JPS58204716A - 自動点検装置 - Google Patents
自動点検装置Info
- Publication number
- JPS58204716A JPS58204716A JP57086225A JP8622582A JPS58204716A JP S58204716 A JPS58204716 A JP S58204716A JP 57086225 A JP57086225 A JP 57086225A JP 8622582 A JP8622582 A JP 8622582A JP S58204716 A JPS58204716 A JP S58204716A
- Authority
- JP
- Japan
- Prior art keywords
- point
- inspection
- relay
- operating
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 68
- 230000001681 protective effect Effects 0.000 claims description 13
- 230000007547 defect Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 9
- 230000005856 abnormality Effects 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000008439 repair process Effects 0.000 description 2
- OWNRRUFOJXFKCU-UHFFFAOYSA-N Bromadiolone Chemical compound C=1C=C(C=2C=CC(Br)=CC=2)C=CC=1C(O)CC(C=1C(OC2=CC=CC=C2C=1O)=O)C1=CC=CC=C1 OWNRRUFOJXFKCU-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000012806 monitoring device Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Emergency Protection Circuit Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57086225A JPS58204716A (ja) | 1982-05-21 | 1982-05-21 | 自動点検装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57086225A JPS58204716A (ja) | 1982-05-21 | 1982-05-21 | 自動点検装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58204716A true JPS58204716A (ja) | 1983-11-29 |
| JPH0256007B2 JPH0256007B2 (enrdf_load_stackoverflow) | 1990-11-29 |
Family
ID=13880843
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57086225A Granted JPS58204716A (ja) | 1982-05-21 | 1982-05-21 | 自動点検装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58204716A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04302155A (ja) * | 1991-03-29 | 1992-10-26 | Nec Corp | 半導体集積回路のスクリーニング方法 |
-
1982
- 1982-05-21 JP JP57086225A patent/JPS58204716A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04302155A (ja) * | 1991-03-29 | 1992-10-26 | Nec Corp | 半導体集積回路のスクリーニング方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0256007B2 (enrdf_load_stackoverflow) | 1990-11-29 |
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