JPS5884692A - Detector for weld line in electron beam welding - Google Patents
Detector for weld line in electron beam weldingInfo
- Publication number
- JPS5884692A JPS5884692A JP18254081A JP18254081A JPS5884692A JP S5884692 A JPS5884692 A JP S5884692A JP 18254081 A JP18254081 A JP 18254081A JP 18254081 A JP18254081 A JP 18254081A JP S5884692 A JPS5884692 A JP S5884692A
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- zero point
- bath
- detection
- secondary energy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K15/00—Electron-beam welding or cutting
- B23K15/02—Control circuits therefor
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Welding Or Cutting Using Electron Beams (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は、′電子ビーム溶接を行なう除、カ1工片の
断目位置と、電子ビームとの位置関係音検出するための
電子ビーム浴接における浴接線検出装置に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a bath tangent detection device in electron beam bath contact for detecting the position of a cut in a work piece and the sound of the positional relationship with the electron beam, except when performing electron beam welding. It is something.
従来ごの独の装置gとして第1図V()]〈すものがあ
った。図において、lは高′11イ圧電諒、コは′−子
銃、3は電子ビーム、ダは加工片、Sは′亀子gik、
2jり発生した電子ビーム3を加工片l入面に東束式せ
るだめの東東コイル、6は力11工片lの人、困目7を
横切るように電子ビーム3を走査せしめるだめの偏向コ
イル、され1反射電子および二次電子9を捕捉するコレ
クタ、/θは信号発生器、//は波形変換部、/コは波
形変換部//からの1d号を偏向コイル乙に印刀口する
だめの電流積!鴫器、■り、および1(2は抵抗器、/
3はオシロスコープ、/グはオフ0スコーノ/3の画面
上に現れる輝点である。In the past, there was a device shown in FIG. 1 (V()). In the figure, l is a high 11-pin piezoelectric cylinder, ko is a '-child gun, 3 is an electron beam, da is a processed piece, S is a 'kameko gik',
The electron beam 3 generated by 2j is directed to the entrance surface of the workpiece l by the Toto coil, 6 is the force 11 of the workpiece l, and the deflection is made to scan the electron beam 3 across the difficulty 7. The coil is a collector that captures reflected electrons and secondary electrons 9, /θ is a signal generator, // is a waveform converter, /ko is a waveform converter that stamps No. 1d from // into the deflection coil B. No-good current product! 1 (2 is a resistor, /
3 is an oscilloscope, and /g is a bright spot appearing on the screen of OFF 0 Scono/3.
次に動作について説明する。第1図において信号発生器
10の出力は波形変換部//を社て電流増@器/2に人
力さ扛、7J+定の大きざに増幅ざnだ仮、偏向コイル
乙に供給されると共に、抵抗器R1両端よりの信号がオ
ンロスコープ/3の水平軸偏向端子/3a$−よび/、
?bに人力される。一方集束コイルs vCより力11
工片ダ衣而に果束された電子ビーム3 i11上記偏向
コ1ル乙によって〃1]工片継目7を4A切るように走
立式ノア、る。Next, the operation will be explained. In Fig. 1, the output of the signal generator 10 is manually amplified by a waveform converter///2 to a current amplifier/2, and is amplified to a constant size of 7J+, and is then supplied to the deflection coil B. , the signal from both ends of resistor R1 is the horizontal axis deflection terminal of onroscope /3 /3a$- and /,
? B is manually operated. On the other hand, the force 11 from the focusing coil s vC
The electron beam 3 that was delivered to the workpiece was turned on by the above-mentioned deflection coil (1).
また、′…、子ビーム3の反射電子1)・よび二次電子
夕はコレクタざにより捕捉?Σれオシロスコープ/3の
垂直IKiI偏向!H11子/3C,および/、ノdに
入力される。信号発生器10は三角波状の信号を出力し
、この信号は波形変換部/lで第2図に示されるととき
波形に変換部れる。第2図に示でれる波形は各電圧零点
が時間τの=+、引〜延1才ざt′lている。これによ
り、に子ビーム3が測量されない点、すなわちビームか
継目7上にあるとさ、オンロスコープ/3では・屯田波
形が第ス図中の時IMiτの開停止するので、画面V(
は輝点/ダが生ずることとなる。従って、反射電子およ
び二次電子ンのコレクタgへの到達量が力11工片継目
7の位1鹸において減少する特徴を利用し、前配輝照/
ダと、コレクタざよシの信号減少のピーク点とを一致さ
ぜれは、位置決めが達成式れることとなる。Also, '..., the reflected electrons 1) and secondary electrons of the child beam 3 are captured by the collector? Vertical IKiI deflection of Σre oscilloscope/3! It is input to H11 child /3C, and /, and node d. The signal generator 10 outputs a triangular waveform signal, and this signal is converted into the waveform shown in FIG. 2 by a waveform converter/l. In the waveform shown in FIG. 2, each voltage zero point is at a time .tau.=+, which is an extension of 1 time t'l. As a result, when the beam 3 is at a point where it is not surveyed, that is, the beam is on the seam 7, on the Onroscope/3, when the Tonta waveform is in the figure, IMiτ stops opening, so the screen V (
A bright spot/da will occur. Therefore, by utilizing the characteristic that the amount of backscattered electrons and secondary electrons reaching the collector g decreases in the order of force 11 and piece joint 7,
By aligning the peak point of the signal decrease with the peak point of the collector signal, positioning can be achieved.
しかしながら、従来の浴接線検出装置では、電子ビーム
が偏向さt′Lない点にあ・いて−走時間τの間体止す
るため、加工片が溶融し易くなるという欠点があり、七
扛を避&jるために電子ビーム流量を小部くすれば、検
出信号苅雑音比が低くなってオシロスコープでの観察が
困難となり、4灸出装置の適用範囲は力0上片の熱的容
量が大である時のみに限られる等の欠点があった。However, in the conventional bath tangent detection device, the electron beam hits a point where it is not deflected t'L and stops for a travel time τ, which has the disadvantage that the work piece is easily melted. If the electron beam flow rate is made small in order to prevent There were disadvantages such as being limited to only when .
この発明は上記のような従来のものの欠点を除去するた
めに為されたもので、波形変換11+ / /の代わり
に、偏向コイルに通1ば4式れる三角波信号の零点(電
子ビームが偏向されない点)を検出する手段を設けるこ
とによシ、加工片継目位置と′成子ビーム照射位置との
位置決めを正確に行い、これによし苅1工片を溶融させ
ることのないようにした電子ビーム浴接における浴接線
検出装置を提供することを目的とする。This invention was made in order to eliminate the drawbacks of the conventional ones as described above. Instead of waveform conversion 11 + By providing a means for detecting the point), the joint position of the processed pieces and the position of the beam irradiation can be accurately positioned, thereby preventing the electron beam bath from melting the piece. An object of the present invention is to provide a bath tangent detection device in a bath.
身重、この発明の一実施例を第3図に基づいて説明する
。第3図においては、(g号発生器lθと電流増幅器/
2との間から波形変換g / /が取除かれておυ、そ
れに代って抵抗1(1の両端に、偏向コイル6への入力
信号の零点を検出するための零点検出部/Sが設けら扛
ている。σらyc苓零点出部/Sの出力倶jには、この
零点検出部/Sからの信号に対応(〜だパルス発生部を
発生さぜるためのパルス発生部16が設けられており、
パルス発生部/6の出力側はオシロスコープ13の輝度
変調入力端子/Jeおよび/3fVC接続されている。An embodiment of the present invention will be described with reference to FIG. In Fig. 3, (g generator lθ and current amplifier/
The waveform conversion g / / has been removed from between 2 and 2, and in its place, a zero point detection section /S for detecting the zero point of the input signal to the deflection coil 6 is installed at both ends of the resistor 1 (1). The output of the zero point output section/S is provided with a pulse generating section 16 for generating a pulse generating section corresponding to the signal from the zero point detecting section/S. is provided,
The output side of the pulse generator /6 is connected to the brightness modulation input terminals /Je and /3fVC of the oscilloscope 13.
なお、他の構成は第7図と同様なので説明を省略する。Note that the other configurations are the same as those in FIG. 7, so explanations will be omitted.
次に動作について説明する。第3図において抵抗R1の
両端には、偏向コイルtに通′−避れる′磁流に対して
同位相の信号、すなわち電子ビーム3の走査に対応した
信号が得ら’n−sこの信号はオシロスコープ13の水
平軸偏向端子/3aおよび/、?bに接続すると共VC
′4点検出都13Vcも入力される。零点検出部15か
らの出力はパルス発生部/ぶでパルス電圧に変挨烙れて
、オンロスコープ/3の輝度変調入力端子/3eおよび
/ 3f VC入力芒しる。この端子/3eおよび/3
fに入力−anるパルス電圧は、前記電子ビーム3が偏
向避れない点を表わしている。Next, the operation will be explained. In FIG. 3, a signal having the same phase as the magnetic current passing through and away from the deflection coil t, that is, a signal corresponding to the scanning of the electron beam 3, is obtained at both ends of the resistor R1. are the horizontal axis deflection terminals /3a and /, ? of the oscilloscope 13. When connected to b, both VC
'4 point detection capital 13Vc is also input. The output from the zero point detection section 15 is converted into a pulse voltage by the pulse generation section /b, and is applied to the brightness modulation input terminals /3e and /3f VC input terminals of the onroscope /3. This terminal /3e and /3
The pulse voltage input to f represents the point at which the electron beam 3 is unavoidably deflected.
一方、コレクタlよシの信号eま抵抗器R2の′亀出師
V 分の信号がオフ0スコープ/3の垂直軸偏向端子/
、3C,および/、?dへ入力埒ムる。前述のように反
射電子および二次電子qが力11工片継目位置7におい
て減少するので、この%徴的な現象をオリ用することに
より、オンロスフ−7”/Jの画面上VCおける垂直軸
の変化がピークに達する点と輝):、(/ダとを一致さ
せ、電子ビーム、)を力11工片継目位置7に桔度よく
仕致させることができる。On the other hand, the signal from the collector L and the signal from the resistor R2's V is turned off at the vertical axis deflection terminal of the scope/3.
,3C,and/,? Input to d. As mentioned above, the backscattered electrons and secondary electrons q decrease at the force 11 piece joint position 7, so by using this characteristic phenomenon, the vertical axis of the on-screen VC of Onrosf-7''/J is reduced. By matching the point at which the change in the electron beam reaches its peak with the brightness): (/da), the electron beam () can be directed to the force 11 piece joint position 7 with good precision.
なお、上記実織例でt士パルス発生11μ/6の出力を
オシロスコープ13の輝11j変調入力端子/3θおよ
び/3fに人力し、前記メジ〔」スコープ画面に輝点l
ダを生じせしめる1′)&Cしたもび〕を示したが、第
り図VC示すよりにパルス発生器/Aの出力とコレクタ
ざからの伯−号と含:力11カー器/’IVC入力し、
C,ノJJf+ W 器/ ?の出力’a= iiJ
i己」/「1スコープ/3の垂直軸偏向端子/3Cしよ
び/ 、7 dに接続するよ) VCt、でも艮い。こ
の場合にはオシロスコープ13には第3′図に示は71
.る↓うに輝点のかわりに貞饅波形/にが生じることと
なる。In addition, in the above actual example, the output of the pulse generation 11μ/6 is inputted to the brightness 11j modulation input terminals /3θ and /3f of the oscilloscope 13, and a bright spot l appears on the scope screen.
However, as shown in Figure VC, the output of the pulse generator/A and the input voltage from the collector are included. death,
C、ノJJf+W 器/? Output 'a= iiJ
VCt, but in this case, the oscilloscope 13 is connected to 71 as shown in Figure 3'.
.. ↓ Instead of a bright spot, a chama waveform/ni will appear.
また、反射′1ムf子および二次・電子でなくX勝を検
出手段に用いても基本的VC(”]ら変わること7’J
: <同様の効果を突する。In addition, even if X-rays are used as the detection means instead of reflection '1 mu f-sons and secondary/electrons, the basic VC('') will change.7'J
: <A similar effect.
以上のようにこの発ψ」によjLば、電子ビームが偏向
てれない点を′電気的に検出し、この検出点においてパ
ルス電圧な発生8せ、オノpスコープ輝度変詞入力端子
に剛力11する構成としたので、電子ビームを−ボ時間
体止延せることなく浴接線検出が行なえ、加工片浴融に
よる問題を大中rtc g少させることができ加工片の
熱的容置の選択範囲を拡大できるという効果がある。As described above, by this emission ψ, the point where the electron beam is not deflected is electrically detected, a pulse voltage is generated at this detection point, and a rigid force is applied to the onoposcope luminance input terminal. 11, the bath tangent can be detected without delaying the electron beam time, reducing problems caused by bath melting of the workpiece, and selecting the thermal location of the workpiece. This has the effect of expanding the range.
第1図は従来の溶接線検出装置を示すブロック構成図、
第2図は、第1図の動作をi;l明するだめの波形図、
第3図はこの発り」の一実施例による溶接線検出装置を
示すブロック構成図、第9図はこの発明の他の実施例を
示すブロック構成図、第3−図は第9図の動作によりオ
シロスコープ−面VC現わ扛る波形を示す図である。図
VCj、−いて、3は゛−子ビーム、ダは加工片、夕は
集束コイル、tkま偏向コイル、7は継目、gはコレク
タ、91反射1し子および二次電子、゛またt、i X
&+(二次エネルギ)、10は信号発生器、/2し1
′屯61L増幅器、/、?はオシロスコープ、/3aお
↓び/ 、7 tl lま水平軸偏向端子、、/3CL
−よび/3dしま垂1ム軸偏向端子、/3eおよび/、
3ffまj4f Mc K 1t14入力端子、/Sは
零点検出部、/lfまパルス発生)11(、/7はjJ
ll m器である。
なお、図中同一符号は同一・、−土だQ1相当部分を示
す。
代理人 碍 野 1r3 −FIG. 1 is a block diagram showing a conventional weld line detection device.
FIG. 2 is a waveform diagram that explains the operation of FIG. 1;
Fig. 3 is a block diagram showing a welding line detection device according to an embodiment of this invention, Fig. 9 is a block diagram showing another embodiment of the invention, and Figs. FIG. 3 is a diagram showing a waveform appearing on an oscilloscope plane VC. In the diagram VCj, 3 is the child beam, da is the workpiece, y is the focusing coil, tk is the deflection coil, 7 is the joint, g is the collector, 91 reflected 1st beam and secondary electron, ゛also t, i X
&+ (secondary energy), 10 is the signal generator, /2 and 1
'Tun 61L amplifier, /,? is an oscilloscope, /3a and / , 7 tl l, horizontal axis deflection terminal, /3CL
- and /3d striped 1mm axis deflection terminal, /3e and /,
3ff maj4f Mc K 1t14 input terminal, /S is zero point detection section, /lf ma pulse generation) 11 (, /7 is jJ
It's a ll m device. In addition, the same reference numerals in the drawings indicate the same parts corresponding to the same and -Tsuda Q1. Agent Kano 1r3 −
Claims (1)
ルに交流電流を流すことにより、前記′電子ビームが加
工片の継目を横切って走置するよ′)にした電子ビーム
浴接において、ojJ記交流電流の零点を検出する零点
検出部と、前記電子ビームの前記加工片への衝突によ)
生ずる二次エネルギを検出するためのコレクタと、前記
コレクタからの前記二次エネルギ検出111の最小とな
る点を前記零点検出部からの零点検出信号と比較するこ
とによシ、前記加工片の継目位置と前記電子ビームとの
位置関係を検出aJ能とした手段とを備えたことを%徴
とする電子ビーム浴接における浴接縁検出装置。 (2) 位置関係検出iJ餌の前記手段はオンロスコ
ーグである%訂請求の範囲第7項記載の電子ビーム浴接
における浴接縁検出装置。 (31MJ記ゴレクタからの前記二次エネルギ検出値は
前記オシロスコープの垂直軸偏向端子に人力は扛、前記
零点検出部からの信号は零点に対応したパルスに変換さ
扛た板前記オンロスコープの輝度変調入力端子に入力さ
扛るよ’) vCした%訂趙求の範囲第一項記載の′電
子ビーム浴接ycおける浴接線検出装置。 (4) 前記コレクタからの前記二次エネルギ検出値
と、前記零点検出部からのパルスVC変換延れた信号と
を加算器で重畳でせて前記オフ0スコープに入力するよ
うにした%許請求の範囲第、2項記載の電子ビーム溶接
における浴接縁検出装置。 (5) 前記偏向コイ/l/ vC流さ扛る前記交流
・電流は三角波電流である特許請求の範囲第1項乃至第
q項いずれか記載の電子ビーム浴接にふ・ける浴接線検
出装置。[Claims] tl) The electron beam is caused to travel across the seam of the work piece by passing an alternating current through a deflection coil disposed in the irradiation path of the electron beam. In beam bath contact, a zero point detection unit detects the zero point of the ojj alternating current, and the collision of the electron beam with the workpiece)
By using a collector for detecting the generated secondary energy and comparing the minimum point of the secondary energy detection 111 from the collector with the zero point detection signal from the zero point detection section, it is possible to detect the seam of the work piece. 1. A bath contact edge detection device for electron beam bath contact, characterized by comprising means capable of detecting a position and a positional relationship between the electron beam and the electron beam. (2) The bath contact edge detection device for electron beam bath contact according to claim 7, wherein the means for positional relationship detection iJ bait is an Onroscog. (The secondary energy detection value from the 31MJ gorector is manually applied to the vertical axis deflection terminal of the oscilloscope, and the signal from the zero point detection section is converted into a pulse corresponding to the zero point. The bath tangent detection device in the electron beam bath tangent yc described in the first item. (4) The secondary energy detection value from the collector and the pulse VC conversion extended signal from the zero point detection section are superimposed by an adder and input to the off-zero scope. A bath contact detection device for electron beam welding according to item 2. (5) A bath tangent detection device for electron beam bath tangent according to any one of claims 1 to q, wherein the alternating current flowing through the deflection coil /l/vC is a triangular wave current.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18254081A JPS5884692A (en) | 1981-11-12 | 1981-11-12 | Detector for weld line in electron beam welding |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18254081A JPS5884692A (en) | 1981-11-12 | 1981-11-12 | Detector for weld line in electron beam welding |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5884692A true JPS5884692A (en) | 1983-05-20 |
Family
ID=16120073
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18254081A Pending JPS5884692A (en) | 1981-11-12 | 1981-11-12 | Detector for weld line in electron beam welding |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5884692A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4724736A (en) * | 1985-09-02 | 1988-02-16 | Nippon Gakki Seizo Kabushiki Kaisha | Keyboard musical instruments with transpositional function |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5277847A (en) * | 1975-12-23 | 1977-06-30 | Mitsubishi Electric Corp | Electron beam welding device |
JPS5419299U (en) * | 1977-07-11 | 1979-02-07 |
-
1981
- 1981-11-12 JP JP18254081A patent/JPS5884692A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5277847A (en) * | 1975-12-23 | 1977-06-30 | Mitsubishi Electric Corp | Electron beam welding device |
JPS5419299U (en) * | 1977-07-11 | 1979-02-07 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4724736A (en) * | 1985-09-02 | 1988-02-16 | Nippon Gakki Seizo Kabushiki Kaisha | Keyboard musical instruments with transpositional function |
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