JPS59148956A - Display system of defective information - Google Patents

Abstract

PURPOSE:To restore a defect rapidly by transferring and displaying the defective information and applying simple indication such as retry, skip and advance when a defect is detected during the test of a device to be tested. CONSTITUTION:A testing adaptor 2 is connected to the device 1 to be tested. When a defect is generated in the device 1 to be tested, the test item No., the defective contents and other information related to the defect are typed out 4 and the defect information is transmitted to a display part/alarm part 7 through a defect information transmitter 6 to inform the defect to the operator. An operating section instructs to retry, skip or advance against defective information. Said constitution makes it possible to monitor many devices always by a small number of operators and prevent a defective device from being left as it is for a long time.

Description

[Detailed description of the invention] The present invention relates to a defect information display system.

Conventionally, for example, in a test system, each test station uses a test program or the like under a control device to confirm the functionality of a test object.

When many defects are detected, the operator (inspector) becomes attached to the test system and is engaged in analyzing the details of the defects, tracing the location of the failure, and repairing the failure.

When the number of defects is not very large, or when performing continuous testing over a long period of time such as margin testing and counting the number of errors within that time, the operator (inspector) does not necessarily need to be present at the testing station. There isn't. Therefore, it is possible to take charge of a plurality of test stations and operate them in a circular manner, or to carry out other tasks in parallel.

However, in the latter case, the operator (inspector) is often absent from the test station, so when a defect occurs in the device under test, the defect detection diameter remains undetected for a long time. There was a drawback that the defect detection state remained unaddressed.

The present invention has been made in view of the above-mentioned conventional circumstances, and
SUMMARY OF THE INVENTION It is therefore an object of the present invention to provide a new display system which eliminates the above-mentioned drawbacks.

In order to achieve the above object, the present invention provides a defect information transfer device that transfers defect information when a defect in a device under test is detected during a test using a test system; It is configured to include a display section that displays defective j'#@, an alarm section, and an operation section that gives simple instructions such as retry, skip, and advance.

Next, a preferred embodiment of the present invention will be specifically explained with reference to the drawings.

FIG. 1 shows a block configuration of an embodiment of a defect information transfer optical display system according to the present invention.

In FIG. 1, reference number 1 is a device under test, 2 is a test adapter, 3 is a control device, 4 is a typewriter, 5 is an input/output device, 6 is a defect information transfer device, 7 is a display section, an alarm section,
Reference numeral 8 indicates an operation section.

Each display section 7 provided corresponding to each test station,
The operating units 8 are installed together in a central monitoring station, for example, and the central monitoring station can centrally monitor and control each test station.

If there is a defect in the device under test 1 and it is detected, the test item number, details of the defect, and the status of each attached part are written out on the typewriter 4. At the same time, in order to transfer defect information (whether it is a serious failure or a rolling failure),
For example, a relay of the defect information transfer device 6 is operated. The contact lead of this relay is connected to the display section and alarm section 7 installed at the operator (inspector) who is engaged in other work at a distance.
It extends to As a result, the lamp of the relevant test station lights up and the bell rings. The operator (inspector) should stop the alarm bell and, taking into consideration the display contents and his or her own work schedule, immediately go to the relevant test station and take action, or select Retry, Skip, or Advance using the operation section 8. You will have to select and operate the telephone key.

As a result, the work efficiency of the operator (inspector) is improved, and even if a defect is detected, it will not be left unattended for a long time due to the absence of the operator.

Although the configuration of the present invention has been described above with reference to one preferable embodiment thereof, this is merely an example, and the present invention is not limited only by the embodiment described here, but only within its scope. Of course, various modifications and changes are included. For example, in this embodiment, the defect information transfer device 6 transfers the defect information by a relay, but it is also possible to use a semiconductor element or the like as a substitute.

As explained above, by using the system of the present invention, the work efficiency of the operator (inspector) is significantly improved, and defect detection diameters are prevented from being left unattended due to the absence of an operator for a long time. be able to.

[Brief explanation of the drawing]

FIG. 1 is a block diagram showing an embodiment of a defect information display system according to the present invention. 1...Device under test, 2...Test adapter, 3...
・Control device, 4...Typewriter, 511...Input/output device, 6...Fist failure information transfer device, 7...Display section, alarm section, 8...Operation section Patent applicant NEC Corporation Representative Patent Attorney Yutabe Kumagai

Claims (1)

[Claims] A failure information transfer device that transmits this failure report when a failure of the device under test is detected during a test using the test system, and a display unit and an alarm unit that display the failure information transferred by the transfer device. and IJ) an operation section that gives simple instructions such as lie, skip, and advance.