JPS59128195U - Lamp burnout detection circuit - Google Patents

Lamp burnout detection circuit

Info

Publication number
JPS59128195U
JPS59128195U JP20242783U JP20242783U JPS59128195U JP S59128195 U JPS59128195 U JP S59128195U JP 20242783 U JP20242783 U JP 20242783U JP 20242783 U JP20242783 U JP 20242783U JP S59128195 U JPS59128195 U JP S59128195U
Authority
JP
Japan
Prior art keywords
resistor
transistor
voltage
generates
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20242783U
Other languages
Japanese (ja)
Other versions
JPH04560Y2 (en
Inventor
芳昭 佐野
悟 岸本
俊幸 松山
Original Assignee
富士通株式会社
富士通テン株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士通株式会社, 富士通テン株式会社 filed Critical 富士通株式会社
Priority to JP20242783U priority Critical patent/JPS59128195U/en
Publication of JPS59128195U publication Critical patent/JPS59128195U/en
Application granted granted Critical
Publication of JPH04560Y2 publication Critical patent/JPH04560Y2/ja
Granted legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はランプの電圧電流特性図、第2図は断線検知回
路図、第3図は本考案の実施例を示す回路図、第4図は
基準電圧特性図である。 図面でL1〜Lnは複数のランプ、R5はランプ電流比
例電圧を発生する抵抗、R,R4〜R1o、 Trl。 Tr2. D□〜D、は基準電圧発生回路、COMPは
比較回路、Rは基準電圧を発生する抵抗、Tr2は第1
のトランジスタ、R1−R7はその抵抗、D2〜D、は
そのダイオード、Tr□は第2のトランジスタ、R8は
その抵抗、Dlはそのダイオードである。
FIG. 1 is a voltage-current characteristic diagram of a lamp, FIG. 2 is a disconnection detection circuit diagram, FIG. 3 is a circuit diagram showing an embodiment of the present invention, and FIG. 4 is a reference voltage characteristic diagram. In the drawing, L1 to Ln are a plurality of lamps, R5 is a resistor that generates a voltage proportional to the lamp current, and R, R4 to R1o, and Trl. Tr2. D□ to D are reference voltage generation circuits, COMP is a comparison circuit, R is a resistor that generates the reference voltage, and Tr2 is the first
, R1-R7 are its resistances, D2-D are its diodes, Tr□ is the second transistor, R8 is its resistance, and Dl is its diode.

Claims (1)

【実用新案登録請求の範囲】 電源へ並列に接続された複数のランプの1つ以上の断線
を検知する回路において、 該ランプへ流れる全電流に比例する電圧を生じる抵抗と
、該ランプ群の電圧電流特性を3直線で近似した特性を
持つ基準電圧を発生する回路と、前記のランプ電流比例
電圧が前記特性の基準電圧より小になるときランプ断線
を示す出力を生じる比較回路とを備え、該基準電圧を発
生する回路は、該比較回路に接続されて基準電圧を発生
する第1の抵抗と、ベースが第2、第3の抵抗を介して
該第1の抵抗へ、ダイオードを介して低電位側の電源線
へ接続され且つコレクタ・霊ミッタ間及び第4の抵抗を
介して該第1の抵抗に電流を流す第1のトランジスタと
、該第2と第3の抵抗の接続点にベースが接続され、該
第4の抵抗に流れる電流を増加させるための第2のトラ
ンジスタと具備し、該電源の電圧が第1の範囲に於いて
該第1のトランジスタのみが導通し、第2の範囲に於い
ては該ダイオードが導通して該第1のトランジスタのベ
ース電位をクランプし、第3の範囲に於いては該第2の
トランジスタが導通し該第4の抵抗へ流れる電流が増加
する様に該第2.3.4の抵抗の値を設定したことを特
徴とするランプ断線検知回路。
[Claims for Utility Model Registration] In a circuit for detecting a break in one or more of a plurality of lamps connected in parallel to a power source, a resistor that generates a voltage proportional to the total current flowing through the lamps, and a voltage across the group of lamps. A circuit that generates a reference voltage having a characteristic that approximates the current characteristic by three straight lines, and a comparison circuit that generates an output indicating lamp breakage when the lamp current proportional voltage becomes smaller than the reference voltage of the characteristic, The circuit that generates the reference voltage includes a first resistor that is connected to the comparator circuit and generates the reference voltage, and a base that is connected to the first resistor through a second and third resistor, and a low voltage resistor that is connected to the first resistor through a diode. A first transistor that is connected to the power supply line on the potential side and allows current to flow through the first resistor between the collector and the spiritual transmitter and through the fourth resistor, and a base at the connection point between the second and third resistors. is connected to the second transistor for increasing the current flowing through the fourth resistor, and when the voltage of the power supply is in the first range, only the first transistor is conductive and the second transistor is connected to the second transistor. In a range, the diode conducts and clamps the base potential of the first transistor, and in a third range, the second transistor conducts and increases the current flowing to the fourth resistor. A lamp breakage detection circuit, characterized in that the value of the resistor of 2.3.4 is set as follows.
JP20242783U 1983-12-28 1983-12-28 Lamp burnout detection circuit Granted JPS59128195U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20242783U JPS59128195U (en) 1983-12-28 1983-12-28 Lamp burnout detection circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20242783U JPS59128195U (en) 1983-12-28 1983-12-28 Lamp burnout detection circuit

Publications (2)

Publication Number Publication Date
JPS59128195U true JPS59128195U (en) 1984-08-29
JPH04560Y2 JPH04560Y2 (en) 1992-01-09

Family

ID=30427898

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20242783U Granted JPS59128195U (en) 1983-12-28 1983-12-28 Lamp burnout detection circuit

Country Status (1)

Country Link
JP (1) JPS59128195U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010119901A1 (en) * 2009-04-15 2010-10-21 ボッシュ株式会社 Abnormalit detection device for detection circuit and electric circuit, and detection system and electronic system using the abnormality detection device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50132784A (en) * 1974-04-08 1975-10-21

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50132784A (en) * 1974-04-08 1975-10-21

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010119901A1 (en) * 2009-04-15 2010-10-21 ボッシュ株式会社 Abnormalit detection device for detection circuit and electric circuit, and detection system and electronic system using the abnormality detection device

Also Published As

Publication number Publication date
JPH04560Y2 (en) 1992-01-09

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