JPS5834283U - Spark source mass spectrometer - Google Patents
Spark source mass spectrometerInfo
- Publication number
- JPS5834283U JPS5834283U JP12664981U JP12664981U JPS5834283U JP S5834283 U JPS5834283 U JP S5834283U JP 12664981 U JP12664981 U JP 12664981U JP 12664981 U JP12664981 U JP 12664981U JP S5834283 U JPS5834283 U JP S5834283U
- Authority
- JP
- Japan
- Prior art keywords
- mass spectrometer
- sample
- spark source
- source mass
- heater
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electron Tubes For Measurement (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は多数個の電極調整器を取付けたイオン化室の断
面図、第２図は本考案に用いた凹面鏡付き試料加熱器を
備えたイオン化室の断面図である。
１・・・試料、１′・・・試料、２・・・赤外線ヒータ
ー、３・・・凹面鏡、４・・・スライダック、５・・・
リード線、６・・・フランジ、７・・・支持棒。FIG. 1 is a sectional view of an ionization chamber equipped with multiple electrode adjusters, and FIG. 2 is a sectional view of an ionization chamber equipped with a sample heater with a concave mirror used in the present invention. 1... Sample, 1'... Sample, 2... Infrared heater, 3... Concave mirror, 4... Slide duck, 5...
Lead wire, 6...flange, 7...support rod.
Claims (1)
ることでイオンを生成し、得られるマススペクトルを測
定するスパーク・ソース質量分析装置において、前記試
料を真空内で加熱することができる試料加熱器を備えた
ことを特徴とするスパーク・ソース質量分析装置。 ２ 実用新案登録請求の範囲第１項において、前記試料
加熱器に凹面鏡を設けることで、測定前の試料だけを集
中的に加熱できることを特徴とするスパーク・ソース質
量分析装置。[Claims for Utility Model Registration] 1. In a spark source mass spectrometer that generates ions by attaching a sample to multiple electrodes and generating sparks between the samples and measuring the resulting mass spectrum, the sample is placed in a vacuum. A spark source mass spectrometer characterized in that it is equipped with a sample heater that can be heated with a sample heater. 2 Utility Model Registration The spark source mass spectrometer according to claim 1, characterized in that by providing a concave mirror in the sample heater, only the sample before measurement can be intensively heated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12664981U JPS5834283U (en) | 1981-08-28 | 1981-08-28 | Spark source mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12664981U JPS5834283U (en) | 1981-08-28 | 1981-08-28 | Spark source mass spectrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5834283U true JPS5834283U (en) | 1983-03-05 |
Family
ID=29920431
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12664981U Pending JPS5834283U (en) | 1981-08-28 | 1981-08-28 | Spark source mass spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5834283U (en) |
-
1981
- 1981-08-28 JP JP12664981U patent/JPS5834283U/en active Pending
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