JPS5883277A - Quality discriminating device for composite electronic parts - Google Patents

Abstract

PURPOSE:To detect defective goods surely, by providing the first switch group between individual terminals of composite electronic parts and an impedance measuring device and providing the second switch group between adjacent individual terminals and controlling the switching of them. CONSTITUTION:When a common switch 9 and the first switch groups 7A-7G of a resistance value measuring switch part 6 are closed and other switches are opened, resistance values of resistance value measurers 5A-5G become a resistance value ROMEGA of resistance elements 1A-1G. If the resistance value of one of measurers 5A-5G is different from ROMEGA (for example, infinite), it is found that the resistance element connected to this resistance value measurer is abnormal (disconnected). When the common switch 9 and switches 7C, 7F, 8CD, and 8FG are closed and other switches are opened, the resistance value of the resistance value measurer 5F becomes R/2OMEGA, and the measured value of the resistance value measurer 5C becomes ROMEGA, and the abnormality (disconnection or short- circuit) between individual terminals 4C and 4D is detected.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for determining the quality of composite electronic components in which one end of the same element, such as a resistor with the same resistance value or a capacitor with the same capacitance value, is connected in common. , FIG. 1 shows an electrical equivalent circuit of a composite resistor made up of resistive elements 1mm to 1G having the same resistance value, and FIG. 2 shows an electrical equivalent circuit of a composite capacitor made up of capacitor elements 2mm to 2G having the same capacitance value. Composite electronic components are originally manufactured to form equinodal circuits as shown in Figures 1 and 2, but many products are manufactured with defects such as disconnections and short circuits. Ru. Products with such defective parts conventionally have a resistance value or capacitance between the common terminal 3 and the individual terminals 4M, between the common terminal 3 and the individual terminals 4B, ..., between the common terminal 3 and the individual terminals 4G. It is checked by measuring the value and removed 1. However, if the cause of the failure is a disconnection or short circuit B as shown in FIG. 3, the conventional method cannot detect the abnormality.

In view of the above points, it is an object of the present invention to provide a composite type device for determining the quality of child parts that can reliably detect defective products whose abnormalities cannot be detected using conventional measuring methods.

To achieve this objective, the present invention provides an impedance measuring device for measuring impedance, a first switch group provided between the individual terminals of the composite electronic component and the impedance measuring device, and a first switch group provided between the adjacent individual terminals. The resistance value measurement switching section includes a second switch group, and a switching control section that selectively controls switching between the first switch group and the second switch group.

Embodiments of the present invention will be described below with reference to FIG. Note that the same numbers are given to the same parts as before.

In the figure, 6mm to 5G are resistance value measuring devices, and 6 is a resistance value measurement switching section. This resistance value measurement switching unit includes a first switch group 75 to 7G that connects and connects each resistance element 1M to 1G and each resistance value measuring device 5M to 6G, and
G adjacent individual terminals 4M, between 4B, between 4B and 40, 4
Between 0.4D, between 4D and 4E, between 4IC and 4F, 4F+
A second switch group 85B to syG that switches between 4G and 4G;
It consists of a common terminal 3 and a common switch 9 that connects and connects resistance value measuring devices 6m to 5G, and each switch 7m to 7G.

8mm B to 5ire and 9 are selectively switched and controlled by a switching control section (not shown). This switching control section is constituted by a microcomputer or the like, and controls the switching of each switch 7~7G, 8~B~gFG, 94/- in a predetermined order.

The operation of the quality determining device configured as described above will be explained.

First, among the switches of the resistance value measurement switching unit 6, the common switch 9 and the first switch group 7-G are closed, and the other switches are opened. At this time, each resistance value measuring device 55~
The measured value of 5G is the resistance value of each resistor element 1μ~1G.
Then, it becomes RΩ. If any of the measured values of the resistance value measuring device 6M to 6G shows a value different from RΩ (for example, infinity), the resistance element connected to that resistance value measuring device is abnormal (
It can be seen that there is a disconnection). Next, common switch 9, switches 7M, 7D, 8MB, and 5DIc are closed, and the other switches are opened. At this time, the measured value of sD using the resistance value measuring device 5 is R/2Ω. Next, common switch 9, switches 7B, 71C, 8BC, 8EF.

Close the switch and leave the other switches open. At this time, the measured value of the resistance value measuring devices 5B and 51C becomes R/2Ω. Next, common switch 9, switches 7C, 7F.

8 (D, close sFG and open other switches.

At this time, the measured value of the resistance value measuring device 5F is R/2Ω, but the measured value of the resistance value measuring device 5C is RΩ, and the individual terminal 4
G, 41) abnormality between the two is detected.

Furthermore, as is clear from the above operation explanation, the common switch 9
Since it is always closed, there is no need to provide a switch.

In the above embodiment, a resistance value measuring device is used, but in the case of a composite capacitor, a capacitance value measuring device may be used.

Since the device for determining the quality of composite electronic components of the present invention is configured as described above, it is possible to detect complex abnormalities that cannot be detected by conventional checking methods, and a defect rate of less than PPM order is required. It can perform highly reliable checks on electronic components, and its industrial value is high.

[Brief explanation of drawings]

Figure 1 is an equivalent circuit diagram of a general composite resistor, Figure 2 is an equivalent circuit diagram of the same composite capacitor, Figure 3 is an equivalent circuit diagram for explaining a defective state, and Figure 4 is an example of an implementation of the present invention. FIG. 2 is a diagram illustrating a configuration circuit of a quality determination device in an example. 1mm~1G...Resistance element, 3...Common terminal, 4mm~4G...Individual terminal, 5mm~5G・
...Resistance value measuring device, 6...Resistance value measurement switching unit, 7m~7G...1st switch group, 8mB~8FG... Second switch group.

Claims (1)

[Claims] an impedance measurement device that measures impedance;
From a first switch group provided between the impedance measuring device and an individual terminal of a composite electronic component in which one end of a plurality of elements having the same impedance are commonly connected, and a second switch group provided between adjacent individual terminals. A device for determining the quality of a composite electronic component, comprising a resistance measurement switching section and a switching control section that selectively controls switching of a first switch group and a second switch group of the resistance measurement switching section.