JPS59160892A - Prom device - Google Patents
Prom deviceInfo
- Publication number
- JPS59160892A JPS59160892A JP58033055A JP3305583A JPS59160892A JP S59160892 A JPS59160892 A JP S59160892A JP 58033055 A JP58033055 A JP 58033055A JP 3305583 A JP3305583 A JP 3305583A JP S59160892 A JPS59160892 A JP S59160892A
- Authority
- JP
- Japan
- Prior art keywords
- vpp
- level
- theta
- address
- writing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
Abstract
Description
【発明の詳細な説明】
本発明はF ROMに関し2、特に紫外線消去型PRO
Mに門するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an F ROM 2, particularly an ultraviolet erase type PRO.
It belongs to M.
通常、I)ROMにテークを誉込む饗合、1アドレスを
選ひ、1ワ一ド分のテークを設定し、番込みパルス4F
=’号を印加する事によってテークの實込みが行なわれ
る。この時選択されたアドレスに対応するメモリセル群
(1ワ一ド分のメモリセル)の制御ゲート電圧には豊込
み電圧(以後vpp’と略記する)が印加されこのVl
)り’によって生じる高′亀界によシ高工不ルキー届子
をフローテインクケート内に引込み情報を記憶する。Normally, I) When writing a take to ROM, select one address, set a take for one word, and set the number pulse to 4F.
The take is actually loaded by applying the =' sign. At this time, a rich voltage (hereinafter abbreviated as vpp') is applied to the control gate voltage of the memory cell group (memory cells for one word) corresponding to the selected address, and this Vl
) The information generated by the high-speed turtle world is stored in the floating cage.
その他の非選択アドレス群は書込み製作か生じない様に
する為、これらのアドレス群に対応するメモリセル群の
制御ゲート電圧にはθ■近い電圧のみ印加される。卸ち
N(自然数)ワードのメモリ容量のF ROMが簀込み
状態にある時はlワード分のメモリセル群の制御ケート
[のみ、vpp′が印加をれ、その他のN−1ワ一ド分
のメモリセル群の制御ゲートにはθV近い電圧が印加さ
れる。In order to prevent programming from occurring in other non-selected address groups, only voltages close to θ■ are applied to the control gate voltages of the memory cell groups corresponding to these address groups. When the F ROM with a memory capacity of N (natural number) words is in the storage state, the control gate of the memory cell group for l words is applied, and the other N-1 words are controlled. A voltage close to θV is applied to the control gates of the memory cell group.
メモリセルの制御ゲートの′電圧を制御する回路は通常
第1図に示す回路か用いられ、メモリセル1の制御ゲー
ト、すなわちワード νVLの゛0.圧ケθV近くする
為には■phテプレッション型違荷トランジスタ2→デ
プレッション型制何」トランジスタ3→テコードを形成
1゛るトランジスタ4→GNDに電流を流す必賛がある
。The circuit shown in FIG. 1 is usually used as a circuit for controlling the voltage of the control gate of the memory cell 1, that is, the voltage of the control gate of the memory cell 1, that is, the voltage of the word νVL. In order to make the pressure close to θV, it is necessary to flow a current from PH depletion type transistor 2 to depletion type transistor 3 to transistor 4 to form a tecode to GND.
従って、メモリ容量が増加するに従い、非選択のメモリ
セル群の書込み回路に流れる電流が増加シフ、好ましく
ない。例λば書込み回路の電流が増加すると、有込み電
圧供給ラインの配線幅を太くする必殺が侑り1、又書込
み電圧の供給電源の容量も大きくする必要があり、更に
は、FROMチップの電力による発熱が大きく成る等の
不都合が生じる。Therefore, as the memory capacity increases, the current flowing through the write circuit of the unselected memory cell group increases, which is undesirable. For example, when the current of the write circuit increases, it becomes necessary to increase the wiring width of the embedded voltage supply line1, and the capacity of the power supply for the write voltage also needs to be increased, and furthermore, the power of the FROM chip increases. This causes inconveniences such as increased heat generation.
本づ〔明は上Ic健釆の馳込み方式の間厨点をにみメモ
リ谷量が増加しても非煉択状悪の瞥込与矩力がt・ン7
加し2いP i< (邑4ケ折供する都を目的とするも
のである。The book is that even if the amount of memory increases while looking at the point during the rush method of the above-mentioned Ic, the power of looking at the evil in the form of non-reduction is t・n7
Add 2 P i < (It is intended to be a capital that serves 4 villages.
即ち本等、、明Fi彰込み用高%7圧が、沙数個の並列
接続さft f(スイッチトランジスタを介し7て豊込
み回路部例供給され、酌記轡数個のスイッチトランジス
タが、アドレス信号によって制御さi’Lる1M回路を
具備した蜘を41とするものであり、k込み状態にある
領域にのみ誓込与電圧を供給し、ヤの他の領域の非選択
晩に広扛る僑込み電流を無くするもので夕、る。In other words, the high voltage of 7% is connected in parallel with several ft f (switch transistors are supplied through the 7 circuits, and several switch transistors are connected in parallel). 41 is a spider equipped with a 1M circuit controlled by an address signal, which supplies a fixed voltage only to the area in the crowded state, and spreads it to other areas of the area that are not selected. It's something that eliminates the extra current that comes with it.
次に不3b明【失施ψ11ケ用いてbl−細にhン″明
する。Next, we will explain in detail using 11 pieces of ψ.
第2図に於いて、8.9は公知のチャージポンプ回路で
凌)シスイッチトランジスタ6.7を制御する。ここで
はt込み電圧VpI)’が、スイッチトランジスター6
.7の 値′j−圧分のみ降下するのを防ぐ為、チャー
ジポンプ回路8.7會用いている。In FIG. 2, 8.9 is a known charge pump circuit which controls a switch transistor 6.7. Here, the t-included voltage VpI)' is the switch transistor 6
.. In order to prevent the pressure from dropping by the value 'j-' of 7, a charge pump circuit 8.7 is used.
史に、チャージポンプ回路はアドレスの第上位ヒツトに
対応し、六制御伯号CI、Cθによ逆制御される。例λ
ばアドレスの取上位ビットか■l /L レベルの開
は5、そのアドレスに対応する領域ぬ、第3図のメモリ
セル群kl、の領域に対応[7、その領域の看込み5庄
はv p p’、が4P1給さjる。アドレスの最上位
ビットがNv〃 レベルの時は、第3メ1の]■の領域
に対応シ7、その領域の書込み”Fh圧はVl)[)’
θが供給される。Historically, the charge pump circuit corresponds to the most significant hit of the address and is inversely controlled by the six control numbers CI and Cθ. Example λ
If the upper bit of the address is taken, the /L level is 5, which corresponds to the area corresponding to that address, which corresponds to the area of the memory cell group kl in FIG. p p', is given by 4P1. When the most significant bit of the address is at the Nv〃 level, it corresponds to the area [■] of the 3rd mail 7, and writing to that area ``Fh pressure is Vl) [)''
θ is supplied.
今、アドレスの最上位ビットがSt l Itレベルの
時は$1;徒月り一号C1によシチャージボンフ゛口路
8は動作し、制御信号C0Vcよりチャージポンプ回路
9は動作しない。従ってVpp; はVl)J)レベル
と成り、Vl)I)’θは”6’レベルと成る。逆にア
ドレスの最上位ビットがSS vttレベルの時は上記
と全く進であシ、■pp管?θ〃レベル、Vpp’+は
Vl)pレベルと成る。Now, when the most significant bit of the address is at the StlIt level, the charge pump circuit 8 operates due to C1, and the charge pump circuit 9 does not operate due to the control signal C0Vc. Therefore, Vpp; becomes the Vl)J) level, and Vl)I)'θ becomes the "6" level.On the other hand, when the most significant bit of the address is the SSvtt level, it is completely inverse as above, ■pp The tube ?θ〃 level, Vpp'+ becomes the Vl)p level.
従って第1図に示すVpP’がアドレスの最上位ピッ1
.ノs+(j〃、気l〃に従い、蟻θ〃レベル、vpp
レベル変化する。即ち、メモリ容量の1/2領域のVp
p/がり〃レベル、 Vりpレベルと変化する。従って
、メモリ容量の1/2が書込み時にもかかわらす、省込
み電流がθICれなくなt)1:込み電力の:・廣少が
計れる。Therefore, VpP' shown in FIG.
.. Nos + (j〃, according to Qi〃, ant θ〃 level, vpp
Level changes. That is, Vp of 1/2 area of memory capacity
It changes to p/gari〃 level and Vri p level. Therefore, even when 1/2 of the memory capacity is written, the saved current is no longer θIC, and the saved power can be reduced.
上記ソ・:流側ではV I)I)ラインを2りのスイッ
チトランジスタで2分割したが更に4分割にすれば畳込
み1D、力の枦失は更に減少させる事が出来る。父上記
実施例ではチャージポンプを個別に設けたがチャージポ
ンプを共用し、チャージポンプの出力を制御する事も可
能である。On the flow side, the VII) I) line is divided into two by two switch transistors, but if it is further divided into four, the convolution is 1D and the power loss can be further reduced. In the above embodiment, charge pumps are provided individually, but it is also possible to use a common charge pump and control the output of the charge pump.
h本実姑例を示す図であり、第3図は本実流側のメモリ
セル群と青込み′[K圧との関係を示す図である。FIG. 3 is a diagram illustrating the relationship between the memory cell group on the actual flow side and the blue ′[K pressure].
ここに、1・・・・・・メモリセル、2・・・・・・デ
プレッション型負荷トランジスタ、3・・・・・・デプ
レッション型制御トランジスタ、4・・・・・・エンノ
\ンスメ/ト型トランジスタ、5・・・・・・デプレッ
ション型負荷トランジスp、6.7・・・・・・エンハ
ンスメント型スイッチトランジスタ、8.9・・・・・
・チャージポンプ回路である。Here, 1...memory cell, 2...depression type load transistor, 3...depression type control transistor, 4...ennome type Transistor, 5...depression type load transistor p, 6.7...enhancement type switch transistor, 8.9...
・It is a charge pump circuit.
第1図 第2図 Vpp’o VPP’1 第3図 一111/FP’0Figure 1 Figure 2 Vpp’o VPP’1 Figure 3 1111/FP’0
Claims (1)
ンジスタを介して偽込み回路部に供給され前ff+、:
叛cり個のスイッチトランジスタがアドレス信号によ
って制御される回路を具備し7たことを′[・r徴とす
るFROMoThe writing cylinder pressure is supplied to the false write circuit section via several switch transistors connected in series.
FROMMo is characterized by having a circuit in which a number of switching transistors are controlled by an address signal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58033055A JPS59160892A (en) | 1983-03-01 | 1983-03-01 | Prom device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58033055A JPS59160892A (en) | 1983-03-01 | 1983-03-01 | Prom device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS59160892A true JPS59160892A (en) | 1984-09-11 |
Family
ID=12376070
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58033055A Pending JPS59160892A (en) | 1983-03-01 | 1983-03-01 | Prom device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59160892A (en) |
-
1983
- 1983-03-01 JP JP58033055A patent/JPS59160892A/en active Pending
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