JPS5850864A - Method and device for measuring correction signal - Google Patents

Method and device for measuring correction signal

Info

Publication number
JPS5850864A
JPS5850864A JP9269782A JP9269782A JPS5850864A JP S5850864 A JPS5850864 A JP S5850864A JP 9269782 A JP9269782 A JP 9269782A JP 9269782 A JP9269782 A JP 9269782A JP S5850864 A JPS5850864 A JP S5850864A
Authority
JP
Japan
Prior art keywords
signal
correction signal
correction
supplied
point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9269782A
Other languages
Japanese (ja)
Other versions
JPS6052632B2 (en
Inventor
Hideo Hatada
畑田 英夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP9269782A priority Critical patent/JPS6052632B2/en
Publication of JPS5850864A publication Critical patent/JPS5850864A/en
Publication of JPS6052632B2 publication Critical patent/JPS6052632B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00Diagnosis, testing or measuring for television systems or their details
    • H04N17/04Diagnosis, testing or measuring for television systems or their details for receivers

Landscapes

  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

PURPOSE:To obtain the accurate waveform of a correction signal through simple constitution by measuring the level, etc., of the correction signal with a signal from a photodetector. CONSTITUTION:A horizontal and a vertical deflection signal from a deflecting circuit 1 are supplied to the deflection coil 3 of a picture tube 2. Then, part of the vertical deflection signal is supplied to a parabolic wave generating circuit 4, a parabolic wave signal Sa from which is supplied to a deflection coil 5 for correction. This parabolic wave signal Sa is supplied to a two-phenomenon oscilloscope 6. Further, a detection signal Sb from a photodetector 7 is supplied to the oscilloscope 6 through an attenuator 8. So as a point where the photodetector 7 is in contact is an accurate landing state, the parabolic wave generating circuit 4 is adjusted and the level B at the intersection of the rising signal Sb and signal Sa is read to measure the necessary amount of correction at the point. Further, the distance l from the beginning of the parabolic signal Sa to the rising point of the signal Sb is measured to obtain the accurate position of a measurement point on the deflection signal.

Description

【発明の詳細な説明】 テレビジョン受像機の受像管におい【1例えば糸巻き形
歪みを補正する場合には、従来は垂直周期及び水平周期
のパラボッ波をaII偏向信号及び水平偏向信号に重畳
して行っていた。しかしながら、大形の受像管において
は、単なるパラボラ波では完全な補正を行5ことはでき
ない。
DETAILED DESCRIPTION OF THE INVENTION In the picture tube of a television receiver, [1] For example, when correcting pincushion distortion, conventionally, vertical and horizontal period parabo waves are superimposed on the aII deflection signal and the horizontal deflection signal. I was going. However, in a large-sized picture tube, complete correction cannot be performed with a mere parabolic wave.

そこで例えばラスタを映出し、蛍光画の任意の点でビー
ムが正しくランディングするように偏向信号を補正し、
そのとき必要とした補正量を固定すると共に、蛍光面の
全面にわたって同じ操作を繰り返し、各点の補正量をプ
ロットして必要な補正信号の波形を得ることが行われて
いる。
For example, by projecting a raster image and correcting the deflection signal so that the beam will land correctly at an arbitrary point on the fluorescent image,
The amount of correction required at that time is fixed, the same operation is repeated over the entire surface of the phosphor screen, and the amount of correction at each point is plotted to obtain the waveform of the necessary correction signal.

ところでこのような測定を行う場合には、棚定点の位置
を知る必要がある。そのため従来は、蛍光面上にスクー
ルを当て【位置を測定するようkしていた。
By the way, when performing such measurements, it is necessary to know the position of the shelf fixed point. Therefore, in the past, a school was placed on the phosphor screen to measure its position.

ところが受像管において、ラスタは蛍光面よりも太き(
、いわゆるオーバースキャンされている。
However, in a picture tube, the raster is thicker than the phosphor screen (
, so-called overscanning.

このため蛍光面上で位置を測定しても、その位置と側内
信号上での位置とは一致しない。またスク−ルを目で見
て測定するため正確な値を得る仁ともむずかしい、従っ
て、そのような一定量なプロットして得た補正信号を偏
向信号に重畳しても正しい補正を行うととはできなかっ
た。
Therefore, even if the position is measured on the phosphor screen, the position does not match the position on the intralateral signal. Also, since the deflection is measured visually, it is difficult to obtain accurate values.Therefore, even if the correction signal obtained by plotting a fixed amount is superimposed on the deflection signal, it is difficult to perform correct correction. I couldn't.

本発明はヒのような点kかんがみ、簡単な構成で、正確
な補正信号のIIty#を得ることができるよ5Kt、
たものである。
The present invention is based on the point K, and with a simple configuration, it is possible to obtain an accurate correction signal IIty#.
It is something that

以下、図面を参照しながら本発明の一実施例にりいて説
明しよさ、なお、この例では―直方向の糸巻き歪番の補
正信号を一定する場合について述べる。
An embodiment of the present invention will be described below with reference to the drawings. In this example, a case will be described in which the correction signal for the pincushion distortion number in the normal direction is constant.

第1図#Cシいて、偏向−路(1)からの水平及び―直
偏向信号が受俊管(2)の偏向コイル(3)k供給され
る。また、−直偏陶信号の一部がパラボラ波発生回路(
4) k供給され、この発生団路(4)からのパラぽう
波信号S麿が補正用の偏向コイル(5)k供給される。
At #C in FIG. 1, horizontal and direct deflection signals from the deflection path (1) are supplied to the deflection coil (3) of the receiving tube (2). In addition, a part of the -direct polarization signal is transmitted to the parabolic wave generation circuit (
4) The paraponic wave signal S from the generation group (4) is supplied to the correction deflection coil (5).

また%このパラボラ波、信号am tie fA II
象のオシ田スコープ(6)k供給される。′8らに受光
器(7)からの検出信4#8bがアツテネー−(8)を
通じてオシpX=−プ(6) IC供給される。
Also% this parabolic wave, signal am tie fA II
Elephant Oshida scope (6)k supplied. Detection signal 4#8b from the photoreceiver (7) is supplied to the amplifier (6) through the amplifier (8).

従ってこの回路において、オシキスコープ(6) kは
第2m1k示すようにパラボッ波信号8mが映出される
・それと共に、受光II (7)を蛍光画の任意の点に
轟てることkより、その点を電子ビームが通過したとき
゛の発光が検出され、これが検出信号8bとして映出さ
れる。そしてこの場合にパラメツ波信号8aと検出信号
8bとは、時間軸が一致している。
Therefore, in this circuit, the oscilloscope (6) is projected with a parabonic wave signal 8m as shown in the second m1k.At the same time, the oscilloscope (6) is capable of projecting the received light II (7) to any point on the fluorescent image. When the electron beam passes through, the light emission is detected, and this is displayed as a detection signal 8b. In this case, the time axes of the parameter wave signal 8a and the detection signal 8b match.

そζで、受光器ff)を轟てている点が正確なツンデイ
yグ状園となるようにパラポラ波発生回路(4)を調整
し、そのときの信号8bの立ち上がり点と信号8aとの
交点のレベルBを絖み壜れば、その点の必要な補正量を
一定するヒとができる。
Then, adjust the parapolar wave generation circuit (4) so that the point at which the photoreceiver ff) is pulsating becomes an accurate tunde Y waveform, and then compare the rising point of the signal 8b and the signal 8a at that time. By adjusting the level B of the intersection point, it is possible to keep the necessary correction amount at that point constant.

また、パラボッ波信号8Fは■厘偏向信号に同期してい
るので、この信号qaの始めから信号8bの立ち上がり
点までの距離1を一定することkより、偏向信号上での
測定点の位置を正確に知ることがで書る。
Also, since the parabonic wave signal 8F is synchronized with the deflection signal, the position of the measurement point on the deflection signal can be determined by keeping the distance 1 from the beginning of the signal qa to the rising point of the signal 8b constant. Write what you know exactly.

モして測定点を順次炭化させ、測定されたレベルBと距
離患、とをプロットするヒとkより、必要な補正信号の
波形を得ることができる。
The waveform of the necessary correction signal can be obtained by sequentially carbonizing the measurement points and plotting the measured level B and distance curve.

なおl!Ilkは、測定点を順次変えていき、そのとき
どきの交点をオシレス:l−1上にプνットすることk
より、直接必要な波形を得ることもできる。
In addition, l! Ilk is to sequentially change the measurement points and put the intersection points on the oscilloscope:l-1.
It is also possible to directly obtain the required waveform.

こうして補正信号のH形を一定することができるわけで
あるが、本発1plkよれば、一定点を正確に知ること
ができるので、一定される補正信号の波形が正確になる
In this way, the H-shape of the correction signal can be kept constant, and according to the present 1 PLK, the fixed point can be accurately known, so the waveform of the fixed correction signal becomes accurate.

なお本発明は糸巻き形歪みの袖正に眼らず、νニアリテ
イ、すνギンダ、ミスコンバージェンス等の補正信号の
一定にも使用できる。
The present invention can also be used to fix correction signals for ν nearness, ν ginder, misconvergence, etc. without focusing on pincushion distortion.

また上述の例は1厘周期の一定の場合について述べたが
、水平周期の一定の場合には信号8bの波形が鈍つcl
ll定しにくくなる・そζで水平周期の測定の場合には
検出信号sbを微分回路に供給し、さらkその微分信号
をスライスして明瞭な波形を得ることができる。
Furthermore, in the above example, the case where the period is constant is 1, but when the horizontal period is constant, the waveform of the signal 8b becomes dull.
Therefore, in the case of measuring the horizontal period, the detection signal sb is supplied to a differentiating circuit, and the differentiated signal is further sliced to obtain a clear waveform.

さらに信号8mをデジール一定器に供給し、受光器から
の信号で測定器をトリガして、レベルな表示させるよ5
kL、てもよい。
Furthermore, the signal of 8 m is supplied to the digital constant meter, and the signal from the receiver triggers the measuring device to display the level.
kL, good.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一例の系統図、館2図はその説明のた
めの波形図である。 (5)ハ補正°用の偏向コイル、(6)はオシロスコー
プ、(7)は受光器である。
FIG. 1 is a system diagram of an example of the present invention, and FIG. 2 is a waveform diagram for explaining the same. (5) A deflection coil for C correction, (6) an oscilloscope, and (7) a light receiver.

Claims (1)

【特許請求の範囲】 1、受像管のビーム走査位置を補正する補正信号を発生
する補正信号発生器からの上記補正信号な波形一定器に
供給するとともに、上記受像管の前面の任意の点におい
た受光器からの信号を上記波形測定器に供給して、上記
受光器からの信号により上記任意の点における上記補正
信号のレベルを固定するようにした補正信号の測定方法
。 λ 受像管のビーム走査位置を補正する補正信号を発生
する補正信号発生器と波形測定器と受光器とを有し、上
記受光器を上記受像管の前面の任意の位置におき、上記
補正信号発生器と上記受光器を上記波形測定器に接続し
、上記受光器からの信号により上記任意の点における上
記補正信号のレベルを測定するようkした補正信号の測
定装置。
[Claims] 1. The correction signal from the correction signal generator that generates a correction signal for correcting the beam scanning position of the picture tube is supplied to the waveform constant device, and the correction signal is supplied to the waveform constant device at any point on the front surface of the picture tube. A method for measuring a correction signal, comprising: supplying a signal from a photoreceiver to the waveform measuring device, and fixing the level of the correction signal at the arbitrary point using the signal from the photoreceiver. λ A correction signal generator, a waveform measuring device, and a light receiver that generate a correction signal for correcting the beam scanning position of the picture tube, and the light receiver is placed at an arbitrary position in front of the picture tube, and the correction signal is generated by placing the light receiver at an arbitrary position in front of the picture tube. A correction signal measuring device, wherein a generator and the light receiver are connected to the waveform measuring device, and the level of the correction signal at the arbitrary point is measured based on the signal from the light receiver.
JP9269782A 1982-05-31 1982-05-31 Correction signal measurement method and measurement device Expired JPS6052632B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9269782A JPS6052632B2 (en) 1982-05-31 1982-05-31 Correction signal measurement method and measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9269782A JPS6052632B2 (en) 1982-05-31 1982-05-31 Correction signal measurement method and measurement device

Publications (2)

Publication Number Publication Date
JPS5850864A true JPS5850864A (en) 1983-03-25
JPS6052632B2 JPS6052632B2 (en) 1985-11-20

Family

ID=14061685

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9269782A Expired JPS6052632B2 (en) 1982-05-31 1982-05-31 Correction signal measurement method and measurement device

Country Status (1)

Country Link
JP (1) JPS6052632B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH084117B2 (en) * 1988-03-30 1996-01-17 株式会社東芝 Method for manufacturing semiconductor device

Also Published As

Publication number Publication date
JPS6052632B2 (en) 1985-11-20

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