JPS59100219U - Light emitting diode test equipment - Google Patents

Light emitting diode test equipment

Info

Publication number
JPS59100219U
JPS59100219U JP19935282U JP19935282U JPS59100219U JP S59100219 U JPS59100219 U JP S59100219U JP 19935282 U JP19935282 U JP 19935282U JP 19935282 U JP19935282 U JP 19935282U JP S59100219 U JPS59100219 U JP S59100219U
Authority
JP
Japan
Prior art keywords
light
emitting diode
light emitting
test equipment
diode test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19935282U
Other languages
Japanese (ja)
Inventor
芦沢 運二
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP19935282U priority Critical patent/JPS59100219U/en
Publication of JPS59100219U publication Critical patent/JPS59100219U/en
Pending legal-status Critical Current

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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はLEDの光度を測定分類する従来の試験装置の
構成図、第2図は本考案によるLEDの光度試験装置の
構成図、第3図は第2図の各部における信号及び出力電
圧のタイミングチャートである。
Fig. 1 is a block diagram of a conventional test device for measuring and classifying the luminous intensity of LEDs, Fig. 2 is a block diagram of the LED luminous intensity testing device according to the present invention, and Fig. 3 shows the signals and output voltages in each part of Fig. 2. This is a timing chart.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 発光ダイオードの光度の測定装置において光センサーの
受光面に入る外部光のリーク、光センサー及びプリアン
プのオフセット等による誤差電圧を保持するサンプルア
ンドホールド回路を有し、測定ディバイス毎に自動的に
誤差補正をすることを特徴とする1発光ダイオードの光
度試験装置。
A light-emitting diode light intensity measurement device has a sample-and-hold circuit that holds error voltages caused by leakage of external light entering the light-receiving surface of the light sensor, offset of the light sensor and preamplifier, etc., and automatically corrects errors for each measurement device. 1. A light intensity testing device for light emitting diodes.
JP19935282U 1982-12-24 1982-12-24 Light emitting diode test equipment Pending JPS59100219U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19935282U JPS59100219U (en) 1982-12-24 1982-12-24 Light emitting diode test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19935282U JPS59100219U (en) 1982-12-24 1982-12-24 Light emitting diode test equipment

Publications (1)

Publication Number Publication Date
JPS59100219U true JPS59100219U (en) 1984-07-06

Family

ID=30424889

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19935282U Pending JPS59100219U (en) 1982-12-24 1982-12-24 Light emitting diode test equipment

Country Status (1)

Country Link
JP (1) JPS59100219U (en)

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