JPS5879259U

JPS5879259U - Ultrasonic probe device

Info

Publication number: JPS5879259U
Application number: JP17428481U
Authority: JP
Inventors: 稲崎　宏治; 小崎　巧三; 幸郎杉元; 大力　健市; 洋次田中
Original assignee: 新日本製鐵株式会社; 三菱電機株式会社
Priority date: 1981-11-24
Filing date: 1981-11-24
Publication date: 1983-05-28

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

[Brief explanation of drawings]

第１図は従来の局部水浸探触子装置の断面図、第２図は
従来の局部水浸探触子装置の断面図、第３図ａは従来の
背割形探触子装置の断面図、第３図すは背割形探触子を
用いた時の探傷波形図、第４図ａは背割形探触子装置を
用いた時の被検材先端部配置図、第４図すは背割形探触
子装置を用いた時の被検材後端部配置図、第５図ａはこ
の考案による局部水浸探触子装置の断面図、第５図すは
探傷波形図、第６図ａは局部水浸探触子装置を用いた時
の被検材先端部配置図、第６図すは局部水浸探触子装置
を用いた時の被検材後端部配置図である。図において１は超音波探触子、１ａ〜１ｄは超音波探触
子群、２は振動子、２ａは送信用振動子、２ｂは受信用
振動子、３はホルダー、４ａはしきり膜、５はシュー、
６は超音波伝播媒体、６ａは水ギャップ、７は被検材、
８は背割形探触子、８ａ〜８ｄは背割形探触子群、９は
ハウジング、１０は送信パルス、１１は表面エコー、１
２は底面エコー、１３は不惑帯、１５．１６は探触子装
置配置上による未探傷領域、１５ａ、１６ａは被検材の
搬送及び探触子装置の接材、離材の制御誤差による未探
傷領域である。尚、図中同一あるいは相当部分には同一
符号を付して示しである。第４図Ｃｔ）ゐ　　８第６図　　叩第４図　　　１Fig. 1 is a sectional view of a conventional local water immersion probe device, Fig. 2 is a sectional view of a conventional local water immersion probe device, and Fig. 3a is a sectional view of a conventional split-back probe device. Fig. 3 is a flaw detection waveform diagram when using a split-back type probe, Fig. 4a is a diagram of the arrangement of the tip of the test material when using a split-back type probe device, Fig. 4 Figure 5a is a cross-sectional view of the local water immersion probe device according to this invention, and Figure 5 is a flaw detection waveform diagram. , Figure 6a shows the arrangement of the tip of the specimen when using the local water immersion probe device, and Figure 6A shows the arrangement of the rear end of the specimen when using the local water immersion probe device. It is a diagram. In the figure, 1 is an ultrasonic probe, 1a to 1d are a group of ultrasonic probes, 2 is a transducer, 2a is a transmitting transducer, 2b is a receiving transducer, 3 is a holder, 4a is a barrier membrane, 5 shoo,
6 is an ultrasonic propagation medium, 6a is a water gap, 7 is a test material,
8 is a split-back type probe, 8a to 8d are a group of split-back type probes, 9 is a housing, 10 is a transmission pulse, 11 is a surface echo, 1
2 is the bottom echo, 13 is the fuwa zone, 15.16 is the undetected area due to the probe device arrangement, and 15a and 16a are the undetected areas due to the conveyance of the test material and the contact and separation control errors of the probe device. This is the flaw detection area. In the drawings, the same or corresponding parts are denoted by the same reference numerals. Figure 4 Ct) ゐ 8 Figure 6 Figure 4 1

Claims

[Scope of utility model registration request]

In an ultrasonic probe device comprising an ultrasonic probe and a holder that holds and fixes the ultrasonic probe and stores an ultrasonic propagation medium, an ultrasonic wave is applied to the surface of the holder facing the specimen material. An ultrasonic probe device comprising a member made of a material having substantially the same acoustic impedance as a propagation medium and having high ultrasonic attenuation.