JPS5866940A - Developer for heat resistant photosensitive resin - Google Patents

Developer for heat resistant photosensitive resin

Info

Publication number
JPS5866940A
JPS5866940A JP16580781A JP16580781A JPS5866940A JP S5866940 A JPS5866940 A JP S5866940A JP 16580781 A JP16580781 A JP 16580781A JP 16580781 A JP16580781 A JP 16580781A JP S5866940 A JPS5866940 A JP S5866940A
Authority
JP
Japan
Prior art keywords
solvent
film
developer
water
aprotic polar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16580781A
Other languages
Japanese (ja)
Inventor
Kazunari Takemoto
一成 竹元
Fumio Kataoka
文雄 片岡
Fusaji Shoji
房次 庄子
Mitsumasa Kojima
児嶋 充雅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd, Hitachi Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP16580781A priority Critical patent/JPS5866940A/en
Publication of JPS5866940A publication Critical patent/JPS5866940A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • G03F7/322Aqueous alkaline compositions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)

Abstract

PURPOSE:To obtain an insulating film pattern free from cracks of >=2mum size by patterning a photosensitive polyimide resin precursor with a developer consisting of an aprotic polar solvent and water or further contg. an org. solvent. CONSTITUTION:A preferred example of an aprotic polar solvent is N,N-dimethylformamide, N,N-dimethylacetoamide, dimethylsulfoxide, N-methyl-2-pyrrolidone, 1, 3-dimethyl-2-imidazolidinone or N-acetyl-epsilon-caprolactam, and ion exchanged water is desirably used as water from the requirement of the semiconductor industry. The preferred amount of water blended with the solvent is 10-50wt% basing on the total weight of the resulting developer. A conventional org. solvent may be added as a tertiary component. Development is carried out by an immersion method or a spraying method, and development by immersion is finished in 1-5min at room temp. The developed picture is rinsed to remove the developing solvent.

Description

【発明の詳細な説明】 本発明は感光性ボ1」イミド糸樹脂前駆体をパターン化
する際の新規現像液に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a novel developer for patterning photosensitive BO1 imide thread resin precursors.

近年、半導体工業の分野でボIIイミド糸m脂が多層配
線の層間絶縁膜として一部で使用されている。さらに最
近になってボIIイミド系樹脂前駆体にフォトレジスト
の如きパターン形成能を付与し。
In recent years, in the field of the semiconductor industry, Boiiimide yarn M resin has been used in some areas as an interlayer insulating film for multilayer wiring. Furthermore, recently, a pattern forming ability such as that of a photoresist has been imparted to BoIimide resin precursors.

感光性のボ11イミド系前躯体とし、工程を合理化する
ことが試みられている。庭とえば、感光性ポリイミド系
樹脂前駆体を用いる層間絶練膜の形成工程は以下の如く
に示される。
Attempts have been made to use a photosensitive bo-11 imide precursor to streamline the process. For example, the process of forming an interlayer film using a photosensitive polyimide resin precursor is shown below.

(1)塗布:感光性ポリイミド前躯体フェスを所定の基
板上に塗布する。
(1) Coating: Coating a photosensitive polyimide precursor face onto a predetermined substrate.

(2)プリベ〜り:溶媒を乾燥して感光性ポリイミド系
樹脂の塗膜とTる。
(2) Privilege: Dry the solvent and bond with the photosensitive polyimide resin coating.

(3)露光:Pk定のフォトマスクを介して露光↑る◎
このとき露光部のボ11マは架橋して均像液に不溶とな
り、ネガ型の画像を与える。
(3) Exposure: Exposure ↑ through a photomask with constant Pk◎
At this time, the exposed areas 11 are crosslinked and become insoluble in the equalizing solution, giving a negative image.

(4)  現像:未露光部を現像液で溶解除去し1次い
でlンス液で洗浄してポリイミド前駆体のパターンを得
る。
(4) Development: Unexposed areas are dissolved and removed with a developer, and then washed with a rinse solution to obtain a pattern of the polyimide precursor.

(5)ポストベーク:加熱処理することによって現像液
オニびリンスfI!L’x蒸発させ、さらにポリイミド
前駆体をボ1フイミドに転化する。
(5) Post-bake: Heat treatment to remove developer and rinse fI! L'x is evaporated and the polyimide precursor is further converted to boimide.

上記の一連の工程における膜Ji2の変化に治1t−f
ると・感光性付与方式に工り異なるが、プリベーク後の
塗膜の厚さは現像とボストベークの2つの工程を経ると
減少して約8割〜4 ′kIJとなる。したがって、培
°終硬化膜の腓犀の約1.3〜2.5倍の塗布護岸がは
じめに心安となる。半導体集積回路においては配#14
体は通常2μm程度の岸さのAIlが用いられているた
め、これを絶縁するためKは少なくとも2μm以上の最
終膜厚が要求される。
Changes in the film Ji2 during the above series of steps
Then, the thickness of the coating film after prebaking decreases to approximately 80% to 4'kIJ after the two steps of development and postbaking, although the method of imparting photosensitization varies. Therefore, a coating of about 1.3 to 2.5 times as much as the final cured film of the staghorn rhinoceros will provide peace of mind. In semiconductor integrated circuits, wiring #14
Since Al is usually used for the body with a thickness of about 2 μm, K is required to have a final film thickness of at least 2 μm or more in order to insulate it.

しかしながら、従来の現像液にとえば、ジメチルアセト
アミド単独の現像液、あるいはiンメチルアセトアミド
とジオキサンの混合物(tJL比1 :1)。
However, conventional developers include, for example, dimethylacetamide alone or a mixture of dimethylacetamide and dioxane (tJL ratio 1:1).

またジメチルアセトアミドとメタノールの1:1の混合
液の如きボ11イミドの前駆体の良溶媒と貧溶媒から成
る現像液では、プリベーク後の膜厚が3μm以上になる
と現像中に膜にクラックが入り。
In addition, in a developing solution consisting of a good solvent and a poor solvent for the precursor of bo-11imide, such as a 1:1 mixture of dimethylacetamide and methanol, if the film thickness after prebaking exceeds 3 μm, the film will crack during development. .

1.5μmの厚さの最終硬化膜でさえも得ることができ
なかった。
Even a final cured film with a thickness of 1.5 μm could not be obtained.

本発明の目的は上記した従来技術の欠点をなくし2μm
以上のクラックのないfek膜iJ−ンを得るための現
像液を提供するにある。
The purpose of the present invention is to eliminate the drawbacks of the prior art described above, and to
The object of the present invention is to provide a developer for obtaining a crack-free Fek film as described above.

この1」的のため釉々の現像溶媒を検討した結果。This is the result of considering developing solvents for glazes for this purpose.

予期に反して水が必須の成分となることを見い川した。Contrary to his expectations, he discovered that water was an essential ingredient.

すなわち、非プロトン性極性溶媒に水を加えた混合溶媒
が3μm以上の厚さのポリイミド前駆体の前駆体の塗膜
をクラックを発生させることなく現像できることがわか
つ几。
In other words, it was found that a mixed solvent obtained by adding water to an aprotic polar solvent can develop a coating film of a polyimide precursor having a thickness of 3 μm or more without causing cracks.

本発明に用いる非プロトン性極性溶媒には、N。The aprotic polar solvent used in the present invention includes N.

N−ジメチルホルムアミド、N、N−ジメチルアセトア
ミド、ジメチルスルホキンド、N−メチル−2−ピロ1
1トン、1,3−ジメチル−2−イミダゾリジノン、N
−アセチル−ε−カプロラクタムなどが好適な例として
挙げられるが、未棒元部のポリイミド前駆体が溶けるも
のであれはこれに制約されない。また、これらの41合
物は単独もしくは二種類以上混合して用いられる。
N-dimethylformamide, N,N-dimethylacetamide, dimethylsulfoquinde, N-methyl-2-pyro1
1 ton, 1,3-dimethyl-2-imidazolidinone, N
Preferred examples include -acetyl-ε-caprolactam, but the present invention is not limited to this as long as the polyimide precursor in the unrodded base portion is soluble. Further, these 41 compounds may be used alone or in combination of two or more.

本発明に用いる水は半導体工業の要求からイオン交換水
を用いることが望ましい。水の配合量は現像液の総屯蓋
に対して1?]+l’+:量%以上、50屯奮%以下の
範囲から選ばれる(M機溶剤を配合していないときは、
非プロトン性極性溶媒が残部となり90重量%以下、5
0Φ″量%垣上配合される)。
As the water used in the present invention, it is desirable to use ion-exchanged water in view of the requirements of the semiconductor industry. Is the amount of water mixed 1 to the total volume of developer? ]+l'+: Selected from the range of % by volume or more and 50% or less (when no M solvent is blended,
The aprotic polar solvent will be the remainder, 90% by weight or less, 5
0Φ″ amount% Kakigami is blended).

10重蓋%工り少ないとIIりにクラックが入り、50
重蓋%より多いと未に元部が溶解しなくなり、現像され
ない。
If 10% less work is done on the lid, a crack will appear on the second lid, and the 50
If the amount exceeds the percentage of heavy lids, the base portion will not be dissolved yet and development will not be possible.

本発明は第3成分として通常の有機溶媒を加えても艮い
。第3成分としてメチルアルコールチルアルコール、イ
ソプロピルフルコール、トルエン、キシレン、了セトン
,メチルエチルケトノ。
The present invention is applicable even if a conventional organic solvent is added as the third component. The third component is methyl alcohol, isopropyl flucol, toluene, xylene, ryosetone, and methyl ethyl ketone.

メチルセロソルブ、エチルセロンルプなどが挙ケられる
。また、これらの化合物は単独もしくは二す類以上混合
【7て用いられる。添加量は,に大で非プロトン性極性
溶媒の寺である。
Examples include methyl cellosolve and ethyl cellosolve. Further, these compounds may be used alone or in combination of two or more kinds. The amount added is a large amount of aprotic polar solvent.

現像は浸漬法お工びスプレー法に工り行われ。Development is done by dipping, spraying, and immersion methods.

浸漬法では室温で1〜5分で完成する。現像した画像は
現像溶媒を取り除くkめ11ンス液で洗浄する。リンス
液には現像溶媒と混和性の良いポ11アミド酸(ポリイ
ミドの前駆体ボ))マ)の貧溶媒が用いられる。ITン
ス液の例としては,水.メチルアルコール、エチルアル
コール、イソフロビルアルコール、トルエン、キシレン
、了セトン,メチルエチルケトン、メチルセロソルフ,
エチルセロソルブなどが挙げられる。
The immersion method takes 1 to 5 minutes to complete at room temperature. The developed image is washed with an 11-ounce solution that removes the developing solvent. The rinsing liquid uses a poor solvent of poly-11-amic acid (polyimide precursor) which is highly miscible with the developing solvent. Examples of IT solution include water. Methyl alcohol, ethyl alcohol, isoflobil alcohol, toluene, xylene, methyl alcohol, methyl ethyl ketone, methyl cellosol,
Examples include ethyl cellosolve.

本発明にかかわる感光性ポIJイミド糸樹脂前駆体は現
在まで公知になったネガ型の材料であれば何でもよい。
The photosensitive po-IJ imide thread resin precursor according to the present invention may be any negative-working material that has been known up to now.

例えば特開昭49−17374,特開昭49−1 1 
5541 、特開昭54−88116,特開昭5←14
5794、特開昭55−155347,特開昭55−4
5748に開示された感光性ポ11イミド系樹脂前駆体
かその例として掌けられる。
For example, JP-A-49-17374, JP-A-49-1 1
5541, JP-A-54-88116, JP-A-5←14
5794, JP-A-55-155347, JP-A-55-4
An example of this is the photosensitive poly-11imide resin precursor disclosed in No. 5748.

以下.本発明を具体例を用いて説明Tる。below. The present invention will be explained using specific examples.

実施例1 表の漱1に示fi成の感光性ボIJイミド前駆体をシI
Iコンウェハに回転塗布し,70℃で60分間乾保して
Nさ約5μmの塗膜とした。この塗膜に所定のフォトマ
スクを弁して,高圧水銀燈で1分間処光した。このとき
の紫外線節度は10mW/3’(365℃m)であッ’
fc 0次にN−メチル−2−ピロ11トンが902,
イオン交換水が102からなる現像液で室温で2分1i
f!&漬現像し六〇次いでエチルアルコールで1分間浸
漬.して117スしに.ここでのM岸は約4.5μmで
あった。次に200℃で30分間.I&後に毎分20!
のN2$囲気中350℃で30分間の熱処理を行って最
終硬化膜としに0このとき膜厚は約2.7μmであった
.上記の勝光膜は現源工程後,500倍の金楓顕微鏡で
観察したところクラックは全く認められなかっに0ま′
fc最終硬化膜は絶縁膜として非常に優れた電気的特性
ならびに耐熱性を有していた。
Example 1 The photosensitive IJ imide precursor of the composition shown in Table 1 was
It was spin-coated onto an I-con wafer and kept dry at 70°C for 60 minutes to form a coating film with a N thickness of about 5 μm. This coating film was exposed to a high-pressure mercury lamp for 1 minute using a prescribed photomask. The ultraviolet ray moderation at this time is 10mW/3' (365℃m).
fc 0 next, 11 tons of N-methyl-2-pyro is 902,
1i for 2 minutes at room temperature with a developer consisting of 102 ion-exchanged water.
f! Developed by soaking and developing, then immersed in ethyl alcohol for 1 minute. Then 117 seconds. The M shore here was approximately 4.5 μm. Next, heat at 200℃ for 30 minutes. 20 per minute after I&!
A final cured film was obtained by heat treatment at 350°C for 30 minutes in a N2 atmosphere, and the film thickness was approximately 2.7 μm. After the Gengen process, the above-mentioned Katsukou film was observed with a 500x magnification magnification microscope, and no cracks were observed.
The fc final cured film had excellent electrical properties and heat resistance as an insulating film.

実施例2 実施例1と同様に(7て表のN111に示す組成の感光
性ポリイミド前駆体を用いて約5μmの妬光膜を得に0
次にN−メチル−2−ピロI+トンが75t。
Example 2 In the same manner as in Example 1 (7), a photosensitive polyimide precursor having the composition shown in Table N111 was used to obtain a photosensitive film of about 5 μm.
Next, 75 tons of N-methyl-2-pyro I+ton.

イオン交換水が25pからなる現像液を用いて室温で2
分間浸漬現像をし1次いでエチルアルコールで1分間浸
漬してIIンスしko’Jンス後の膜厚は約4.7μm
であり、500倍の金属顕微鏡で観察してクラックは皆
無でさった。次に200℃で60分間、さらに毎分20
!のN2雰囲気中350℃で30分間熱処理すると約2
.9μmの最終硬化膜が得られに0この膜は優れた耐熱
性と優れた′電気的特性を持って1nfc。
2 at room temperature using a developer consisting of 25p of ion-exchanged water.
Developed by immersion for 1 minute, then immersed in ethyl alcohol for 1 minute, rinsed again, and the film thickness after rinsing was approximately 4.7 μm.
When observed with a metallurgical microscope at 500x magnification, there were no cracks. Next, at 200℃ for 60 minutes, and then at 20℃ per minute.
! When heat treated for 30 minutes at 350°C in a N2 atmosphere, approximately 2
.. A final cured film of 9μm was obtained, and this film had excellent heat resistance and excellent electrical properties.

実施例3 実施例1と同様にして表のNa1に示す組成の感光性ボ
11イミド前駆体を用いて約5μmの蕗光膜を得友。次
にN−メチル−2〜ピロυトン50t。
Example 3 A photosensitive film of about 5 μm was obtained in the same manner as in Example 1 using a photosensitive boimide precursor having the composition shown in Na1 in the table. Next, 50 tons of N-methyl-2-pyroυton.

イオン交換水50yからなる′現1ボ液を用いて楽温で
2分間浸漬法で現像し次−でエチルアルコールで1分間
浸漬してIJンスした。IJンス後の膜ルは約4.6μ
mであり、500倍の金属顕微鏡で観察してクラックは
全く認められなかった。次に200℃で60分間、さら
に毎分20IlのN2雰囲気中350℃で30分間熱処
理Tると約2.8μmの最終硬化膜が得られた。この膜
に優れた耐熱性と優れ几′峨気的特性を持っていた。
The film was developed by immersion at a comfortable temperature for 2 minutes using a developing solution consisting of 50 y of ion-exchanged water, and then immersed in ethyl alcohol for 1 minute for IJ rinsing. The membrane after IJ is approximately 4.6μ
m, and no cracks were observed when observed with a metallurgical microscope at 500x magnification. Next, heat treatment was performed at 200° C. for 60 minutes and then at 350° C. for 30 minutes in an N2 atmosphere of 20 Il/min, resulting in a final cured film of about 2.8 μm. This film had excellent heat resistance and excellent thermal properties.

実施例4 表の階2に示T組成の感光性ボ1]イミド前駆体を用い
て露光後の膜厚が約8μmの塗膜を得た。
Example 4 A coating film having a film thickness of about 8 μm after exposure was obtained using a photosensitive bo1]imide precursor having the T composition shown in Floor 2 of the table.

この麹光膜iN、N−ジメチルアセトアミドが75t。This KojikomeiN, N-dimethylacetamide is 75t.

イオン交換水が25#からなる現像液を用いて室温で2
分間浸漬法で現像し1次いでアセトンで1分間浸漬して
リンスした。リンス後の膜厚は約7μmであシ、5θO
倍の金属顕微鏡でし察してクラックは全(認められなか
った。次に200℃で30分間、さらに毎分2o1のN
2雰囲気中350℃で50分間熱処理すると約4μmの
最終硬化膜が得られた。この膜は耐熱性お工び電気的特
性ともに優れていに0 実施例5 実施例1と同様にして表のNa3に示す紐取の感光性ボ
■iイミド前駆体を用いて約4μmの塗膜を得た。この
塗膜にPJT足のフォトマスクを介して高圧水銀燈で1
0分間鈷光重た。このときの紫外線強度は15mW/c
m’(565℃m)であッfc。次にN−メチル−2−
ピロリドンが75g、イオン交換水が25.からなる現
像液を用いて室温で2分間浸漬して現像し1次いでエチ
ルアルコールで1分間浸漬して11ンスした。IIンス
後の膜厚は約5.9μmであり、500倍の金属顕微鏡
で観察してクラックは皆無であった。次に200℃で3
0分曲1次いで毎分2onのN2 雰囲気中350℃で
60分間熱処理Tると約2,1μmの最終硬化膜が得ら
れfc、この膜は耐熱性お工ひ電気特性ともに優れてい
た。
2 at room temperature using a developer consisting of 25# ion-exchanged water.
The film was developed by dipping for one minute, and then rinsed by dipping in acetone for one minute. The film thickness after rinsing is approximately 7μm, 5θO
When observed with a metallurgical microscope at a magnification of 200℃, no cracks were observed.
A final cured film of approximately 4 μm was obtained by heat treatment at 350° C. for 50 minutes in a 2 atmosphere. This film has excellent heat resistance and electrical properties.Example 5 A coating film of about 4 μm was made in the same manner as in Example 1 using the photosensitive boimide precursor shown in Na3 in the table. I got it. This coating film is coated with a high-pressure mercury lamp through a photomask on the PJT foot.
The light was heavy for 0 minutes. The UV intensity at this time was 15mW/c
fc at m' (565°C m). Next, N-methyl-2-
75g of pyrrolidone, 25g of ion exchange water. The film was developed by immersing it in a developer consisting of the following at room temperature for 2 minutes, and then immersing it in ethyl alcohol for 1 minute for 11 seconds. The film thickness after II rinsing was about 5.9 μm, and there were no cracks when observed under a metallurgical microscope with a magnification of 500 times. Then 3 at 200℃
When the film was heated for 60 minutes at 350° C. in an N2 atmosphere at 2 on/min, a final cured film of about 2.1 μm was obtained, and this film was excellent in both heat resistance and electrical properties.

比較例1 比較例1と同様にして第1表の而1に示す組成の感光性
ポリイミド前駆体を用いて露光後の膜厚が約3μmの塗
膜を得た。この棒光膜をN、N−ジメチルアセトアミド
が8g、メチルアルコールが2部からなる現像液を用い
て室温で2分間浸漬して現像し次めでメチルアルコール
で1分間浸漬して++ンスしたところパダーンにクラッ
クが発生し膜が一部脱落しているところも肉眼で観察さ
れた。
Comparative Example 1 In the same manner as in Comparative Example 1, a coating film having a thickness of about 3 μm after exposure was obtained using a photosensitive polyimide precursor having the composition shown in Table 1. This stick light film was developed by immersing it at room temperature for 2 minutes in a developer consisting of 8 g of N,N-dimethylacetamide and 2 parts of methyl alcohol, and then immersed in methyl alcohol for 1 minute to develop it. It was also observed with the naked eye that cracks had formed and parts of the film had fallen off.

実施例1と同一条件で熱処理を行って得られた最終硬化
膜は絶縁膜として実用に耐えなかつ六〇以上、述べた如
く1本発明による現像液を用いることで、従来できなか
った5μm以上の岸さの感光性ポリイミド前駆体の塗膜
をクラックの発生を見ることなく現像Tることができ穴
。このため半導体集積回路あるI/′1は混成集積回路
などにおける多層配線の層間絶縁膜として2μm以上の
厚さの膜が得られ、?!縁性能が飛躍的に向上しに0代
理人弁理士 薄 1)利 幸
The final cured film obtained by heat treatment under the same conditions as in Example 1 was not suitable for practical use as an insulating film and had a diameter of more than 60 μm. The photosensitive polyimide precursor coating can be developed without any cracks or holes. For this reason, in the semiconductor integrated circuit I/'1, a film with a thickness of 2 μm or more can be obtained as an interlayer insulating film for multilayer wiring in a hybrid integrated circuit, etc. ! The relationship performance has improved dramatically and the agent patent attorney Susuki 1) Toshiyuki

Claims (1)

【特許請求の範囲】 感光性ポリイミド系樹脂前駆体から所定のパターンを有
するポリイミド系樹脂を形成するために用いる現像液に
おりて、非プロトン性極性溶媒t。 10重量%以上50重量%以下の水と、必袈に応じて加
える有機溶媒とから成ることを特徴とする感光性耐熱樹
脂用現像液。
[Scope of Claims] An aprotic polar solvent t is used in a developer used to form a polyimide resin having a predetermined pattern from a photosensitive polyimide resin precursor. A developer for photosensitive heat-resistant resins, characterized in that it consists of 10% by weight or more and 50% by weight or less of water, and an organic solvent added as necessary.
JP16580781A 1981-10-19 1981-10-19 Developer for heat resistant photosensitive resin Pending JPS5866940A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16580781A JPS5866940A (en) 1981-10-19 1981-10-19 Developer for heat resistant photosensitive resin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16580781A JPS5866940A (en) 1981-10-19 1981-10-19 Developer for heat resistant photosensitive resin

Publications (1)

Publication Number Publication Date
JPS5866940A true JPS5866940A (en) 1983-04-21

Family

ID=15819362

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16580781A Pending JPS5866940A (en) 1981-10-19 1981-10-19 Developer for heat resistant photosensitive resin

Country Status (1)

Country Link
JP (1) JPS5866940A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62269955A (en) * 1986-05-19 1987-11-24 Asahi Chem Ind Co Ltd Pattern forming method
JPH04133062A (en) * 1990-09-25 1992-05-07 Toray Ind Inc Developer for photosensitive polyimide
US6403289B1 (en) 1997-10-31 2002-06-11 Nippon Zeon Co., Ltd. Developer for photosensitive polyimide resin composition

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS564630A (en) * 1979-05-11 1981-01-19 Minnesota Mining & Mfg Hardening of polyamic acid or its salt by ultraviolet ray exposure
JPS5622428A (en) * 1979-08-01 1981-03-03 Toray Ind Inc Polyimide pattern forming method
JPS5638038A (en) * 1979-08-01 1981-04-13 Toray Ind Inc Photosensitive polyimide precursor
JPS5645915A (en) * 1979-09-25 1981-04-25 Hitachi Ltd Photosensitive polymer composition
JPS56110728A (en) * 1980-02-08 1981-09-02 Hitachi Ltd Photosensitive polymer composition and preparation of the same

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS564630A (en) * 1979-05-11 1981-01-19 Minnesota Mining & Mfg Hardening of polyamic acid or its salt by ultraviolet ray exposure
JPS5622428A (en) * 1979-08-01 1981-03-03 Toray Ind Inc Polyimide pattern forming method
JPS5638038A (en) * 1979-08-01 1981-04-13 Toray Ind Inc Photosensitive polyimide precursor
JPS5645915A (en) * 1979-09-25 1981-04-25 Hitachi Ltd Photosensitive polymer composition
JPS56110728A (en) * 1980-02-08 1981-09-02 Hitachi Ltd Photosensitive polymer composition and preparation of the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62269955A (en) * 1986-05-19 1987-11-24 Asahi Chem Ind Co Ltd Pattern forming method
JPH04133062A (en) * 1990-09-25 1992-05-07 Toray Ind Inc Developer for photosensitive polyimide
US6403289B1 (en) 1997-10-31 2002-06-11 Nippon Zeon Co., Ltd. Developer for photosensitive polyimide resin composition

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