JPS5824111A - Light beam deflection scanner - Google Patents
Light beam deflection scannerInfo
- Publication number
- JPS5824111A JPS5824111A JP12330581A JP12330581A JPS5824111A JP S5824111 A JPS5824111 A JP S5824111A JP 12330581 A JP12330581 A JP 12330581A JP 12330581 A JP12330581 A JP 12330581A JP S5824111 A JPS5824111 A JP S5824111A
- Authority
- JP
- Japan
- Prior art keywords
- light
- opening
- photosensitive material
- light beam
- parallel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
- G02B26/106—Scanning systems having diffraction gratings as scanning elements, e.g. holographic scanners
Abstract
Description
【発明の詳細な説明】
この発明は、走査用光ビームのエツジ部をシャープかつ
その強度分布を比較的平坦とした光ビー五偏向・走査装
置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical beam deflection/scanning device in which the edge portion of a scanning light beam is sharp and its intensity distribution is relatively flat.
従来の光ビーム偏向・走査装置は、たとえば第1図に示
すようにレーザ発振器1からのレーザ光2をコリメータ
レンズ系3で平行光4とした後、偏向器5で偏向してか
ら集光レンズ系6で集光し、この先ビーム7で感光材料
8を走査しながら感光するようになっている。このよう
に従来の偏向・走査装置は光ビームとしてコヒーレント
なレーザビームを使用しているが、レーザビームはいわ
ゆるガウス型の強度分布を有している。このため、感光
材料8を感光する光ビーム70強度分布も第2図に示す
ようなガウス分布曲線となっており、走査ビームのエツ
ジの切れが悪くなると共に、露光量によって走査線幅が
変化するといった欠点がある。よって、この発明の目的
はかかる欠点のない光ビーム偏向・走査装置を提供する
ことKあり、走査用光ビームのエツジ部をシャープかつ
その強度分布を比較的平坦なものとしている。In a conventional optical beam deflection/scanning device, for example, as shown in FIG. 1, a laser beam 2 from a laser oscillator 1 is converted into parallel light 4 by a collimator lens system 3, then deflected by a deflector 5, and then sent to a condenser lens. The system 6 focuses the light, and the beam 7 scans the photosensitive material 8 and exposes it. As described above, conventional deflection/scanning devices use a coherent laser beam as a light beam, but the laser beam has a so-called Gaussian intensity distribution. For this reason, the intensity distribution of the light beam 70 that exposes the photosensitive material 8 also has a Gaussian distribution curve as shown in FIG. 2, and the edge of the scanning beam becomes less sharp and the width of the scanning line changes depending on the amount of exposure. There are drawbacks such as: Therefore, an object of the present invention is to provide a light beam deflection/scanning device free from such drawbacks, in which the edge portion of the scanning light beam is sharp and its intensity distribution is relatively flat.
以下にこの発明を説明する。This invention will be explained below.
この発明では先ずホーグラフィック・フィルタをコヒー
レント光、たとえばレーザを用いて作成するが、その作
成の様子を第3図及び第4図に示して説明する。すなわ
ち、レーザ発振器lOから発振されたレーず光11をコ
リメータレンズ系化で平行光13とし、この平行光13
の光路中に円形の開口4を有する開口鐘光板加を配設す
る。この場合、開口遮光板加は平行光13を遮断するに
十分な大きさであり、開口4は平行光13の径に比して
十分に小さくなっている。これにより開口21から回折
光14か生ぜられるので、この回折光14をレンズ系(
7−リエ変換系)15で平行光16として感光材料17
に照射する。なお、レンズ系15の焦点距離はfである
。一方、開口21に関する振幅情報と位相情報を感光材
料17に記録するために、角度−で入射する平行光(レ
ーザ光)18を参照光として同時に感光材料17に照射
する。このように、開口21に関する振幅情報と位相情
報とを与える平行光と参照用平行光18とを同時に感光
材料17に照射することによって干渉縞を形成し、開口
21に対応するホログラフィック・フィルタ園を作成す
ることができる。In the present invention, first, a holographic filter is created using coherent light, such as a laser, and the manner of its creation will be explained with reference to FIGS. 3 and 4. That is, the laser beam 11 oscillated from the laser oscillator IO is converted into parallel light 13 by collimating the lens system, and this parallel light 13
An aperture light plate having a circular aperture 4 is disposed in the optical path of the light beam. In this case, the aperture shielding plate is large enough to block the parallel light 13, and the aperture 4 is sufficiently small compared to the diameter of the parallel light 13. As a result, diffracted light 14 is generated from the aperture 21, and this diffracted light 14 is transmitted through the lens system (
7-Lie transform system) 15 as parallel light 16 to light-sensitive material 17
irradiate. Note that the focal length of the lens system 15 is f. On the other hand, in order to record amplitude information and phase information regarding the aperture 21 on the photosensitive material 17, the photosensitive material 17 is simultaneously irradiated with parallel light (laser light) 18 incident at an angle of - as reference light. In this way, interference fringes are formed by simultaneously irradiating the photosensitive material 17 with parallel light giving amplitude information and phase information regarding the aperture 21 and the reference parallel light 18, and a holographic filter field corresponding to the aperture 21 is formed. can be created.
次に、上述の如くして作成されたホログラフィック・フ
ィルタ加を第5図に示すような光ビーム偏向・走査装置
に配設する。すなわち、ホログラフィック・フィルタ(
資)に、これを作成する時に参照光18を照射した角度
0と同一の入射角W#で、平行光31を照射する。この
場合、平行光31は上述と同11に、レーザ発振器部及
びコリメータレンズ系おで形成される。こうしてホログ
ラフィック・フィルタIに平行光31が入射角度θで照
射されると、ホログラフィック・フィルタIから1次回
折光あが得られるので、この回折党別を偏向器あで偏向
してから集光レンズ系(逆フーリエ変換系)藁で集光し
て走査用光ビームrを形成し、この光ビームnで感光材
料間を感光する。ここにおいて、ホログラフィック・フ
ィルタ加には開口21に関する振幅情報と位相情報とが
記録されているので、その1次回折光あを集光して形成
された光ビーム37には開口21が再生され、光ビーム
γの断面形状は開口4に対応する円形になると共に、そ
の強度分布は第6図に示す如く平坦化される。つまり、
、エツジ部分の強度をシャープにすること
ができ、これkより前述したような走査線幅が変化する
といった欠点が除去されるのである。Next, the holographic filter produced as described above is placed in a light beam deflection/scanning device as shown in FIG. That is, the holographic filter (
2), parallel light 31 is irradiated at the same incident angle W# as the angle 0 at which reference light 18 was irradiated when creating this. In this case, the parallel light 31 is formed by the laser oscillator section and the collimator lens system 11 as described above. In this way, when the parallel light 31 is irradiated onto the holographic filter I at an incident angle θ, first-order diffracted light is obtained from the holographic filter I, so this diffracted light is deflected by a deflector and then condensed. A lens system (inverse Fourier transform system) condenses light to form a scanning light beam r, and this light beam n sensitizes between photosensitive materials. Here, since the amplitude information and phase information regarding the aperture 21 are recorded in the holographic filter, the aperture 21 is reproduced in the light beam 37 formed by condensing the first-order diffracted light. The cross-sectional shape of the light beam γ becomes circular corresponding to the aperture 4, and its intensity distribution is flattened as shown in FIG. In other words,
, the intensity of the edge portion can be sharpened, and the above-mentioned drawback of changing the scanning line width can be eliminated.
なお、上述の実施例では開口の形状を円形として説明し
たが、方形、三角形等の任意の形状にすることができ、
この場合、光ビームの断面形状もこれに対応した形状と
なる。また、光ビームは感光材料を感光するだけでなく
、光学系で読取って別途利用するようにすることも可能
であり、さらに、ホログラフィック・フィルタはコンピ
ュータを用いて作成することも可能である。In addition, although the shape of the opening was explained as circular in the above-mentioned embodiment, it can be any shape such as a square or a triangle.
In this case, the cross-sectional shape of the light beam also has a shape corresponding to this. Further, the light beam not only sensitizes the photosensitive material, but can also be read by an optical system and used separately. Furthermore, a holographic filter can also be created using a computer.
以上のように、この発明の光ビーム偏向・走査装置によ
れば、走査用犬ビームのエツジ部をシャープにすると共
にその強度分布を平坦化しているので、走査線のバラツ
キや変動の影響を小さくすることができる。また、ホロ
グラフィック・フィルタを作成する開口の形状に対応す
る断面形状です査用光ビームを形成することができるの
で、その応用分野は広い。As described above, according to the optical beam deflection/scanning device of the present invention, the edge portion of the scanning dog beam is sharpened and its intensity distribution is flattened, so that the influence of variations and fluctuations in the scanning line is reduced. can do. In addition, since the scanning light beam can be formed with a cross-sectional shape corresponding to the shape of the aperture used to create the holographic filter, its application fields are wide.
第1図は従来の光ビームによる偏向・走査装置の概略を
示す構成図、第2図はその光ビームの強度分布を示す図
、第3図はこの発明に用いるホログラフィック・フィル
タの作成方法を示す図、第4図はホログラフィック・フ
ィルタの作成に用いる開口遮光板の一例を示す平面図、
縞5図はこの発明の光ビーム偏向・走査装置の概略構成
例を示す図、第6図はこの発明の光ビームの強度分布を
示す図である。
1.10.32・・・レーザ発振器、3,12.33・
・・コリメータレンズ系、5.35・・・偏向器、6.
あ・・・集光レンズ系、8,17.38・・・感光材料
、加・・・開口遮光板、21・・・開口、加・・・ホロ
グラフィック・フィルタ、a・・・光ビーム。Fig. 1 is a schematic configuration diagram of a conventional deflection/scanning device using a light beam, Fig. 2 is a diagram showing the intensity distribution of the light beam, and Fig. 3 is a diagram showing a method for creating a holographic filter used in the present invention. FIG. 4 is a plan view showing an example of an aperture light shielding plate used for creating a holographic filter,
FIG. 5 is a diagram showing a schematic configuration example of the light beam deflection/scanning device of the present invention, and FIG. 6 is a diagram showing the intensity distribution of the light beam of the present invention. 1.10.32...Laser oscillator, 3,12.33.
... Collimator lens system, 5.35 ... Deflector, 6.
A...Condensing lens system, 8,17.38...Photosensitive material, Addition...Aperture light shielding plate, 21...Aperture, Addition...Holographic filter, a...Light beam.
Claims (1)
ク・フィルタを所定角度で照射し、前記ホーグラフィッ
ク・フィルタからの1次回折光を偏向器で偏向して後に
集光レンズ系で集光することにより、エツジ部がシャー
プかつ強度分布が比較的平坦な光ビームで走査面上を走
査し得るようkしたことを特徴とする光ビーム偏向・走
査装置。A holographic filter having a minute aperture is irradiated with parallel coherent light at a predetermined angle, and the first-order diffracted light from the holographic filter is deflected by a deflector and then condensed by a condensing lens system, thereby forming an edge part. 1. A light beam deflection/scanning device characterized in that a light beam can be scanned over a scanning surface with a light beam having a sharp intensity distribution and a relatively flat intensity distribution.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12330581A JPS5824111A (en) | 1981-08-06 | 1981-08-06 | Light beam deflection scanner |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12330581A JPS5824111A (en) | 1981-08-06 | 1981-08-06 | Light beam deflection scanner |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5824111A true JPS5824111A (en) | 1983-02-14 |
Family
ID=14857244
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12330581A Pending JPS5824111A (en) | 1981-08-06 | 1981-08-06 | Light beam deflection scanner |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5824111A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60108802A (en) * | 1983-11-18 | 1985-06-14 | Fuji Photo Film Co Ltd | Method and device for optical beam synthesis |
JPS6151561U (en) * | 1984-09-10 | 1986-04-07 | ||
JP2013171288A (en) * | 2012-02-21 | 2013-09-02 | Samsung Electro-Mechanics Co Ltd | Laser scan device and laser scan method |
CN104634793A (en) * | 2015-02-04 | 2015-05-20 | 南京理工大学 | Coaxial digital holographic microscopy imaging device and method for detecting glass subsurface defect |
-
1981
- 1981-08-06 JP JP12330581A patent/JPS5824111A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60108802A (en) * | 1983-11-18 | 1985-06-14 | Fuji Photo Film Co Ltd | Method and device for optical beam synthesis |
JPS6151561U (en) * | 1984-09-10 | 1986-04-07 | ||
JPS647396Y2 (en) * | 1984-09-10 | 1989-02-28 | ||
JP2013171288A (en) * | 2012-02-21 | 2013-09-02 | Samsung Electro-Mechanics Co Ltd | Laser scan device and laser scan method |
CN104634793A (en) * | 2015-02-04 | 2015-05-20 | 南京理工大学 | Coaxial digital holographic microscopy imaging device and method for detecting glass subsurface defect |
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