JPS582638A - ガス濃度検出方式 - Google Patents

ガス濃度検出方式

Info

Publication number
JPS582638A
JPS582638A JP10212281A JP10212281A JPS582638A JP S582638 A JPS582638 A JP S582638A JP 10212281 A JP10212281 A JP 10212281A JP 10212281 A JP10212281 A JP 10212281A JP S582638 A JPS582638 A JP S582638A
Authority
JP
Japan
Prior art keywords
gas
light
laser
wavelength
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10212281A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0247694B2 (enExample
Inventor
Shoji Doi
土肥 正二
Hiroyuki Ishizaki
石崎 洋之
Isao Tofuku
東福 勲
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10212281A priority Critical patent/JPS582638A/ja
Publication of JPS582638A publication Critical patent/JPS582638A/ja
Publication of JPH0247694B2 publication Critical patent/JPH0247694B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP10212281A 1981-06-29 1981-06-29 ガス濃度検出方式 Granted JPS582638A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10212281A JPS582638A (ja) 1981-06-29 1981-06-29 ガス濃度検出方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10212281A JPS582638A (ja) 1981-06-29 1981-06-29 ガス濃度検出方式

Publications (2)

Publication Number Publication Date
JPS582638A true JPS582638A (ja) 1983-01-08
JPH0247694B2 JPH0247694B2 (enExample) 1990-10-22

Family

ID=14318984

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10212281A Granted JPS582638A (ja) 1981-06-29 1981-06-29 ガス濃度検出方式

Country Status (1)

Country Link
JP (1) JPS582638A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7602485B2 (en) 2006-12-28 2009-10-13 Hokuyo Automatic Co., Ltd. Optical window contamination detecting device for optical apparatus
WO2009128138A1 (ja) * 2008-04-15 2009-10-22 株式会社島津製作所 校正用ガスセルを搭載したガス分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5614138A (en) * 1979-07-13 1981-02-10 Fujitsu Ltd Infrared-ray spectroscopic analyzer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5614138A (en) * 1979-07-13 1981-02-10 Fujitsu Ltd Infrared-ray spectroscopic analyzer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7602485B2 (en) 2006-12-28 2009-10-13 Hokuyo Automatic Co., Ltd. Optical window contamination detecting device for optical apparatus
WO2009128138A1 (ja) * 2008-04-15 2009-10-22 株式会社島津製作所 校正用ガスセルを搭載したガス分析装置

Also Published As

Publication number Publication date
JPH0247694B2 (enExample) 1990-10-22

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JPS582638A (ja) ガス濃度検出方式