device characterized by:
JP58058493A 1983-04-01 1983-04-01 Optical pickup device Pending JPS59185045A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58058493A JPS59185045A (en) 1983-04-01 1983-04-01 Optical pickup device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58058493A JPS59185045A (en) 1983-04-01 1983-04-01 Optical pickup device

Publications (1)

Publication Number Publication Date
JPS59185045A true JPS59185045A (en) 1984-10-20

Family

ID=13085945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58058493A Pending JPS59185045A (en) 1983-04-01 1983-04-01 Optical pickup device

Country Status (1)

Country Link
JP (1) JPS59185045A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU702576B2 (en) * 1995-09-05 1999-02-25 Nippon Steel & Sumitomo Metal Corporation Thin cast strip formed of molten steel, process for its production, and cooling drum for thin cast strip continuous casting apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU702576B2 (en) * 1995-09-05 1999-02-25 Nippon Steel & Sumitomo Metal Corporation Thin cast strip formed of molten steel, process for its production, and cooling drum for thin cast strip continuous casting apparatus

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