JPS5918440A - Gas analyzing meter - Google Patents

Gas analyzing meter

Info

Publication number
JPS5918440A
JPS5918440A JP12862782A JP12862782A JPS5918440A JP S5918440 A JPS5918440 A JP S5918440A JP 12862782 A JP12862782 A JP 12862782A JP 12862782 A JP12862782 A JP 12862782A JP S5918440 A JPS5918440 A JP S5918440A
Authority
JP
Japan
Prior art keywords
amplifier
span adjustment
span
instantaneous
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12862782A
Other languages
Japanese (ja)
Other versions
JPH0249458B2 (en
Inventor
Naoki Noguchi
直樹 野口
Masaru Tanaka
優 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP12862782A priority Critical patent/JPH0249458B2/en
Publication of JPS5918440A publication Critical patent/JPS5918440A/en
Publication of JPH0249458B2 publication Critical patent/JPH0249458B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To perform accurate calibration of a gas analyzing meter, by providing a linked adjusting means for adjusting a first span adjusting amplifier, in association with the gain adjustment of a second span adjusting amplifier. CONSTITUTION:In a gas analyzing meter, the following parts and devices are provided: an instantaneous measuring part 1, which measures incoming gas; a first span adjusting amplifier A1 which amplifiers the output of the instantaneous measuring part 1; an instantaneous value display device 2 which displays the output of the first span adjusting amplifier A1; an operating part 4 which computes the integrated value or average value of the instantaneous values; a holding amplifier HA which holds the output of the operating part 4; a second span adjusting amplifiers A2 which amplifies the output of the holding amplifier HA; and a calibration display device 5 which displays the output of the second span adjusting amplifier A2. A linked adjusting means, which adjusts the first span adjusting amplifier A1, in association with the gain adjustment of the second span adjusting amplifier A2, is provided.

Description

【発明の詳細な説明】 不発明け、例えば大気中の一酸化炭素等の濃度を連続測
定するために用いられる非分散形赤外分析ｌｔなどのガ
ス分析計、詳］７〈け、そのガス分析計における全く新
規な較正手段に関するものである。[Detailed description of the invention] A gas analyzer such as a non-dispersive infrared analyzer used to continuously measure the concentration of carbon monoxide, etc. in the atmosphere, details] 7. Gas analysis thereof This invention relates to a completely new means of calibration in meters.

従来、連続測定を行なうガス分析性１°にあっ′Ｃ目゛
、測定に先立ってなされる分析計の較正は、次のように
行なわれるものであった。即ち、従来のガス分析計は、
第１図に示すように、高圧ボンベａに詰められた既知濃
度の標準ガスを用意し、この標準ガスを分析計の瞬時測
定部すに導いて分析し、その結果として表示器Ｃに表示
される濃度測定値が前記既知濃度と等しくなるようにス
パン調節アンプｃｌ調節するように構成されていた。Conventionally, the calibration of the analyzer prior to the measurement was carried out in the following manner for gas analysis of 1°C, in which continuous measurements were carried out. In other words, the conventional gas analyzer
As shown in Figure 1, a standard gas of known concentration packed in a high-pressure cylinder a is prepared, and this standard gas is led to the instantaneous measurement section of the analyzer and analyzed, and the result is displayed on the display C. The span adjustment amplifier cl is configured to adjust the measured concentration value equal to the known concentration.

しかしながら、かかる従来構成のものでは、濃度が正確
に知られている標準ガスボンベを必要とするために、そ
のような標準ガスを得られない場合には分析計の較正が
できず極めて不便であ−った。However, this conventional configuration requires a standard gas cylinder whose concentration is accurately known, and if such a standard gas is not available, the analyzer cannot be calibrated, which is extremely inconvenient. It was.

捷た、測定するガスの成分によっては、吸着、液化、分
解、反応などにより濃度が変化するために安定した標準
ガスを得ることが困難な場合が多い。Depending on the components of the sampled gas to be measured, it is often difficult to obtain a stable standard gas because the concentration changes due to adsorption, liquefaction, decomposition, reaction, etc.

例えば、トリメチルアミン、ジメチルスルフィド、アル
デヒドなどは、極めて短期間しか安定していないから、
このような場合には、分析計の較正の度に新しい標準ガ
スを用意しなければ精度良い測定を行なうことができな
い。For example, trimethylamine, dimethyl sulfide, aldehyde, etc. are only stable for a very short period of time.
In such a case, accurate measurements cannot be made unless a new standard gas is prepared each time the analyzer is calibrated.

上記したような従来問題を解消するための手段として、
第２図に示すような構成の分析計が考えられる。即ち、
測定成分が液状または固状の純物質として得られる場合
、この純物質ｐｏ’ｉ既知の一定量ｍだけ混合器ｅに入
れて一定流量Ｑのゼロガスｇｏを通気すると、混合器ｅ
からはゼロガスｇｏで希釈された測定成分ガスが第３図
に示すような濃度曲線で流出してくる。つまり、時刻ｔ
１からｔｘｔでの間に混合器ｅ内の純物質ｐＯが全て気
化流出したとすれば、 が成立つ。但し、Ｍは純物質ｐＯの分子量であり、圧力
、温度は標準状態とする。一方、第２図の構成のものに
おける瞬時測定部ｆｉこよる濃度測定値ｋ　ｘ’（ｔ＞
とすると、積分器、乗算器等から成る演算ｍｇの出力ｍ
′は となる。故に、較正用表示器りの表示値ｍ′がｍに等し
くなるように瞬時測定部ｆのスパン調整アンプｌ調整す
ればｘ’（ｔ）＝　ｘ　（ｔ）となって、理論的にはガ
ス分析計の較正が可能である。As a means to solve the conventional problems mentioned above,
An analyzer having a configuration as shown in FIG. 2 can be considered. That is,
When the component to be measured is obtained as a liquid or solid pure substance, if a certain amount m of the pure substance po'i known to the pure substance po'i is placed in a mixer e and a constant flow rate Q of zero gas go is passed through the mixer e.
The component gas to be measured diluted with the zero gas go flows out according to a concentration curve as shown in FIG. In other words, time t
If all the pure substance pO in the mixer e vaporizes and flows out between 1 and txt, then the following holds true. However, M is the molecular weight of the pure substance pO, and the pressure and temperature are standard conditions. On the other hand, the concentration measurement value k x'(t>
Then, the output m of the operation mg consisting of an integrator, a multiplier, etc.
′ becomes . Therefore, if the span adjustment amplifier l of the instantaneous measuring section f is adjusted so that the displayed value m' on the calibration display becomes equal to m, x'(t) = x (t), and theoretically the gas Calibration of the analyzer is possible.

ところが、このようなバッチサンプルを利用する構成の
ものにおいても、なお実用的には困難な問題が残存して
いる。即ち、瞬時測定部ｆのアンプｉの調整は試行備誤
的に何度も行なわねばならないため、バッチサンプルの
準備に非常な手間を要するとともに、較正のために多大
な時間を要する難点がある。However, even with such a configuration that utilizes batch samples, there still remain problems that are difficult in practice. That is, since the adjustment of the amplifier i of the instantaneous measurement section f must be carried out many times by trial and error, there are disadvantages in that it requires a great deal of effort to prepare batch samples and a great deal of time is required for calibration.

本発明は、上記実情に鑑みてなされたものであって、そ
の目的は、濃度が既知の標準が又ボンベ力無くても、バ
ッチサンプルによって較正が可能で、しかも、バッチサ
ンプルを唯１回通過させるだけで正確に較正を行なうこ
とができる。実用上極めて便利なガス分析計を提供せん
とすることにある。The present invention has been made in view of the above-mentioned circumstances, and its purpose is to enable calibration using a batch sample using a standard with a known concentration without the need for a cylinder, and to pass the batch sample only once. Calibration can be performed accurately simply by The object of the present invention is to provide a gas analyzer that is extremely convenient in practice.

以下、本発明の実施例を図面（第４図〜第７図）に基い
て説明する。Embodiments of the present invention will be described below with reference to the drawings (FIGS. 4 to 7).

第４図は、本発明の第１５Ｅ施例に係るガス分析計を示
す。FIG. 4 shows a gas analyzer according to the 15th embodiment of the present invention.

ｌは、これ全通過する被測定ガスの濃度ｘ（ｔ）ｋ非分
散形赤外方式により時々刻々連続的に検出する瞬時測定
部であり、この瞬時測定部ｌにより検出される瞬時値ｘ
　（Ｌ）は第１スパン調整アンプＡ＋’に介して瞬時値
表示器２に連続的に表示されるようになっている。1 is an instantaneous measurement section that continuously detects the concentration x(t)k of the gas to be measured that passes through it every moment using a non-dispersive infrared method, and the instantaneous value x detected by this instantaneous measurement section 1
(L) is continuously displayed on the instantaneous value display 2 via the first span adjustment amplifier A+'.

３は、前記瞬時測定部１を通過した被測定ガスの流量Ｑ
１ならびに、そのガスが流れ始めた時間【１および流れ
終わった時間ｔｉ１に計測する流量および時間測定部で
あって、これによる検出流量Ｑ’を示す信号、ならびに
、前記時間【１における５ＴＡＲ”［’信号、および、
前記時間ｔ２における５ＴＯＰ信号が演算部４に入力さ
れるようになっている。3 is the flow rate Q of the gas to be measured that has passed through the instantaneous measurement section 1
1, a flow rate and time measuring section that measures the time ti1 when the gas starts flowing and the time ti1 when it finishes flowing, and a signal indicating the detected flow rate Q' by this, and 5TAR'' at the time ti1. 'signal, and
The 5TOP signal at the time t2 is input to the calculation section 4.

この演算部４には、上記の信号のほか、前記瞬時測定部
ｌにより検出される瞬時値Ｘ（【）が前記第１スパン調
整アンプＡ１を介さずに入力される。In addition to the above-mentioned signals, the calculation section 4 receives the instantaneous value X([) detected by the instantaneous measurement section 1 without going through the first span adjustment amplifier A1.

前記演算部４においては、入力される前記濃度信号ｘ　
（Ｌ）、時間信号ｔ＋　（５ＴＡＲＴ　）、ｔｔ　（５
ＴＯＰ　）および流ｍ信号Ｑに基いて、次式 により瞬時測定部ｉ１通過した被測定ガス中の成分量ｍ
を演算する。そして、この演算された成分量ｍｕホール
ドアンプＨＡによってホールドさね、るとともに、第２
スパン調整アンプＡ２ヲ介して較正用表示器５Ｉこ表示
されるようになっている。In the calculation unit 4, the input concentration signal x
(L), time signal t+ (5TART), tt (5
TOP ) and the flow m signal Q, the amount of component m in the gas to be measured that has passed through the instantaneous measurement part i1 is determined by the following formula:
Calculate. Then, the calculated component quantity mu is held by the hold amplifier HA, and the second
This is displayed on the calibration display 5I via the span adjustment amplifier A2.

前記第１スパン調整アンプＡ１と第２スパン調整アンプ
〜け、何れか一方をゲイン調整することによって、それ
ら両アンプＡ、、　Ｍ：自動的にゲイン調整できるよう
に連動連結されている。The first span adjustment amplifier A1 and the second span adjustment amplifiers .

上記構成のガス分析計では、次のように、ただ１回だけ
バッチサンプルを通過させるのみで、極めて容易にその
正確な較正を行うことができる。With the gas analyzer having the above configuration, accurate calibration can be performed very easily by passing a batch sample through the sample only once, as described below.

即ち、洗気びんにより構成される混合器６の中に、被測
定ガスの成分に対応する液状捷たは固状の純物質ｐ（例
えばＨｇｃｌｚ　溶液とかドライアイスなど）を既知量
ｍだけ封入するとともに、ゼロガスｇを通気することに
よって生成される較正用測定成分ガスを、前記構成のガ
ス分析計にその純物質ｐが完全番こ気化する捷で通過さ
せると、較正用表示器５に一応の成分量演算値ｍ′が表
示される。That is, a known amount m of liquid or solid pure substance p (for example, Hgclz solution or dry ice) corresponding to the component of the gas to be measured is sealed in a mixer 6 constituted by an air washing bottle. At the same time, when the calibration measurement component gas generated by aerating the zero gas g is passed through the gas analyzer having the above configuration at such a point that the pure substance p is completely vaporized, the calibration display 5 shows a certain amount. The component quantity calculation value m' is displayed.

ここで真の成分量ｍは既知であるから、較正用表示器２
における表示値ｍ′がｍに合致するように第２スパン調
整アンプ〜のゲイン調整を行うと、こね、に連動して第
１スパン調整アンプＡ１も瞬時値表示器２に真の瞬時値
ｘ　（ｔ）が表示されるようにゲイン調整されるのであ
る。Here, since the true component amount m is known, the calibration display 2
When the gain of the second span adjustment amplifier ~ is adjusted so that the displayed value m' matches m, the first span adjustment amplifier A1 also shows the true instantaneous value x ( The gain is adjusted so that t) is displayed.

第５図は別の実施例を示す。この実施例では、第１スパ
ン調整アンプＡ１の出力が計測−較正切替スイッチＳＷ
＋および補助アンプＡ７金介して演算部４に入力される
よう１こしである。この補正アンプＡＩのゲインは前記
第１スパン調整アンプＡ１のゲインとけ常に逆数の関係
となるように自動調整されるようになっているので、た
とえ第１スパン調整アンプＮ１のゲインが正しく調整さ
れていなくても、瞬時測定部ｌの出力値がそのまま演算
部４に入力されることと同義になる。FIG. 5 shows another embodiment. In this embodiment, the output of the first span adjustment amplifier A1 is set to the measurement-calibration changeover switch SW.
+ and auxiliary amplifier A7 so as to be input to the calculation section 4 via the auxiliary amplifier A7. The gain of this correction amplifier AI is automatically adjusted so that it always has a reciprocal relationship with the gain of the first span adjustment amplifier A1, so even if the gain of the first span adjustment amplifier N1 is not adjusted correctly. Even if it is not present, it is equivalent to inputting the output value of the instantaneous measurement section 1 to the calculation section 4 as is.

第１スパン調整アンプＡ１と補正アンプＭと第２スパン
調整アンプんは、そのうちの何れかひとつのもの全ゲイ
ン調整することによって、それら全てのアンプん、　Ａ
１．　Ａ２に自動的にゲイン調整できるように連動連結
されている。そして、本実施例においては、アンプ〜、
　　ＡＩ’、　Ａ２のゲインは、常にＫ　：に：　Ｋの
関係を維持するように構成されている。ただし、一般的
には例えば、アンプＡ＋、Ａ２のゲインの比が一定でさ
えあれば足りるものである。By adjusting the total gain of any one of the first span adjustment amplifier A1, the correction amplifier M, and the second span adjustment amplifier, all of them can be adjusted.
1. It is interlocked and connected to A2 so that the gain can be automatically adjusted. In this embodiment, the amplifier ~,
The gains of AI' and A2 are configured to always maintain the relationship K: to:K. However, in general, it is sufficient that the ratio of the gains of the amplifiers A+ and A2 is constant, for example.

何故なら、その比如何によって表示器２の目盛の付し万
を変えれば足りるからである。This is because it is sufficient to change the marking of the scale on the display 2 depending on the ratio.

第６図は別の実施例全示し、前述の第２実施例における
補正アンプＡＩの代りに、第１スパン調整アンプＡ１と
第２スパン調整アンプんとの連動構成の間に、第１スパ
ン調整アンプ八〇に対するゲイン補正演算器Ｂ’を介装
したものである。この演算器Ｂにおいては、第２スパン
調整アンプＡ２の調整値に７０）とこれに連動して調整
された第１スパン調整アンプＡ１の調整値Ｋｌ（ｎ）か
らＫｌ　（ｎ　＋１　）　＝　Ｋ、（ｎ）ＸＫ２（ｎ）
ｋ演算して、第１スパン調整アンプＡ、を再調整するの
である。この時、第２スパン調整アンプ〜のゲインは（
ＸＩ）にリセットする。FIG. 6 shows another embodiment, in which, instead of the correction amplifier AI in the second embodiment, a first span adjustment amplifier is provided between the first span adjustment amplifier A1 and the second span adjustment amplifier. A gain correction calculator B' for the amplifier 80 is interposed. In this arithmetic unit B, from the adjusted value 70) of the second span adjusting amplifier A2 and the adjusted value Kl(n) of the first span adjusting amplifier A1 adjusted in conjunction with this, Kl (n +1) = K, (n)XK2(n)
The first span adjustment amplifier A is readjusted by calculating k. At this time, the gain of the second span adjustment amplifier ~ is (
XI).

第７図は、更に別の実施例を示し、前記第２実施例を更
に簡略な構成とする之めに、前記第１スパン調整アンプ
Ａ１と第２スパン調整アンプＡ２、ナらびに、前記瞬時
値表示器２と較正用表示器５を、夫々、−組の共通のス
パン調整アンプＡおよび表示器７にて兼用するとともに
、切換スイッチＳＷ２の切換えによって計測時および較
正時に択一使用可能に構成したものである。FIG. 7 shows still another embodiment. In order to further simplify the configuration of the second embodiment, the first span adjustment amplifier A1, the second span adjustment amplifier A2, the The value display 2 and the calibration display 5 are shared by the common span adjustment amplifier A and the display 7 of the − group, respectively, and are configured so that they can be used selectively during measurement and calibration by switching the changeover switch SW2. This is what I did.

なお、前記各実施例では、演算部４において、瞬時測定
部ｌを通過する成分量の合計を演算するように構成して
いるが、その量を直接算出する壕でも無く、前記瞬時測
定部ｌにおいて計測される連続的瞬時値の積算値あるい
は平均値に相当する値であればどのような形の演算を行
なうものであってもよい。In each of the above embodiments, the calculating section 4 is configured to calculate the total amount of components passing through the instantaneous measuring section l, but the amount is not directly calculated; Any type of calculation may be performed as long as the value corresponds to the integrated value or average value of continuous instantaneous values measured in .

以上要するに、本発明によるガス分析計は、流入ガスを
連続的に測定する瞬時６１１Ｊ定部と、連記瞬時測定部
からの出力を増幅する第１スパン調整アンプと、前記第
１スパン調整アンプからの出力を連続的に表示する瞬時
値表示器と、前記連続的瞬時値の積算値捷たけ平均値に
相当する値全算出する演算部と、前記演算部からの出力
全ホールドするアンプと、１０記ホールドアンプからの
出力を増幅する第２スパン調整アンプと、前記第２スパ
ン調整アンプからの出力全表示する較正用表示器と、前
記較正用表示器の表示値と既知の値との比較に基いて前
記第２スパン調整アンプのゲイン調整を行なったときに
、その調整に連動して自動的に前記第１スパン調整アン
プ全正確に調整するための連動調整手段とを備えている
ことを特徴とするものである。In summary, the gas analyzer according to the present invention includes an instantaneous 611J constant section that continuously measures inflow gas, a first span adjustment amplifier that amplifies the output from the continuous instantaneous measurement section, and a first span adjustment amplifier that amplifies the output from the first span adjustment amplifier. an instantaneous value display that continuously displays the output; an arithmetic unit that calculates all the values corresponding to the cumulative average value of the continuous instantaneous values; and an amplifier that holds all the outputs from the arithmetic unit; A second span adjustment amplifier that amplifies the output from the hold amplifier, a calibration display that displays the entire output from the second span adjustment amplifier, and a calibration display that is based on a comparison between the displayed value of the calibration display and a known value. and an interlocking adjustment means for automatically adjusting all of the first span adjustment amplifiers accurately in conjunction with the gain adjustment of the second span adjustment amplifier. It is something to do.

そして、かかる特徴構成ケ有するが故に、本発明による
ガス分析計は、実施例中で詳述したように、ただ１回だ
けバッチサンプルを通してアンプのゲイン調整を行なう
、という極めて簡単な操作によって、その正確な較正を
行なうことができるのであり、実用上極めて便利なもの
にできたのである。Since the gas analyzer according to the present invention has such characteristic configurations, the gas analyzer according to the present invention can be operated by an extremely simple operation of adjusting the gain of the amplifier through a batch sample only once, as described in detail in the embodiment. Accurate calibration can be performed, making it extremely convenient in practice.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明全説明するためのものであって、第１図は
従来技術の説明図、第２図および第３図は本発明の根底
にある原理の説明図、そして、第４図、第６図、第６図
、第７図が本発明の種々の実施例を示す概略ブロック図
である。 １・・・瞬時測定部、２・・・瞬時値表示器、３・・・
流量・時間測定部、４・・・演算部、５・・・較正用表
示器、７・・・兼用表示器、Ａ・・・兼用アンプ、Ａ１
・・第１スパン調整アンプ％　Ａｌ’・・・補正アンプ
、〜・・・第２スパン調整アンプ、Ｂ・・・補正演算器
、ＩＩＡ・・ホールドアンプ、ＳＷ２・・・切替スイッ
チ。 第１図 第２図 第３図 第４図 ９に 　　　　　　　請、、　　　　８□１時４： ｔｌ＋ｊｔＶＩ５　　　　　　　Ｅ８’１ｆｉＰｉ　Ｅ
［Ｉｓ已）賞ｉｓ　部 ｐ（ｗ） Ｉ Ａ ：２ Ａ２　　−−ゲイン調整 ｉ　　　　　　　　　　ど］）　口 第６図 第７図The drawings are for explaining the present invention in its entirety; FIG. 1 is an explanatory diagram of the prior art, FIGS. 2 and 3 are explanatory diagrams of the underlying principle of the present invention, and FIGS. 6, 6, and 7 are schematic block diagrams showing various embodiments of the present invention. 1... Instantaneous measurement section, 2... Instantaneous value display, 3...
Flow rate/time measurement section, 4... Calculation section, 5... Calibration display, 7... Dual-purpose display, A... Dual-purpose amplifier, A1
...First span adjustment amplifier % Al'...Correction amplifier, ~...Second span adjustment amplifier, B...Correction calculator, IIA...Hold amplifier, SW2...Changing switch. Figure 1 Figure 2 Figure 3 Figure 4 Figure 9
[Is part p(w) I A :2 A2 --Gain adjustment i]) Mouth Figure 6 Figure 7

Claims (1)

【特許請求の範囲】 ■　流入ガスを連続的に測定する瞬時測定部１と、前記
瞬時測定部ｌからの出力を増幅する第１スパン調整アン
プＡ１と、前記第１スパン調整アンプＡ１からの出力を
連続的寥こ表示する瞬時値表示器２と、前記連続的瞬時
値の積算値またに平均値に相当する値を算出する演算部
４と、前記演算部４からの出力をホールドするアンプＨ
Ａと、前記ホールドアンプＨＡからの出力全増幅する第
２スパン調整−γツブＡ２と、前記第２スパン調整アン
プＭからの出力全表示する較正用表示器５と、前記較正
用表示器５１７）表示値と既知の値との比較に基いて前
記第２スパン調整アンプ〜のゲイン調整を行なったとき
に、その調整番こ連動１〜で自動的に前記第１スパン調
整了ンブんゲ正確番こ調整する几めの連動調整手段とを
備えているガス分析計。 （２）前記＠４部１０人力段に、前記第１スパン調整ア
ンプＡ、のゲインとは常に逆数関係となるゲインを有す
る補正アンプ氏′ヲ設けである特許請求の範囲第０項に
記載のガス分析計 ■　前記連動調整手段にはＤｔＩ記第１スパン調整アン
プへに則するゲイン補正演算器Ｂｋ設けである特Ｗ′［
請求の範囲第０項に記載のガス分析計。 （ｏ　　ｎｔｔ記第１スパン調整アンプＡ１と第２スパ
ン調整アンプへ、ならびに、前記瞬時値表示器２と較正
用表示器５を、夫々、−組の共通のスパン調整′ｒンプ
Ａおよび表示器７にて兼用するとともに、切換スイッチ
ＳＷ２の切換えによって計測時および較Ｅ時に択一使用
可能に構成しである特許請求の範囲第０項に記載のガス
分析計。[Claims] ■ An instantaneous measurement section 1 that continuously measures inflow gas, a first span adjustment amplifier A1 that amplifies the output from the instantaneous measurement section 1, and an output from the first span adjustment amplifier A1. an instantaneous value display 2 that continuously displays the continuous instantaneous values, an arithmetic unit 4 that calculates a value corresponding to an integrated value or an average value of the continuous instantaneous values, and an amplifier H that holds the output from the arithmetic unit 4.
A, a second span adjustment gamma knob A2 that amplifies the entire output from the hold amplifier HA, a calibration display 5 that displays the entire output from the second span adjustment amplifier M, and the calibration display 517) When the gain adjustment of the second span adjustment amplifier ~ is performed based on the comparison between the displayed value and the known value, the adjustment number is linked to 1 ~ and the first span adjustment is automatically completed. This gas analyzer is equipped with a precise interlocking adjustment means for this adjustment. (2) The @4 part 10 manual stage is provided with a correction amplifier having a gain that is always inversely related to the gain of the first span adjustment amplifier A. Gas analyzer■ The interlocking adjustment means is equipped with a gain correction calculator Bk in accordance with the first span adjustment amplifier described in DtI.
A gas analyzer according to claim 0. (On ntt) To the first span adjustment amplifier A1 and the second span adjustment amplifier, as well as the instantaneous value display 2 and the calibration display 5, respectively, to the common span adjustment amplifier A and the display 7. The gas analyzer according to claim 0, wherein the gas analyzer is configured to be able to be used selectively during measurement and during calibration by switching the changeover switch SW2.
JP12862782A 1982-07-22 1982-07-22 GASUBUNSEKIKEI Expired - Lifetime JPH0249458B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12862782A JPH0249458B2 (en) 1982-07-22 1982-07-22 GASUBUNSEKIKEI

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12862782A JPH0249458B2 (en) 1982-07-22 1982-07-22 GASUBUNSEKIKEI

Publications (2)

Publication Number Publication Date
JPS5918440A true JPS5918440A (en) 1984-01-30
JPH0249458B2 JPH0249458B2 (en) 1990-10-30

Family

ID=14989475

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12862782A Expired - Lifetime JPH0249458B2 (en) 1982-07-22 1982-07-22 GASUBUNSEKIKEI

Country Status (1)

Country Link
JP (1) JPH0249458B2 (en)

Also Published As

Publication number Publication date
JPH0249458B2 (en) 1990-10-30

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