JPS5825232B2 - Overvoltage detection circuit - Google Patents

Overvoltage detection circuit

Info

Publication number
JPS5825232B2
JPS5825232B2 JP52041352A JP4135277A JPS5825232B2 JP S5825232 B2 JPS5825232 B2 JP S5825232B2 JP 52041352 A JP52041352 A JP 52041352A JP 4135277 A JP4135277 A JP 4135277A JP S5825232 B2 JPS5825232 B2 JP S5825232B2
Authority
JP
Japan
Prior art keywords
voltage
detection circuit
overvoltage
resistor
light emitting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52041352A
Other languages
Japanese (ja)
Other versions
JPS53126969A (en
Inventor
古関庄一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP52041352A priority Critical patent/JPS5825232B2/en
Publication of JPS53126969A publication Critical patent/JPS53126969A/en
Publication of JPS5825232B2 publication Critical patent/JPS5825232B2/en
Expired legal-status Critical Current

Links

Description

【発明の詳細な説明】 本発明は、過電圧検出回路に係り、特に半導体整流素子
(サイリスタ)を保護するのに好適な過電圧検出回路に
関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an overvoltage detection circuit, and particularly to an overvoltage detection circuit suitable for protecting semiconductor rectifying elements (thyristors).

近年、発達の急な半導体整流装置においては、半導体の
過電圧耐量が低いことから、種々の原因で生じる異常電
圧から半導体整流素子をいかに保護するかが重要な課題
になっている。
In semiconductor rectifiers, which have been rapidly developing in recent years, how to protect semiconductor rectifier elements from abnormal voltages caused by various causes has become an important issue because the overvoltage resistance of semiconductors is low.

この保護手段の1つに半導体整流素子の過電圧を検出し
て適当な保護(例えば過電圧が印加されたサイリスタを
点弧する)を施すものがある。
One of these protection means is to detect an overvoltage of a semiconductor rectifying element and apply appropriate protection (for example, firing a thyristor to which an overvoltage is applied).

上記のように、半導体整流素子の保護を過電圧の検出で
行なう場合、過電圧検出は迅速にかつ電気的に絶縁され
ることが望ましい。
As described above, when protecting the semiconductor rectifying element by detecting overvoltage, it is desirable that the overvoltage be detected quickly and electrically isolated.

第1図は、従来の過電圧検出回路を示すものである。FIG. 1 shows a conventional overvoltage detection circuit.

端子1゜2は過電圧検出端を示し、両端子1,2間に過
電圧の被検出体3が接続される。
Terminals 1 and 2 indicate overvoltage detection terminals, and an overvoltage detection object 3 is connected between both terminals 1 and 2.

被検出体3としては、例えば半導体整流装置の主サイリ
スタがあげられる。
An example of the object to be detected 3 is a main thyristor of a semiconductor rectifier.

端子1,2間に接続される抵抗体4と逆並列接続の発光
ダイオード10,11との直列接続体で過電圧を光量と
して検出する。
Overvoltage is detected as a light amount by a series connection body of a resistor 4 connected between terminals 1 and 2 and light emitting diodes 10 and 11 connected in antiparallel.

即ち、端子1.2間に加わる電圧が増加すると共に電圧
の極性によって発光ダイオード10,11のいずれか一
方の発する光量が増加する。
That is, as the voltage applied between the terminals 1 and 2 increases, the amount of light emitted by one of the light emitting diodes 10 and 11 increases depending on the polarity of the voltage.

この光量はライトガイド40を通して光検出回路50で
とらえ、レベル検出回路51により光量に対応した信号
(例えば電圧)が予め設定したレベル以上になると過電
圧検出信号を得る。
This amount of light is detected by a light detection circuit 50 through the light guide 40, and an overvoltage detection signal is obtained by a level detection circuit 51 when a signal (for example, voltage) corresponding to the amount of light exceeds a preset level.

この検出信号は例えばサイリスタのゲートアンプを起動
してサイリスタを点弧する保護制御信号にされる。
This detection signal is converted into a protection control signal that activates the gate amplifier of the thyristor to fire the thyristor, for example.

しかし、上記従来のものは、抵抗体4が線形特性である
ことおよび端子1,2間の電圧の大部分が抵抗体4にか
かることから、第2図に示すように、検出回路の電圧電
流特性もほぼ線形でかつ電流変化(光量変化)が少なく
、高精度の検出が難しいという問題があった。
However, in the above conventional method, since the resistor 4 has a linear characteristic and most of the voltage between terminals 1 and 2 is applied to the resistor 4, the voltage and current of the detection circuit is reduced as shown in FIG. The characteristics are also almost linear, and there are few changes in current (changes in light amount), making it difficult to detect with high precision.

特に、発光ダイオード10.110発光量や、光検出回
路50の検出感度に温度依存性があるため、過電圧検出
設定が温度に影響されるし、ノイズによる誤動作を起し
易すがった。
In particular, since the amount of light emitted by the light emitting diode 10,110 and the detection sensitivity of the photodetector circuit 50 are temperature dependent, overvoltage detection settings are affected by temperature and are prone to malfunction due to noise.

改良された従来回路は、抵抗体4に非線形抵抗素子を用
い、第3図に示す電圧電流特性とすることにより、検出
感度を向上するものもあるが、検出レベルV。
Some improved conventional circuits improve detection sensitivity by using a nonlinear resistance element as the resistor 4 and having the voltage-current characteristics shown in FIG.

の付近だけみれば、やはり線形特性のためノイズに弱く
、精度を上げられなかった。
If we look only at the vicinity of , it is susceptible to noise due to its linear characteristics, and we were unable to improve accuracy.

本発明の目的は、高精度の過電圧検出回路を提供するに
ある。
An object of the present invention is to provide a highly accurate overvoltage detection circuit.

本発明の過電圧検出回路は、抵抗体4または発光ダイオ
ード10,11等の発光半導体素子の少くとも一方を負
性抵抗特性を持つものにしたものである。
In the overvoltage detection circuit of the present invention, at least one of the resistor 4 or the light emitting semiconductor elements such as the light emitting diodes 10 and 11 has negative resistance characteristics.

以下、本発明の実施例を詳細に説明する。Examples of the present invention will be described in detail below.

第4図は、本発明の一実施例を示し、第1図と同じもの
あるいは同じ機能を有するものは同一符号で示す。
FIG. 4 shows an embodiment of the present invention, and the same parts or parts having the same functions as those in FIG. 1 are designated by the same reference numerals.

第4図において、抵抗体4は以下の素子から構成される
In FIG. 4, the resistor 4 is composed of the following elements.

即ち、第5図の破線Aで示す電圧電流特性をもつ非線形
抵抗素子20と、この非線形抵抗素子20に直列接続さ
れ第5図の点線Bで示すように電圧v2 でナチュラル
ブレークオーバする逆並列接続のサイリスタ2L22と
、過電圧検出設定値V。
That is, a nonlinear resistance element 20 having voltage-current characteristics shown by the broken line A in FIG. 5, and an antiparallel connection that is connected in series to this nonlinear resistance element 20 and has a natural breakover at voltage v2 as shown by the dotted line B in FIG. thyristor 2L22 and overvoltage detection setting value V.

において非線形抵抗素子20とサイリスタ21,22と
の分圧がvl:V2となる値の分圧用抵抗5とからなる
It consists of a voltage dividing resistor 5 having a value such that the voltage dividing between the nonlinear resistance element 20 and the thyristors 21 and 22 becomes vl:V2.

このような構成により、抵抗体4は第5図に実線Cで示
す電圧電流特性をもつことができる。
With such a configuration, the resistor 4 can have the voltage-current characteristics shown by the solid line C in FIG.

即ち、抵抗体4に加えられた電圧がV。That is, the voltage applied to the resistor 4 is V.

を超えると、サイリスタ21.22の電圧もV2 を超
え、電圧極性によってそのいずれか一方がナチュラルブ
レークオーバし、負性抵抗領域を介して電流が11から
■。
When it exceeds V2, the voltage of the thyristors 21 and 22 also exceeds V2, and depending on the voltage polarity, one of them undergoes a natural breakover, and the current flows from 11 to 2 through the negative resistance region.

に急増するという負性抵抗特性を持つ。It has a negative resistance characteristic of rapidly increasing.

なお過電圧検出レベルの設定は両回路素子20,21,
22の特性と分圧抵抗5の抵抗値により設定する。
Note that the overvoltage detection level is set by both circuit elements 20, 21,
22 and the resistance value of the voltage dividing resistor 5.

次に、発光ダイオード10.11には直列に抵抗6が接
続され、この接続体と並列に逆直列接続された定電圧ダ
イオード23.24が設けられる。
Next, a resistor 6 is connected in series to the light emitting diode 10.11, and a constant voltage diode 23.24 connected in anti-series is provided in parallel with this connection body.

これら抵抗6、定電圧ダイオード23.24は、発光ダ
イオード10,11に流れる電流を制限し、発光ダイオ
ードio、i1を保護するためのものであり、検出電圧
が極端に高くならない装置に適用する場合は省略できる
ものである。
These resistors 6 and constant voltage diodes 23 and 24 are used to limit the current flowing through the light emitting diodes 10 and 11 and to protect the light emitting diodes io and i1, and when applied to a device where the detection voltage does not become extremely high. can be omitted.

また、これら素子10,11,6,23,24から成る
回路に分担される電圧は、抵抗体4に分担される電圧に
比較して十分外さく、過電圧検出回路全体の電圧電流特
性もほぼ第5図の実線Cで示す特性になる。
In addition, the voltage distributed to the circuit consisting of these elements 10, 11, 6, 23, and 24 is sufficiently small compared to the voltage distributed to the resistor 4, and the voltage-current characteristics of the entire overvoltage detection circuit are approximately the same. The characteristic is shown by the solid line C in Figure 5.

斯かる過電圧検出回路において、端子1,2間にV。In such an overvoltage detection circuit, V is applied between terminals 1 and 2.

以上の過電圧が印加され、過電圧により定電圧ダイオー
ド23.24に加わる電圧がその定電圧特性値範囲内に
ある場合にも過電圧の極性によって発光ダイオード10
.11のいずれか一方の電流が11からI。
Even if the overvoltage above is applied and the voltage applied to the constant voltage diode 23 or 24 is within the constant voltage characteristic value range, the polarity of the overvoltage causes the light emitting diode 10 to
.. The current of either one of 11 is from 11 to I.

に急増し、発光量も同様に急増する。The amount of light emitted increases rapidly as well.

従って、レベル検出回路51は電i11と■。Therefore, the level detection circuit 51 is connected to the voltage i11 and ■.

に対応する間のいずれかのレベル(■o と11 の
ほぼ中間が好ましい)に比較基準レベルを設定しておけ
ば、正規の電圧からの差が小さい過電圧に対しても確実
に過電圧を検出でき、ノイズや設定した検出レベルの変
動などに基づく検出誤差がなくなり、高精度の検出が可
能となる。
By setting the comparison reference level at a level corresponding to (preferably approximately midway between o and 11), overvoltage can be reliably detected even if the difference from the normal voltage is small. , detection errors due to noise, fluctuations in the set detection level, etc. are eliminated, and highly accurate detection is possible.

なお、上記実施例においては、高電圧部にある被検出体
3の過電圧を検出するものとしたので、ライトガイド4
0の如き絶縁性パイプで発光ダイオード10,11の光
を光検出回路50に導く場合を示したが、絶縁する電位
差が低い場合にはフォトカプラ等により直接に光を検出
しても良い。
In addition, in the above embodiment, since the overvoltage of the detected object 3 in the high voltage section is detected, the light guide 4
Although the case where the light from the light emitting diodes 10 and 11 is guided to the photodetection circuit 50 using an insulating pipe such as 0 is shown, if the insulating potential difference is low, the light may be directly detected using a photocoupler or the like.

また、本実施例では両極性の過電圧を検出できるように
したが、被検出体3の電圧極性が定まっている場合は対
にした発光ダイオード、定電圧ダイオードサイリスタの
一方を省略することができる。
Further, in this embodiment, overvoltages of both polarities can be detected, but if the voltage polarity of the detected object 3 is determined, one of the light emitting diode and the constant voltage diode thyristor can be omitted.

また、過電圧の最大値と非線形抵抗20とでほぼ決まる
最大過電流値が発光ダイオードの許容値を越えない場合
には抵抗6、定電圧ダイオード23.24を省略するこ
ともできる。
Furthermore, if the maximum overcurrent value approximately determined by the maximum overvoltage value and the nonlinear resistor 20 does not exceed the allowable value of the light emitting diode, the resistor 6 and the constant voltage diodes 23 and 24 may be omitted.

また、本実施例において、サイリスタ21゜220代り
に双方向性のナチュラルブレークオーバ特性を持つサイ
リスタ1個にすることもできる。
Further, in this embodiment, instead of the thyristors 21 and 220, a single thyristor having a bidirectional natural breakover characteristic may be used.

また、発光ダイオード10,11そのものにナチュラル
ブレークオーバ特性を持つ負性抵抗特性の発光半導体素
子を使用し、実施例に示す回路と同様の特性を持たせる
こともできる。
Furthermore, the light emitting diodes 10 and 11 themselves can be provided with the same characteristics as the circuit shown in the embodiment by using a light emitting semiconductor element having a negative resistance characteristic and a natural breakover characteristic.

この場合、第4図における抵抗体4は非線形抵抗素子で
良い。
In this case, the resistor 4 in FIG. 4 may be a nonlinear resistance element.

第6図は、本発明の他の実施例を示す。FIG. 6 shows another embodiment of the invention.

同図が第4図と異なる部分は、ナチュラルブレークオー
バ特性を持つサイリスタ21,22を逆導通性のサイリ
スタ25,26にし、それらを直列に接続し、両サイリ
スタ25.26には分圧抵抗1,8を夫々並列接続した
点にある。
The difference between this figure and FIG. 4 is that the thyristors 21 and 22 with natural breakover characteristics are replaced with reverse conductive thyristors 25 and 26, and they are connected in series, and both thyristors 25 and 26 have voltage dividing resistors 1 and 26. , 8 are connected in parallel.

このようにすることで、第4図の作用効果に加えて順、
通雨方向の過電圧検出レベルを夫々独立に分圧抵抗1,
8で設定でき、さらに2つのサイリスタ2L22のナチ
ュラルブレークオーバ電圧をそろえる必要がない特徴を
持つ。
By doing this, in addition to the effects shown in Figure 4,
The overvoltage detection level in the direction of rain flow is independently set by voltage dividing resistors 1 and 1, respectively.
8, and also has the feature that it is not necessary to align the natural breakover voltages of the two thyristors 2L22.

なお、第6図に示す実施例においても、第4図の場合と
同様に種々の変形回路を構成できる。
In addition, in the embodiment shown in FIG. 6, various modified circuits can be constructed as in the case of FIG. 4.

また、サイリスタ2L22は逆導通性を持たないサイリ
スタと逆並列にダイオードを設けたもので代替できる。
Furthermore, the thyristor 2L22 can be replaced by a thyristor that does not have reverse conductivity and a diode provided in antiparallel.

以上説明したように、本発明による過電圧検出回路は、
負性抵抗特性を持つ要素を過電圧検出回路に採用したこ
とにより、検出レベルの精度が高い利点を有する。
As explained above, the overvoltage detection circuit according to the present invention
By employing elements with negative resistance characteristics in the overvoltage detection circuit, the detection level has the advantage of high accuracy.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の過電圧検出回路を示す構成図、第2図は
第1図における電圧電流特性を示す図、第3図は第1図
における改良された電圧電流特性を示す図、第4図は本
発明の一実施例を示す構成図、第5図は第4図における
電圧電流特性を説明するための図、第6図は本発明の他
の実施例を示す構成図である。 計・・被検出体、4・・・抵抗体、5,7,8・・・分
圧抵抗、10,11・・・発光ダイオード、20・・・
非線形抵抗素子、21,22・・・サイリスタ、25,
26・・・逆導通形サイリスタ、40・・・ライトガイ
ド、50・・・光検出回路、51・・・レベル検出回路
Figure 1 is a block diagram showing a conventional overvoltage detection circuit, Figure 2 is a diagram showing voltage-current characteristics in Figure 1, Figure 3 is a diagram showing improved voltage-current characteristics in Figure 1, and Figure 4 is a diagram showing improved voltage-current characteristics in Figure 1. 5 is a block diagram showing one embodiment of the present invention, FIG. 5 is a diagram for explaining the voltage-current characteristics in FIG. 4, and FIG. 6 is a block diagram showing another embodiment of the present invention. Meter: object to be detected, 4: resistor, 5, 7, 8: voltage dividing resistor, 10, 11: light emitting diode, 20...
Nonlinear resistance element, 21, 22...thyristor, 25,
26... Reverse conducting thyristor, 40... Light guide, 50... Light detection circuit, 51... Level detection circuit.

Claims (1)

【特許請求の範囲】[Claims] 1 抵抗体と発光半導体素子との直列接続体に印加され
る過電圧を上記発光半導体素子の発光量で検出する過電
圧検出回路において、上記抵抗体は非線形抵抗素子を含
み、かつ上記抵抗体または発光半導体素子の少なくとも
一方を負性抵抗特性をもつものにしたことを特徴とする
過電圧検出回路。
1. In an overvoltage detection circuit that detects an overvoltage applied to a series connection of a resistor and a light emitting semiconductor element based on the amount of light emitted by the light emitting semiconductor element, the resistor includes a nonlinear resistance element, and the resistor or the light emitting semiconductor An overvoltage detection circuit characterized in that at least one of the elements has negative resistance characteristics.
JP52041352A 1977-04-13 1977-04-13 Overvoltage detection circuit Expired JPS5825232B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52041352A JPS5825232B2 (en) 1977-04-13 1977-04-13 Overvoltage detection circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52041352A JPS5825232B2 (en) 1977-04-13 1977-04-13 Overvoltage detection circuit

Publications (2)

Publication Number Publication Date
JPS53126969A JPS53126969A (en) 1978-11-06
JPS5825232B2 true JPS5825232B2 (en) 1983-05-26

Family

ID=12606107

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52041352A Expired JPS5825232B2 (en) 1977-04-13 1977-04-13 Overvoltage detection circuit

Country Status (1)

Country Link
JP (1) JPS5825232B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6183969A (en) * 1984-09-29 1986-04-28 Toshiba Corp Apparatus for detecting voltage

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS515476B2 (en) * 1972-01-07 1976-02-20

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5515100Y2 (en) * 1974-06-28 1980-04-07

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS515476B2 (en) * 1972-01-07 1976-02-20

Also Published As

Publication number Publication date
JPS53126969A (en) 1978-11-06

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