JPS585376B2 - lang camera - Google Patents

lang camera

Info

Publication number
JPS585376B2
JPS585376B2 JP432172A JP432172A JPS585376B2 JP S585376 B2 JPS585376 B2 JP S585376B2 JP 432172 A JP432172 A JP 432172A JP 432172 A JP432172 A JP 432172A JP S585376 B2 JPS585376 B2 JP S585376B2
Authority
JP
Japan
Prior art keywords
sample
ray
point
photosensitive plate
guide surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP432172A
Other languages
Japanese (ja)
Other versions
JPS4875085A (en
Inventor
遠藤成章
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Original Assignee
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd filed Critical Rigaku Denki Co Ltd
Priority to JP432172A priority Critical patent/JPS585376B2/en
Publication of JPS4875085A publication Critical patent/JPS4875085A/ja
Publication of JPS585376B2 publication Critical patent/JPS585376B2/en
Expired legal-status Critical Current

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Description

【発明の詳細な説明】 ラングカメラにおいては、はぼ一定の波長を有する平行
X線を平面状の単結晶試料の一部に投射して、その回折
X線を感光板に入射させ、試料と感光板とを同時に移動
させて、試料全面の回折X線写真を撮影する。
Detailed Description of the Invention In a Lang camera, parallel X-rays with a nearly constant wavelength are projected onto a part of a flat single crystal sample, and the diffracted X-rays are incident on a photosensitive plate, which allows the specimen to be separated from the sample. A diffraction X-ray photograph of the entire surface of the sample is taken by moving the photosensitive plate at the same time.

しかし上記平行X線には多少の開き角があると共に投射
X線にも一般に波長の僅かに異なる特性X線にα1とに
α2とが含まれる。
However, the parallel X-rays have a certain opening angle, and the projected X-rays also generally include characteristic X-rays α1 and α2 having slightly different wavelengths.

このため色収差を生じて撮影された回折X線像の鮮鋭度
が劣化する。
Therefore, chromatic aberration occurs and the sharpness of the photographed diffraction X-ray image deteriorates.

本発明は極めて簡単な機構によって上述のような色収差
を補正しようとするものである。
The present invention attempts to correct the above-mentioned chromatic aberration using an extremely simple mechanism.

第1図は本発明実施例のラングカメラの平面図で、平板
状の単結晶試料1およびX線感光板2は紙面と垂直に配
置されている。
FIG. 1 is a plan view of a Lang camera according to an embodiment of the present invention, in which a flat single crystal sample 1 and an X-ray photosensitive plate 2 are arranged perpendicular to the plane of the paper.

この試料1およびX線感光板2はそれぞれ試料台3並び
に基台4上に設置されたもので、その試料台3およびX
線感光板の基台4は水平面内において適当な角度をなす
ように架設された案内軌道5,6に摺動自在に取付けら
れている。
The sample 1 and the X-ray photosensitive plate 2 are installed on a sample stand 3 and a base 4, respectively.
The base 4 of the photosensitive plate is slidably attached to guide tracks 5 and 6 constructed at an appropriate angle in a horizontal plane.

かつ試料台3には軌道5と平行に配置された螺杵7の一
端を固定して、その螺杵7をめねじ筒8に螺合し、めね
じ筒8に固定した歯車9を減速機付電動機10の歯車1
1に噛合せである。
In addition, one end of a screw punch 7 arranged parallel to the track 5 is fixed to the sample stage 3, the screw punch 7 is screwed into a female threaded tube 8, and a gear 9 fixed to the female threaded tube 8 is connected to a reducer. Gear 1 of electric motor 10
It is meshed with 1.

従って電動機10を起動すると、試料台3が矢印pのよ
うに低速度で移動する。
Therefore, when the electric motor 10 is started, the sample stage 3 moves at a low speed as indicated by the arrow p.

更に試料台3には直線状の色収差補正案内面12を有す
る腕13を設けて、その腕の一端をねじ14で締付ける
と共に腕13に指標15を設は試料台3の表面に目盛1
6を設けである。
Further, the sample stage 3 is provided with an arm 13 having a linear chromatic aberration correction guide surface 12, one end of which is tightened with a screw 14, and an index 15 is provided on the arm 13.
6 is provided.

従ってねじ14をゆるめて腕13を回転し、目盛16と
指標15とによって案内面12を試料1の面に対して任
意の角度をなすように固定することができる。
Therefore, by loosening the screw 14 and rotating the arm 13, the guide surface 12 can be fixed at an arbitrary angle with respect to the surface of the sample 1 using the scale 16 and the index 15.

またX線感光板の基台4にはねじ17によって腕18を
固定し、その腕の先端にローラー19を取付けると共に
該基台4をばね20によって固定部に牽引し、ローラー
19を前記案内面12に圧接させである。
Further, an arm 18 is fixed to the base 4 of the X-ray photosensitive plate with a screw 17, a roller 19 is attached to the tip of the arm, the base 4 is pulled to the fixed part by a spring 20, and the roller 19 is moved to the guide surface. 12.

なおねじ17は腕18の溝21に嵌合しているから、こ
のねじをゆるめることによって柵8の実効長を調節し、
X線感光板2が試料1と対向するようにその位置を調節
することができる。
Note that since the screw 17 is fitted into the groove 21 of the arm 18, the effective length of the fence 8 can be adjusted by loosening this screw.
The position of the X-ray photosensitive plate 2 can be adjusted so that it faces the sample 1.

上述の装置において、紙面に対し垂直な板状のX線Xを
試料1に投射し、試料1によって回折したX線X′を感
光板2に入射させると同時に試料台3を矢印pのように
移動させる。
In the above-mentioned apparatus, a plate-shaped X-ray X perpendicular to the plane of the paper is projected onto the sample 1, and the X-ray X' diffracted by the sample 1 is made incident on the photosensitive plate 2. At the same time, the sample stage 3 is moved in the direction of the arrow p. move it.

これに伴ってX線感光板の基台4が腕13で押されて矢
印qのように移動し、かつローラー19はその際に案内
面12上を滑動する。
Accordingly, the base 4 of the X-ray photosensitive plate is pushed by the arm 13 and moves in the direction of arrow q, and the roller 19 slides on the guide surface 12 at this time.

第2図はこの場合におけるX線光学系を示すもので、上
記X線Xは点焦点から微小の発散角△θをもって試料1
に入射し、試料上の点Aに入射したにα1線が該試料で
回折して感光板2上の点Cに入射するものとする。
Figure 2 shows the X-ray optical system in this case.
Assume that the α1 ray is incident on a point A on the sample, diffracted by the sample, and incident on a point C on the photosensitive plate 2.

また試料1および感光板2が前記矢印p、qの方向に移
動して試料上の点へが点Bの位置に達したときにα2線
に回折を生じて、その回折X線が感光板上の点りに入射
するものとすると、この場合感光板上の点Cを点りの位
置まで移動させることによって色収差を補正することが
できる。
Further, when the sample 1 and the photosensitive plate 2 move in the directions of the arrows p and q and the point on the sample reaches the position of point B, diffraction occurs in the α2 ray, and the diffracted X-rays are reflected on the photosensitive plate. In this case, chromatic aberration can be corrected by moving point C on the photosensitive plate to the dot position.

今、前記点焦点から試料1におけるX線入射位置までの
距離をl、試料のX線入射位置から感光板2における回
折X線の入射位置までの距離をmとし、かつ回折X線は
感光板2にほぼ直角に入射するものとする。
Now, the distance from the point focus to the X-ray incident position on the sample 1 is l, the distance from the X-ray incident position on the sample to the incident position of the diffracted X-rays on the photosensitive plate 2 is m, and the diffracted X-rays are It is assumed that the incident angle is approximately perpendicular to 2.

この場合、点Bに入射するX線に点Aから垂線AEを下
すと距離AEはl△θである。
In this case, when a perpendicular line AE is drawn from point A to the X-ray incident on point B, the distance AE is lΔθ.

またにα1線およびにα2線の回折角θ1.θ2はほぼ
等しいから、これをθとし、かつ試料1における結晶格
子面と試料面との間の角度をαとすると、点Bに入射す
るX線の入射角はほぼ(α+θ)で与えられる。
Also, the diffraction angle θ1 of the α1 ray and the α2 ray. Since θ2 is approximately equal, if this is θ and the angle between the crystal lattice plane and the sample surface in sample 1 is α, then the incident angle of the X-ray incident on point B is approximately given by (α+θ).

従って点A、B間の距離ABは で表わされる。Therefore, the distance AB between points A and B is It is expressed as

また点Bを通り回折X線ACに並行な直線が感光板2と
交わる点をFとすると、該直線は点Fにおいて感光板2
と直交する。
Further, if the point where a straight line passing through point B and parallel to the diffracted X-ray AC intersects with the photosensitive plate 2 is F, then the straight line crosses the photosensitive plate 2 at point F.
orthogonal to

更に点Cを通り直線ABに並行な直線が直線BPと交わ
る点をGとすると、距離σ百は明らかに距離層に等しく
、かつ直線GC,GFの間の角度は(α−β)で与えら
れる。
Furthermore, if the point where a straight line passing through point C and parallel to straight line AB intersects straight line BP is G, then the distance σ is clearly equal to the distance layer, and the angle between straight lines GC and GF is given by (α-β). It will be done.

従って距離C〒はCF=ABsin(α−β)・・・・
・・(2)である。
Therefore, the distance C〒 is CF=ABsin(α-β)...
...(2).

また直線BFと回折X線BDの間の角度はほぼ△θであ
るから、距離FDは FD−mΔθ ・・・・・・(3
)である。
Also, since the angle between the straight line BF and the diffracted X-ray BD is approximately △θ, the distance FD is FD - mΔθ (3
).

よって上記(1)(2)(3)式より距離CDとABの
比は で与えられる一定値である。
Therefore, from equations (1), (2), and (3) above, the ratio of distances CD and AB is a constant value given by.

また第3図は第1図における機構を示すもので、試料1
から任意の角度ψをもって案内面12が突設されている
Also, Figure 3 shows the mechanism in Figure 1, and shows sample 1.
A guide surface 12 is provided to protrude from the guide surface 12 at an arbitrary angle ψ.

試料1が矢印pのように移動するとX線感光板2は上記
案内面12で押されて矢印qのように移動する。
When the sample 1 moves in the direction of arrow p, the X-ray photosensitive plate 2 is pushed by the guide surface 12 and moves in the direction of arrow q.

従って試料1上の任意の点すを通り案内面12に並行な
直線が感光板2と交わる点をdとすると、試料が点aか
らbまで移動したとき、感光板は案内面12に接する点
Cから点dまで移動する。
Therefore, if the point where a straight line passing through an arbitrary point on the sample 1 and parallel to the guide surface 12 intersects with the photosensitive plate 2 is d, then when the sample moves from point a to b, the photosensitive plate touches the guide surface 12 at the point. Move from C to point d.

今、点Cを通り試料1に並行な直線を画いて、その直線
が直線bdと交わる点をhlまた点dから直線chに下
した垂線の足を1とすると、回折X線X′は前述のよう
に感光板2に直角に入射するから、角idcは回折X線
X′と試料1とのなす角に等しくなる。
Now, if we draw a straight line passing through point C and parallel to sample 1, and let the point where the straight line intersects with straight line bd be hl, and the foot of the perpendicular line drawn from point d to straight line ch be 1, then the diffracted X-ray X' will be Since the light is incident on the photosensitive plate 2 at a right angle, the angle idc is equal to the angle between the diffracted X-ray X' and the sample 1.

かつ回折X線X′と試料1との角度は(α−β)であり
、また直線abとchは等しいから、直角三角形cid
およびhidによって距離abおよ徹dの間に ab=cdsin(α−β)+cdcos(α−β)c
otψ の関係が成立する。
And since the angle between the diffracted X-ray X' and the sample 1 is (α-β), and the straight lines ab and ch are equal, a right triangle cid
and hid between the distance ab and d between ab=cdsin(α-β)+cdcos(α-β)c
The relationship otψ holds true.

すなわちである。In other words.

従って(4)(5)式からとなるように案内面12の角
度ψを設定すると、第2図における試料1上の点Aが点
Bまで移動したとき、感光板上の点Cは点りまで移動す
る。
Therefore, if the angle ψ of the guide surface 12 is set so as to satisfy equations (4) and (5), when point A on the sample 1 in Fig. 2 moves to point B, point C on the photosensitive plate becomes a point. Move up to.

すなわちにα1線による回折線とにα2線の回折線とが
、感光板上の同一点に入射して、このため色収差を補正
し得るものである。
That is, the diffraction line of the α1 ray and the diffraction line of the α2 ray are incident on the same point on the photosensitive plate, so that chromatic aberration can be corrected.

なお前述の実施例は試料台に案内面12を設けたが、X
線感光板の基台4に案内面を設けてその案内面に試料台
を摺接させることもできる。
In the above-mentioned embodiment, the guide surface 12 was provided on the sample stage, but
It is also possible to provide a guide surface on the base 4 of the line-sensitive plate and to slide the sample stage onto the guide surface.

上述のように本発明は試料およびX線感光板をそれ等の
面とそれぞれ並行に移動させると共にその一方に適宜の
角度で設けた案内面に他方を摺接させたもので、極めて
簡単な機構によって色収差を補正し、鮮鋭な像を撮影し
得るものである。
As mentioned above, the present invention has an extremely simple mechanism in which the sample and the X-ray photosensitive plate are moved parallel to their respective surfaces, and the other is brought into sliding contact with a guide surface provided at an appropriate angle on one side. This allows chromatic aberration to be corrected and sharp images to be taken.

かつ歯車等を必要としないから機構が簡単であると共に
X線源から試料までの距離と同等の極めて長い腕等を必
要としないから、装置を小型に構成し得る。
In addition, since no gears or the like are required, the mechanism is simple, and an extremely long arm, etc., which is equivalent to the distance from the X-ray source to the sample, is not required, so the apparatus can be constructed in a compact size.

しかも案内面の角度αの調節によって簡易に各種の試料
に対する補正を行い得る等の優れた作用効果がある。
Furthermore, there are excellent effects such as the ability to easily make corrections for various samples by adjusting the angle α of the guide surface.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明実施例の平面図、第2図は第1図の装置
におけるX線光学系を示す図、第3図は第1図の装置の
動作機構を示す略図である。 なお図において、1・・・・・・試料、2・・・・・・
X線感光板、3・・・・・・試料台、4・・・・・・X
線感光板の基台、5,6・・・・・・案内軌道、12・
・・・・・案内面。
FIG. 1 is a plan view of an embodiment of the present invention, FIG. 2 is a diagram showing the X-ray optical system in the apparatus shown in FIG. 1, and FIG. 3 is a schematic diagram showing the operating mechanism of the apparatus shown in FIG. In the figure, 1...sample, 2...
X-ray photosensitive plate, 3...sample stand, 4...X
Base of line-sensitive plate, 5, 6... Guide track, 12.
...Information surface.

Claims (1)

【特許請求の範囲】[Claims] 1 試料台並びにX線感光板の基台をそれぞれ試料およ
びX線感光板を含む平面と並行な軌道に沿って移動し得
るように保持すると共に試料台またはX線感光板の基台
の一方に直線状の色収差補正案内面を形成して上記案内
面に他方を摺接させたことを特徴とするラングカメラ。
1 Hold the sample stage and the base of the X-ray photosensitive plate so that they can move along a trajectory parallel to the plane containing the sample and the X-ray photosensitive plate, respectively, and hold the base of the sample table or the base of the X-ray photosensitive plate on one side. A Lang camera characterized in that a linear chromatic aberration correction guide surface is formed and the other guide surface slides into contact with the guide surface.
JP432172A 1972-01-07 1972-01-07 lang camera Expired JPS585376B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP432172A JPS585376B2 (en) 1972-01-07 1972-01-07 lang camera

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP432172A JPS585376B2 (en) 1972-01-07 1972-01-07 lang camera

Publications (2)

Publication Number Publication Date
JPS4875085A JPS4875085A (en) 1973-10-09
JPS585376B2 true JPS585376B2 (en) 1983-01-31

Family

ID=11581186

Family Applications (1)

Application Number Title Priority Date Filing Date
JP432172A Expired JPS585376B2 (en) 1972-01-07 1972-01-07 lang camera

Country Status (1)

Country Link
JP (1) JPS585376B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01500866A (en) * 1986-09-19 1989-03-23 ヒユーズ・エアクラフト・カンパニー Trimming of passive components embedded in multilayer structures

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11041536B2 (en) * 2017-01-31 2021-06-22 Piolax, Inc. Spring assembly

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01500866A (en) * 1986-09-19 1989-03-23 ヒユーズ・エアクラフト・カンパニー Trimming of passive components embedded in multilayer structures
JPH0239116B2 (en) * 1986-09-19 1990-09-04

Also Published As

Publication number Publication date
JPS4875085A (en) 1973-10-09

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