JPS5865502U - Micrometer with dual scale - Google Patents
Micrometer with dual scaleInfo
- Publication number
- JPS5865502U JPS5865502U JP15990381U JP15990381U JPS5865502U JP S5865502 U JPS5865502 U JP S5865502U JP 15990381 U JP15990381 U JP 15990381U JP 15990381 U JP15990381 U JP 15990381U JP S5865502 U JPS5865502 U JP S5865502U
- Authority
- JP
- Japan
- Prior art keywords
- scale
- sleeve
- main scale
- main
- micrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Instruments Using Mechanical Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来のマイクロメータの一例を示す斜視図、第
2図は従来のマイクロメータにより被測定物の手前側部
を測定する際における被測定物と測定者との位置関係を
示す図、第3図は従来のマイクロメータによる測定状態
を示す斜視図、第4図は従来のマイク、ロメータにより
被測定物の後部を測定する際における被測定物と測定者
との位置関係を示す図、第5図は従来のマイクロメータ
による被測定物の後側部の測定状態を示す斜視図、第6
図はこの考案の一実施例を示す斜視図、第7図はそのマ
イクロメータの裏面側を示す斜視図、 −第8図
はそのマイクロメータにより被測定物の後側部を測定す
る際における被測定物と測定者との位置関係を示す図、
第9図はそのマイクロメータによる被測定物の後側部の
測定状態を示す斜視図である。
3・・・スリーブ、5・・・シンプル、7・・・主尺目
盛(第1の主尺目盛)、訃・・主尺読み取り文字(第1
の主尺読み取り文字)、9・・・副尺目盛(第1の副尺
目盛)、10・・・副尺読み取り文字(第1の副尺読み
取り文字)、21・・・第2の主尺目盛、22・・・第
2の主尺読み取り文字、23・・・第2の副尺読み取り
文字。
第5図FIG. 1 is a perspective view showing an example of a conventional micrometer, and FIG. 2 is a diagram showing the positional relationship between the object to be measured and the measurer when measuring the front side of the object with the conventional micrometer. FIG. 3 is a perspective view showing a measurement state using a conventional micrometer, and FIG. 4 is a diagram showing the positional relationship between the object to be measured and the measuring person when measuring the rear part of the object using a conventional microphone and micrometer. Figure 5 is a perspective view showing the state of measurement of the rear side of the object to be measured using a conventional micrometer;
Figure 7 is a perspective view showing an embodiment of this invention, Figure 7 is a perspective view showing the back side of the micrometer, and Figure 8 is a perspective view showing the back side of the object to be measured with the micrometer. A diagram showing the positional relationship between the measurement object and the measurement person,
FIG. 9 is a perspective view showing how the micrometer measures the rear side of the object. 3... Sleeve, 5... Simple, 7... Main scale scale (first main scale scale), End... Main scale reading character (first
main scale reading characters), 9... Vernier scale scale (first vernier scale scale), 10... Vernier scale reading characters (first vernier scale reading characters), 21... Second main scale Scale, 22... Second main scale reading characters, 23... Second vernier scale reading characters. Figure 5
Claims (1)
スリーブの軸線方向に向けて主尺目盛及び主尺読み取り
文字を設け、前記スリーブに回転自在に嵌合されたシン
プルの前記主尺目盛側端部の外周面に、前記シンプルの
円周方向に向けて副尺目盛及び副尺読み取り文字を設け
たマイクロメータにおいて、前記スリーブの外周面に、
該スリーブの軸線に対し前髭主尺目盛及び前記主尺読み
取り文字と対称状態に第2の主尺目盛及び第2の主尺読
み取り文字を設け、前記シンプルの外周面に、前記副尺
読み取り文字の近傍に位置して前記名菓2の主尺目盛間
の値を読み取るための第2の副尺読み取り文字を設けた
ことを特徴とするデュアルケール付マイクロメータ。A main scale scale and a main scale reading character are provided on the outer circumferential surface of the sleeve and are located on one side of the sleeve and directed in the axial direction of the sleeve, and the simple main scale scale is rotatably fitted to the sleeve. In a micrometer in which a vernier scale and vernier reading characters are provided on the outer circumferential surface of the side end portion toward the circumferential direction of the simple, the outer circumferential surface of the sleeve includes:
A second main scale scale and a second main scale read character are provided in symmetry with the front whisker main scale scale and the main scale read character with respect to the axis of the sleeve, and the vernier scale read character is provided on the outer peripheral surface of the simple. A micrometer with a dual scale, characterized in that a second vernier scale reading character is provided near the main scale scale for reading the value between the main scale marks of the famous confectionery 2.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15990381U JPS5865502U (en) | 1981-10-27 | 1981-10-27 | Micrometer with dual scale |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15990381U JPS5865502U (en) | 1981-10-27 | 1981-10-27 | Micrometer with dual scale |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5865502U true JPS5865502U (en) | 1983-05-04 |
Family
ID=29952338
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15990381U Pending JPS5865502U (en) | 1981-10-27 | 1981-10-27 | Micrometer with dual scale |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5865502U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008039790A (en) * | 2007-09-11 | 2008-02-21 | Akio Yazaki | Micrometer |
-
1981
- 1981-10-27 JP JP15990381U patent/JPS5865502U/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008039790A (en) * | 2007-09-11 | 2008-02-21 | Akio Yazaki | Micrometer |
JP4668962B2 (en) * | 2007-09-11 | 2011-04-13 | 昭男 矢崎 | Micrometer |
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