JPS582800A - Current measuring circuit for target incidence beam - Google Patents
Current measuring circuit for target incidence beamInfo
- Publication number
- JPS582800A JPS582800A JP10280381A JP10280381A JPS582800A JP S582800 A JPS582800 A JP S582800A JP 10280381 A JP10280381 A JP 10280381A JP 10280381 A JP10280381 A JP 10280381A JP S582800 A JPS582800 A JP S582800A
- Authority
- JP
- Japan
- Prior art keywords
- target
- fixed angle
- incident beam
- current
- measuring circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Current Or Voltage (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
この発明に、粒子線加速器のタ−ゲット入射ビームの電
11に測定子ゐターゲット入射ビームの電流測定回路に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a circuit for measuring the current of a beam incident on a target of a particle beam accelerator using a measuring element.
従来の粒子加速器のターゲット部の構成11−第1齢に
示す。この第1図においてlσx*w#生するターグツ
?、grzこれt冷却する冷却パイプであり、この冷却
パイプ2に固定アングル8で固定されている。固定アン
グル8は筐体4に固定されている。筐体4σ電気的にグ
ランドレベルになっていゐ◎
次に、動作について説明する。加速装置KLり加速され
た電子ビームEに、誘導系に19ターゲツ)1に誘導さ
れ衝突する。これKL9X@Aを発1するターグツ)L
tC衝突された電子ビームに冷却パイプ2、固定アング
ル311−過り、電気的グランドレベルの筐体4に流れ
込む0このためターゲット入射ビームσ一定できなかっ
π0従米の粒子Il加速襞置σターゲット入射ビームを
測定子ゐにσターゲットsを解体し別のビーム4レクタ
をセットしなければならなかった0筐瓦。Configuration 11 of the target section of a conventional particle accelerator is shown in the first stage. In this Fig. 1, lσx*w# is the raw targtu? , grz This is a cooling pipe for cooling, and is fixed to this cooling pipe 2 with a fixed angle 8. The fixed angle 8 is fixed to the housing 4. The housing 4σ is electrically at ground level.◎ Next, the operation will be explained. The electron beam E accelerated by the accelerator KL is guided by the guidance system to 19 targets (1) and collides with it. This is a tag that emits KL9X@A) L
tC The collided electron beam flows into the cooling pipe 2, the fixed angle 311, and the electrical ground level housing 4. Therefore, the target incident beam σ cannot be constant. I had to dismantle the σ target s and set another beam 4 rectifier to the measuring element.
Xatたa電子線発生中に、ターゲット入射ビームの測
定ができないなどの欠点があった0この発明に1上配従
米の欠点を除去子4ためになされπ屯ので、ターゲット
部会体を電気的グランドレベルの筐体り、v絶縁体にて
浮7Qh丁ことKLり、ビーム調整の能率化と、X@、
オ九は電子線発生中ターゲット入射ビームをモニタ丁4
Cとに19、装置の動作状況の確認と御所を丁番ことり
できるターゲット入射ビームの電流測定回路を提供丁4
cとを目的と丁ゐ〇
以下、この発明のターゲット入射ビームの電流測定回路
の実總例につ―て他面に基づき説明丁番。This invention has been made to eliminate the drawbacks of the above-mentioned devices, such as not being able to measure the target incident beam during electron beam generation. Level casing, floating 7Qh ding (KL) with v insulator, efficiency of beam adjustment,
4 monitors the incident beam on the target while the electron beam is being generated.
C219, provides a current measurement circuit for the target incident beam that can check the operating status of the device and detect the Imperial Palace.
For the purpose of c., an actual example of the current measuring circuit of the target incident beam of the present invention will be explained below based on the other aspects.
il!!!図にその一実總例を示すターゲット部の断面
および測定回路を示すものであめ。この#12図におい
て、xisムと発生するターゲット11このターゲット
llj冷却する冷却パイプ2、冷却パイプ21を固定丁
ゐ固定アングル8、電気的にグランドレベルの筐体4σ
第11!iIと同様である。Il! ! ! The figure shows a cross section of the target part and a measurement circuit, an example of which is shown in the figure. In this figure #12, the target 11 that occurs with xism, the cooling pipe 2 that cools this target, the cooling pipe 21 fixed at a fixed angle 8, and the housing 4σ electrically at ground level.
11th! It is the same as iI.
筐体4と固定アングル8円IIcに絶縁体5が介在され
ており、この絶縁体5を介して絶縁ボルト6に19固定
アングル8が筐体4に固定されている。An insulator 5 is interposed between the casing 4 and the fixed angle 8 circle IIc, and the 19 fixed angle 8 is fixed to the casing 4 via the insulator 5 to an insulating bolt 6.
これにLす、電気的にグランドレベルにある筐体4v1
ら冷却パイプ2、固定アングル8が浮くことにな壱〇
測定用ケーブル7框固定アングル8に接続されており、
測定用ケー プル7の先端にモニタ用の終端抵抗8が接
続されている。筐た、固定アングル8と筐体40間に框
保護抵抗9が接続されている。In addition to this, the casing 4v1 is electrically at ground level.
The cooling pipe 2 and the fixed angle 8 are connected to the measuring cable 7 and the fixed angle 8,
A terminating resistor 8 for monitoring is connected to the tip of the measuring cable 7. A frame protection resistor 9 is connected between the fixed angle 8 and the casing 40.
゛ 次に、以上の工うに構成されたこの発明のターゲッ
ト入射ビームの電流測定回路の動作について説明する0
加速俟置に19加速された電子ビームEσ、誘導系に工
り、ターゲットlに誘導されこれに衝突する0これに1
9X@ムが発生子ゐ◎ターゲラ)1に衝突された電子ビ
ームEに導体である冷却パイプ2.固定アングルsv流
れる◎固定アングル8と筐体4とa絶縁体5に!−り絶
縁されてい、6ため、電子ビーム電流a欄定用ケーブル
7’rffれ、終端抵抗8を違ってグランドレベルの筐
体4に流れ込む。終端抵抗8e抵抗値框保護抵抗91り
〃−なり小さな値である。絶縁抵抗80両端の電圧を測
定子れば、X@A筐たσ電子−発生中のターゲットに入
射丁番電子ビームEの電流値が+1
わかゐ〇
以上の1うに、この発明のターゲット入射ビームの電流
側足回路に1れば、ターゲット部全体を電気的グランド
レベル1り浮かすことに19、ターゲラ[に入射するビ
ームを測定で、1に心。したがってビーム調整の能率化
sx1mまたは電子−発生中ターゲット入射ビームの電
流測定に161j置の動作確認、診断ができる効果を奏
するものである。゛ Next, the operation of the target incident beam current measurement circuit of the present invention configured as described above will be explained.
19 The accelerated electron beam Eσ is guided to the target l by the guidance system and collides with it.
9 Fixed angle sv flows ◎ Fixed angle 8, housing 4 and a insulator 5! Since the electron beam current (a) is insulated, the electron beam current (a) is insulated from the cable 7'rff and flows through the terminating resistor 8 into the housing 4 at ground level. The resistance value of the terminating resistor 8e is smaller than that of the frame protection resistor 91. If we measure the voltage across the insulation resistance 80, we can see that the current value of the incident electron beam E on the target during generation of σ electrons in the X@A box is +1. If the current side of the circuit is 1, it will raise the entire target part to the electrical ground level. Therefore, it is possible to perform operational confirmation and diagnosis at 161j positions for streamlining beam adjustment sx1m or for current measurement of a target incident beam during electron generation.
11!111α従米の粒子加速fFKおけるターゲット
部の断面図sjl!2図にこの発明の、ターゲット入射
ビームの電流測定回−の−実織例におけゐターゲット部
の断面図おLび測定・−一の接続園で6401”・ター
グ、ット、トド冷却、ビ(イブ、8・・・固定アングル
、4・・・筐体、5・・・絶縁体、6・・・絶縁ボルト
、7・・・測定用ケーブル、8・・・絶縁抵抗、ト・・
保護抵抗。
なお、図中同−符号框同−′!穴σ相当部分を水子0
・ −
代理人葛野信−
t 1 図
221閃11!111α Cross-sectional view of the target part at particle acceleration fFK sjl! Figure 2 shows a cross-sectional view of the target part and measurement in an actual example of the current measurement circuit of the target incident beam according to the present invention. 8... Fixed angle, 4... Housing, 5... Insulator, 6... Insulating bolt, 7... Measurement cable, 8... Insulation resistance,...
protection resistance. In addition, the same symbol in the figure is the same as the frame -'! Mizuko 0 for the part corresponding to hole σ
・ - Agent Makoto Kuzuno - t 1 Figure 221 flash
Claims (1)
を介して固定されて電気的なグランドレベルから浮いて
いる固定アングル、この固定アングルにWRり付けられ
た入射ビームの衝突に!−リXII筐たに電子St−発
生するターゲットを冷却する冷却パイプ、上記固定アン
グルに接続され上記入射ビーム電Rk導く測定用ケーブ
ル、この測定用ケーブルに流れる入射ビーム電流t−測
定丁、4手段を備えてなるターゲット入射ビームの電流
測定回路。A casing that is electrically at ground level, a fixed angle that is fixed to this casing via an insulator and floating above the electrical ground level, and an incident beam attached to this fixed angle with a WR collide! - A cooling pipe for cooling the generated target, a measurement cable connected to the fixed angle and guiding the incident beam current Rk, an incident beam current t flowing through this measurement cable, a measuring device, 4 means A current measurement circuit for the target incident beam.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10280381A JPS582800A (en) | 1981-06-30 | 1981-06-30 | Current measuring circuit for target incidence beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10280381A JPS582800A (en) | 1981-06-30 | 1981-06-30 | Current measuring circuit for target incidence beam |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS582800A true JPS582800A (en) | 1983-01-08 |
Family
ID=14337219
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10280381A Pending JPS582800A (en) | 1981-06-30 | 1981-06-30 | Current measuring circuit for target incidence beam |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS582800A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7654174B2 (en) | 2005-06-28 | 2010-02-02 | Honda Motor Co., Ltd. | Tappet clearance adjustment device |
-
1981
- 1981-06-30 JP JP10280381A patent/JPS582800A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7654174B2 (en) | 2005-06-28 | 2010-02-02 | Honda Motor Co., Ltd. | Tappet clearance adjustment device |
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