JPS59183351A - Ampule examining apparatus - Google Patents

Ampule examining apparatus

Info

Publication number
JPS59183351A
JPS59183351A JP58058502A JP5850283A JPS59183351A JP S59183351 A JPS59183351 A JP S59183351A JP 58058502 A JP58058502 A JP 58058502A JP 5850283 A JP5850283 A JP 5850283A JP S59183351 A JPS59183351 A JP S59183351A
Authority
JP
Japan
Prior art keywords
product
inspection
examination
ampoule
defective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58058502A
Other languages
Japanese (ja)
Other versions
JPH0317089B2 (en
Inventor
Shinichi Taniguchi
紳一 谷口
Takashi Otsuki
隆 大月
Haruo Tsuji
春夫 辻
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Takeda Pharmaceutical Co Ltd
Original Assignee
Takeda Chemical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Takeda Chemical Industries Ltd filed Critical Takeda Chemical Industries Ltd
Priority to JP58058502A priority Critical patent/JPS59183351A/en
Publication of JPS59183351A publication Critical patent/JPS59183351A/en
Publication of JPH0317089B2 publication Critical patent/JPH0317089B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018Dirt detection in containers
    • G01N21/9027Dirt detection in containers in containers after filling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0078Testing material properties on manufactured objects
    • G01N33/0081Containers; Packages; Bottles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enhance the recovery ratio of a good product, by a method wherein conveyed ampules are examined by a plurality of examination means to judge a good product and a bad product according to the quality judging results of a specific number or more of examination means and the re-examination of the bad product is repeated. CONSTITUTION:Ampules (a) to be examined are successively supplied to an examination drum 8 rotating to the direction shown by the arrow from a delivery port 1 through a belt conveyor 4, a bridge breaker belt 5, a delivery star wheel 6 and a supply star wheel 7. Each ampule is rotated around the shaft core of the drum 8 at a high speed at a position I and the rotation thereof is stopped at a position II while the examination of quality is performed at a position III by a TV camera 11 while the content liquid during rotation is illuminated. Similarily, examination is performed at positions IV-VI and, when results in four-time examinations are good, said ampule is judged as a good product and, when bad, it is judged as a bad product while the other ampule is judged as a re-examination product. In this case, the bad product is sent to a bad product star wheel 17 by a bad product distributing valve 16 operated through a control circuit 13, the good product to a star wheel 18 and the re-examination product to a re-examination star wheel 15. Because the re-examination product is repeatedly re-examined, the recovery ratio of the good product is enhanced.

Description

【発明の詳細な説明】 本発明はアンプルの検査装置、更に詳しくはアンプル、
バイアル等の内容液を充填した被検査物の[Flを複数
個のテレビジョンカメラ等の検査手段でとらえてその内
容液に含む異物の序在を確認するようにした検査装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ampoule inspection device, more specifically an ampoule,
The present invention relates to an inspection device for checking the presence of foreign substances contained in the liquid by capturing the image (Fl) of a liquid-filled object such as a vial using inspection means such as a plurality of television cameras.

アンプル、バイアル類はその内容液にガラス破片等の異
物が誤って混入することがあるので、従来から内容液を
旋回させてその中に含む異物をテレビジョンカメラでと
らえるようにした検査装置が特公昭52−19798号
、特公昭52−47914号等で提案されている。しか
し、これらの検査装置に備えるカメラは一定の感夷で異
物を検知してアンプ71zf良品と不良品に判別するの
みのものでめったから、近時の如く、内容液に含むよシ
微少な異物の検出が要求されて来てカメラの感度を上げ
ると、内容液の旋回に伴って発生する徽少な気泡をも検
出して、異物と気泡を区別することができず、したがっ
て気泡をも異物と検知せざるを得なかったために、検査
後の良品のアンプルの回収率が極度に低下して生産性が
悪くなる欠点があった。
Since foreign objects such as glass shards may accidentally get mixed into the liquid content of ampoules and vials, conventional inspection equipment that swirls the liquid content and uses a television camera to capture the foreign objects contained therein has been specially developed. It has been proposed in Publication No. 52-19798, Special Publication No. 47914/1983, etc. However, the cameras installed in these inspection devices are only capable of detecting foreign objects with a certain level of sensitivity and distinguishing between good and defective Amplifier 71zf products. However, when the sensitivity of the camera was increased to meet the demand for detection of air bubbles, it became possible to detect even small air bubbles that were generated as the liquid content swirled, making it impossible to distinguish between foreign objects and air bubbles. Since detection had to be carried out, the recovery rate of good ampoules after inspection was extremely low, resulting in poor productivity.

本発明は、上記従来例の欠点を除去すべく、アンプルの
検査手段として複数個のカメラを備え、各カメラの異物
検知感度を上げると同時に全カメラの検知結果を総合し
て一定の基準でアンプルを良品と不良品及び再検査品に
判別し、再検査品のアンプルは今−変相数個のカメラの
検査を行わせるヱうにして、良品のアンプルの回収率を
向上させるようにしたものである。すなわち、本発明に
かかるアンプルの検査装置は、アンプルを投入位置から
少くとも1ケ所以上の検査位置を経て取出位置へ搬送す
る搬送手段と、上記検査位置で夫々アンプ/Vを検査し
て良品と不良品に判別する複数個の検査手段と、第1特
定数以上の検査手段が良品と判別すると良品と判定し、
かつ第2特定数以下の検査手段が良品と判別すると不良
品と判定し、さらに第1特定数未満で第2特定数こえる
検査手段が良品と判断すると、再検査品と判定する判定
手段と、該判定手段の出力で再検査品と判定したアンプ
ルを取出位置から投入位置または検査位置へ戻す回帰手
段を備えて、アンプルの再検査を繰り返し行うようにし
たことを特徴とするものである。
In order to eliminate the drawbacks of the conventional example, the present invention includes a plurality of cameras as an ampoule inspection means, increases the foreign object detection sensitivity of each camera, and at the same time integrates the detection results of all cameras and tests the ampoules according to a certain standard. The ampules of re-inspected products are inspected using several phase-changing cameras to improve the recovery rate of non-defective ampoules. It is. That is, the ampoule inspection device according to the present invention includes a conveying means for conveying the ampoule from an input position to an unloading position via at least one inspection position, and a means for inspecting the amplifier/V at each of the inspection positions to determine whether it is a good product. A plurality of inspection means for determining a defective product and a first specific number or more of inspection means determine the product to be non-defective,
and determination means that determines the product to be defective if the number of inspection means equal to or less than the second specific number determines the product to be good, and further determines the product to be re-inspected if the number of inspection means less than the first specific number and more than the second specific number determines the product to be good; The present invention is characterized in that it includes return means for returning ampules determined to be re-inspected products from the output position to the input position or inspection position from the output position of the determination means, so that re-inspection of the ampoules is repeatedly performed.

以下、本発明を図面番こ示す実施例について詳細に説明
する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to embodiments shown in the drawings.

第1図に示すアンプル検査装置において、検査すべきア
ンプル3は順次仕込口1から仕込台3の前方で仕込ガイ
ド2で囲まれたベルトコンベア4に送り込まれる。アン
プル3は送出しベルトコンベア4で、両側のブリッジブ
レーカベルト5の助けを受けながら、時計方向へ回転す
る仕込みスターホイル6の搬送ポケツ)5aへ一つずつ
送り出される。仕込みスターホイル6のアンプル3は反
時計方向へ回転する供給スターホイル7の搬送ポケット
7aを経て、検査ドラム8のホルダー9へ順次供給され
る時計方向へ回転する一検査ドラム8は、順次供給され
るアンプルaを上下一対のホルダー9a、9bでアンプ
ルaの底面と肩部を保持し乍ら、第1位置■でアンプル
をその軸芯の回りに高速回転させ、次の第2位置■でア
ンプルの回転を停止させ(但し、アンプル内容液は慣性
で回転を続けている。)、ざらに、第37Jg位置■て
アンプルλを投光器10で照らし乍らテレビジョンカメ
ラ11でアンプルの良品、不良品を一定の感度(アンプ
ル内容液中に含む異物を検出して良品と不良品を一定の
レベルで識別する。)で検査をする。量線にして、第4
−第5、第6の各検査位if IV、■、■iこおいて
も、アップルを回転させてのち停止した状態で投光器で
照らして夫々のテレビジョンカメラでアンプルの良品、
不良品を検をする。検査ドラム8のアンプルaは、反時
計方向に回転する取出しスターホイル12の酔送ポケッ
ト12aへ送られ、上記カメラ]1の検査結果番こ基づ
き制御回路13を介して作・助する再検査振分バルブ1
4によって再検査すべきアンプルは再検査スターホイル
15の搬送ポケッ) ]、 5 aへ送り出される一方
、」−記カメラ11の検査結果に基づき制御回路13を
介して作動する不良品振分バルブ16によって不良品の
アンプルは不良品スターホイル】7の搬送ポケット17
aへ送り出され、良品のアンプルのみが取出しスターホ
イルj2から次工程送りスターホイル18の搬送ポケッ
ト18aへ送り出される。%検査ナベきアンプルは再検
査スターホイル15から回帰回路を構成する中間送炭ス
ターホイル19の搬送ポ (以下 余 白) ケラ)19aを経て上記仕込スフ−ホイール6の搬送ポ
ケット6aへ送シ戻されて、上記の如き検査ドラム8で
の検査を今一度繰り返えす。不良品のアンプルは不良品
スターホイー/L/17がら案内ガイド20を経て不良
品箱21へ投入される。
In the ampoule inspection apparatus shown in FIG. 1, ampoules 3 to be inspected are sequentially fed from a loading port 1 to a belt conveyor 4 surrounded by a loading guide 2 in front of a loading table 3. The ampoules 3 are delivered one by one by a delivery belt conveyor 4 to a transport pocket 5a of a charging star wheel 6 rotating clockwise with the help of bridge breaker belts 5 on both sides. The ampoules 3 of the preparation star foil 6 are sequentially supplied to the holder 9 of the inspection drum 8 through the conveyance pocket 7a of the supply star foil 7 that rotates counterclockwise.The test drum 8 that rotates clockwise is sequentially supplied. While holding the bottom and shoulders of ampoule a with a pair of upper and lower holders 9a and 9b, the ampoule is rotated at high speed around its axis at the first position (■), and then the ampoule is rotated at the second position (■). (However, the liquid in the ampoule continues to rotate due to inertia.) Then, at the 37th Jg position, the ampoule λ is illuminated by the projector 10 and the television camera 11 is used to check whether the ampoule is good or defective. is inspected with a certain level of sensitivity (detecting foreign substances in the ampoule contents and distinguishing between good and defective products at a certain level). On the dose line, the fourth
- In each of the 5th and 6th inspection positions if IV, ■, and ■i, after rotating the apple and stopping it, the ampoule was illuminated with a floodlight and each television camera was used to check if the ampoule was good or not.
Inspect defective products. The ampoule a of the inspection drum 8 is sent to the transport pocket 12a of the extraction star wheel 12 which rotates counterclockwise, and a re-inspection shaker is generated and assisted via the control circuit 13 based on the inspection result number of the camera]1. minute valve 1
The ampoule to be re-inspected by 4 is sent to the transport pocket of the re-inspection star wheel 15)], 5a, while the defective product sorting valve 16 is operated via the control circuit 13 based on the inspection result of the camera 11. Defective ampoules are transported by defective star foil] 7, transportation pocket 17
Only good ampoules are sent out from the take-out star foil j2 to the conveyance pocket 18a of the star foil 18 for the next process. The %-inspected pan ampoule is transported back from the re-inspection star wheel 15 to the transport pocket 6a of the preparation square wheel 6 via the transport port (hereinafter referred to as "margin") 19a of the intermediate coal feeding star wheel 19 that constitutes the return circuit. Then, the inspection using the inspection drum 8 as described above is repeated once again. Defective ampoules are thrown into a defective product box 21 through a guide 20 along with the defective Star Wheel/L/17.

上記の如きアンプルの検査装置で、検査ドラム8及び全
スターポイ−zl/6,7,12.15’、17.18
.19は上記の如くアンプルが順次搬送されるように図
示し々い駆動装置で同期して駆動される。壕だ、検査ド
ラム8の外側の第3.第4、”l’J 5 、第6の各
位置III 、 IV ’、 V 、 VIに設けたカ
メラ11は、全て制御回路13に接続され、かつ該it
i制御回路13の出力で夫々作動される電磁作動手段2
2.23’!r介して再検査振分バルブ14および不良
品振分バルブ16が作動する。各振分バルブ14.J6
は、閉作動時には例えばバキューム作用でアンプ/1/
を取出スターホイー/L/12の搬送ポケツ)12a内
に滞在せしめる一方、開作動時には例えば圧力エアーの
作用でアンプルを取出スクーホイー/l/12の搬送ボ
ケ″ット12a内よシ外側へ放シ出して再検査スターホ
イール15の搬送ポケット15aまたは不良品スターホ
イー/I/17の搬送ポケツl−17aへ送シ込むよう
にする。上記制御回路13はカウンター等の論理回路よ
シなり、上記全カメラ11より夫々良品、不良品の判別
信号を入力する一方、良品、不良品、再検査品の判定信
号を出力して後述するように、第8図にに設けた回転自
在な下ホルダー9aと、上円板26に設けた回転自在に
して上下摺動自在な上ホルダー9bと、固定板28に設
けた上ホルダー9bの上下位置を制御するカム板29と
を備えて、第3図に示す如く供給スクーホイ〜/v7か
ら検査ドラム8へ送シ込まれてくるアンプルa(Z上下
のホルダー9a、9bで保持する一方、検査ドラム8か
ら取出しスターホイールv12ヘアンプルを送9出す時
にはアンプ)Vを上下ホルダー9a、9b、Jlニジ解
放するようにする。第4図に示す如く、アンプ/L/a
を上下ホルダー92.9b、]ニジ解放する時は、カム
板29に設けた段部30によシ上ホルダー91)ヲ上下
動させてアンプルが上ホルダー9bより確実に離れるよ
うにする。第5図に示す如く、アンプルが検査ドラム8
の上下ホルダーに保持されて第1位箭■に来た時は、高
速回転ベルト用ブー I+ 31でその軸芯の回りにホ
ルダー9と共に高速回転さぜられる。次の第2位置■で
はアンプル′−1第6図に示す如く摩擦ブレーキ32で
示ルダー9と共に回転が停止されて、アンプル内容液の
みが慣性で”回転している状態で一項次第3.第4゜第
5 、 第6の検査位置m、rv、v、■へ送られる。
With the ampoule inspection device as described above, the inspection drum 8 and all star points -zl/6, 7, 12.15', 17.18
.. 19 are synchronously driven by a drive device not shown in the drawings so that the ampoules are sequentially conveyed as described above. It's the trench, the third hole outside the inspection drum 8. The cameras 11 provided at the fourth and sixth positions III, IV', V and VI are all connected to the control circuit 13, and
Electromagnetic actuation means 2 each actuated by the output of the i control circuit 13
2.23'! The re-inspection distribution valve 14 and the defective product distribution valve 16 are operated through the r. Each distribution valve 14. J6
When closed, for example, the amplifier/1/
While the ampoule remains in the transport pocket 12a of the Star Wheel/L/12, during the opening operation, the ampoule is ejected from the transport pocket 12a of the Star Wheel/L/12 to the outside by the action of, for example, pressurized air. The control circuit 13 is similar to a logic circuit such as a counter, and all the cameras 11 are The rotatable lower holder 9a provided in FIG. 8 and the upper As shown in FIG. 3, it is equipped with a rotatable upper holder 9b provided on a disc 26 and capable of vertically sliding, and a cam plate 29 for controlling the vertical position of the upper holder 9b provided on a fixed plate 28. Ampoule a fed from Sukuhoi~/v7 to the inspection drum 8 (while being held by Z upper and lower holders 9a and 9b, when taking out the star wheel v12 hair ampoule from the inspection drum 8, the amplifier) V is placed in the upper and lower holders. 9a, 9b, and Jl.As shown in Figure 4, the amplifier/L/a
When releasing the upper and lower holders 92.9b, the upper holder 91) is moved up and down by the stepped portion 30 provided on the cam plate 29 to ensure that the ampoule is separated from the upper holder 9b. As shown in FIG.
When it is held in the upper and lower holders of 1 and reaches the first position, it is rotated at high speed together with the holder 9 around its axis by the high-speed rotation belt I+ 31. At the next second position (3), as shown in FIG. 6, the ampoule '-1 is stopped from rotating together with the liquid holder 9 by the friction brake 32, and only the liquid in the ampoule is rotating due to inertia. It is sent to the 4th, 5th and 6th inspection positions m, rv, v, ■.

第7図に示す如く各検査位置でアンプル3は駆動プーリ
33で常にその前面がカメラ11の方へ向くように回転
され乍ら、ランプ10で照明されてカメラ11でその静
止画像がとらえられる。アンプルの内容液の中に異物が
ある場合にはその画像がカメラで移動している異物とし
てとらえられて、良品捷たは不良品の判別がなされる。
As shown in FIG. 7, at each inspection position, the ampoule 3 is rotated by the driving pulley 33 so that its front face always faces the camera 11, and is illuminated by the lamp 10 so that the camera 11 captures a still image thereof. If there is a foreign object in the liquid contained in the ampoule, the camera captures an image of the moving foreign object and determines whether the ampoule is good or defective.

各カメラ11は、一定の高感度でアンプル内容液の異物
を検出して一定の判別レベルで各アンプルの合否を判別
する。またアンプル内容液の異物は内容液と共に回転し
て位置が変るので、異物の検出の精度を上げるために、
各カメラ11ゆ検査ドラム8の外側の異る検査値6m 
、 ■、 v 、 V’Iに配置σれている。全容カメ
ラ11のアンプル合否の判別結果が入力される制御回路
13は、@1特定数以上のカメラ、たとえば4台以上の
カメラか−らアンプル合格の判別信号を受けると、当該
アンプルを良品として判定する良品信号出力手段と、第
2特定数以上のカメラ、たとえば4台以上のカメラから
アンプル不合格の判別信号を受けると当該アンプルを不
良品として判定する不良品信号′吊力手段と、上記・第
1特定数以下のカメラでアンプル合格の判別信号を受け
ると共に上記第2特定数未満のカメラでアンプル不合格
の判別信号を受けると、たとえば3台、2台、または1
台のカメラから合格信号を受は残シのカメラから不合、
洛信号を受けると、当該アンプ)Vf検査不明確の再検
査品として判定する再検査信号出力手段を備え、」二記
不良品信り゛出力手段の出力で電磁作動手段23を介し
て不良品振分バルブ16を作動し、該当するアンプルヲ
取出スターホイー/し12から不良品振分スターホイー
ル17へ取シ出すようにする一方、上記再検査信号出力
手段の出力で電磁作動手段22を介して再検査振分バル
ブ14を作動し、該当するアンプルを取出スターホイー
ル12から再検査振分スクーホイー/v15へ取り出す
ようにする。したがって、良品のアンプルは取出スター
ホイー)v12から次工程スターホイール18へ取り出
されると共に不良品のアンプルは不良品振分スターホイ
ー/1/17から案内ガイド20を経て不良品箱21に
取り出される一方、残りの再検査品のアンプルは再検査
振分スターホイ−zv15から中間逆戻スターホイール
19を介して送り出しスターホイール6へ送り戻されて
、今一度供給スターホイー/L/7を経て検査ドラム8
へ送り込まれるようになる。
Each camera 11 detects foreign matter in the liquid contained in the ampoule with a certain high sensitivity and determines whether each ampoule is acceptable or not at a certain discrimination level. In addition, since foreign objects in the liquid in the ampoule rotate with the liquid and change their position, in order to increase the accuracy of detecting foreign objects,
Each camera 11 has a different inspection value 6m on the outside of the inspection drum 8
, ■, v, V'I is placed σ. When the control circuit 13 to which the ampoule pass/fail judgment result from the full-view camera 11 is input receives the ampoule pass judgment signal from a specified number or more cameras, for example, four or more cameras, the control circuit 13 judges the ampoule as a good product. a defective product signal 'hanging force means for determining the ampoule as a defective product when receiving a determination signal indicating that the ampoule is rejected from a second specific number or more cameras, for example, four or more cameras; If the number of cameras below the first specified number receives a signal indicating that the ampoule has passed, and the number of cameras below the second specified number receives a signal indicating that the ampoule has failed, for example, 3, 2, or 1
If you receive a pass signal from one camera, the other camera will fail.
It is equipped with a re-inspection signal output means which determines that the amplifier is a re-inspection product whose Vf test is unclear upon receiving the signal, and the output means outputs a defective product through the electromagnetic actuating means 23. The sorting valve 16 is operated to take out the corresponding ampoule from the take-out star wheel 12 to the defective product sorting star wheel 17, while the re-inspection signal is outputted via the electromagnetic actuating means 22 by the output of the re-inspection signal output means. The inspection distribution valve 14 is operated to take out the corresponding ampoule from the take-out star wheel 12 to the re-inspection distribution schoohy/v15. Therefore, good ampoules are taken out from the take-out star wheel v12 to the next step star wheel 18, and defective ampoules are taken out from the defective product sorting star wheel/1/17 via the guide 20 to the defective product box 21, while the remaining Ampules of re-inspection products are sent from the re-inspection sorting star wheel zv15 via the intermediate return star wheel 19, sent back to the star wheel 6, passed through the supply star wheel/L/7 again, and then transferred to the inspection drum 8.
will be sent to.

しだがって、第8図に示す如く、仕込台3の全検頁すべ
きアンプルは、検査ドラム8の第1回の検査で、良品と
不良品及び不明の再検査品と区分けされ、再検査品のみ
が今一度検査ドラム8の范2回の検査を受けて、再び良
品と不良品及び不明の再検査品と区分けきれ、この再検
査品のみが次の第3回の検査を受けて、さらにその不明
の再検査品がさらに次の第4回の検査をと、順次何回も
検査を繰υ返えすことになる。再検査品が検査ドラム8
で再検査を受ける時には、同1侍に仕込台3から新らた
に始めて検査を受けるアンプルが検査ドラム8へ連続し
て送シ込丑れており、したがって多量のアンプルの検査
が連続して行われることになる。このように再検査品の
アンプルが、検査ドラム8で再検査を受ける毎に、良品
のアンプルと不良品のアンプルが取わ出されで、最後に
は再検査品のアンプルがなくなるようになる。
Therefore, as shown in FIG. 8, the ampoules to be fully inspected on the preparation stand 3 are classified into good, defective, and unknown re-inspected items during the first inspection on the inspection drum 8, and are then re-inspected. Only the inspected items have been inspected twice by the inspection drum 8, and can be separated into good items, defective items, and unknown re-inspected items, and only these re-inspected items have been subjected to the next third inspection. Then, the unknown re-inspected product will undergo a fourth inspection, and the inspection will be repeated many times in sequence. The re-inspected product is inspection drum 8.
When undergoing re-inspection, the same ampoules are continuously fed into the inspection drum 8 from the preparation stand 3, and therefore a large number of ampoules are inspected in succession. It will be done. In this way, every time the ampoules of re-inspected products are re-inspected on the inspection drum 8, good ampoules and defective ampoules are taken out, and finally there are no ampoules of re-inspected products.

今、上記の如く、4台のカメラ11を用い夫々のカメラ
の合否の判別信号によってアンプルの良1台のカメラで
の検知率(ト)を示し、縦軸は4台のカメラでの総合検
知率(至)を示す。第9図において、各曲線に1. K
2. K3. K4. S2. S3.S4は次のよう
な場合である。
Now, as mentioned above, four cameras 11 are used, and the detection rate (g) of one ampoule is shown based on the pass/fail discrimination signal of each camera, and the vertical axis is the overall detection rate of the four cameras. Indicates the rate (to). In FIG. 9, each curve has 1. K
2. K3. K4. S2. S3. S4 is the following case.

K1 ・・・・・・4台のカメラの中で、1台のカメラ
でもアンプルが不合格であると検知すると、当該アンプ
/Vを不良品と判定する一方、他のアンプルを全〆で良
品と判定した場合の総合検知率を示す。
K1...If even one of the four cameras detects that an ampoule is rejected, the amplifier/V in question is determined to be a defective product, while all other ampoules are determined to be non-defective. This shows the overall detection rate when it is determined that

K2・・・・・・4台のカメラの中で、2台以上のカメ
ラがアンプ)Vf不合格であると検知した場合は、当該
アンプ/I/を不良品と判定する一方、他のアンプルを
全て良品と判定した場合の総合検知率を示す。
K2...If two or more of the four cameras detect that the amplifier/I/ is defective, the amplifier/I/ in question is determined to be defective, while other amplifiers Shows the overall detection rate when all are judged as non-defective.

K3・・・・・・4台のカメラの中で、3台以上のカメ
ラが蒼ンプ)Vを不合格であると検知した場合は、当該
アンプlVf不良品と判定する一方、他のアンプルを全
〆て良品と判定した場合の総合検知率を示す。
K3...If three or more cameras out of the four cameras detect that the ampule (blue lamp)V has failed, the corresponding amplifier lVf is determined to be defective, while other ampoules are judged to be defective. Shows the overall detection rate when all products are determined to be non-defective.

K4・・・・・・4台のカメラ全部がアンプ/L/ヲ不
合格であると検知した場合は、当該アンプルを不良品と
判定する一方、他のアンプ)Vf全て良品き判定した場
合の総合検知率を示す。
K4...If all four cameras detect that the amplifier/L/wo has failed, the ampoule is determined to be defective, while the other amplifiers) Vf are all determined to be good. Shows the overall detection rate.

S2・・・・・・4台のカメラの中で、4台のカメラ全
部がアンプ)I/f合格であると検知した場合は当該ア
ンプルを良品と判定する一方、2台以上のカメラがアン
プ)Ltf不合格であると検知した場合は当該アンプル
を不良品と判定し、かつ1台のカメラのみがアンプルを
不合格であると検知した場合には、当該アンプ)Vf再
検査品と判定した場合の総合検知率を示す。
S2: Out of the four cameras, if all four cameras are detected to have passed the amplifier I/F, the ampoule is determined to be good, while two or more cameras are detected to have passed the amplifier I/F. ) If it is detected that the ampoule fails Ltf, the ampoule is determined to be defective, and if only one camera detects the ampoule as failing, the ampoule is determined to be re-inspected. Shows the overall detection rate for the case.

S3 ・・・・・・4台のカメラの中で、4台のカメラ
全部がアンプ/L/ヲ合格であると検知した場合は当該
アンプ)L/f良品と判定する一方、3台以上のカメラ
がアンプルを不合格であると検知した場合は当該アンプ
)Vf不良品と判定し、かつ1台または2台のカメラが
アンプ)Vf不合格とした場合には、湧該アンプルを再
検査品と判定した場合の総合検知率を示す。
S3...If all four cameras among the four cameras are detected to have passed the amplifier/L/f, the amplifier) is determined to be good, but if three or more If the camera detects that the ampoule has failed, the ampoule is judged to be a defective product, and if one or two cameras have detected that the ampoule has failed the amplifier) Vf, the ampoule is re-inspected. This shows the overall detection rate when it is determined that

S4・・・・・・4台のカメラの中で、4台のカメラ全
部がアンプ)v1合格であると検知した場合は当意し、
これらを本発明の如き、四台のカメラで54の検査、再
検査を繰り返して、どの位の数のアンプルが不良品とし
て判定されるかどうかをみる一方、一台のカメラで検査
して80%の確率で検出される異物を持つアンプルを1
00本用意し、これらを本発明の如き、四台のカメラで
54の検査、再検査を繰り返してどの位の数のアンプル
が不良品として判定されるのかどうかをみると、各数回
の実例の結果、次の如くなった。
S4: Out of the four cameras, if all four cameras are detected to have passed the amplifier) v1,
These are inspected and re-inspected 54 times using four cameras as in the present invention to see how many ampoules are determined to be defective. Ampoules with foreign substances detected with a probability of 1
00 ampoules are prepared, and they are inspected and re-inspected 54 times using four cameras as in the present invention, to see how many ampoules are determined to be defective. The result was as follows.

第1回検査    第2回検査 第3回検査      第4回検査 第5回検査 上記の如く5回の検査を繰り返すことによって、良品は
9950%、不良品は0.01%となった。
1st Inspection 2nd Inspection 3rd Inspection 4th Inspection 5th Inspection By repeating the inspection 5 times as described above, the percentage of non-defective products was 9950%, and the percentage of defective products was 0.01%.

また、多数の良品のアンプルの中に80%の異物を内容
液に持つアンプルを100本混入させて上記S4の検査
を繰り返すと次の如くなった。
Further, when 100 ampoules having 80% foreign matter in the liquid content were mixed into a large number of good ampoules and the test in S4 was repeated, the results were as follows.

第1回検査    第2回検査 @3回検査    第4回検査 第5回検査      第6回検査 第7回検査      第8回検査 第9回検査 上記のhll < 9回の検査を繰り返すことによって
、良品が036%、不良品は9879%となった。
1st inspection 2nd inspection @ 3rd inspection 4th inspection 5th inspection 6th inspection 7th inspection 8th inspection 9th inspection 036%, and 9879% of defective products.

したがって、上記の2例共に良品の回収率が良くなると
同時に不良品の見逃しが少くなって、高感度の検査を通
った高品質のアンプルを得ること
Therefore, in both of the above cases, the recovery rate of good products is improved, and at the same time, defective products are less likely to be overlooked, making it possible to obtain high-quality ampoules that have passed highly sensitive inspection.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は未発明(こかかるアンプル検査装置の平面図、
第2図は第1図の一部の縦断面図、第3図は第2図の一
部の斜視図、第4図は第3図の一部の側面図、第5図は
第1図の一部の拡大平面図、第6図は第5図のA−A線
における断面図、第7図は第5図の13−B線における
断面[叉、第8図は検査回数の説明図、第9図は検知率
の説明図である。 8・・・検査ドラム、11・・・カメラ、J2・・・取
出しスターホイル、13・・・制御回路、14・・・再
検査振分バルブ、15・・・再検査スターホイル。 特許出願人 武田薬品工業株式会社 代理人弁理士 青 山 葆ほか2名 第3図 第4図 第5図 R 第6図 第9図 149nny?57!(1)&lU’P %手続補正書
(自発) 昭和58年5月17日 特許庁長官殿 1、事件の表示 昭和58年特許願第58502号 2、発明の名称 アンプルの検査装置 3、補正をする者 事件との関係 特許出願人 4、代理人 〒541
Figure 1 is a plan view of an uninvented ampoule inspection device;
Figure 2 is a vertical sectional view of a part of Figure 1, Figure 3 is a perspective view of a part of Figure 2, Figure 4 is a side view of a part of Figure 3, and Figure 5 is a side view of part of Figure 1. FIG. 6 is a cross-sectional view taken along line AA in FIG. 5, FIG. 7 is a cross-sectional view taken along line 13-B in FIG. , FIG. 9 is an explanatory diagram of the detection rate. 8... Inspection drum, 11... Camera, J2... Takeout star foil, 13... Control circuit, 14... Re-inspection distribution valve, 15... Re-inspection star foil. Patent applicant: Takeda Pharmaceutical Company Limited Patent attorney: Aoyama Aoyama and two others Figure 3 Figure 4 Figure 5 R Figure 6 Figure 9 149nnny? 57! (1) &lU'P % Procedural Amendment (Voluntary) May 17, 1988 Mr. Commissioner of the Japan Patent Office 1. Indication of the case 1985 Patent Application No. 58502 2. Name of the invention Ampoule inspection device 3. Amendment Relationship with the patent applicant case 4, agent 〒541

Claims (1)

【特許請求の範囲】[Claims] (1)アンプ)Vf投入位置から少くとも1ケ所以上の
検査位置を経て取出位置へ搬送する搬送手段と、上記検
査位置で夫々アンプルを検査して良品と不良品に判別す
る複数個の検査手段と、第1特定数以上の検査手段が良
品と判別すると良品と判定し、かつ第2特定数以下の検
査手段が良品と判別すると不良品と判定し、さらに第1
特定数未満で・第2特定数こえる検査手段が良品と判断
すると再検査品と判定する判定手段と、該判定手段の出
力で再検査品と判定したアンプ/L/を取出“位置から
投入位置または検査位置へ戻す回帰手段を備えて、アン
プルの再検査を繰シ返し行うようにしたことを特徴とす
るアンプルの検査装置。
(1) Amplifier) A conveyance means that transports the ampoule from the Vf input position to the take-out position via at least one inspection position, and a plurality of inspection means that inspects each ampoule at the above inspection position to determine whether it is a good product or a defective product. The product is determined to be non-defective when a first specified number or more of the inspection means determine the product to be non-defective, and the product is determined to be defective when the second specific number or less inspection means determine the product to be non-defective.
Judgment means for determining the product to be re-inspected when the inspection means determines that the product is non-defective when the number is less than a specific number and exceeds a second specific number; Alternatively, an ampoule inspection device characterized in that the ampoule is repeatedly re-inspected by being provided with return means for returning the ampoule to the inspection position.
JP58058502A 1983-04-01 1983-04-01 Ampule examining apparatus Granted JPS59183351A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58058502A JPS59183351A (en) 1983-04-01 1983-04-01 Ampule examining apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58058502A JPS59183351A (en) 1983-04-01 1983-04-01 Ampule examining apparatus

Publications (2)

Publication Number Publication Date
JPS59183351A true JPS59183351A (en) 1984-10-18
JPH0317089B2 JPH0317089B2 (en) 1991-03-07

Family

ID=13086189

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58058502A Granted JPS59183351A (en) 1983-04-01 1983-04-01 Ampule examining apparatus

Country Status (1)

Country Link
JP (1) JPS59183351A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912318A (en) * 1987-08-04 1990-03-27 Kanebo Ltd. Inspection equipment for small bottles
JPH04309851A (en) * 1991-04-05 1992-11-02 Hitachi Ltd External appearance/foreign matter composite type inspecting device
EP0585821A1 (en) * 1992-08-29 1994-03-09 Kirin Techno-System Corporation Container inspecting apparatus
JP2004522960A (en) * 2001-02-02 2004-07-29 ブリストル−マイヤーズ・スクイブ・ファーマ・カンパニー Apparatus and method for online monitoring of fluorinated material in vial headspace
JP2013198858A (en) * 2012-03-23 2013-10-03 Fuji Electric Co Ltd Bubble removing apparatus, foreign matter inspection device with the same, and bubble removing method
JP2015125016A (en) * 2013-12-25 2015-07-06 株式会社 日立産業制御ソリューションズ Inspection apparatus
JP2020024121A (en) * 2018-08-06 2020-02-13 澁谷工業株式会社 Article inspection device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1630550A1 (en) * 2004-08-27 2006-03-01 Moller & Devicon A/S Methods and apparatuses of detecting foreign particles or faults in a plurality of filled containers

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912318A (en) * 1987-08-04 1990-03-27 Kanebo Ltd. Inspection equipment for small bottles
JPH04309851A (en) * 1991-04-05 1992-11-02 Hitachi Ltd External appearance/foreign matter composite type inspecting device
EP0585821A1 (en) * 1992-08-29 1994-03-09 Kirin Techno-System Corporation Container inspecting apparatus
JP2004522960A (en) * 2001-02-02 2004-07-29 ブリストル−マイヤーズ・スクイブ・ファーマ・カンパニー Apparatus and method for online monitoring of fluorinated material in vial headspace
JP2013198858A (en) * 2012-03-23 2013-10-03 Fuji Electric Co Ltd Bubble removing apparatus, foreign matter inspection device with the same, and bubble removing method
JP2015125016A (en) * 2013-12-25 2015-07-06 株式会社 日立産業制御ソリューションズ Inspection apparatus
JP2020024121A (en) * 2018-08-06 2020-02-13 澁谷工業株式会社 Article inspection device

Also Published As

Publication number Publication date
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