JPS59122970A - Apparatus for detecting solder bridge between lead terminals of electronic parts - Google Patents

Apparatus for detecting solder bridge between lead terminals of electronic parts

Info

Publication number
JPS59122970A
JPS59122970A JP57229584A JP22958482A JPS59122970A JP S59122970 A JPS59122970 A JP S59122970A JP 57229584 A JP57229584 A JP 57229584A JP 22958482 A JP22958482 A JP 22958482A JP S59122970 A JPS59122970 A JP S59122970A
Authority
JP
Japan
Prior art keywords
lead terminals
solder bridge
contact
solder
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57229584A
Other languages
Japanese (ja)
Inventor
Hiroshi Nomoto
野本 博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Victor Company of Japan Ltd
Nippon Victor KK
Original Assignee
Victor Company of Japan Ltd
Nippon Victor KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Victor Company of Japan Ltd, Nippon Victor KK filed Critical Victor Company of Japan Ltd
Priority to JP57229584A priority Critical patent/JPS59122970A/en
Publication of JPS59122970A publication Critical patent/JPS59122970A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To attain to shorten a detecting time by enabling the automation in the detection of a solder bridge, by detecting the presence or absence of the solder bridge between lead terminals by measuring voltage corresponding to the resistance between the lead terminals. CONSTITUTION:The respective solder parts of lead terminals 2, 3 of a switch are connected to a constant-current circuit through contact pins 10, 11 and the voltage between the terminals 2, 3 is measured through contact pins 16, 17 and an A/D converter 22. The presence or absence of the solder bridge 5 is automatically detected regardless of the state of a movable contact piece on the basis of the voltage corresponding to the resistance value between the terminals 2, 3 changed corresponding to the presence or absence of the solder bridge 5 and the contact or not of the movable contact piece 6. By this constitution not requiring the change-over of the contact piece, the detection of the solder bridge can be automated and the detecting time of the solder bridge is shortened.

Description

【発明の詳細な説明】 本発明は電子部品のリード端子間の半田ブリッジ検出装
置に係り、測定1べきリード端子夫々が接続されたパタ
ーン上の点間に定電流を供給してこの測定すべきリード
端子間の電位差を検出して抵抗値を測定することにより
このリード端子間の半田ブリッジの有無を検出し、例え
ばスイッチの接続位置を切換えることなくスイッチのリ
ード端子間の半田ブリッジの有無を検出できてスイッチ
の接続位置を切換える工程が不用となり、プリント基板
回路の検査工程が自動化でき検査時間が短縮される電子
部品のリード端子間の半田ブリッジ検出装置を提供づる
ことを目的とする。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a solder bridge detection device between lead terminals of an electronic component, in which a constant current is supplied between points on a pattern to which respective lead terminals to be measured are connected. By detecting the potential difference between the lead terminals and measuring the resistance value, the presence or absence of a solder bridge between the lead terminals can be detected.For example, the presence or absence of a solder bridge between the lead terminals of a switch can be detected without changing the connection position of the switch. To provide a device for detecting solder bridges between lead terminals of electronic components, which eliminates the need for the process of changing the connection position of a switch, automates the process of inspecting printed circuit board circuits, and shortens inspection time.

一般に、電子部品をプリント回路基板上に半田付けされ
たプリント基板回路を検査づる揚台、半田付は部分にコ
ンタクトビンを当接させ、夫々のコンタクトビンより例
えば2つのコンタクl−ビンを選択して単一の電子部品
に電流を流し、この間の電圧を測定して各電子部品の定
数及び配線パターンのオーブン、ショート等を検査する
Generally, electronic components are soldered onto a printed circuit board, and a printed circuit board circuit is inspected on a platform. During soldering, a contact bin is brought into contact with the part, and two contact bins, for example, are selected from each of the contact bins. A current is passed through a single electronic component, and the voltage during this time is measured to inspect the constants of each electronic component and the wiring pattern for short circuits, etc.

ここで第1図に示す如きプリント基板回路上のスイッチ
1はそのリード端子2,3間に半田ブリッジ5を生じて
リード端子2,3間がショートすることがある。このた
め、スイッチのリード端子2.3.4の中から2つのリ
ード端子2,3又は3,4又は2.4を順次選択してこ
の間に電流を流しこれらリード端子間の電圧を測定して
半田ブリッジの有無を検査するが、この検査されるリー
ド端子2,3間が可動接片6により導通状態にある場合
このリード端子2,3間の半田ブリッジの有無を検出J
ることができない。このため、従来はスイッチの検査途
中で検査中のリード端子間が可動接片で導通されないよ
う可動後Hの接続位置を順次切換えていた。従って、リ
ード端子の数が多く切換回数の多いスイッチが設けられ
たり、多数のスイッチを設【プられたプリント基板回路
では」上記スイッチの切換操作が検相で、この切換操作
工程に時間を要するという欠点があった。
Here, a switch 1 on a printed circuit board as shown in FIG. 1 may produce a solder bridge 5 between its lead terminals 2 and 3, resulting in a short circuit between the lead terminals 2 and 3. For this purpose, two lead terminals 2, 3, 3, 4, or 2.4 are sequentially selected from among the lead terminals 2.3.4 of the switch, and a current is passed between them and the voltage between these lead terminals is measured. The presence or absence of a solder bridge is inspected. If the lead terminals 2 and 3 to be inspected are in a conductive state by the movable contact piece 6, the presence or absence of a solder bridge between the lead terminals 2 and 3 is detected.
I can't do it. For this reason, conventionally, during the test of the switch, the connection position of the movable contact H was sequentially changed so that the lead terminals under test would not be electrically connected by the movable contact piece. Therefore, in printed circuit board circuits that have a large number of lead terminals and a large number of switching cycles, or are equipped with a large number of switches, the switching operation of the above-mentioned switches requires phase detection, and this switching operation process takes time. There was a drawback.

ここで、リード端子間が半田ブリッジにより導通した場
合の抵抗値は略1mΩ以下、可動接片により導通した場
合の抵抗値はその接触抵抗により5〜30IIlΩ程度
である。これら抵抗値の差を検出できれば上記可動後H
の接続位置を切換える必要はなくなるが、リード端子と
コンタク1−ビンとの間には接触抵抗があるため低抵抗
測定器を用いてもコンタクトビンを介して上記抵抗値の
差を測定することは不可能である。更に低抵抗測定器は
その信号源として交流の定電流源が必要であるため測定
器とスイッチのリード端子とを結ぶ4本のケーブル間で
上記交流信号が干渉し測定誤差を生じるため、容易に使
用できない。
Here, the resistance value when the lead terminals are electrically connected by the solder bridge is about 1 mΩ or less, and the resistance value when the lead terminals are electrically connected by the movable contact piece is about 5 to 30 IIlΩ depending on the contact resistance. If the difference between these resistance values can be detected, the H
However, since there is contact resistance between the lead terminal and the contact pin, it is not possible to measure the difference in resistance value through the contact pin even if a low resistance measuring device is used. It's impossible. Furthermore, since low-resistance measuring instruments require an AC constant current source as their signal source, the alternating current signals interfere between the four cables connecting the measuring instrument and the lead terminals of the switch, causing measurement errors. I can not use it.

また、画像処理技術でスイッチのリード端子間の半田ブ
リッジを検出することも考えられるが、半田付は部の周
囲に設けられる半田流れ防止用のパターンが白色であり
、隣接するり一ド端子の半田付は部分ではこの白色のパ
ターンが重なり半田ブリッジとの区別が難しく、また半
田ブリッジが微細な場合己れを検出することは困難であ
る。
It is also possible to use image processing technology to detect solder bridges between the lead terminals of a switch. In some parts of soldering, the white patterns overlap, making it difficult to distinguish them from solder bridges, and if solder bridges are minute, it is difficult to detect them.

本発明は上記の欠点を除去したものであり、第2図以下
と共にその一実施例につき説明する。
The present invention eliminates the above-mentioned drawbacks, and an embodiment thereof will be described with reference to FIG. 2 and the following figures.

第2図は本発明装置の一実施例のブロック系統図を示す
。同図中、8は定電流回路であり、直流電圧源9とこれ
に直列接続された抵抗Rsとより構成されており、抵抗
Rsの一端にはコンタクトビン10がリード線11によ
り接続され直流電圧源11の一端にはコンタクトビン1
2がリード線13により接続されでいる。ここC゛、第
1図示のスイッチ1のリード端子2,3間のハンダブリ
ッジの有無を検査する場合、コンタクトビン10゜12
夫々は第3図に示すプリント基板の半田面の半田イ]け
部14.15に当接される。この第3図示のプリント基
板は第1図示のスイッチ1に対応したものであり、半田
付けされたスイッチ1のリード端子2,3は夫々配線パ
ターンによって半田刊は部14.,15夫々に接続され
ている。
FIG. 2 shows a block system diagram of an embodiment of the apparatus of the present invention. In the same figure, 8 is a constant current circuit, which is composed of a DC voltage source 9 and a resistor Rs connected in series with the DC voltage source 9. A contact bin 10 is connected to one end of the resistor Rs by a lead wire 11, and a DC voltage source At one end of the source 11 is a contact bottle 1.
2 are connected by lead wires 13. Here C゛, when inspecting the presence or absence of a solder bridge between the lead terminals 2 and 3 of the switch 1 shown in the first diagram, contact bin 10゜12
Each is brought into contact with a solder hole 14, 15 on the solder surface of the printed circuit board shown in FIG. The printed circuit board shown in the third diagram corresponds to the switch 1 shown in the first diagram, and the lead terminals 2 and 3 of the soldered switch 1 are arranged in the soldering pattern 14. , 15, respectively.

また、上記スイッチ1のリード端子2,3夫々にはコン
タクトビン16.17が当接される。このコンタクトビ
ン16.17は夫々リード線1819によって差動増幅
器20の第1.第2の入力端子に接続されている。差動
増幅器20はこの第19、第2の入力端子犬々に印加さ
れる電圧を差動増幅して差電圧を胃る。この差電圧は直
流増幅器21で増幅された後、A/D変換器22でディ
ジタル愉に変換されてマイクロコンピュータ23に供給
され、ここで所定の愉と比較される。
Further, contact pins 16 and 17 are brought into contact with the lead terminals 2 and 3 of the switch 1, respectively. The contact bins 16, 17 are connected to the first . It is connected to the second input terminal. The differential amplifier 20 differentially amplifies the voltages applied to the nineteenth and second input terminals to obtain the differential voltage. This differential voltage is amplified by a DC amplifier 21, then converted into a digital value by an A/D converter 22, and supplied to a microcomputer 23, where it is compared with a predetermined value.

ここで直流電圧源9の電圧を20■、抵抗Rsを1にΩ
としてコンタクトビン10.12をショートづ−ると電
流iは20m Aである。また、コンタクトビン10,
12夫々が半田付は部14.15に当接したときの接触
抵抗とリード線11.13の抵抗及びり」ド端子3,4
が可動接片6により導通したときの接触抵抗は通常合計
10以下であり、これらの抵抗による上記電流iの変動
Δiは0.02111A以下となり、定電流回路8は変
動率0.1%、 20m Aの定電流を供給する。
Here, the voltage of the DC voltage source 9 is set to 20■, and the resistance Rs is set to 1Ω.
When the contact pins 10 and 12 are shorted as shown in FIG. 1, the current i is 20 mA. In addition, contact bin 10,
Terminals 3 and 4 are the contact resistance and the resistance of the lead wires 11 and 13 when each of the soldered parts 14 and 15 comes into contact with each other.
The contact resistance when conductive by the movable contact piece 6 is usually 10 or less in total, and the fluctuation Δi of the above current i due to these resistances is 0.02111A or less, and the constant current circuit 8 has a fluctuation rate of 0.1% and a 20 m A constant current of A is supplied.

]ンタトクビン10.12が半田イ]け部14゜15に
当接されたときリード端子2,3に半田ブリッジ5及び
可動接片6がない場合は、このリード端子2.3間の抵
抗値は無限大で電流1は流れず、リード端子2,3間の
電圧は20Vである。
] When the contact pin 10.12 is brought into contact with the solder joint 14°15, if the lead terminals 2 and 3 do not have the solder bridge 5 and the movable contact piece 6, the resistance value between the lead terminals 2 and 3 is At infinity, current 1 does not flow, and the voltage between lead terminals 2 and 3 is 20V.

次にリード端子2,3間が可動接片6で導通されかつ半
田ブリッジ5がない場合は、上記電流iが流れ、リード
端子2.3間の可動接片6による接触抵抗を例えば10
mΩとするとリード端子2.3門の電圧降下は0.2m
 Vとなる。また、リード端子2.3間に半田ブリッジ
5がある場合、このリード端子2,3間の電圧降下は半
田ブリッジ5によるリード端子2.3間の抵抗値が1m
Ω以下であるため0.02mV以下となる。
Next, when the lead terminals 2 and 3 are electrically connected by the movable contact piece 6 and there is no solder bridge 5, the current i flows and the contact resistance due to the movable contact piece 6 between the lead terminals 2 and 3 is reduced to 10, for example.
If it is mΩ, the voltage drop across 2.3 lead terminals is 0.2m.
It becomes V. In addition, when there is a solder bridge 5 between the lead terminals 2 and 3, the voltage drop between the lead terminals 2 and 3 is equal to the resistance value between the lead terminals 2 and 3 caused by the solder bridge 5 of 1 m.
Since it is Ω or less, it is 0.02 mV or less.

このリード端子2,3間の電圧は差動増幅器20で差電
圧とされ、そのディジタル値がマイクロコンピュータ2
3に供給されるが、マイクロコンピュータ23はその内
蔵するメモリに例えば電圧0.1m Vに対応した基準
電圧のディジタル値を記憶しており、このリード端子2
,3間の検査の際に上記差電圧のディジタル値とこの基
準電圧のディジタル値とを比較弁別し、差電圧が基準電
圧より低いとぎ半LTIブリッジ有り9.高いとき半田
ブリッジ無しとして半田ブリッジの有無の情報をメモリ
に書き込む。
The voltage between the lead terminals 2 and 3 is converted into a differential voltage by the differential amplifier 20, and the digital value is input to the microcomputer 2.
The microcomputer 23 stores a digital value of a reference voltage corresponding to a voltage of 0.1 mV in its built-in memory, and this lead terminal 2
9. During the inspection between 3 and 3, the digital value of the differential voltage and the digital value of this reference voltage are compared and discriminated, and the differential voltage is lower than the reference voltage.9. When the value is high, it is assumed that there is no solder bridge, and information about the presence or absence of a solder bridge is written to the memory.

この検査の回路構成は第4図に示す等価回路で表わされ
るが、コンタクトビン10.L2の接触抵抗R+ 、R
2及びリード線11.13の抵抗R3、R4は前記の如
く略無視づることができ、リード端子2,3間が可動接
片6又は半田ブリッジ5により導通しているときこのリ
ード端子2゜3間の抵抗RXに定電流回路8よりの電流
iが流れる。また、差動増幅器20の入力インピーダン
スRs 、R6をコンタクトビン16,17の接触抵抗
R7、Ra及びリード線18.19の抵抗R9,RIG
に比し−C非常に大ぎくしでお(プは、このコンタクト
ビン16.11の接触抵抗R7゜R8及びリード線18
.19の抵抗R9,RlOを無視することができ、差動
増幅器20の第1.第2の入力端子犬々の電位はリード
端子2.3の電位に等しい。このため、リード端子2,
3夫々にコンタクトビンを当接してこの間に定電流を流
し、このコンタクトビン間の電圧を測定する従来の方法
では、これらのコンタクトビンを接続するり一ド線の抵
抗R3,R4及びコンタクトビンの接触抵抗R+ 、R
2による電圧降下が含まれて正確に測定できなかったコ
ンタクトビン間の電圧降下Rx−1を高精度に測定でき
、半田ブリッジによる抵抗値と可動接片による抵抗値と
を弁別することが可能である。従ってスイッチ1の可動
接片6がリード端子3.4を導通するよう切換える必要
はない。この検査の際定電流回路8側の」ンタクI−ビ
ン10.12夫々はリード端子2.3に接続された配線
パターン上に当接させても良いが、差動増幅器20側の
コンタクトビン16.17夫々はリード端子2,3に当
接しなければならない。
The circuit configuration for this test is represented by the equivalent circuit shown in FIG. Contact resistance of L2 R+, R
2 and the resistances R3 and R4 of the lead wires 11 and 13 can be almost ignored as described above, and when the lead terminals 2 and 3 are electrically connected by the movable contact piece 6 or the solder bridge 5, A current i from the constant current circuit 8 flows through the resistor RX between them. In addition, the input impedance Rs and R6 of the differential amplifier 20 are replaced by the contact resistances R7 and Ra of the contact bins 16 and 17 and the resistances R9 and RIG of the lead wires 18 and 19.
Compared to -C, the contact resistance of this contact bottle 16.
.. The resistors R9 and RlO of the differential amplifier 20 can be ignored. The potential of the second input terminals is equal to the potential of the lead terminal 2.3. For this reason, lead terminal 2,
In the conventional method, a contact bin is brought into contact with each of the three contact bins, a constant current is passed between them, and the voltage between the contact bins is measured. Contact resistance R+, R
The voltage drop Rx-1 between the contact bins, which could not be measured accurately due to the voltage drop caused by 2, can be measured with high accuracy, and it is possible to distinguish between the resistance value due to the solder bridge and the resistance value due to the movable contact piece. be. Therefore, it is not necessary for the movable contact piece 6 of the switch 1 to switch the lead terminal 3.4 into conduction. During this inspection, the contact pins 10.12 on the constant current circuit 8 side may be brought into contact with the wiring patterns connected to the lead terminals 2.3, but the contact pins 10.12 on the differential amplifier 20 side .17 must be in contact with lead terminals 2 and 3, respectively.

また、このリード端子2,3間の検査の後、マイクロコ
ンピュータ23によってリレー(図示せず)の切換を行
ない、コンタクトビン10をリード端子4に配線パター
ンで接続された半田付は部24に当接したコンタクトビ
ンに切換え、コンタクトビン16をリード端子4に当接
したコンタク1−ビンに切換えることによりリード端子
3,4間の半田ブリッジの有無を検出する。−以下同様
にしてプリント基板回路に設けられた総てのスイッチの
リード端子間の半田ブリッジの有無を検出り゛る。
After the inspection between the lead terminals 2 and 3, a relay (not shown) is switched by the microcomputer 23, and the soldered contact pin 10 connected to the lead terminal 4 in the wiring pattern is connected to the part 24. The presence or absence of a solder bridge between the lead terminals 3 and 4 is detected by switching the contact bin 16 to the contact 1-bin that is in contact with the lead terminal 4. - The presence or absence of solder bridges between the lead terminals of all the switches provided on the printed circuit board circuit is then detected in the same manner.

このようにして、スイッチの検査途中で可動接片の接続
位置を切換えるための複雑で時間のかかる工程をなくづ
ことができる。
In this way, the complicated and time-consuming process of switching the connection position of the movable contact piece during inspection of the switch can be eliminated.

なお、スイッチの検査の後、プリント基板回路の他の電
子部品の検査が従来通り行なわれるのはもちろんである
After the switch is inspected, it goes without saying that other electronic components of the printed circuit board circuit are inspected as usual.

なお、スイッチ以外にも内部に直流抵抗値を持ちかつリ
ード端子の間隔が狭い電子部品例えばIFT(中間周波
トランス)コイル、ボリウム等のリード端子間の半田ブ
リッジを検出づることも可能であり、上記実施に限定さ
れない。
In addition to switches, it is also possible to detect solder bridges between lead terminals of electronic components that have an internal DC resistance value and whose lead terminals are narrowly spaced, such as IFT (intermediate frequency transformer) coils and volume regulators. Not limited to implementation.

上述の如く、本発明になる電子部品のリード端子間の半
田ブリッジ検出装置は、プリント基板の配線パターンに
リード端子を半田付けされ、内部で導通状態にある電子
部品のリード端子間の抵抗値を測定するにあたり、測定
すべきリード端子犬々が接続された配線パターン上の点
間に直流電流を供給し、測定ツベぎリード端子間の電圧
を検出してこのリード端子間の抵抗を測定し、電子部品
内部を介し1=抵抗値とリード端子間の半田ブリッジを
介した抵抗値との差を弁別し、リード端子間の半田ブリ
ッジの有無を検出するため、例えばスイッチの可動接片
がどのような接続位置にあってもスイッチのリード端子
間の半田ブリッジ・の有無を検出づ゛ることができ、従
ってスイッチの接続位置を切換える切換操作工程が不用
となり、プリント基板回路の検査工程を完全に自動化で
き、この検査時間を短縮覆ることができる等の特長を有
するものである。
As described above, the solder bridge detection device between the lead terminals of an electronic component according to the present invention detects the resistance value between the lead terminals of an electronic component that is soldered to the wiring pattern of a printed circuit board and is in a conductive state internally. To perform the measurement, a direct current is supplied between the points on the wiring pattern to which the lead ends to be measured are connected, the voltage between the measurement lead terminals is detected, and the resistance between the lead terminals is measured. In order to detect the presence or absence of a solder bridge between lead terminals by distinguishing the difference between the resistance value 1 = resistance value through the inside of the electronic component and the resistance value through the solder bridge between the lead terminals, for example, the movable contact piece of the switch is It is possible to detect the presence or absence of solder bridges between the switch lead terminals even when the switch is in a different connection position. Therefore, the switching operation process of changing the connection position of the switch is no longer necessary, and the inspection process of printed circuit board circuits can be completely completed. It has the advantage of being automated and shortening the inspection time.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はスイッチの一例の一部切截側面図、第2図は本
発明装置の一実施例のブロック系統図、第3図は本発明
装置を適用されるプリント基板回路の一例の半lu面を
示り一部、第4図は第2図の一部の等価回路図である。 1・・・スイッチ、2〜4・・・リード端子、5・・・
半田ブリッジ、6・・・可動接片、8・・・定電流回路
、9・・・直流電圧源、1.0.12.16.17・・
・コンタクトビン、11,13,18.19・・・リー
ド線、14.15.24・・・半田(=J【プ部分、2
o・・・差動増幅器、21・・・直流増幅器、22・・
・A/D・・・変換器、23・・・マイクロコンビコー
タ。 手続補正書 昭和58年2月24日 1、事件の表示 昭和57年特 許 願第 229584号2、発明の名
称 電子部品のリード端子間の半田ブリッジ検出装置3、補
正をする者 特  許 出願人 住 所  畳221  神奈川県横浜市神奈用区守屋町
3丁目12番地名称 (432)  日本ビクター株式
会社代表者 取Hi+役社長  宍 道一部未代理人 6、補正の対象 明細書の発明の詳細な説明の簾及び図面。 Z補正の内容 (1ン 明細書中、第5頁第2行の「11」を「9」と
補正する。 (2)同、第6頁第7行のr3,4Jをr2.5Jと補
正する。 (6)  図面中、第2図を、別紙図面写しに朱書せる
如く補正する。
Fig. 1 is a partially cutaway side view of an example of a switch, Fig. 2 is a block diagram of an embodiment of the device of the present invention, and Fig. 3 is a half-lu of an example of a printed circuit board circuit to which the device of the present invention is applied. FIG. 4 is an equivalent circuit diagram of a portion of FIG. 2. 1...Switch, 2-4...Lead terminal, 5...
Solder bridge, 6... Movable contact piece, 8... Constant current circuit, 9... DC voltage source, 1.0.12.16.17...
・Contact bottle, 11, 13, 18. 19... Lead wire, 14. 15. 24... Solder (=J[pu part, 2
o... Differential amplifier, 21... DC amplifier, 22...
・A/D...Converter, 23...Micro Combi Coater. Procedural amendment dated February 24, 1980 1, Case indication 1982 Patent Application No. 229584 2, Title of invention Solder bridge detection device between lead terminals of electronic components 3, Person making the amendment Patent Applicant Address Tatami 221 3-12 Moriya-cho, Kanayō-ku, Yokohama, Kanagawa Prefecture Name (432) Japan Victor Co., Ltd. Representative Tori Hi+Yaku President Shishi Michi Part 6 Unrepresented, details of the invention in the specification subject to amendment Explanatory blinds and drawings. Contents of Z correction (1) In the specification, "11" in the second line of page 5 is corrected to "9". (2) r3, 4J in the seventh line of page 6 is corrected to r2.5J. (6) Amend Figure 2 of the drawings so that it can be written in red on the attached copy of the drawings.

Claims (1)

【特許請求の範囲】[Claims] プリン1一基板の配線パターンにリード端子を半田イ1
けされ、内部で導通状態にある電子部品のり一ド端子間
の抵抗値を測定するにあたり、測定リーへきり一ド端子
夫々が接続された配線パターン上の点間に直流電流を供
給し、該測定すべきり一ド端子間の電圧を検出して該リ
ード端子間の抵抗を測定し、該電子部品内部を介した抵
抗値と該り一ド端子間の半田ブリッジを介した抵抗値と
の差を弁別し、該リード端子間の半田ブリッジの有無を
検出覆ることを特長とづ゛る電子部品のリード端子間の
半田ブリッジ検出装置。
Solder the lead terminals to the wiring pattern on the printed circuit board 1
To measure the resistance value between the wire terminals of an electronic component that has been connected to the wire and is in a conductive state internally, a direct current is supplied to the measurement lead between the points on the wiring pattern to which each wire terminal is connected. Detect the voltage between the lead terminals to be measured, measure the resistance between the lead terminals, and measure the difference between the resistance value through the inside of the electronic component and the resistance value through the solder bridge between the lead terminals. 1. A device for detecting solder bridges between lead terminals of electronic components, which detects the presence or absence of solder bridges between the lead terminals.
JP57229584A 1982-12-29 1982-12-29 Apparatus for detecting solder bridge between lead terminals of electronic parts Pending JPS59122970A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57229584A JPS59122970A (en) 1982-12-29 1982-12-29 Apparatus for detecting solder bridge between lead terminals of electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57229584A JPS59122970A (en) 1982-12-29 1982-12-29 Apparatus for detecting solder bridge between lead terminals of electronic parts

Publications (1)

Publication Number Publication Date
JPS59122970A true JPS59122970A (en) 1984-07-16

Family

ID=16894468

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57229584A Pending JPS59122970A (en) 1982-12-29 1982-12-29 Apparatus for detecting solder bridge between lead terminals of electronic parts

Country Status (1)

Country Link
JP (1) JPS59122970A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102095956A (en) * 2009-12-11 2011-06-15 名硕电脑(苏州)有限公司 Detecting device and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102095956A (en) * 2009-12-11 2011-06-15 名硕电脑(苏州)有限公司 Detecting device and method

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