JPS5848562Y2 - Micrometer accuracy inspection device - Google Patents

Description

[Detailed Description of the Invention] This invention relates to an accuracy testing device for checking the accuracy of a micrometer.

It is desirable that a micrometer be used at the work site where it is used, either by performing a work inspection to confirm its accuracy or by further correcting its accuracy.

Conventionally, there was no simple accuracy inspection equipment for carrying out work inspections, so measurements were carried out using commercially available block gauges and surface plates, or using test bars, but these methods were This method is suitable for sugar content tests carried out by specialized inspectors at workplaces, and the handling of the measuring tools is complicated when used as a measurement method at work sites.

The former method, that is, measuring using a block gauge, requires a lot of effort and time, as it requires close operation of multiple block gauges of various nominal dimensions in order to obtain measurement reference dimensions. The disadvantage is that handling and accuracy control, such as adding oil, is troublesome, and when measuring using a test bar, there is a risk that the measurement may become unstable because there is no support mechanism for the test bar. In particular, when measuring parallelism, the spindle of the micrometer, the axis of the anvil, and the axis of the test bar must be shifted from each other to make measurements at several locations, which is difficult to operate. It was unsuitable for the required work inspection.

SUMMARY OF THE INVENTION In view of the above drawbacks, it is an object of the present invention to provide an accuracy inspection device suitable for work inspections that is easy and quick to handle during measurement and easy to manage.

According to the present invention, the above object is to provide a test bar holding plate for horizontally holding a plurality of test bars arranged in a row, and a support bolt located at one end of the test bar and adjustable in the vertical direction. The micrometer is composed of a support plate arranged in a pedestal shape, and a base on which the test bar holding plate and the support plate are installed upright on a surface, and the micrometer is placed on the head of the support bolt by adjusting the support bolt. This is achieved by having a structure in which the anvil-side frame end of the test bar is moved up and down to align the axis of the test bar with the axis of the micrometer.

Embodiments of the present invention will be described below based on the drawings.

Fig. 1 is a plan view of an accuracy inspection device according to an embodiment of the present invention, Fig. 2 is a front view of the same, Fig. 3 is a side view of the same, and Fig. 4 is a plan view of an accuracy inspection device as an embodiment of the present invention.
The figure is a perspective view showing a measurement state of a micrometer using the same device.

The general structure of the accuracy testing device according to the present invention is that multiple test bars that serve as measurement standards are arranged in a row, and a support mechanism is provided at one end of the test bars (usually the left side is convenient) to support the micrometer. This is a device that stabilizes one end of the frame by supporting it with a support mechanism, and measures micrometers with a test bar.

To explain with a diagram, 1 is a base, and a test bar holding plate 2 stands upright approximately in the center of the base, and the test bar holding plate 2 is penetrated in a right angle direction to test the nominal dimensions required for measurement. Bar A,,A2. A3. A4. A plurality of A5's are attached and arranged in a pedestal shape as shown in the figure (in the example in the figure, '' is arranged at an inclination of 45°).

The reason for arranging the micrometers in a pedestal shape is to reduce the planar area of the device and to make the operating position of the micrometer convenient during measurement, as is clear from the perspective view of FIG.

Therefore, test bar A1. A2. A3. A4. It is desirable that A5 be arranged from top to bottom in order of nominal size from smallest to largest.

Test bar A1. A2, A3, A4゜A
5 are each fixed to the test bar holding plate by tightening the fixing screws 3.

This test bar Al. A2. A3. A4. A support bolt 4 for supporting one end of the micrometer frame is provided at the left end of each A5.

The support bolts 4 are screwed vertically into each crotch of the support plate 5 of the test bar holding plate 2, which is provided upright on the base 1 and has a shape that matches the podium. Head height is adjustable.

To test the accuracy of the length dimension of the micrometer 6 using a device with such a structure, first place the anvil 6a of the micrometer 6 on the left end surface of the test bar (A2 in FIG. 4) of the nominal size to be measured. In order to raise or lower the position of the micrometer 6 so as to align the axes while touching the end faces of the micrometer 6, the frame end 6b of the anvil side of the micrometer 6 is placed on the head of the support bolt 4, and the support bolt 4 is rotated to adjust the position.

Next, while supporting the frame 6C of the micrometer 6 with your hand, align the axis of the right end surface of the test bar A2 with the axis of the spindle 6d of the micrometer 6, and surround the ratchet stop 6e of the micrometer until both end surfaces come into contact. 1.
The scale 6f of the micrometer 6 is read after 5 to 2 rotations.

(Micrometer reading) (Nominal dimension of test bar) Confirmed as an error in two length dimensions.

Next, when performing a parallelism test, the center part ■ and the four corners ■■■■ at both ends of the anvil 6a and spindle 6d of the micrometer 6 shown in FIG.
The value of the length dimension measurement performed above may be used as the location.

For front and rear measurements, use spindle 6d of micrometer 6.
After loosening the tightening and positioning the entire micrometer 6 by horizontally shifting it forward or backward, measure by operating the ratchet 1 stop 6e.

Measurement of upper and lower part ■■ is done using spindle 6d of micrometer 6.
After loosening the tightening, perform vertical positioning by rotating the support bolt 4, and then measure by operating the ratchet stop 6e.

The difference between the maximum value and the minimum value among the five points of ■■■■■ determined by this measurement is taken as the parallelism error.

The precision inspection apparatus having the structure shown in FIGS. 1 to 4 described above is an example of a micrometer having an outer dimension of 0 to 100 mm.

Normally, when inspecting the accuracy of a microphone meter, it is customary to measure three points of its nominal measurement dimension: the maximum flame, the minimum length, and the intermediate length.

Since the number of test bars for measuring outside dimensions of 125 to 3QQ mm is large, the installation structure of the test I bars is divided into two sets as shown in FIGS. 6 to 8.

The gist of the structure is exactly the same as in the case of FIGS. 1 to 4 described above, and the test bar holding plate 2A is provided approximately in front of the center on the screen of the base IA, and the test bar A6. A7. A
, are arranged and fixed with setscrews 3, respectively.

A support plate 5A having support bolts 4 is provided on the left side.

Behind these, two sets of test bar holding plates 2B are provided on the surface of the base 1A, and test bars A9, A1o, A are arranged in a pedestal shape astride these two sets of test bar holding plates 2B.
tt, A 12 and A 13 are arranged and fixed with setscrews 3, respectively.

A support plate 5B having support bolts 4 is provided on the left side.

A device with this structure is also measured using the same handling as in FIG.

Although the position of the frame 6C of the micrometer 6 in FIG. 4 is an example of a horizontal measurement position, this measurement position may be a vertical position or an oblique position, and the frame end of the micrometer 6 on the anvil side If the portion 6b is supported above the support bolt 4, stable measurements can be made no matter where the frame 6C is located.

As is clear from the structure described above, the test bars of the required nominal dimensions are arranged and fixed in a pedestal shape for easy measurement, which eliminates instability during measurement and makes handling easy. Moreover, since it can be carried out quickly and its management is easy, it is possible to provide an accuracy inspection device that is most suitable for use in work inspections.

[Brief explanation of drawings]

Fig. 1 is a plan view of an accuracy inspection device according to an embodiment of the present invention, Fig. 2 is a front view of the same, Fig. 3 is a side view of the same, and Fig. 4 is a plan view of an accuracy inspection device as an embodiment of the present invention.
FIG. 5 is a perspective view showing the measuring state of the micrometer using the same device as above; FIG. 5 is a view showing the locations where the parallelism of the micrometer is measured; FIG. 6 is a plan view of an accuracy inspection device according to another embodiment of the present invention; FIG. 7 is a front view of the same as above, and FIG. 8 is a side view of same as above. 1, I A: Base, 2, 2A, 2B: Test bar holding plate, 4: Support bolt, 5, 5A, 5B: Support plate, 6: Micrometer, 6b: Anvil side frame end, A1-
A13: Test bar

Claims (1)

[Scope of utility model registration request] A test bar holding plate that arranges a plurality of test bars in a pedestal shape and holds them horizontally; and a support plate in which support bolts that are located at one end of the test bars and are adjustable in the vertical direction are arranged in a pedestal shape. and a base on which the test bar holding plate and the support plate are installed upright on a surface, and the anvil-side frame end of the micrometer mounted on the support bolt head can be raised or lowered by adjusting the support bolt. A precision testing device for a micrometer, characterized in that the axial center of the test bar is aligned with the axial center of the micrometer.