JPS59172244A - Notch detecting process of disc - Google Patents

Notch detecting process of disc

Info

Publication number
JPS59172244A
JPS59172244A JP4604583A JP4604583A JPS59172244A JP S59172244 A JPS59172244 A JP S59172244A JP 4604583 A JP4604583 A JP 4604583A JP 4604583 A JP4604583 A JP 4604583A JP S59172244 A JPS59172244 A JP S59172244A
Authority
JP
Japan
Prior art keywords
disc
pixel
notch
interest
peripheral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4604583A
Other languages
Japanese (ja)
Other versions
JPS6245694B2 (en
Inventor
Makoto Fukuda
真 福田
Makoto Asakawa
誠 浅川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP4604583A priority Critical patent/JPS59172244A/en
Publication of JPS59172244A publication Critical patent/JPS59172244A/en
Publication of JPS6245694B2 publication Critical patent/JPS6245694B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means

Abstract

PURPOSE:To detect the notch of a disc rapidly and accurately by a method wherin a curvature fluctuation on the circumference of a disc at a specified distance is pursued after along the periphery of the disc to detect a straight line part out of circular part. CONSTITUTION:A marking peripheral image element detector 7 detects an optional peripheral image element P0 out of peripheral image elements on the circumference of a disc 2. Next a peripheral equidistant image element detector 8 as a means to detect two peripheral image elements P1 and P2 at a specified distance (r) from the reference image element P0 outputs location data of said elements P1 and P2 from the reference image element P0. A straight line discriminator 9 calculates a supplementary angle delta met by segments P0-P1 and P0-P2 in terms of the location data on three image elements comprising the reference image element P0, said peripheral equidistant image elements P1 and P2 to output a true datum in case the image elements P0, P1 and P2 are on a straight line with the supplementary angle delta=0 while a final processor 10 discriminates the direction of a notch of the straight line part i.e. the attitude of the disc 2. When the datum is false, said output may be forward to a marking image element shifting processor 11 to set up a new marking image element for detecting a truly straight line part.

Description

【発明の詳細な説明】 本発明は、半導体素子の製造に用いる物体で直線状の切
欠を有する円板形状体の直線部分と円形部分とから成る
物体を撮像することにより得らnた画像情報より、その
直線部分の方向を検出する方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides image information obtained by imaging an object used in the manufacture of semiconductor devices, which consists of a straight part and a circular part of a disc-shaped body having a straight notch. More specifically, the present invention relates to a method of detecting the direction of the straight line portion.

円板形状体に半導体素子の識別標識を読み取るなどに際
しては、円板形状体の基準線となる精確な切欠の方向が
把握されねばならない。従来この円板形状体の基準線を
把握するためには、第1図に示すように直線状の切欠l
を有する円板形状体2を撮像装置3でとらえ、との撮像
装置3からの出力信号全前処理部4にて第2図の如く円
板形状体20部分でON、それ以外でOFFの2値画像
情報に変換し、この前処理部4の出力である2値画像情
報全記憶部5に取シ込み、姿勢検出処理部6では記憶部
5に取り込ま扛た2値画像情報から円板形状体2の中心
を算出すると共に、円板形状体2と同径の円形の辞書パ
ターンの中心と算出された円板形状体2の中心とを一致
させ、切欠1に該当する不一致部分を求め(ミスマツチ
ング法)ることにより切欠1の直線部分の方向を求めて
いる。
When reading an identification mark of a semiconductor element on a disc-shaped body, it is necessary to know the precise direction of the notch, which serves as a reference line of the disc-shaped body. Conventionally, in order to grasp the reference line of this disc-shaped body, a linear notch L was used as shown in Figure 1.
The image pickup device 3 captures the disk-shaped body 2 having The binary image information output from the pre-processing section 4 is converted into value image information, and the entire binary image information is taken into the storage section 5.The posture detection processing section 6 calculates the disc shape from the binary image information taken into the storage section 5. Calculate the center of the body 2, match the center of the circular dictionary pattern with the same diameter as the disc-shaped body 2, and find the mismatched part corresponding to the notch 1 ( The direction of the straight part of the notch 1 is determined by the mismatching method.

ところが、かかる切欠検出方法にあっては、姿勢検出処
理部6における処理、すなわち円板形状体2の中心全算
出するための処理と、円板形状体2と辞書パターンとの
ミスマツチングを検出するための処理とは、いずれにお
いても画面上の全ての画素に対して中心であるか否かを
区別しミスマツチングであるか否かを区別するという処
理を行なうため、処理演算が膨大となシ処理時間が非常
に掛るという欠点があった。
However, in this notch detection method, the processing in the posture detection processing unit 6, that is, the processing for calculating the entire center of the disc-shaped body 2, and the processing for detecting mismatching between the disc-shaped body 2 and the dictionary pattern are required. In both cases, the processing requires a huge amount of processing time and requires a huge amount of processing time, as it involves distinguishing between all pixels on the screen whether they are centered or not, and whether or not they are mismatched. The disadvantage was that it took a lot of time.

また、円板形状体2には半導体素子形成用の様々なパタ
ーンが記入さ扛るため、円板形状体2の表面パターンが
撮像後の2値画像変換時にノイズとなって生起し、円板
形状体2の中心位置に正確に算出することが困難であっ
た。
In addition, since various patterns for forming semiconductor elements are written on the disc-shaped body 2, the surface pattern of the disc-shaped body 2 becomes noise during binary image conversion after imaging, and the disc-shaped body 2 It was difficult to accurately calculate the center position of the shaped body 2.

本発明は上述の欠点を除去するため、円板形状体の外周
の曲率変化を円板形状体の周縁に沿って一定距離ごとに
追跡して行くことによ〕円形部分から直線部分を見出す
ようにして、切欠を高速かつ精確に検出した円板形状体
の切欠検出方法の提供を目的とする。
In order to eliminate the above-mentioned drawbacks, the present invention detects a straight part from a circular part by tracing the change in curvature of the outer periphery of the disc-shaped body at regular intervals along the periphery of the disc-shaped body. It is an object of the present invention to provide a method for detecting notches in a disc-shaped body, which detects the notches at high speed and accurately.

かかる目的を達成する本発明は、外周の一部に直線状の
切欠全有する円板形状体全撮像装置でとらえ、この撮像
装置の出力信号を前処理部により2値画像情報に変換後
記憶部に収納し、この記憶部からの2値画像情報よ)上
記円板形状体の切欠を検出する方法において、上記円板
形状体の周縁画素の一つを注目画素として、この注目画
素によ郵上記周縁画累を追跡しながら、上記注目画素か
ら一定距離にある二つの周縁画素を見い出し、それら三
つの周縁画素が直線上にあることを見い出すことによシ
円板形状体の切欠を検出することを特徴とする。
The present invention achieves this object by capturing an entire disk-shaped body having a linear notch in a part of its outer periphery, converting the output signal of this imaging device into binary image information by a preprocessing unit, and then storing the image information in a storage unit. In the method for detecting a notch in the disc-shaped body (using the binary image information stored in While tracking the peripheral image, two peripheral pixels located at a certain distance from the pixel of interest are found, and by finding that these three peripheral pixels are on a straight line, a notch in the disc-shaped body is detected. It is characterized by

本発明による切欠検出方法は、原理的には、第3図に示
すように、円板形状体2の外周の曲率を、円板形状体2
の注目する周縁画素(注目画素)Poよシ等距離rにあ
る二つの周縁画素Pl。
In principle, the notch detection method according to the present invention, as shown in FIG.
Two peripheral pixels Pl are equidistant r from the peripheral pixel of interest (pixel of interest) Po.

P、の成す角P、 、 Po、 P、の補角6により代
表させ、円板形状体20周縁に沿って、一定距離rごと
に補角δを検出し、δ=0、すなわち、周縁画素P、 
、 Po、 P、が直線となる条件よシ円鈑形状体2の
直線部分の方向を見い出すものである。
The angle P formed by P, , Po, is represented by the supplementary angle 6 of P, and the supplementary angle δ is detected at every fixed distance r along the circumference of the disc-shaped body 20, and when δ=0, that is, the peripheral pixel P,
, Po, and P are straight lines to find the direction of the straight line portion of the circular plate-shaped body 2.

以下、第3図と共に第4図、第5図を参照して本発明の
詳細な説明する。第4図において、注目周縁画素検出部
7は円板形状体2の外周に存在する周縁画素のうち任意
の一つの周縁画素(注目画素)Poを見い出すための手
段である。
Hereinafter, the present invention will be described in detail with reference to FIGS. 4 and 5 as well as FIG. 3. In FIG. 4, the peripheral pixel of interest detection unit 7 is means for finding an arbitrary peripheral pixel (pixel of interest) Po among the peripheral pixels existing on the outer periphery of the disc-shaped body 2.

具体的には、たとえば撮像画面の左端中央の画素S1よ
シ、右端中央画素S2へ向って画素を水平に走査しつつ
検出して行き、円板形状体2以外の画面に当る2値画像
情報OFFから円板形状体2に描る2値画像情報ONに
変化する最初の変化点を見い出してその画素(注目画素
)Poの位置情報を出力する。
Specifically, for example, pixels are detected while horizontally scanning from the center pixel S1 at the left end of the imaging screen to the center pixel S2 at the right end, and binary image information corresponding to the screen other than the disk-shaped body 2 is detected. The first point of change at which the binary image information drawn on the disc-shaped body 2 changes from OFF to ON is found and the position information of that pixel (target pixel) Po is output.

ついで、周縁等距離画素検出部8は注目画素POよシ一
定距離rに存在する二つの周縁画素P。
Next, the peripheral equidistant pixel detection unit 8 detects two peripheral pixels P existing at a constant distance r from the pixel of interest PO.

およびPie見い出す手段で、注目画素POに対する周
縁等距離画素P1. P2の位置情報を出力する。
and Pie, the peripheral equidistant pixel P1 . Output the position information of P2.

具体的には、第5図に示すように予め一つの中心画素0
から一定距離rにある画素からなる円形パターンを作成
しておき、円形パターンの中心画素0’(5注目画素P
oに一致させたときの円形パターンと円板形状体2との
交点として周縁等距離画素P1.P、を求める。この周
縁画素P、 、 P。
Specifically, as shown in FIG.
Create a circular pattern consisting of pixels located at a certain distance r from
The peripheral equidistant pixel P1. Find P. These peripheral pixels P, , P.

の位置の決定は中心となる注目画素Poが決まっておシ
、シかも円形パターンも設定しであるので簡単にかつ直
ちに求められる。
The position can be determined easily and immediately because the central pixel of interest Po is determined and a circular pattern is also set.

直線判断部9は注目画素Poおよび周縁等距離画素P1
 * Plからなる三つの画素位置情報により、Poと
P、の線分と、PoとPlの線分とが成す補角δをη出
し、補角δ=0となって画素P、 、 P、 、 Pl
が直線上にあるとき真の情報を出力し、補角δNOとな
って直線上に典[いとき偽の情@を出力する。終了処理
部10は真の情報が直線判断部9から出力されたとき直
線部分の切欠きの方向すなわち円板形状体2の姿勢を得
る。
The straight line determining unit 9 selects the pixel of interest Po and the peripheral equidistant pixel P1.
* Based on the three pixel position information consisting of Pl, calculate the supplementary angle δ formed by the line segment between Po and P and the line segment between Po and Pl, and the supplementary angle δ becomes 0, and the pixels P, , P, , Pl
When is on a straight line, it outputs true information, and when it is a supplementary angle δNO and is on a straight line, it outputs false information @. When the true information is output from the straight line determining unit 9, the termination processing unit 10 obtains the direction of the notch in the straight line portion, that is, the attitude of the disc-shaped body 2.

直線判断部9からの出力が偽の情報であるとき、この出
力は注目画素移動処理部11に至る。
When the output from the straight line determining section 9 is false information, this output reaches the pixel of interest movement processing section 11.

注目画素移動処理部11は偽の情報に基づく画素P。、
 p、 、 p、が直線部分でないので更に直線部分を
捜すため新たな注目画素を設定する手段である。ここで
、新たな注目画素を決めるに際しては、直線部分でない
ことが判明した画素のうち周縁等距離画素PtすPg 
y新たな注目画素とする。すなわち、注目画素移動処理
部11では新たな注目画素であるPl又はPlの画素位
置情報を出力する。注目画素として画素Pl又はPlの
いず4、にするかは、円板形状体の周縁を時計回りに追
跡するか、反時計回シに追跡するかで定まシ、いず牡の
選択も可能である。また、この注目画素の決定方法とし
ては、画面の端から走査を行なう最初の注目画素の決定
以外では円形パターンと周縁画素との交点のいずれかを
注目画素としているのであるが、この方法によらず注目
画素は全て画面の端から走査して浅定するようにしても
よい。
The pixel of interest movement processing unit 11 selects a pixel P based on false information. ,
Since p, , p, is not a straight line part, this is a means of setting a new pixel of interest in order to further search for a straight line part. Here, when determining a new pixel of interest, among the pixels that are found to be not in a straight line, the peripheral equidistant pixels Pt, Pg
y as a new pixel of interest. That is, the pixel of interest movement processing section 11 outputs Pl, which is a new pixel of interest, or pixel position information of Pl. Whether to use pixel Pl or Pl 4 as the pixel of interest depends on whether the circumference of the disc-shaped object is tracked clockwise or counterclockwise, and either can be selected. It is possible. Furthermore, this method of determining the pixel of interest is that, except for determining the first pixel of interest that is scanned from the edge of the screen, one of the intersections between the circular pattern and the peripheral pixels is set as the pixel of interest. First, all pixels of interest may be scanned from the edge of the screen to narrowly determine the pixels of interest.

上記の手法は、半導体基板のように、円板形状体に直線
状の切欠のあるどのような対象にも用いることが可能な
うえに、円板形状体が画面上の任意の位置にある場合に
も、その切欠の方向を高速に検出することができるとい
う特徴を有する。
The above method can be used for any object that has a linear cutout in a disc-shaped body, such as a semiconductor substrate, and can also be used when the disc-shaped body is located at an arbitrary position on the screen. It also has the feature that the direction of the notch can be detected at high speed.

以上説明したように本発明にょnば隻手導体基板のごと
きその形状が円形部分と直線部分とから構成さnている
対象物の特徴を有効に利用し、注目画素と周縁等距離画
素との決定に特異性を有して、従来のように円板形状体
の中心算出、パターンのミスマツチングの検出など多量
の処理を必要とせず、円板形状体の画像から高速かつ正
確に切欠の方向を検出できる。このため、移動中の円板
形状体の姿勢検出にも用いることができ、しかも対象物
の大きさが変化しても全く同じ手法が取れる。
As explained above, the present invention makes effective use of the characteristics of an object such as a one-handed conductor board whose shape is composed of a circular part and a straight part, and allows It has specificity in determination, and does not require a large amount of processing such as calculating the center of a disc-shaped object or detecting pattern mismatching, as required in the past, and can quickly and accurately determine the direction of a notch from an image of a disc-shaped object. Can be detected. Therefore, it can be used to detect the attitude of a moving disc-shaped body, and the same method can be used even if the size of the object changes.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の切欠検出方法の説明のための構成図、第
2図は画面に対応する2値画像情報の一例の説明図、第
3図は本発明の詳細な説明図、第4図は本発明の切欠検
出方法の一例を説明する回路ブロック図、第5図は円形
パターンの例を示す説明図である。 図  面  中、 3は撮像装置、 4は前処理部、 5は記憶部、 7は注目周縁画素検出部、 8は周縁等距離画素検出部、 9は直線判断部、 10は終了処理部、 11は注目画素移動処理部、 Poは注目画素、 Pl、Plは周縁等距離画素である。 特許出願人 日本電信電話公社 代   理   人 弁理士光石士部 (他1名)
Fig. 1 is a configuration diagram for explaining a conventional notch detection method, Fig. 2 is an explanatory diagram of an example of binary image information corresponding to a screen, Fig. 3 is a detailed explanatory diagram of the present invention, and Fig. 4 5 is a circuit block diagram illustrating an example of the notch detection method of the present invention, and FIG. 5 is an explanatory diagram showing an example of a circular pattern. In the figure, 3 is an imaging device, 4 is a preprocessing unit, 5 is a storage unit, 7 is a peripheral pixel of interest detection unit, 8 is a peripheral equidistant pixel detection unit, 9 is a straight line determination unit, 10 is an end processing unit, 11 is a pixel of interest movement processing unit, Po is a pixel of interest, and Pl and Pl are peripheral equidistant pixels. Patent applicant Nippon Telegraph and Telephone Public Corporation representative Patent attorney Shibu Mitsuishi (and one other person)

Claims (3)

【特許請求の範囲】[Claims] (1)  外周の一部に直線状の切欠含有する円板形状
体を撮像装置でとらえ、との撮像装置の出力信号を前処
理部によシ2値画像情報に変換後記憶部に収納し、この
記憶部からの2値画像情報よシ上記円板形状体の切欠を
検出する方法において、上記円板形状体の周縁画素の一
つを注目画素として、この注目画素によシ上記周縁画素
を追跡しながら、上記注目画素から一定距離にある二つ
の周縁画素を見い出し、それら三つの周縁画素が直線上
にあることを見い出すことによシ円板形状体の切欠を検
出することを特徴とした円板形状体の切欠検出方法。
(1) A disk-shaped object containing a linear notch on a part of its outer periphery is captured by an imaging device, and the output signal of the imaging device is converted into binary image information by a preprocessing section and stored in a storage section. In the method of detecting a notch in the disc-shaped body using binary image information from the storage unit, one of the peripheral pixels of the disc-shaped body is set as a pixel of interest, and this pixel of interest is used to detect the notch of the disc-shaped body. The present invention is characterized by detecting a notch in a disc-shaped body by finding two peripheral pixels located at a certain distance from the pixel of interest while tracking the above-mentioned pixel, and finding that these three peripheral pixels are on a straight line. A method for detecting notches in disc-shaped objects.
(2)上記特許請求の範囲第1項記載の円板形状体の切
欠検出方法において、注目画素から一定距離に′ある二
つの周縁画素を見い出すに際し、あらかじめ、注目画素
から一定距離にある画素から成る円形パターンを構成し
ておき、その円形パターンの中心を注目画素に一致させ
、この円形パターンの画素と円板形状体の周縁画素との
交点を求めることによシ、二つの周縁画素を求めるよう
にした円板形状体の切欠検出方法。
(2) In the method for detecting a notch in a disc-shaped body according to claim 1, when finding two peripheral pixels located at a certain distance from the pixel of interest, in advance, from a pixel located at a certain distance from the pixel of interest, A circular pattern is constructed, the center of the circular pattern is aligned with the pixel of interest, and two peripheral pixels are found by finding the intersection between the pixel of this circular pattern and the peripheral pixel of the disc-shaped object. A method for detecting a notch in a disc-shaped object.
(3)上記特許請求の範囲第1項記載の円板形状体の切
欠検出方法において、三つの周縁画素が直線上にあるこ
とを見い出すまでの注目画素の特定に当っては、注目画
素から一定の距離におる二つの周縁画素の一つを次の注
目画素とした円板形状体の切欠検出方法。
(3) In the method for detecting a notch in a disc-shaped body according to claim 1 above, in identifying the pixel of interest until it is found that the three peripheral pixels are on a straight line, A method for detecting a notch in a disc-shaped body using one of two peripheral pixels at a distance of as the next pixel of interest.
JP4604583A 1983-03-22 1983-03-22 Notch detecting process of disc Granted JPS59172244A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4604583A JPS59172244A (en) 1983-03-22 1983-03-22 Notch detecting process of disc

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4604583A JPS59172244A (en) 1983-03-22 1983-03-22 Notch detecting process of disc

Publications (2)

Publication Number Publication Date
JPS59172244A true JPS59172244A (en) 1984-09-28
JPS6245694B2 JPS6245694B2 (en) 1987-09-28

Family

ID=12736054

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4604583A Granted JPS59172244A (en) 1983-03-22 1983-03-22 Notch detecting process of disc

Country Status (1)

Country Link
JP (1) JPS59172244A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0313466A2 (en) * 1987-10-20 1989-04-26 Fujitsu Limited Wafer positioning apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0313466A2 (en) * 1987-10-20 1989-04-26 Fujitsu Limited Wafer positioning apparatus

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JPS6245694B2 (en) 1987-09-28

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