JPS59151126A - Projection inspecting machine - Google Patents

Projection inspecting machine

Info

Publication number
JPS59151126A
JPS59151126A JP2532983A JP2532983A JPS59151126A JP S59151126 A JPS59151126 A JP S59151126A JP 2532983 A JP2532983 A JP 2532983A JP 2532983 A JP2532983 A JP 2532983A JP S59151126 A JPS59151126 A JP S59151126A
Authority
JP
Japan
Prior art keywords
projection
half mirror
light
work
projection lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2532983A
Other languages
Japanese (ja)
Inventor
Taizo Nakamura
泰三 中村
Tomoyuki Kimura
木村 知行
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsutoyo Manufacturing Co Ltd
Original Assignee
Mitsutoyo Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsutoyo Manufacturing Co Ltd filed Critical Mitsutoyo Manufacturing Co Ltd
Priority to JP2532983A priority Critical patent/JPS59151126A/en
Publication of JPS59151126A publication Critical patent/JPS59151126A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To execute selectively reflection/transmission illuminations by placing plural mirrors whose reflection selecting wavelengths are different from each other, on the side opposite to a half mirror of a work, so that they can go into and out of a telecentric illuminating system. CONSTITUTION:A half mirror 6 is placed on an optical axis 13A of a magnifying projection lens 13, a projected light from the side of this mirror 6 is reflected by this mirror 6, a telecentric illuminating system for irradiating a work W placed at a focal position of the projection lens 13 is provided, and a shape of the work is magnified and made to form an image on a screen 8 from the magnifying projection lens 13 by utilizing a reflected light from the work W. Plural mirrors 14A-14C whose reflection selecting wavelengths are different from each other are placed on the side opposite to the half mirror 6 of the work W so that they can go selectively into and out of the telecentric illuminating system. The mirrors 14A-14C are placed concentrically on a rotating plate 15 so that the turret is replaced freely.

Description

【発明の詳細な説明】 この発明は、工作H城のハイド刃先、歯車等を拡大投影
して検査するための投影検査1幾の改良に関づる。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to improvements in projection inspection 1 for inspecting hide cutting edges, gears, etc. of workpieces by enlarging projection.

従来、第1図に示8れるように、光源ランプ1からの光
を、コンデンサレンズ2を介して、載物台3にφ、(置
された1ノーク(図示前略)を下ノブがらif、は痢し
、又は、1IIJ記軟物台3の側方(、こ配置されl−
丸源うンブ4力自らの光をコンデンサレンズ5J−3よ
び11−フミラー6を介して前記載物台3上のワークの
上方から照罰し、これによつ−C午した]6過光又は反
射光による11」記ワーク形状を、拡大投影装h7を介
してスクリーン8に結像おせるようにし!:投影1幾か
ある。
Conventionally, as shown in FIG. 1, light from a light source lamp 1 is transmitted via a condenser lens 2 to a stage 3 with φ, (a placed knob (not shown in the figure)) from a lower knob if, If you have diarrhea, or on the side of the soft food table 3 described in 1IIJ (this is placed l-
Marugen Umbu 4 Forces' own light is illuminated from above the workpiece on the document table 3 through the condenser lens 5J-3 and the 11-fumirror 6, and the light is emitted from above. Or, the shape of the workpiece 11" by reflected light can be imaged on the screen 8 via the enlarged projection device h7! :There are several projections.

図の符号10は熱KA吸収フィルター、11J3よび1
2は前記拡大投影装置7の投影レンズ13を声壜つノ=
光線を反則させ−(前記スクリーンF3に柿くためのミ
ラーをそれぞれ示す。
Reference number 10 in the figure is a thermal KA absorption filter, 11J3 and 1
2 is the projection lens 13 of the enlarged projection device 7.
Mirrors are shown for redirecting the light rays and directing them to the screen F3.

上記従来の投影(段は、載物台3土のワークを透過照明
および反則照明の一方もしくは両方を適宜利用覆ること
によって、最適な拡大影1象を得るようにづるものであ
るが、透過照明用および反則照明用に別個の光源ランプ
1および4を各々本体Hに取付けているために、拡大投
影装置7に熱歪みの影響か生しないように対策をとらな
ければならないとともに、各別に光源を順えていること
から(−矢光量が大きく、又一方の光源ランプのみを使
用している時は、11υ方の光源ランプは利用されず、
IJ”4f=か低く、且つ、全体か大型化するという問
題点かある。
The above-mentioned conventional projection (stage) is designed to obtain an optimal enlarged shadow by covering the workpiece on the stage 3 using either or both of transmitted illumination and counter illumination, but transmitted illumination Since separate light source lamps 1 and 4 are attached to the main body H for the purpose of illumination and for counter illumination, measures must be taken to prevent thermal distortion from occurring on the enlarged projection device 7, and separate light sources must be installed for each. (-) When the amount of light is large and only one of the light source lamps is used, the light source lamp on the 11υ side is not used.
There are problems in that the IJ"4f is low and the overall size is increased.

又、従来は、I’¥ $k %の疲労を低減させるため
に、照明系の途中に特定波長の光線(例えば緑色光)の
みを透過させるフィルターを設け、ワークの輪郭を該特
定波長の色でスクリーン8に投影させるようにしたもの
があるが、フィルターを取付けるために、その分たけ装
睦容積が大きくなるという画題点かある。
Furthermore, in the past, in order to reduce I'\$k % fatigue, a filter was installed in the illumination system to transmit only light of a specific wavelength (for example, green light), and the outline of the workpiece was colored in the color of the specific wavelength. There is one in which the image is projected onto a screen 8, but the problem is that the installation volume becomes larger due to the installation of a filter.

この光間は上記従来のl?18]題点に16み1なされ
たしのであって、反射照明系により反則照明および透過
照明をすることができ、且つ、装置を単科且つ小型とす
ることができる投影検査孜を提供することを目的とする
This light interval is the same as the conventional l? 18] The object of the present invention is to provide a projection inspection device that can perform counter illumination and transmitted illumination using a reflective illumination system, and can be made into a single unit and compact device. purpose.

又この発明は、フィルターをy受けることなく、特定波
長の光によつ1、スクリーン上(こ結像を碍ることがで
きるようにした投影恢査澱を提供することを目的とする
Another object of the present invention is to provide a projection image that can be imaged on a screen using light of a specific wavelength without passing through a filter.

更に、この発明は、反射照明系により反則照明と透過照
明又は反則照明のみを選択的に行うことfJlできるよ
うにした投影検査機を提IJLすることを目的とづる。
A further object of the present invention is to provide a projection inspection machine that can selectively perform counter illumination and transmitted illumination or only counter illumination using a reflective illumination system.

史に又この光間は、スクリーンに投影される結敗の特定
波長を容易に変換できるようにした投影(炙査)洩を1
呈(共づることを目的とづる。
Historically, this light beam was used to create a projection (scanning) beam that made it possible to easily convert the specific wavelength of the results projected onto the screen.
presentation (written with the purpose of sharing)

この発明は、拡大投影レンズの光軸上にハーフミラ−を
配置し、該ハーフミラ−のfi!1方からの投光を該ハ
ーフミラ−により反射して、lI□j記投影レンズの焦
点位置に置かれたワークを照明づるテレセン1〜リツク
照明系を備え、il」記ツークn+らの反射光を利用し
て前記拡大投影レンズによりワーク形状をスクリーン上
に拡大結1象させるようにした投影検査機において、前
記ワークの、前記ハーフミラ−と反対側に、反射選択波
長の異なる複数のミラーを、前記テレセンドリンク照明
系へ、選択的に出入可能に配置することにより上記目的
を達成するものである。
In this invention, a half mirror is arranged on the optical axis of a magnifying projection lens, and the fi! It is equipped with a telecenter 1~rick illumination system that reflects the light projected from one direction by the half mirror and illuminates the work placed at the focal position of the projection lens 1I□j, and reflects the reflected light from il'' Zug n+ et al. In the projection inspection machine, the shape of the workpiece is magnified and projected on the screen by the magnifying projection lens using a plurality of mirrors having different reflection selection wavelengths on the opposite side of the workpiece to the half mirror. The above object is achieved by arranging it so that it can selectively enter and exit the telesend link lighting system.

又この発明は、前記(3影倹査孜において、前記事9数
のミラーを回転板上(二同心状にターレット交換自在に
配置することにより波長の異なる透過照明光を選択的t
こ冑で上記目的を達成するものである。
In addition, the present invention provides a method for selectively transmitting transmitted illumination light of different wavelengths by arranging the nine mirrors on a rotary plate (two concentrically arranged turrets that can be exchanged) in the three-ray inspection.
This helmet accomplishes the above purpose.

又この発明は、前記投影検M1幾において、前記回転板
に前記複数のミラーと一同心状に非反QJ部を形成して
、反則照明と透過照明又は反則照明のみを選択自在とづ
ることにより上記目的を達成し覆るものである。
Further, the present invention provides that, in the projection inspection M1, a non-reflective QJ portion is formed on the rotary plate concentrically with the plurality of mirrors, so that only the counter illumination, the transmitted illumination, or the counter illumination can be selected. It achieves and overcomes the above objectives.

以下本光明の実施例を図面を参照して説明する。Embodiments of the present invention will be described below with reference to the drawings.

この実施例においては、前記第1図の+、を米の投影(
契査問と同−又は)U当811分については同一の可月
を1−]づるものとづる。
In this example, + in FIG. 1 is replaced by the projection of rice (
The same month as the contract question or) U to 811 minutes is spelled as the same month as 1-].

この実施例は、第2図に示されるように、拡大投影レン
ズ13の光軸13A上にハーノミラー6を配置し、該ハ
ーフミラ−6のin!l h力口らの投光を該ハーフミ
ラ−6により反射して、0り記(す影しンス13の焦点
位置に置かれたワーク\\を照@Jづるテレセン1〜リ
ツク照明系を備え、前記ワーク\へ・からの反射光を利
用して前記拡大投影レンズT3によりワーク形状をスク
リーン8上に拡大結像させるようにした投影偵査1幾に
J5いて、…■記ワーク〜′の、0り記ハーフミラ−6
と反対側に、反則i!択波長の異なる復歓のミラー14
A〜14Cを、前記テレセントリック照明糸l\、選択
的に出入可能に配置し)〔ものである。
In this embodiment, as shown in FIG. 2, a Harno mirror 6 is arranged on the optical axis 13A of the enlarged projection lens 13, and the in! The projector is equipped with a telecenter 1~rick illumination system that reflects the projected light from the half mirror 6 and illuminates the work piece placed at the focal position of the projection lens 13. , a projection reconnaissance 1 in which the shape of the workpiece is enlarged and imaged on the screen 8 by the enlargement projection lens T3 using the reflected light from the workpiece \. ,0ki half mirror 6
And on the other side, foul i! Reflection mirror 14 with different selective wavelengths
A to 14C are arranged such that they can be selectively moved in and out of the telecentric illumination thread.

これらミラー14A〜14Cは、第3図に拡大して示さ
れるように、回転機15上に同)し・状にターレツ1へ
交換自在に配置されている。
These mirrors 14A to 14C are arranged on a rotating machine 15 in the same shape as shown in FIG. 3 so as to be replaceable with the turret 1.

即ち、回転数15は、その回転中心軸15Aが、ロリ記
テレセンドリンク照明系の光軸13へと平行に配置され
、回転(k15上に配置されたミラー14A〜14Cは
、前記光軸13へに対して直角方向にIす」転己れて、
該テレセントリック照明系内(こjバ(1だ的に出入づ
ること1〕\できるようにされている。
That is, the rotation speed 15 is such that the rotation center axis 15A is arranged parallel to the optical axis 13 of the telesend link illumination system, and the mirrors 14A to 14C arranged on the rotation (k15) are rotated to the optical axis 13. I turn in the direction perpendicular to the
It is possible to move in and out of the telecentric illumination system.

具、0り記回転)k15には、前記ミラー14A−1/
4 Cと同心状に細毛)kよりなる非反帽部14DD1
配画さ1)、該」1′反罰?J 14 D乃)回転板1
5の回転ととしに1ルJ記デレセシ1〜リンク照明系内
に人)l一時に、ハーフミラ−6からの反則光を吸収し
−(、透過p、i、4明光を形成しないようにされてい
る。
(rotation) k15 includes the mirror 14A-1/
4 Non-recurved part 14DD1 consisting of thin hairs) k concentrically with C
Illustrated 1), ``1' anti-punishment? J 14 Dno) Rotating plate 1
When the rotation of 5 occurs, the half mirror absorbs the repulsive light from the half mirror 6 and prevents the formation of bright light. ing.

又、回転)ル11つの一δ1;は戟物台3からnす方に
突出され、投影(爽Hのol」開υ−ら作業者7’)\
操作できる」、うにされ(いる。
Also, one δ1 of the rotation) 11 is protruded from the tool stand 3 in the n direction, and the projection (the opening of the rotation) is performed by the worker 7'.
It can be operated.''

従って、この実施i’il lこおいては、投影レンズ
1$の焦点位置に置かれ7こワーク\・\・′を光源ラ
ンプ4n)らハーフミラ−6を介して反射照明し、ワー
ク\・\1こd5ける反身J光を、1捷影レンス13(
こよりスクリーン8トに拡大結像し、これ(こよつ(、
ワーク\・〜の表面の状態をj発車できるとともに、ハ
ーフミラ−6によって反則された後、ワーク\へ・の周
囲を沖り、ミラー14A〜14Cの反絹面て反則8れた
光(こより、[ワーク\・\、の輪郭形状を、投影レン
ズ13を介してスクリーン8に投影結像しくその形状1
」ン去等を測定−することができる。
Therefore, in this embodiment, the workpiece \,\,', which is placed at the focal position of the projection lens 1, is illuminated by reflection from the light source lamp 4n) through the half mirror 6, and the workpiece\, \ 1 d 5 reversal J light, 1 1 shadow lens 13 (
The image is enlarged and formed on an 8-screen screen, and this (Koyotsu)
The state of the surface of the workpiece can be determined, and after being reflected by the half mirror 6, the light travels around the workpiece and hits the anti-silk surfaces of the mirrors 14A to 14C. [Project the outline shape of the workpiece \・\ onto the screen 8 through the projection lens 13 and form an image of the shape 1
It is possible to measure the amount of energy that is lost.

従って、従来の投影)灸査機にお()る改用照明糸のみ
によってワーク\へ/を反射照明およし・ノh過照明し
て、その表面形状と輪郭形状を検査りることかてきる。
Therefore, it is possible to inspect the surface shape and contour shape of the work by reflecting and over-illuminating the workpiece using only the modified illumination thread attached to the conventional projection moxibustion machine. .

1寺(こ、この実施1列にd5いて(ま、ミラー14A
−14、Cは、各々、戊割jパ択波長か異なるようにさ
れているので、スクリーン8(二投影〒へ(資)8れ1
ニワーク\\I′の中晶郭形1人(ま、ミラー14ハ・
〜114Cをン内宜選携づることによって、作業者D・
、最し疲労の少ない特定波長の光により形成J−ること
Dlてきる。
1 temple (d5 in this execution row 1 (mirror 14A)
-14 and C are each made to have a different wavelength selection, so the screen 8 (two projections)
1 person in the middle crystal form of Niwork\\I' (well, mirror 14ha)
~ By carrying 114C within the unit, worker D.
, can be formed by light of a specific wavelength that causes the least fatigue.

更にこの実7.t、 DIにJジいては、回転板15に
、前記ミラー14A〜14.0が取付けられているので
、これらミラー14A〜14Gの交換し極めて容易であ
る。
Furthermore, this fruit 7. Since the mirrors 14A to 14.0 are attached to the rotating plate 15 at t and DI, it is extremely easy to replace these mirrors 14A to 14G.

史に又、Mす記回転碌]5には、nir記ミラー]4A
〜14Cと同心状に非反則部1 /ID i><形成さ
れτいるのて、回転板15を回転して非頃躬部1/11
つとワーク〜\′の、前記ハーフミラ−6と反λ4側に
11i宵さ己ることによって、ハーフミラ−6がらの反
Q4照明光を吸収して、ワーク\・\・にょっ−C直接
反9Jされノ:光線のみに」、って、スクリーン8にワ
ーク\\・の表曲形払ハ\投−8されるよう(こするこ
とかでごろ、 又、この奥baa Iuす(ごd5いでは、ミラー14
A・〜14C自体が特定波長の光腺のみを反則ダるよう
にされでいるので、i・f来のように、光路の途中にフ
ィルターを設ける8妓D1ない。
In history, Msuji rotation skill] 5, nirki mirror] 4A
After the non-conforming part 1 /ID i><τ is formed concentrically with ~14C, the rotating plate 15 is rotated to form the non-conforming part 1/11.
By shining 11i on the side opposite to the half mirror 6 and λ4 of the work~\', the opposite Q4 illumination light from the half mirror 6 is absorbed, and the work \, \, Nyo-C is directly opposite 9J. ``It's only for the rays of light'', so that the surface of the work \\・ is thrown onto the screen 8. Now, mirror 14
Since A.~14C itself is designed to filter out only the light beam of a specific wavelength, there is no need to install a filter in the middle of the optical path as in the case of I.F.

尚上記実施1′7すは、反則選択波長の真なる複数のミ
ラーを、回転板15上(こ同心状に取付ける口とに」、
って、テレセン1〜リツク照明系/\ターレツ1へj(
に〕バ(ツマ的(こ出入可能(こしたちのであるが、本
発明はこれに限定ごれるしのでなく、例えは、後&シの
ミラーをスライ1〜恢に112(=Jけ、これによって
、−テレセン1−リック照明系lX、、直線的に選択的
に出入OJ能に−するようにしてしよい。
In the above-mentioned embodiment 1'7, a plurality of true mirrors of the anti-selection wavelength are mounted on the rotary plate 15 (at the openings to be mounted concentrically).
So, go to telecentre 1~rick lighting system/\telecenter 1j (
It is possible to move in and out of the bar, but the present invention is not limited to this.For example, the rear and rear mirrors can be moved from slide 1 to Accordingly, the telecentric illumination system IX may be linearly and selectively turned on and off.

!二ノこし、回転板に趨故のミラーを取付りた場合(,
1,、スラで1−(しに取イー」けた場合に比峙して、
その父(切(二1ツ串11℃ある。
! Ninokoshi, when a conventional mirror is attached to the rotating plate (,
1.Compared to the case where you get 1-(Shini Tori E) with a slur,
The father (cut) (21 skewers is 11 degrees Celsius).

又、前記実施1シlft、回転(々15[(ご3詞のミ
ラー14A〜1 /1. Cを自己誼しtニジの−Cあ
るか、本発明はこれに限定されるしのでなく、その個プ
2(j、2以上の複数てあれはよい。
In addition, the present invention is not limited to the above-mentioned embodiment 1, rotation (15 [(3 words) mirrors 14A to 1/1. It is okay to have a plurality of 2 (j, 2 or more).

丈に、上記実施1511は、ハーフミラ−(5を投影レ
ンズ13とワークいとの間に位1*′さ已るようにし7
こちのである7)1、本光明はこれに限定さ1′(るも
のでなく、投影レンズ13を構成ヴるレンズG1′の間
1こハーフミラ−6を凸装置づるよう(こしてもよく、
又、投影レンズ13とスクリーン8の間(こハーフミラ
−6を配−ツるようにしてもよい。
In the above embodiment 1511, a half mirror (5) is installed with a length of about 1*' between the projection lens 13 and the workpiece.
7) 1. This Komei is not limited to this, but it is also possible to use a convex device to place the half mirror 6 between the lens G1' that constitutes the projection lens 13.
Alternatively, a half mirror 6 may be placed between the projection lens 13 and the screen 8.

本発明は上記のように偶成したのて、簡輌な信1戊で、
 (il’来の反則照明系のみによりて、反し1照明お
よびj6過照明を得ることか−Cき、iItつ−C,1
1来の]L過照明糸(よ不要となり、投影!?!育澱を
小型化且つ単純化−りることかてきるととb を二、熱
M 、77の影響を小8くすることかでき、百つ、賀)
M−、Eス1へを大幅に低下させることかてぎ、史i=
 、 目す記逗過照明光の波長を復波のh4なる特定波
長に、合物に切換えることによって、作業者に爪も疲労
の麦ない波長の光によって、スクリーン上に結(象させ
ることかできるという(曇れた効果を有する。
The present invention has been constructed as described above, and with a simple method,
(Is it possible to obtain reverse illumination and j6 over-illumination only by means of the reverse illumination system of il'?
1] L over-illuminated thread (no longer needed, projection!?! Miniaturizing and simplifying the growing lees - reducing the effect of heat M, 77 to 8) Deki, 100, Ka)
It is important to significantly reduce M-, E-s1, and history i =
By switching the wavelength of the target passing illumination light to a specific wavelength called H4 of the return wave, it is possible to create a condensation (image) on the screen with light of a wavelength that does not cause fingernail fatigue to the worker. It is said that it can be done (has a cloudy effect).

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従米の投影検査(幾における光学系の概略を示
づ光学系配置図、第2図は本発明に係る投影倹沓瀕の実
゛施例を示す第1図と同作の光学系配置図、第3図は同
実施例におけるミラ一部分を拡大して示−づ平囲図であ
る。 4・・・光源ラシフ、 6・・・ハーフミラ−1 8・・・スクリーン、 13・・・投影レンズ、 13A・・・光軸、 14△〜14C・・・ミラー、 14L)・・・非反剣部、 15・・・回転板、 \・\・′・・・ワーク。 代理人  (公 山 手 市 ((まか1名) 第1図
Fig. 1 is an optical system layout diagram showing an outline of the optical system in the projection inspection (Fig. System layout diagram, Fig. 3 is an enlarged diagram showing a part of the mirror in the same embodiment. 4...Light source Rashif, 6...Half mirror 1, 8...Screen, 13...・Projection lens, 13A...Optical axis, 14△~14C...Mirror, 14L)...Non-sword section, 15...Rotating plate, \・\・'...Work. Agent (Public Yamate City (1 person) Figure 1

Claims (1)

【特許請求の範囲】 (1)拡大投−2レシスの光軸上にハーフミラ−を配置
し、該ハーフミラ−の測方からの投光を該ハーフミラ−
により反躬して、前記投影レンズの焦点位置に置か11
だワークを照劉するテレセン1ヘリツタ照明系を1@え
、ilJ記ワークからの反a」光を利用してMiJ記拡
人投影レンしンよりワーク形状をスクリーン上に11ム
人+、′i1象凸せるようにしノこ投影検査敗(こおい
−(、ロリ記1ノークの、iIJ記ハーフミラ−とヴλ
i it!IIに、反q・]退(R:展長の異なる複数
のミラーを、fiIJFieテレしントリツソ照明系I
\、選(1マ的に出入可能に配置し1ごことを持出とづ
る投影1灸査(窺。 (,2)前記?すなのミラーを回転板土に同心状にター
bツ1〜交換自r−fに配置したことを1守山とづる持
晶1請求の範囲第11m配転の投影!@桁j朦。 (3) tflj記回転)双(二+iす配?!歌のミラ
ーと同・L\払に非反’AJ 8iiを形成したことを
特徴とする1寺訂請求の範囲第2項記載の(U彰倹盃1
幾。
[Claims] (1) A half mirror is placed on the optical axis of the magnified projection-2 ratio, and the projected light from the measurement direction of the half mirror is transmitted to the half mirror.
11, placed at the focal position of the projection lens.
Use the telecenter 1 helical illumination system to illuminate the workpiece, and use the light from the workpiece to project the shape of the workpiece onto the screen from the 11mm projection lens. I failed the Shinoko projection test to make the i1 elephant convex.
i it! In II, a plurality of mirrors with different extension lengths are installed in the fiIJFie telescopic illumination system I
\、Selection (1) Projection 1 moxibustion (1 moxibustion) that is placed so that it can be accessed and taken out (1) The projection of the 11th m rotation in the claimed range of 1 Moriyama and Zuru has been placed in the exchange self r-f. (U Shokaku 1
How many?
JP2532983A 1983-02-17 1983-02-17 Projection inspecting machine Pending JPS59151126A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2532983A JPS59151126A (en) 1983-02-17 1983-02-17 Projection inspecting machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2532983A JPS59151126A (en) 1983-02-17 1983-02-17 Projection inspecting machine

Publications (1)

Publication Number Publication Date
JPS59151126A true JPS59151126A (en) 1984-08-29

Family

ID=12162900

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2532983A Pending JPS59151126A (en) 1983-02-17 1983-02-17 Projection inspecting machine

Country Status (1)

Country Link
JP (1) JPS59151126A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994007168A2 (en) * 1992-09-18 1994-03-31 Leica Mikroskopie Und Systeme Gmbh Direct-light illumination system for microscopes

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5135141B2 (en) * 1972-05-30 1976-09-30
JPS5714818A (en) * 1980-06-30 1982-01-26 Nippon Kogaku Kk <Nikon> Reflection lighting type projector

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5135141B2 (en) * 1972-05-30 1976-09-30
JPS5714818A (en) * 1980-06-30 1982-01-26 Nippon Kogaku Kk <Nikon> Reflection lighting type projector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994007168A2 (en) * 1992-09-18 1994-03-31 Leica Mikroskopie Und Systeme Gmbh Direct-light illumination system for microscopes
WO1994007168A3 (en) * 1992-09-18 1994-04-28 Leica Mikroskopie & Syst Direct-light illumination system for microscopes

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