JPS5891168A - Magnetron type sputtering device - Google Patents

Magnetron type sputtering device

Info

Publication number
JPS5891168A
JPS5891168A JP19207282A JP19207282A JPS5891168A JP S5891168 A JPS5891168 A JP S5891168A JP 19207282 A JP19207282 A JP 19207282A JP 19207282 A JP19207282 A JP 19207282A JP S5891168 A JPS5891168 A JP S5891168A
Authority
JP
Japan
Prior art keywords
target
sputtering
magnet
grooves
ferromagnetic material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19207282A
Other languages
Japanese (ja)
Other versions
JPS5943548B2 (en
Inventor
Susumu Watanabe
渡辺 迪
Tetsuo Kurisaki
栗崎 哲雄
Yoshinori Ito
嘉規 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Tokuda Seisakusho Co Ltd
Original Assignee
Toshiba Corp
Tokuda Seisakusho Co Ltd
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokuda Seisakusho Co Ltd, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP19207282A priority Critical patent/JPS5943548B2/en
Publication of JPS5891168A publication Critical patent/JPS5891168A/en
Publication of JPS5943548B2 publication Critical patent/JPS5943548B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering
    • H01J37/3408Planar magnetron sputtering

Abstract

PURPOSE:To sputter a ferromagnetic material through a magnetron type sputtering device, by providing grooves in the surface of a ferromagnetic material target, and giving N or S polarity to its opposite end part. CONSTITUTION:In the surface of a target 1 made of a ferromagnetic material such as Fe, Ni, and Co, grooves 3 are formed and on its reverse surface, an E- shaped magnet 3 is provided. The device is evacuated to a low vacuum, Ar gas is admitted, and the magnet 2 established a magnetic field to the target 1. The thickness of the target 1 is reduced partially at the grooves 3, so magnetic saturation is easily obtained by using a relatively weak magnet 2 to form lines of magnetic force 15 between the N and S poles. At this time, a voltage from a power source 12 is applied between the target 1 as a cathode and an anode 11 to cause glow discharged, and then the target material is hit out of the grooves 3 by the impact of cations to form a plating film 16 of the ferromagnetic material on the surface of a substrate 13, thus performing low-temperature speedy magnetron sputtering.

Description

【発明の詳細な説明】 本発明はマグネ)oン型スパッタ装置に関し、特にター
ゲットの材料及θ形状を改良したマグネトロン型スパッ
タ装置に係る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a magnetron type sputtering apparatus, and more particularly to a magnetron type sputtering apparatus in which the material and θ shape of the target are improved.

近年、無公害なメッキ方法として、蒸着法、イオンブレ
ーティング法、スパッタリング法などの真空メッキ法が
盛んに用いられるようになりてきた。これらの方法は、
いずれの場合でもメッキ基板の表面温度が上昇し、特に
プラスチックなどをメッキ基板とする場合には、基板を
劣化される問題があった。このうち、スパッタリング法
は不活性ガスの低真空中でグロー放電を行なったとき、
その放電で陰極(ターゲット)の金属が陽イオンの衝撃
によりたえき出されて、メッキ基板の表面に付着するも
ので、合金の組成を変える之となくメッキ皮膜が得られ
、しかも高融点材料のメッキも可能であるという特色を
有している。しかしこの方法はスパッタ速度が遅く、作
業圧力が高い上、前述の如くメッキ基板の表面温度が上
昇するといった欠点があるため、限られた分野でしか応
用されていなかった。
In recent years, vacuum plating methods such as vapor deposition, ion blating, and sputtering have come into widespread use as non-polluting plating methods. These methods are
In either case, the surface temperature of the plated substrate increases, and especially when the plated substrate is made of plastic or the like, there is a problem that the substrate is deteriorated. Among these, the sputtering method uses glow discharge in a low vacuum of inert gas.
During the discharge, the cathode (target) metal is ejected by the impact of cations and adheres to the surface of the plating substrate.A plating film is obtained without changing the composition of the alloy, and it is made of high melting point material. It has the feature that it can also be plated. However, this method has the drawbacks of slow sputtering speed, high working pressure, and, as mentioned above, an increase in the surface temperature of the plated substrate, so it has been applied only in limited fields.

この点を改善するため、ターゲットの裏面に磁石を配置
して放電空間に於ける電界に直交した磁石をかけるよう
にしたマグネトロン型のスパッタ装置が開発された。こ
の装置は放電に伴って生成された電子が磁界によシ曲け
られて、ドリフト運動を行なうようにして、陰極(ター
ゲット)に対向して配置されたメッキ基板に電子が流入
するのを防止して、メッキ基板の温度上昇を抑えるよう
にしたものである。しかもこの装置は磁力線がターゲッ
ト表面近傍で長い連続軌道を持ち高い密度の電子雲が形
成されるため、低い圧力においても効率良く気体を電離
でき、大電力を投入してもメッキ基板の温度上昇が抑え
られるので、蒸着に近い高速スバ、りが可能で、プラス
チックなど熱損傷を受は易いメッキ基板に良好なメッキ
皮膜を形成することができる。
In order to improve this point, a magnetron type sputtering device was developed in which a magnet is placed on the back surface of the target so that the magnet is applied orthogonally to the electric field in the discharge space. This device prevents electrons from flowing into the plating substrate placed opposite the cathode (target) by bending the electrons generated by the discharge into a magnetic field and performing a drift motion. This suppresses the temperature rise of the plated substrate. Moreover, in this device, the lines of magnetic force have long continuous orbits near the target surface, forming a high-density electron cloud, so gas can be efficiently ionized even at low pressures, and the temperature of the plated substrate does not rise even when high power is applied. This allows for high-speed sputtering, which is similar to vapor deposition, and enables the formation of good plating films on plated substrates that are easily susceptible to heat damage, such as plastics.

しかしながら、このマグネット型スパッタ装置のターゲ
ットは、その材料として強磁性体を使用しないことが常
識とされていた。この理由はターゲットの表面近傍に磁
力線が存在することが低温高速スパッタを行なうための
要件であ・者トとから、鉄、ニッケル、コバルトなどの
強磁性体でターゲットを構成すると、磁力線がこの中を
通シ、外部に出にくくなると考えられていた丸めである
。しかもターゲットはスパッタ材料で構成されているこ
とから、形成されるメッキ皮膜は磁石に吸引されない材
料で、その上、比較的成形性に優れた材料に限定されて
いた。
However, it has been common knowledge that a ferromagnetic material is not used as a material for the target of this magnet type sputtering apparatus. The reason for this is that the presence of magnetic lines of force near the surface of the target is a requirement for low-temperature, high-speed sputtering, so when the target is made of a ferromagnetic material such as iron, nickel, or cobalt, the lines of magnetic force are This rounding was thought to make it difficult for the rounding to come out. Moreover, since the target is made of a sputtered material, the plated film formed is limited to materials that are not attracted to the magnet and, furthermore, have relatively excellent formability.

またターゲットはこれ自体がスパッタ材料で構成されて
いることからメッキの進行と共に消費されて行き、適宜
、新たなターゲットを取付けなければならず作業性が悪
かった。
Further, since the target itself is made of sputtered material, it is consumed as plating progresses, and a new target must be attached as needed, resulting in poor workability.

本発明は、かかる点に鑑み、強磁性体を始めとして、あ
らゆる材料のスパッタリングが可能で、しかも低温高速
のスパッタリングが可能なマグネトロン型スパッタ装置
を提供することを目的とするものである。
In view of these points, it is an object of the present invention to provide a magnetron type sputtering apparatus that is capable of sputtering all kinds of materials including ferromagnetic materials, and is also capable of sputtering at low temperatures and high speeds.

以下、本発明を図面を参照して詳細に説明する。Hereinafter, the present invention will be explained in detail with reference to the drawings.

第1図は本発明の一実施例を示すもので、図中の1は鉄
、ニッケル、コバルト、又はこれらの合金からなる強磁
性体のターゲットであシ、このターゲット1の裏面には
E字形状をなす磁石2が設けられている。また、前記磁
石2のN極と8極の中間に位置するターゲット1の表面
にはU型状をなす2個の溝部3.3が形成され、該溝部
3,3の対向する端部の一方はN極、他方が8極となる
。前記磁石2には該磁石2を支持するカバー4が取付け
られている。更にこのカバー4は絶縁碍子5を介して真
空壁6の開口部に取付けられ、この真空壁6により大気
側7と内部の真空側8とを隔離している。
FIG. 1 shows an embodiment of the present invention, and numeral 1 in the figure is a ferromagnetic target made of iron, nickel, cobalt, or an alloy thereof. A shaped magnet 2 is provided. Further, two U-shaped grooves 3.3 are formed on the surface of the target 1 located between the N pole and the 8 pole of the magnet 2, and one of the opposing ends of the grooves 3,3 is formed. is the N pole, and the other is the 8 pole. A cover 4 for supporting the magnet 2 is attached to the magnet 2. Further, this cover 4 is attached to an opening of a vacuum wall 6 via an insulator 5, and the vacuum wall 6 isolates an atmospheric side 7 from an internal vacuum side 8.

また前記磁石2にはカバー4を通して冷却水の流入管9
と流出管10とが設けられ、磁石2を常時冷却するよう
になっている。
In addition, the magnet 2 is provided with a cooling water inflow pipe 9 that passes through the cover 4.
and an outflow pipe 10 are provided to constantly cool the magnet 2.

11は陰極となるターゲット1に対向して配置された陽
極で、電源12を介して陰極側の磁石2に接続されてい
る。なお図において13はメッキ基板、14はガスケッ
トを夫々示す。
Reference numeral 11 denotes an anode disposed facing the target 1 serving as a cathode, and is connected to the magnet 2 on the cathode side via a power source 12. In the figure, 13 indicates a plated substrate, and 14 indicates a gasket.

しかして、上記マグネトロン型スパッタ装置において、
その作用を説明すると、先ず装置内を低真空にしてアル
ゴンガスを導入し、所定の内圧に保持する。一方、磁石
2によりターゲット1に磁場を与えると、該ターゲット
1の厚さは溝部3.3の箇所で部分的に薄くしであるの
で、比較的磁力の弱い磁石2を用いても容易に磁気飽和
体に達し、溝部3.3の所で破總で示すように磁力線1
5がN極とS極との間に形成される。この状態で電源1
2により陰極となるターゲット1と陽極11との間に電
圧を印加すると、グロー放電が生じてターゲット1を構
成するスパッタ材料が陽イオンの衝撃により前記溝部3
.3から優先的にた九き出され、メッキ基板13の表面
に付着して強磁性体のメッキ皮膜16が形成され、低温
高速のマグネトロンスパッタがなされる。
However, in the above magnetron type sputtering apparatus,
To explain its operation, first, the inside of the device is made into a low vacuum, argon gas is introduced, and the internal pressure is maintained at a predetermined level. On the other hand, when a magnetic field is applied to the target 1 by the magnet 2, the thickness of the target 1 is partially thinned at the groove portion 3.3, so even if the magnet 2 with a relatively weak magnetic force is used, it is easily magnetized. The saturated body is reached, and magnetic field lines 1 are formed at groove 3.3 as shown by the broken line.
5 is formed between the north and south poles. In this state, power supply 1
2, when a voltage is applied between the target 1 which becomes a cathode and the anode 11, a glow discharge occurs and the sputtering material constituting the target 1 is exposed to the groove 3 due to the impact of cations.
.. 3, and adheres to the surface of the plated substrate 13 to form a ferromagnetic plating film 16, which is subjected to low-temperature, high-speed magnetron sputtering.

なお、溝部3の形状としては、第1図に示すようにU型
状のものに限らず第2図に示すようにV型状をなすもの
、あるいは第3図に示すように皿状をなすものなど何れ
の形状のものでも良い。
Note that the shape of the groove 3 is not limited to a U-shape as shown in FIG. 1, but may be V-shape as shown in FIG. 2, or a dish-shape as shown in FIG. It may be of any shape.

更に本発明は、スパッタ材料自体でターゲット1を構成
せず、第4図に示すように強磁性体でターゲット1を構
成すると共に、とのターゲット10表面に設けた溝部3
に非磁性材料からなるスパッタ材料17を充填して、ス
パッタリングを行なっても良い、この場合、前記溝部3
に対応して、スパッタ材料17を溝部3に供給するフィ
ーダー18.18が設けられている。
Furthermore, in the present invention, the target 1 is not made of the sputtering material itself, but is made of a ferromagnetic material as shown in FIG.
Sputtering may be performed by filling the sputtering material 17 made of a non-magnetic material into the groove portion 3.
Correspondingly, a feeder 18.18 is provided which supplies the sputtered material 17 to the groove 3.

この装置では、磁石2の磁力を調整し、溝部30所で、
その端部の一方をN極、他方をS極として、これらの間
に磁力線15が形成されるようにすると、強磁性体で構
成されたターゲット1がスパッタリングに対して安定と
なり、溝部3に充填した非磁性体からなるスパッタ材料
17が優先的にスパッタリングされて、メッキ基板13
の表面に低温高速でメッキ皮膜16を形成させることが
できる。
In this device, the magnetic force of the magnet 2 is adjusted, and at 30 grooves,
When one of the ends is set as the north pole and the other as the south pole, and magnetic lines of force 15 are formed between them, the target 1 made of ferromagnetic material becomes stable against sputtering, and the groove 3 is filled. The sputtered material 17 made of a non-magnetic material is preferentially sputtered onto the plated substrate 13.
The plating film 16 can be formed on the surface at low temperature and high speed.

従って、スパッタ材料12としては粉状、粒状をなす材
料や、成形性の悪い材料、あるいは高価な材料などでメ
ッキ皮膜16を形成する場合に%に有効である。また異
種金属の粉体、粒体を混合したスパッタ材料17を充填
することにより、容易に所定の組成比の合金メッキ皮膜
16を形成することもできる。また上記装置はフィーダ
ー18を備えていることからスパッタ材料11が連続的
に供給され、従来の如くスパVり材料自体でターゲット
を構成し、次第に消耗して行くものに比べて、著しく作
業性を向上させることができる。
Therefore, the sputtering material 12 is most effective when forming the plating film 16 using a powdered or granular material, a material with poor formability, or an expensive material. Further, by filling the sputtering material 17 which is a mixture of powders and particles of different metals, the alloy plating film 16 having a predetermined composition ratio can be easily formed. Furthermore, since the above-mentioned apparatus is equipped with a feeder 18, the sputtering material 11 is continuously supplied, and the workability is significantly improved compared to the conventional method in which the sputtering material itself constitutes the target and gradually wears out. can be improved.

なお上記実施例ではフィーダー18を備えたものについ
て示したが、スパッタ材料11が箔状であるような場合
には、自動的に供給することが難しく、必ずしもフィー
ダー18を設けていなくとも良い。
In the above embodiment, the feeder 18 is provided, but if the sputtered material 11 is in the form of a foil, it is difficult to automatically supply the sputtered material 11, so the feeder 18 may not necessarily be provided.

次に、本発明の具体的表実施例について説明する。Next, a specific table embodiment of the present invention will be described.

実施例1 第4図に示す如きスパッタ装置に&いて、フィーダー1
8を設けず、ま九ターゲット1を鉄で構成して、その表
面にはげ4 W I深さ4mの溝部3.3を形成し九も
のを用いた。前記溝部3.3にスパッタ材料17として
銀のリボン材を挿入、充填した。この状態で装置内を真
空にしてアルゴンガスを導入し、アルゴン分圧を3 X
 10”−”Torrとし、直流電圧420V、電流2
Aの電力を与えた。またメッキ基板13としてプラスチ
ック板を用い、メッキ基板13とターゲット1の距離を
100nとしてスパッタリングを行なり九ところ、プラ
スチック板の表面に400オノグストロ一ム/分の成膜
速度で成好な釧メッキ皮膜が形成され、ま九プラスチッ
ク板の表面には何ら熱変形は認められなかつ九。
Example 1 In a sputtering apparatus as shown in FIG.
8 was not provided, the target 1 was made of iron, and a groove 3.3 with a depth of 4 m was formed on the surface of the target 1. A silver ribbon material was inserted and filled into the groove 3.3 as the sputtering material 17. In this state, evacuate the inside of the device and introduce argon gas, increasing the argon partial pressure to 3
10"-" Torr, DC voltage 420V, current 2
I gave power to A. In addition, using a plastic plate as the plating substrate 13, sputtering was performed with the distance between the plating substrate 13 and the target 1 being 100 nm, and a well-formed sputtering film was formed on the surface of the plastic plate at a film formation rate of 400 mm/min. was formed, and no thermal deformation was observed on the surface of the plastic plate.

実施例2 第4図に示す如きスパッタ装置においてフづ−ダー18
を設けず、またターゲット1を鉄で構成し、その表面に
第3図に示すような皿状の溝部3を形成したものを用い
た。この溝部3に、約50メツシーの金粉末と、同じく
約50メツシユの銀粉末を予じめ重量比で1:1とまる
ように混合した混合粉末をスパッタ材料17として充填
し九、この状態でアルゴン分圧を3 X 10−”To
rrとし、直流電圧400V、電流1.5Aとして、プ
ラスチック板からなるメッキ基板130表面にスパッタ
リングを行なったところ、表面に300オンゲスト目−
ム/分の成膜速度でAu−Ag合金のメッキ皮膜が得ら
れた。
Embodiment 2 In a sputtering apparatus as shown in FIG.
The target 1 was made of iron and had a dish-shaped groove 3 formed on its surface as shown in FIG. 3. This groove 3 is filled with a sputtering material 17, which is a mixture of about 50 meshes of gold powder and about 50 meshes of silver powder mixed in advance at a weight ratio of 1:1. The partial pressure is 3 x 10-”To
When sputtering was performed on the surface of the plated substrate 130 made of a plastic plate at a DC voltage of 400 V and a current of 1.5 A, the 300-th on-guest surface appeared on the surface.
A plating film of Au-Ag alloy was obtained at a film-forming rate of m/min.

実施例3 第4図に示す如きフィーダー18.18を2個設けたス
パッタ装置において、ターゲット1を鉄で構成し、その
表面に第3図に示すような皿状の溝部3を形成し九もの
を用いた。前記フィーダー18からスパッタ材料11と
して粒径0.5〜1■の金属クロムを溝部3に連続的に
供給した。また装置内のアルゴン分圧を2.2 x 1
0−”Torrとし、直流電圧400V、電流2.5A
で、プラスチック板からなるメッキ基板13の表面にス
パッタリングを行なったところ、純度の高い金属クロム
のメッキ皮膜が形成され、また連続作業が可能であった
Example 3 In a sputtering apparatus equipped with two feeders 18 and 18 as shown in FIG. 4, the target 1 was made of iron, and a plate-shaped groove 3 as shown in FIG. 3 was formed on the surface of the target. was used. Metallic chromium having a particle size of 0.5 to 1 square inch was continuously supplied to the groove 3 as the sputtering material 11 from the feeder 18 . Also, the argon partial pressure inside the device is 2.2 x 1
0-” Torr, DC voltage 400V, current 2.5A
When sputtering was performed on the surface of the plating substrate 13 made of a plastic plate, a highly pure metal chromium plating film was formed, and continuous operation was possible.

実施例4 第4図に示す如きフィーダー18 、.1.IIを2個
設けたスパッタ装置において、ターゲット1をニッケル
で構成し、一方のフィーダー18に約50メツシ旗の金
粉末を入れ、他方のフィーダー18に約50メツシユの
錫粉末を入れた。
Embodiment 4 Feeders 18, . . . as shown in FIG. 1. In a sputtering apparatus equipped with two IIs, the target 1 was made of nickel, one feeder 18 was filled with about 50 meshes of gold powder, and the other feeder 18 was filled with about 50 meshes of tin powder.

また装置内のアルゴン分圧を2.2 X 10−”To
rr 。
In addition, the argon partial pressure inside the device was set to 2.2 x 10-”To
rr.

直流電圧450V、電流2.5Aとし、一方のフィーダ
ー18からスパッタ材料17として金粉末を溝部3に供
給しながらスパッタリングを行なった後、他方のフィー
ダー18から別のスパッタ材料17として錫粉末を他方
の溝部3に供給してスパッタリングを行ない、この操作
を交互に行なった。この結果、プラスチックからなるメ
ッキ基板13の表面に金と錫の多層メッキ皮膜が形成さ
れ、またプラスチックの表面には側ら熱変形は認められ
なかった。
After performing sputtering with a DC voltage of 450 V and a current of 2.5 A while supplying gold powder as sputtering material 17 from one feeder 18 to the groove 3, tin powder is supplied as another sputtering material 17 from the other feeder 18 to the other sputtering material 17. Sputtering was performed by supplying the material to the groove 3, and this operation was performed alternately. As a result, a multilayer plating film of gold and tin was formed on the surface of the plated substrate 13 made of plastic, and no lateral thermal deformation was observed on the surface of the plastic.

以上説明した如く、本発明に係るマグネトロン型スパッ
タ装置によれば、従来、不可能とされていた強磁性体を
始め、あらゆる材料の低温高速スパッタリングが可能で
あり、かつターゲラ)K溝部を設けてここに充填したス
パッタ材料を優先的にスパッタリングできるので、成盤
性の悪い材料や、粉状、粒状、あるいは箔状力ど何れの
形状の材料でも容易にスパッタリングすることができる
。更に本発明によれば、ターゲットに設けた溝部に対応
してスパッタ材料を供給するフィーダーを設けることに
よシ、連続作業も可能になるなど、スパッタ材料自体で
ターゲットを構成していた従来装置に比べて著しく作業
性を向上させることができる。
As explained above, according to the magnetron type sputtering apparatus according to the present invention, it is possible to perform low-temperature, high-speed sputtering of all kinds of materials including ferromagnetic materials, which was previously considered impossible. Since the sputtering material filled here can be preferentially sputtered, it is possible to easily sputter materials with poor plate forming properties or materials in any shape such as powder, granules, or foil. Furthermore, according to the present invention, by providing a feeder for supplying sputtering material in correspondence with the groove provided in the target, it is possible to perform continuous operation. The workability can be significantly improved compared to the conventional method.

【図面の簡単な説明】 第1図はターゲットの表面に溝部を設けたマグネ)oン
型スパッタ装置の正面断面図、第2図および第3図は夫
々異なる溝部の形状を示すターゲットの要部断面図、第
4図祉溝部に対応してフィーダーを設けたマグネトロン
型スパッタ装置の正面断面図である。 1・・・ターゲット、2・・・磁石、3・・・溝部、6
:・。 真空壁、11・・・陽極、12・・・電源、13・・・
メッキ基板、15・・・磁力線、16・・・メッキ凍膜
、17・・・スパッタ材料、18・・・フィーダ7゜出
願人代理人 弁理士 鈴 江 武 彦第1図 z 第2図 第3図
[Brief Description of the Drawings] Figure 1 is a front sectional view of a magneto-on type sputtering device with grooves provided on the surface of the target, and Figures 2 and 3 are the main parts of the target showing different shapes of the grooves. FIG. 4 is a front sectional view of a magnetron type sputtering device in which a feeder is provided corresponding to the groove. 1...Target, 2...Magnet, 3...Groove, 6
:・. Vacuum wall, 11... Anode, 12... Power supply, 13...
Plating substrate, 15... Magnetic field lines, 16... Plating frozen film, 17... Sputtering material, 18... Feeder 7゜ Applicant's agent Patent attorney Takehiko Suzue Figure 1 z Figure 2 Figure 3 figure

Claims (2)

【特許請求の範囲】[Claims] (1)  ターゲットの裏面に磁石を設けたマグネトロ
ン型スパッタ装置において、前記ターゲットを鉄、ニッ
ケル、コバルト又はこれらの合金などの強磁性体で形成
し、かつ前記磁石のN極とS極の中間に位置するターゲ
ットの表面に1個又は複数個の溝部を設け、該溝部の対
向する端部がN極又はS極となるようにしたことを特徴
とするマグネトロン型スパッタ装置。
(1) In a magnetron-type sputtering device in which a magnet is provided on the back surface of a target, the target is formed of a ferromagnetic material such as iron, nickel, cobalt, or an alloy thereof, and a magnet is placed between the N and S poles of the magnet. A magnetron type sputtering apparatus characterized in that one or more grooves are provided on the surface of a target, and opposing ends of the grooves serve as north poles or south poles.
(2)  ターゲットの表面に設けた溝部に対応して、
これにスパッタ材料を供給するフィーダーを備えたこと
を特徴とする特許請求の範囲第1項記載のマグネトロン
型スパッタ装置。
(2) Corresponding to the grooves provided on the surface of the target,
A magnetron type sputtering apparatus according to claim 1, further comprising a feeder for supplying sputtering material.
JP19207282A 1982-11-01 1982-11-01 Magnetron type sputtering equipment Expired JPS5943548B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19207282A JPS5943548B2 (en) 1982-11-01 1982-11-01 Magnetron type sputtering equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19207282A JPS5943548B2 (en) 1982-11-01 1982-11-01 Magnetron type sputtering equipment

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP54054986A Division JPS5813622B2 (en) 1979-05-04 1979-05-04 Magnetron type sputtering equipment

Publications (2)

Publication Number Publication Date
JPS5891168A true JPS5891168A (en) 1983-05-31
JPS5943548B2 JPS5943548B2 (en) 1984-10-23

Family

ID=16285160

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19207282A Expired JPS5943548B2 (en) 1982-11-01 1982-11-01 Magnetron type sputtering equipment

Country Status (1)

Country Link
JP (1) JPS5943548B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2551459A1 (en) * 1983-08-31 1985-03-08 Leybold Heraeus Gmbh & Co Kg ATOMIZATION CATHODE
WO1999034029A1 (en) * 1997-12-26 1999-07-08 Japan Energy Corporation Magnetic body sputtering target
KR100948547B1 (en) 2007-12-11 2010-03-18 한국원자력연구원 A high vacuum magnetron sputter gun
RU180112U1 (en) * 2017-04-20 2018-06-04 Федеральное государственное бюджетное образовательное учреждение высшего образования "Поволжский государственный технологический университет" Magnetron with increased utilization of the target material

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2551459A1 (en) * 1983-08-31 1985-03-08 Leybold Heraeus Gmbh & Co Kg ATOMIZATION CATHODE
WO1999034029A1 (en) * 1997-12-26 1999-07-08 Japan Energy Corporation Magnetic body sputtering target
KR100948547B1 (en) 2007-12-11 2010-03-18 한국원자력연구원 A high vacuum magnetron sputter gun
RU180112U1 (en) * 2017-04-20 2018-06-04 Федеральное государственное бюджетное образовательное учреждение высшего образования "Поволжский государственный технологический университет" Magnetron with increased utilization of the target material

Also Published As

Publication number Publication date
JPS5943548B2 (en) 1984-10-23

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