JPS5865502U - Micrometer with dual scale - Google Patents

Micrometer with dual scale

Info

Publication number
JPS5865502U
JPS5865502U JP15990381U JP15990381U JPS5865502U JP S5865502 U JPS5865502 U JP S5865502U JP 15990381 U JP15990381 U JP 15990381U JP 15990381 U JP15990381 U JP 15990381U JP S5865502 U JPS5865502 U JP S5865502U
Authority
JP
Japan
Prior art keywords
scale
sleeve
main scale
main
micrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15990381U
Other languages
Japanese (ja)
Inventor
柿崎 唯一
Original Assignee
三菱原子燃料株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱原子燃料株式会社 filed Critical 三菱原子燃料株式会社
Priority to JP15990381U priority Critical patent/JPS5865502U/en
Publication of JPS5865502U publication Critical patent/JPS5865502U/en
Pending legal-status Critical Current

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  • Length-Measuring Instruments Using Mechanical Means (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のマイクロメータの一例を示す斜視図、第
2図は従来のマイクロメータにより被測定物の手前側部
を測定する際における被測定物と測定者との位置関係を
示す図、第3図は従来のマイクロメータによる測定状態
を示す斜視図、第4図は従来のマイク、ロメータにより
被測定物の後部を測定する際における被測定物と測定者
との位置関係を示す図、第5図は従来のマイクロメータ
による被測定物の後側部の測定状態を示す斜視図、第6
図はこの考案の一実施例を示す斜視図、第7図はそのマ
イクロメータの裏面側を示す斜視図、    −第8図
はそのマイクロメータにより被測定物の後側部を測定す
る際における被測定物と測定者との位置関係を示す図、
第9図はそのマイクロメータによる被測定物の後側部の
測定状態を示す斜視図である。 3・・・スリーブ、5・・・シンプル、7・・・主尺目
盛(第1の主尺目盛)、訃・・主尺読み取り文字(第1
の主尺読み取り文字)、9・・・副尺目盛(第1の副尺
目盛)、10・・・副尺読み取り文字(第1の副尺読み
取り文字)、21・・・第2の主尺目盛、22・・・第
2の主尺読み取り文字、23・・・第2の副尺読み取り
文字。 第5図
FIG. 1 is a perspective view showing an example of a conventional micrometer, and FIG. 2 is a diagram showing the positional relationship between the object to be measured and the measurer when measuring the front side of the object with the conventional micrometer. FIG. 3 is a perspective view showing a measurement state using a conventional micrometer, and FIG. 4 is a diagram showing the positional relationship between the object to be measured and the measuring person when measuring the rear part of the object using a conventional microphone and micrometer. Figure 5 is a perspective view showing the state of measurement of the rear side of the object to be measured using a conventional micrometer;
Figure 7 is a perspective view showing an embodiment of this invention, Figure 7 is a perspective view showing the back side of the micrometer, and Figure 8 is a perspective view showing the back side of the object to be measured with the micrometer. A diagram showing the positional relationship between the measurement object and the measurement person,
FIG. 9 is a perspective view showing how the micrometer measures the rear side of the object. 3... Sleeve, 5... Simple, 7... Main scale scale (first main scale scale), End... Main scale reading character (first
main scale reading characters), 9... Vernier scale scale (first vernier scale scale), 10... Vernier scale reading characters (first vernier scale reading characters), 21... Second main scale Scale, 22... Second main scale reading characters, 23... Second vernier scale reading characters. Figure 5

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] スリーブの外周面に、該スリーブの一側に位置しかつ該
スリーブの軸線方向に向けて主尺目盛及び主尺読み取り
文字を設け、前記スリーブに回転自在に嵌合されたシン
プルの前記主尺目盛側端部の外周面に、前記シンプルの
円周方向に向けて副尺目盛及び副尺読み取り文字を設け
たマイクロメータにおいて、前記スリーブの外周面に、
該スリーブの軸線に対し前髭主尺目盛及び前記主尺読み
取り文字と対称状態に第2の主尺目盛及び第2の主尺読
み取り文字を設け、前記シンプルの外周面に、前記副尺
読み取り文字の近傍に位置して前記名菓2の主尺目盛間
の値を読み取るための第2の副尺読み取り文字を設けた
ことを特徴とするデュアルケール付マイクロメータ。
A main scale scale and a main scale reading character are provided on the outer circumferential surface of the sleeve and are located on one side of the sleeve and directed in the axial direction of the sleeve, and the simple main scale scale is rotatably fitted to the sleeve. In a micrometer in which a vernier scale and vernier reading characters are provided on the outer circumferential surface of the side end portion toward the circumferential direction of the simple, the outer circumferential surface of the sleeve includes:
A second main scale scale and a second main scale read character are provided in symmetry with the front whisker main scale scale and the main scale read character with respect to the axis of the sleeve, and the vernier scale read character is provided on the outer peripheral surface of the simple. A micrometer with a dual scale, characterized in that a second vernier scale reading character is provided near the main scale scale for reading the value between the main scale marks of the famous confectionery 2.
JP15990381U 1981-10-27 1981-10-27 Micrometer with dual scale Pending JPS5865502U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15990381U JPS5865502U (en) 1981-10-27 1981-10-27 Micrometer with dual scale

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15990381U JPS5865502U (en) 1981-10-27 1981-10-27 Micrometer with dual scale

Publications (1)

Publication Number Publication Date
JPS5865502U true JPS5865502U (en) 1983-05-04

Family

ID=29952338

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15990381U Pending JPS5865502U (en) 1981-10-27 1981-10-27 Micrometer with dual scale

Country Status (1)

Country Link
JP (1) JPS5865502U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008039790A (en) * 2007-09-11 2008-02-21 Akio Yazaki Micrometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008039790A (en) * 2007-09-11 2008-02-21 Akio Yazaki Micrometer
JP4668962B2 (en) * 2007-09-11 2011-04-13 昭男 矢崎 Micrometer

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