JPS5896259U - contact pin - Google Patents

contact pin

Info

Publication number
JPS5896259U
JPS5896259U JP19158081U JP19158081U JPS5896259U JP S5896259 U JPS5896259 U JP S5896259U JP 19158081 U JP19158081 U JP 19158081U JP 19158081 U JP19158081 U JP 19158081U JP S5896259 U JPS5896259 U JP S5896259U
Authority
JP
Japan
Prior art keywords
contact pin
terminal
axis
head
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19158081U
Other languages
Japanese (ja)
Inventor
国重 健二
浅井 健三
Original Assignee
富士通株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士通株式会社 filed Critical 富士通株式会社
Priority to JP19158081U priority Critical patent/JPS5896259U/en
Publication of JPS5896259U publication Critical patent/JPS5896259U/en
Pending legal-status Critical Current

Links

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  • Measuring Leads Or Probes (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はリレーの接点接触抵抗測定製図のリレーとの接
続部分の斜視図、第2図の49口は第1図の接触部分の
断面図、第3図のイ11ロ、ハそれぞれ従来の接触ピン
の頭部断面図、第4図は本考案の一実施例の接触ピンの
頭部のイは斜視図、口は軸心方向に切断した断面図であ
る。 図中1はプリント板、2はリレー、3は接点端子、4は
絶縁基板、5は接触ピン、7はリード線、8はスリーブ
、9は引張コイルばね、10.11゜12は接触ピンの
頭部、13は小孔、14は稜線を示す。
Figure 1 is a perspective view of the connection part with the relay of the relay contact resistance measurement drawing, port 49 in Figure 2 is a sectional view of the contact part in Figure 1, and Figure 3 A, 11B, and C are the conventional FIG. 4 is a perspective view of the head of the contact pin according to an embodiment of the present invention, and the opening is a cross-sectional view taken in the axial direction. In the figure, 1 is a printed board, 2 is a relay, 3 is a contact terminal, 4 is an insulating board, 5 is a contact pin, 7 is a lead wire, 8 is a sleeve, 9 is a tension coil spring, 10.11° 12 is a contact pin The head, 13 is a small hole, and 14 is a ridgeline.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)端子の端面に接触ピンの頭部が当接し該端子と電
気的に接続する接触ピンにおいて、該接触ピンの頭部の
軸心に孔を設け、該軸心より放射線状に前記端子の端面
に向って凸なる複数の稜線を形成せしめてなることを特
徴とする接触ピン。
(1) In a contact pin in which the head of the contact pin abuts the end surface of the terminal and is electrically connected to the terminal, a hole is provided in the axis of the head of the contact pin, and a hole is provided radially from the axis to the terminal. A contact pin characterized by forming a plurality of ridge lines convex toward an end face of the pin.
(2)  前記稜線が軸心より外周に向けて上方に傾斜
してなることを特徴とする実用新案登録請求の範囲第1
項に記載の接触ピン。
(2) Utility model registration claim 1, characterized in that the ridge line is inclined upward from the axis toward the outer circumference.
Contact pins as described in section.
JP19158081U 1981-12-22 1981-12-22 contact pin Pending JPS5896259U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19158081U JPS5896259U (en) 1981-12-22 1981-12-22 contact pin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19158081U JPS5896259U (en) 1981-12-22 1981-12-22 contact pin

Publications (1)

Publication Number Publication Date
JPS5896259U true JPS5896259U (en) 1983-06-30

Family

ID=30105033

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19158081U Pending JPS5896259U (en) 1981-12-22 1981-12-22 contact pin

Country Status (1)

Country Link
JP (1) JPS5896259U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017141706A1 (en) * 2016-02-15 2017-08-24 日本発條株式会社 Conductive contact for inspection, and semiconductor inspecting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017141706A1 (en) * 2016-02-15 2017-08-24 日本発條株式会社 Conductive contact for inspection, and semiconductor inspecting device
JP6243584B1 (en) * 2016-02-15 2017-12-06 日本発條株式会社 Conductive contact for inspection and semiconductor inspection apparatus
US10274517B2 (en) 2016-02-15 2019-04-30 Nhk Spring Co., Ltd. Conductive probe for inspection and semiconductor inspection device

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