JPS5849519B2 - Quartz glass crucible for pulling silicon single crystals - Google Patents

Quartz glass crucible for pulling silicon single crystals

Info

Publication number
JPS5849519B2
JPS5849519B2 JP2867377A JP2867377A JPS5849519B2 JP S5849519 B2 JPS5849519 B2 JP S5849519B2 JP 2867377 A JP2867377 A JP 2867377A JP 2867377 A JP2867377 A JP 2867377A JP S5849519 B2 JPS5849519 B2 JP S5849519B2
Authority
JP
Japan
Prior art keywords
quartz glass
silicon single
ppm
single crystals
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2867377A
Other languages
Japanese (ja)
Other versions
JPS53113817A (en
Inventor
武男 岸
勉 西脇
二夫 片桐
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP2867377A priority Critical patent/JPS5849519B2/en
Publication of JPS53113817A publication Critical patent/JPS53113817A/en
Publication of JPS5849519B2 publication Critical patent/JPS5849519B2/en
Expired legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/06Glass compositions containing silica with more than 90% silica by weight, e.g. quartz

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Glass Compositions (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 本発明は半導体等に使用する溶融シリコンを引上げて単
結晶にする場合に使用される石英ガラスルツボに関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a silica glass crucible used for pulling up molten silicon to form a single crystal for use in semiconductors and the like.

シリコン単結晶引上装置は、通常以下の如きものからな
る。
A silicon single crystal pulling apparatus usually consists of the following components.

即ち、石英ガラスルツボ内にシリコン多結晶体を充填す
る。
That is, a quartz glass crucible is filled with silicon polycrystals.

該石英ガラスルツポは高価なものであるため肉薄のもの
となし、そして強度を補強するために黒鉛製ルツボに内
挿する。
Since the quartz glass crucible is expensive, it is made thin and inserted into a graphite crucible to reinforce its strength.

このシリコンを充填したルツボを回転させつつ高周波誘
導加熱等の熱源で約1450℃に加熱してシリコンを溶
融する。
The crucible filled with silicon is rotated and heated to about 1450° C. using a heat source such as high-frequency induction heating to melt the silicon.

ルツボ上部の引上機に支承されたシリコン単結晶の種を
溶融体に浸漬し、これを引き上げつつ徐冷することによ
って多結晶体を単結晶体とするものである。
A silicon single crystal seed supported by a pulling machine at the top of the crucible is immersed in the melt, and the polycrystal is turned into a single crystal by slowly cooling it while pulling it up.

この単結晶は半導体特性を活かすために極めて高純度で
あることが必要で、溶融体が直接接触する石英ガラスは
シリコンによって浸蝕され、石英ガラス或分( S i
02 )が溶融シリコン中に入るため、その純度が常に
留意されている。
This single crystal needs to be extremely pure in order to take advantage of its semiconducting properties, and the quartz glass that comes into direct contact with the molten material is corroded by silicon, causing some of the quartz glass (S i
02) enters the molten silicon, its purity is always taken care of.

本発明者等は不純物の少ないシリコン単結晶の製造法に
ついて種々研究し、シリコン単結晶中に混入する不純物
の総量を低下させるためには石英ガラス中の不純物の総
量に留意するのみでなく、溶融シリコンによって浸蝕さ
れる量を低減させる方法について着目し、溶損量を減ら
すことによって不純物の混入量を規制しようとした結果
、本発明がなされたものである。
The present inventors have conducted various studies on manufacturing methods for silicon single crystals with few impurities.In order to reduce the total amount of impurities mixed in silicon single crystals, it is necessary to not only pay attention to the total amount of impurities in quartz glass, but also to The present invention was developed as a result of focusing on a method of reducing the amount of silicon eroded by silicon and attempting to control the amount of impurities mixed in by reducing the amount of erosion.

即ち、その溶損量は石英ガラスの粘性にほぼ比例し、こ
の粘性は石英ガラス中のB203及びOH基の含有割合
によって大きく影響されることが判った。
That is, it was found that the amount of melting loss is approximately proportional to the viscosity of the quartz glass, and that this viscosity is greatly influenced by the content ratio of B203 and OH groups in the quartz glass.

石英ガラスの粘性を低下させる要因としてアルカリ金属
酸化物等が知られているが、その存在する割合と溶損量
との関係については実験の結果不純物総量がppmオー
ダーの超高純度品の分野においてはB203及びOH基
の影響も無視し難く、従ってアルカリ金属酸化物その他
の不純物は可及的に少ないことが望ましいが、S203
およびOH基についてはそれぞれ1 ppm、3 0
0 ppm以下であることが必要で、その結果としてか
かる組戒の石英ガラスは1450℃において109ポイ
ズの粘性を有することが必要である。
Alkali metal oxides are known to be factors that reduce the viscosity of quartz glass, but experiments have shown that the relationship between the proportion of these oxides and the amount of melting damage has been determined in the field of ultra-high purity products with a total impurity level of ppm order. It is difficult to ignore the influence of B203 and OH groups, and therefore it is desirable that the amount of alkali metal oxides and other impurities be as low as possible, but S203
and 1 ppm and 30 ppm for OH group, respectively.
0 ppm or less, and as a result, the quartz glass of such a composition must have a viscosity of 109 poise at 1450°C.

即ち、実験によればシリコン単結晶引上げにおげるB2
03およびOH基の量と石英ガラスの粘性および溶損量
の関係は表1の通りであり、又?B203の量を一定に
した時のA103の量と溶損量との関係は表2に示す如
くであった。
That is, according to experiments, B2 in silicon single crystal pulling
The relationship between the amount of 03 and OH groups, the viscosity of quartz glass, and the amount of erosion is shown in Table 1. Table 2 shows the relationship between the amount of A103 and the amount of erosion when the amount of B203 was kept constant.

表1および2の溶損量のデータはテストピースである石
英ガラス管(外30φ、内20φ)を100間たげSi
3N4製ルツボ中で1450℃のシリコン融液に20時
間浸漬し測定したものである。
The data on the amount of melting loss in Tables 1 and 2 is based on the test piece quartz glass tube (outer 30 φ, inner 20 φ).
Measurements were taken in a 3N4 crucible by immersing it in a silicon melt at 1450°C for 20 hours.

表10B203の実験に使用したテストピースは金属酸
化物の総量が10ppm以下、OH基10ppm以下で
ある。
The test pieces used in the experiment shown in Table 10B203 had a total amount of metal oxides of 10 ppm or less and OH groups of 10 ppm or less.

表1のOH基の実験に使用したテストピースは金属酸化
物の総量が10ppm以下、B,2 030. 1pp
m以下である。
The test pieces used in the OH group experiments in Table 1 had a total amount of metal oxides of 10 ppm or less, B, 2 030. 1pp
m or less.

表2のテストピースはA1203を除く金属酸化物の総
量が1 0 ppm以下、OH基1 0 ppm以下で
ある。
The test pieces in Table 2 have a total amount of metal oxides excluding A1203 of 10 ppm or less and OH groups of 10 ppm or less.

従って、溶融シリコンに移行する総不純物量を最小にす
るためにはB203およびOH基の量をも規定した石英
ガラスが好ましいことが認められるから、実際に従来の
高純度品と称される石英ガラスと比較して耐蝕性のある
石英ガラスとしては実験の結果酸化硼素1 ppm以下
、OH基3 0 0 ppm以下および酸化アルミニウ
ム、酸化鉄、酸化チタン、アルカリ金属酸化物の含量が
1 0 0 ppm以下で1450℃における粘性10
9のものが必要であることがわかった。
Therefore, in order to minimize the total amount of impurities transferred to molten silicon, it is recognized that quartz glass with a specified amount of B203 and OH groups is preferable, so in fact, quartz glass that is called a conventional high-purity product is Compared to silica glass, corrosion-resistant quartz glass contains less than 1 ppm of boron oxide, less than 300 ppm of OH groups, and less than 100 ppm of aluminum oxide, iron oxide, titanium oxide, and alkali metal oxide. The viscosity at 1450°C is 10
It turned out that 9 things were needed.

例えば、粒径150乃至420μ程度に微粉砕した高純
度の結晶質石英からなる粒子を、垂直軸のまわりに回転
する型中に充填し、内面からアーク炎で加熱し、内径1
35mm,外径154mm,高さ135山、重量701
’の半球状の上記石英ガラスルツボを製造し、この中に
2500?の多結晶シリコンを充填し、1450℃に加
熱してシリコンを単結晶として2000P引き上げた。
For example, particles made of high-purity crystalline quartz pulverized to a particle size of about 150 to 420 μm are filled into a mold that rotates around a vertical axis, heated from the inside with an arc flame, and
35mm, outer diameter 154mm, height 135 peaks, weight 701
The above-mentioned hemispherical quartz glass crucible of ' is manufactured, and 2,500 ? It was filled with polycrystalline silicon and heated to 1450°C to raise the silicon to a single crystal by 2000P.

又、従来の石英ガラスを同様に成形し、同一条件でシリ
コン単結晶を引き上げた。
Furthermore, conventional quartz glass was molded in the same manner, and silicon single crystals were pulled under the same conditions.

この結果を表3に示す。表3より明らかなように本発明
のシリコン単結晶引上用石英ガラスルツボは溶損量が1
1となり、従来の石英ガラスルツボによる同条件の重量
減少量3グのものと比べて著しく少なくなった。
The results are shown in Table 3. As is clear from Table 3, the quartz glass crucible for pulling silicon single crystals of the present invention has a melting loss of 1
1, which is significantly less than the weight loss of 3 g under the same conditions using a conventional quartz glass crucible.

又、得られたシリコン単結晶の特性についても比較した
が表4に示すように実施例と比較例ではシリコン単結晶
の比抵抗に及ぼす影響が大きく異なり比較例石英ガラス
ルツボでは高比抵抗とすることが非常に困難になる。
The characteristics of the obtained silicon single crystals were also compared, and as shown in Table 4, the influence on the specific resistance of the silicon single crystal was significantly different between the example and the comparative example.The quartz glass crucible of the comparative example had a high specific resistance. becomes very difficult.

酸素濃度も溶損量の影響が出ており、低酸素濃度化のた
めにも溶損量を抑えることが好ましい。
The oxygen concentration is also affected by the amount of erosion loss, and it is preferable to suppress the amount of erosion loss in order to lower the oxygen concentration.

Claims (1)

【特許請求の範囲】[Claims] 1 酸化硼素1 ppm以下、OH基3 0 0 pp
m以下及び酸化アルミニウム、酸化鉄、酸化チタン、ア
ルカリ金属酸化物の合量が1 0 0 ppm以下より
なり、1450℃において109ポイズ以上の粘性を有
することを特徴とするシリコン単結晶引上用石英ガラス
ルツボ。
1 Boron oxide 1 ppm or less, OH group 300 ppm
Quartz for pulling silicon single crystals, characterized in that the total amount of aluminum oxide, iron oxide, titanium oxide, and alkali metal oxide is 100 ppm or less, and has a viscosity of 109 poise or more at 1450°C. glass crucible.
JP2867377A 1977-03-17 1977-03-17 Quartz glass crucible for pulling silicon single crystals Expired JPS5849519B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2867377A JPS5849519B2 (en) 1977-03-17 1977-03-17 Quartz glass crucible for pulling silicon single crystals

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2867377A JPS5849519B2 (en) 1977-03-17 1977-03-17 Quartz glass crucible for pulling silicon single crystals

Publications (2)

Publication Number Publication Date
JPS53113817A JPS53113817A (en) 1978-10-04
JPS5849519B2 true JPS5849519B2 (en) 1983-11-04

Family

ID=12255010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2867377A Expired JPS5849519B2 (en) 1977-03-17 1977-03-17 Quartz glass crucible for pulling silicon single crystals

Country Status (1)

Country Link
JP (1) JPS5849519B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6042244A (en) * 1983-08-12 1985-03-06 Toshiba Ceramics Co Ltd Quartz glass having resistance to melting loss
JPH068181B2 (en) * 1987-03-26 1994-02-02 信越石英株式会社 Quartz glass products for the semiconductor industry
JP2933404B2 (en) * 1990-06-25 1999-08-16 信越石英 株式会社 Quartz glass crucible for pulling silicon single crystal and its manufacturing method
JPH0826742A (en) * 1994-07-11 1996-01-30 Mitsubishi Chem Corp Synthetic quartz glass powder
JP2811290B2 (en) * 1995-04-04 1998-10-15 信越石英株式会社 Quartz glass crucible for pulling silicon single crystal

Also Published As

Publication number Publication date
JPS53113817A (en) 1978-10-04

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