JPS5882000A - Plating apparatus for plating copper-tin alloy - Google Patents

Plating apparatus for plating copper-tin alloy

Info

Publication number
JPS5882000A
JPS5882000A JP17810881A JP17810881A JPS5882000A JP S5882000 A JPS5882000 A JP S5882000A JP 17810881 A JP17810881 A JP 17810881A JP 17810881 A JP17810881 A JP 17810881A JP S5882000 A JPS5882000 A JP S5882000A
Authority
JP
Japan
Prior art keywords
plating
copper
tin alloy
plating bath
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17810881A
Other languages
Japanese (ja)
Inventor
Kenichi Ogawa
健一 小川
Hiroshige Ikeno
池野 広重
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP17810881A priority Critical patent/JPS5882000A/en
Publication of JPS5882000A publication Critical patent/JPS5882000A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enable the control of Ni concn. always, by mounting a mechanism for measuring absorbancy of a plating bath. CONSTITUTION:A liquid recirculating pipe 3 is provided to the plating tank 1 of a plating apparatus for plating a Cu-Sn alloy and a plating bath is recirculated through a pump 2. A bypass passage 4 is provided to said liquid recirculating pipe 3 and an apparatus for measuring absorbancy of the plating bath on the way thereof. In the apparatus 5, a light source 6 is formed to one side of an absorbancy measuring cell 8 connected to the bypass passage 4 and a light receiving part 7 to the other side thereof. Therefore, the variation of Ni concn. in the plating bath can be always measured and the control of Ni concn. is facilitated.

Description

【発明の詳細な説明】 本発明は銅−スズ合金めっき用めっき装置に関するもの
で、特にニッケル塩を含有した青化銅−スズ酸アルカリ
系の銅−スズ合金めっき浴を使用するための新規なめつ
き装置に@するものである銅−スズ合金めつat得るた
めの浴として、青化銅−スズ酸アルカリ系の浴は古くか
ら知らnてk 9 、スズ酸アルカリ、實化銅、青化ア
ルカリ、水酸化アルカリを基本成分とする浴で構成され
、こn&c11々の光沢剤が添加さnて、光沢めっきが
行なわnる0発明者らはこの浴の光沢剤を種々検討して
、光沢剤として、チオシフノ酸塩、ポリエチレンイミン
系化合物、ニッケル塩を組合せるととくより、きわめて
優秀な光沢めり亀を得らf′L為ことを見い出した。し
かしながら、青化銅−スズ酸アルカリ系のめつき浴にお
いて、ニッケル塩紘特異な性質を有し、その濃度によ)
析出する銅−スズ合金めっきの合金Ij7L成が変化す
る性質がある、例えば、下記のような基本組成の浴にお
いて、ニッケル濃度が0〜150 vpdl/Lの場合
スズ含有率40〜45%、300ssJ/4の場合スズ
含有率35チ、750 td/Lの場合スズ含有率25
sと合金組成が変化する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a plating apparatus for copper-tin alloy plating, and in particular, a new plating device for using a copper-tin alloy plating bath based on copper cyanide-alkaline stannate containing nickel salt. Copper cyanide-alkali stannate baths have been known for a long time as baths for obtaining copper-tin alloy metals, which are used in coating equipment. The bath consists of a bath whose basic components are alkali and alkali hydroxide, and bright plating is performed by adding these brighteners. It has been found that when a thiosifunate, a polyethyleneimine compound, and a nickel salt are combined as agents, an extremely excellent brightness can be obtained. However, in a copper cyanide-alkaline stannate plating bath, nickel salts have unique properties (depending on their concentration).
The alloy Ij7L composition of the deposited copper-tin alloy plating has a property of changing. For example, in a bath with the following basic composition, when the nickel concentration is 0 to 150 vpdl/L, the tin content is 40 to 45% and 300ssJ /4, the tin content is 35 T, and 750 td/L, the tin content is 25.
s and alloy composition change.

スズ酸ナトリウム       100Jj/A青化銅
            121/を青化ナトリウム 
       3011/L水酸化ナトリウム    
   IOJ/を従って、このめっきの場合ニッケル濃
度の管理が常に同品質のめつit得る為には必要となる
が、従来のめつき装置では、濃度管理が十分出来ないた
め、安定した品質を常に得ることが困難であった。
Sodium stannate 100Jj/A Copper cyanide 121/ Sodium cyanide
3011/L sodium hydroxide
Therefore, in the case of this plating, it is necessary to control the nickel concentration in order to always obtain the same quality plating, but with conventional plating equipment, it is not possible to adequately control the concentration, so it is necessary to always maintain stable quality. It was difficult to obtain.

本発明拡とのような状況から生み出’artたもので、
常にニッケル濃度管理が可能なめっき装置を提供するこ
とKToJ)、めっき装置にめつき浴の吸光度を測定す
る装置を備えることを特徴とするものである。
This 'art was created from the situation of expanding the invention,
To provide a plating apparatus that is capable of constantly controlling nickel concentration (KToJ), and is characterized in that the plating apparatus is equipped with a device for measuring the absorbance of a plating bath.

本発明者らは、ニッケル塩を含む、上記銅−スズ会金め
つき浴について詳しく研究し、このめっき浴においては
、ニッケル塩を添加するととくよ)、浴の色が淡黄色に
変化することに層目し、この点を利用することを考えた
。こ−rttatgする為、分光光度計によ〕、波長3
70%sKでニッケル濃度と吸光度の関係を調べた所そ
の関係に相関関係がφることを見いだし、本発明の装置
を考えたものである。
The present inventors conducted detailed research on the above-mentioned copper-tin alloy plating bath containing nickel salts, and found that when nickel salts were added to this plating bath, the color of the bath changed to pale yellow. I looked at the layers and thought of taking advantage of this point. In order to do this, the wavelength 3 is measured using a spectrophotometer.
When the relationship between nickel concentration and absorbance was investigated at 70% sK, it was found that there was a correlation φ, and the apparatus of the present invention was devised.

以下、実施例によル本発明を第1図、第2図により詳細
に説明する。
Hereinafter, the present invention will be explained in detail by way of examples with reference to FIGS. 1 and 2.

第1図に示すごとく、めつき槽1に従来のように液循積
用パイプ3を設け、ポンプ2t−介シテ、3にバイパス
路4を設け、その途中に吸光度を測定するための装置5
を設けるものである。
As shown in FIG. 1, a plating tank 1 is provided with a liquid circulation pipe 3 as in the past, a bypass path 4 is provided in the pump 2t, and a device 5 for measuring absorbance is provided along the way.
It is intended to provide

吸光度を測定する為の装置内部は第2図に示すごとくバ
イパス路4と連結さ牡た吸光度測定セル80片側に光源
6、もう一方の側に受光部7が形成されている。
Inside the apparatus for measuring absorbance, as shown in FIG. 2, an absorbance measuring cell 80 connected to a bypass path 4 is provided with a light source 6 on one side and a light receiving section 7 on the other side.

この装置を使用してめっきを行なう場合、液循環によシ
セル部の液も常に循環するととになi1浴中のニッケル
濃度の変化が吸光度測定装置によル常に測定することが
可能とな夛、ニッケル濃度の管理が容易となる。
When plating is performed using this device, the liquid in the cell is constantly circulated through the liquid circulation, which makes it possible to constantly measure changes in the nickel concentration in the i1 bath using the absorbance measurement device. , it becomes easier to manage the nickel concentration.

以上のように本発明の装置によれば、常にニッケル濃度
管理が出来るため、常に安定な品質の銅−スズ合金めっ
きが可能となるものである。
As described above, according to the apparatus of the present invention, since the nickel concentration can be constantly controlled, copper-tin alloy plating of stable quality is always possible.

なお、吸光度測定装置の取り付は方法は実施例に述べた
だけでなく、他の方法にても同様な効果は可能である。
Note that the method for attaching the absorbance measuring device is not limited to that described in the embodiments, and similar effects can be achieved by other methods.

【図面の簡単な説明】[Brief explanation of drawings]

81図は本発明の実施例の一例を示す装置の概略図、第
2図は吸光度測定装置の内部の一例を示す図である。 101.めっき槽 200.ポンプ 306.循環ポンプ 40.。バイパス路 506.吸光度測定装置 6・・・光源 710.受光部 800.吸光度測定セル 以上 出願人 株式会社第二精工金 代理人 1士最上  務 第1図
FIG. 81 is a schematic diagram of an apparatus showing an example of an embodiment of the present invention, and FIG. 2 is a diagram showing an example of the inside of the absorbance measuring apparatus. 101. Plating tank 200. Pump 306. Circulation pump 40. . Bypass path 506. Absorbance measuring device 6...light source 710. Light receiving section 800. Absorbance measurement cell and above Applicant: Daini Seikokin Co., Ltd. Agent Mr. Mogami 1st grade Figure 1

Claims (1)

【特許請求の範囲】[Claims] 銅−スズ合金めっき用めっき装置において、めっき浴の
吸光直管測定する機構を具備したことを特徴とする銅−
スズ合金めっき装置。
A plating apparatus for copper-tin alloy plating, characterized in that it is equipped with a mechanism for measuring the absorption straight tube of a plating bath.
Tin alloy plating equipment.
JP17810881A 1981-11-06 1981-11-06 Plating apparatus for plating copper-tin alloy Pending JPS5882000A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17810881A JPS5882000A (en) 1981-11-06 1981-11-06 Plating apparatus for plating copper-tin alloy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17810881A JPS5882000A (en) 1981-11-06 1981-11-06 Plating apparatus for plating copper-tin alloy

Publications (1)

Publication Number Publication Date
JPS5882000A true JPS5882000A (en) 1983-05-17

Family

ID=16042785

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17810881A Pending JPS5882000A (en) 1981-11-06 1981-11-06 Plating apparatus for plating copper-tin alloy

Country Status (1)

Country Link
JP (1) JPS5882000A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6036686A (en) * 1983-08-08 1985-02-25 Dowa Mining Co Ltd Process control method of electrolytic system for copper

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6036686A (en) * 1983-08-08 1985-02-25 Dowa Mining Co Ltd Process control method of electrolytic system for copper

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