JPS58177180A - Liquid applicator - Google Patents

Liquid applicator

Info

Publication number
JPS58177180A
JPS58177180A JP5995182A JP5995182A JPS58177180A JP S58177180 A JPS58177180 A JP S58177180A JP 5995182 A JP5995182 A JP 5995182A JP 5995182 A JP5995182 A JP 5995182A JP S58177180 A JPS58177180 A JP S58177180A
Authority
JP
Japan
Prior art keywords
coated
solution
wafer
workpiece
coating film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5995182A
Other languages
Japanese (ja)
Inventor
Teruhisa Kamimura
上村 輝久
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP5995182A priority Critical patent/JPS58177180A/en
Publication of JPS58177180A publication Critical patent/JPS58177180A/en
Pending legal-status Critical Current

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  • Coating Apparatus (AREA)

Abstract

PURPOSE:To obtain coating film having uniform thickness, while blowing off liquid drops flying out of a workpiece to be coated, in a rotary liquid applicator, by sending air to each periphery of the edges of the rotating workpiece to be coated from the down side toward the upper side. CONSTITUTION:In the liquid applicator for forming the coating film of a solution by dripping the solution onto a workpiece to be coated fixed onto a mounting stand 1 and concurrently rotating the workpiece to be coated, the ascending stream of air sent through an air-ejecting opening provided at a lower part is formed around the periphery of the mounting stand 1. Hence liquid drops flying out of the workpiece to be coated are blown off upwards, so that a coating film having uniform thickness can be formed on the workpiece to be coated without the mixing of the liquid drops in the coating film.

Description

【発明の詳細な説明】 本発明は回転塗布方式により溶液を基板面上へ均一な厚
さで塗布する溶液塗布装置の構造に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to the structure of a solution coating device that coats a solution onto a substrate surface with a uniform thickness using a spin coating method.

回転塗布方式とは、半導体ウェハー等の被塗布体の略々
中央部面上に塗布すべき溶液を滴下し、被塗布体を回転
させることにより遠心力で液滴を被塗布体表面に均一な
厚さに伸展させながら塗布する方式であり、従来より丸
形ウェハー等に表面処理溶液を塗布する装置として用い
られている。
The spin coating method is to drop a solution to be coated onto approximately the center surface of an object to be coated, such as a semiconductor wafer, and by rotating the object, the droplets are spread uniformly over the surface of the object by centrifugal force. This is a method in which the solution is applied while being spread to a certain thickness, and has been conventionally used as an apparatus for applying a surface treatment solution to round wafers and the like.

この方式を用いた溶液塗布装置は丸形の被塗布体上に均
一な厚さの溶液被膜を形成する手段として非常に有用な
ものであり、半導体ウェハー面上に太陽電池素子を構成
するだめの拡散源を含有する拡散溶液を塗布する場合あ
るいはガラス基板面に化学薬液を塗布する場合等に利用
される。
A solution coating device using this method is extremely useful as a means of forming a solution film of uniform thickness on a round object to be coated. It is used when applying a diffusion solution containing a diffusion source or when applying a chemical solution to a glass substrate surface.

しかしながら、半円形のウェハーあるいは長方形のガラ
ス基板等の如き角形の被塗布体に対しては、従来の回転
式溶液塗布装置では角隅部に塗布される溶液層が厚く形
成され、均一な厚さの塗布膜を得ることができない。こ
の理由は、被塗布体の回転中に被塗布体辺部より跳出し
た液滴が回転してきた被塗布体の角隅部に再度付着し、
この部分の溶液供給を過剰にして塗イIJ膜を厚くする
ことにある。即ち、第1図(4)(B)に示す動作説明
図に於いて、被塗布体Bはその中央部を回転中心として
高速回転され、面上に滴下された溶液はその遠心力で被
塗布体Bの周辺へ向かって伸展される。周辺部へ到達し
た溶液は更に遠心力で被塗布体Bの外方へ液滴となって
飛翔される。例えば図中のL点に位置する溶液は遠心力
と慣性力及び表面張力等が合成された方向へ所定の運動
量をもっだ液滴として飛翔するが、次の瞬間に被塗布体
Bの角隅部Aが回転してこの液滴と接触し、飛翔した液
滴は再度角隅部Aで被塗布体Bの溶液に混成される。
However, for rectangular objects to be coated, such as semicircular wafers or rectangular glass substrates, with conventional rotary solution coating devices, the solution layer applied to the corners is thick and cannot be coated with a uniform thickness. coating film cannot be obtained. The reason for this is that while the object is being rotated, droplets that have jumped out from the sides of the object are reattached to the corners of the object that has been rotating.
The purpose is to thicken the IJ film by supplying too much solution to this area. That is, in the operation explanatory diagram shown in FIG. 1 (4) (B), the object to be coated B is rotated at high speed around its center, and the solution dropped onto the surface is rotated by the centrifugal force. It is extended toward the periphery of body B. The solution that has reached the peripheral area is further flung as droplets to the outside of the object to be coated B by centrifugal force. For example, the solution located at point L in the figure flies as a droplet with a predetermined momentum in the direction in which centrifugal force, inertial force, surface tension, etc. Part A rotates and comes into contact with this droplet, and the flying droplet is mixed with the solution of object B at corner part A again.

従って、角隅部Aは塗布溶液が他の部位に比較して供給
過剰となり、また液滴となった溶液は水分の散出により
成分が変化して比重が増大する傾向にあるため、角隅部
Aの溶液の粘性が高くなり、結果的に角隅部Aの塗布膜
は厚く形成されることになる。
Therefore, the coating solution is supplied to the corner A in excess compared to other parts, and the components of the solution that has become droplets tend to change due to the dispersion of water and the specific gravity tends to increase. The viscosity of the solution in part A increases, and as a result, the coating film in corner part A becomes thicker.

塗布膜の厚さが不均一になると、例えば太陽電池素子等
に用いられるSi ウェハーへの拡散溶液(塗イIJ膜
)からのドーパント拡散皿及び拡散4さが各部位で相違
することとなり、素子特性の悪化、生産の歩留り低下を
招くといった問題点が発生する。従って、従来の回転式
溶液塗布装置は一般的に丸形の被塗布体に対して均一な
塗布膜を得る手段として使用されていた。
If the thickness of the coating film becomes non-uniform, the dopant diffusion plate and diffusion 4 from the diffusion solution (coated IJ film) to the Si wafer used in, for example, solar cell devices will be different at each location, and the device Problems arise such as deterioration of characteristics and reduction in production yield. Therefore, the conventional rotary solution coating apparatus has generally been used as a means for obtaining a uniform coating film on a round object to be coated.

本発明は上述の問題点に鑑み、技術的手段を、駆使する
ことにより角形の被塗布体に対しても均一な溶液塗布膜
を得ることのできる新規有用な溶液塗布装置を提供する
ことを目的とするものである。
In view of the above-mentioned problems, an object of the present invention is to provide a new and useful solution coating device that can obtain a uniform solution coating film even on a rectangular object by making full use of technical means. That is.

以下、本発明を実施例に従って図面を参照しながら詳説
する○ 第2図は本発明の1実施例である溶液塗布装置の動作原
理を説明する説明図である。
Hereinafter, the present invention will be explained in detail according to embodiments with reference to the drawings. Fig. 2 is an explanatory diagram illustrating the operating principle of a solution coating device that is an embodiment of the present invention.

被塗布体として半導体ウェハーを用いる場合について説
明すると、ウェハー載置台1が駆動源に連結されて回転
する駆動軸2に接続され、またウェハー載置台1の上面
にはウェハーを真空チャックするだめの溝3が形設され
ている。ウェハー載置台1の周囲には下方の空気吹出口
より送風されてくる上昇気流4が形成されている。
To explain the case where a semiconductor wafer is used as the object to be coated, a wafer mounting table 1 is connected to a drive shaft 2 that is connected to a drive source and rotates, and a groove is provided on the upper surface of the wafer mounting table 1 for vacuum chucking the wafer. 3 is formed. An ascending air current 4 is formed around the wafer mounting table 1, which is blown from an air outlet below.

ウェハー載置台1にこれより大きい形状の角形ウェハー
を載置し、、真空ポンプ等で溝3の部分を吸引すると角
形ウェハーはウニへ−載置台1の上面に真空チャックさ
れる。また角形ウェハーの全ての縁部は上昇気流4によ
り送風を受けた状態下に置かれる。駆動軸2を介してウ
ェハー載置台I及び角形ウェハーを回転させるとともに
角形ウェハーへの拡散源を含有する拡散溶液を略々回転
中心部の角形ウェハー上面へ滴下すると、この拡散溶液
は遠心力に附勢されて角形ウェハー上面を各縁部方向へ
向かって伸展され、略々全面に拡散溶液の塗布膜が形成
される。また角形ウェハーの縁部より跳出した液滴は上
昇気流4の作用で上方へ飛ばされるため、回転移動する
角形ウェハーの角隅部と接触することはなく、角形ウェ
ハー上面の塗布膜は回転速度に制御された略々全面にわ
たって均一な厚さに設定される。
A rectangular wafer having a larger shape than this is placed on the wafer mounting table 1, and when the groove 3 portion is sucked with a vacuum pump or the like, the rectangular wafer is vacuum chucked to the top surface of the mounting table 1. Also, all edges of the square wafer are placed under a state where they are blown by the rising air current 4. When the wafer mounting table I and the rectangular wafer are rotated via the drive shaft 2 and a diffusion solution containing a diffusion source for the rectangular wafer is dropped onto the upper surface of the rectangular wafer approximately at the center of rotation, this diffusion solution is subjected to centrifugal force. The wafer is forced to spread over the top surface of the rectangular wafer toward each edge, and a coating film of the diffusion solution is formed on substantially the entire surface. In addition, since the droplets that jump out from the edge of the square wafer are blown upward by the action of the rising air current 4, they do not come into contact with the corners of the rotating square wafer, and the coating film on the top surface of the square wafer changes with the rotation speed. The thickness is controlled to be uniform over almost the entire surface.

第3図は本発明の1実施例を示す溶液塗布装置の構成図
である。
FIG. 3 is a configuration diagram of a solution coating apparatus showing one embodiment of the present invention.

ウェハー載置台1は駆動軸2を介して駆動源に接続され
、回転駆動される。ウェハー載置台1の上面に形成され
た真空チャック用溝3は駆動軸2内部の真空通路5を介
して真空ポンプ(図示せず)に接続されている。ウェハ
ー載置台1の下方にはガス吹出用ノズル6が回転周囲方
向に一列まだは複数列周設されておシ、空気または不活
性ガス等が上方へ送風される。外枠7の一部8を開成し
てウェハー載置台1上面に例えば太陽電池素子を作製す
るだめの半導体ウェハー9を載置し、真空ポンプを駆動
することにより溝3の吸引力でウェハー9はウェハー載
置台1上面に真空チャックされる。このウェハー9は半
円形あるいは四角形等の角形ウェハーで良く、その各辺
がウェハー載置台】の外方へ突出するように固定配置す
る。ウェハ。
The wafer mounting table 1 is connected to a drive source via a drive shaft 2 and is rotationally driven. A vacuum chuck groove 3 formed on the upper surface of the wafer mounting table 1 is connected to a vacuum pump (not shown) via a vacuum passage 5 inside the drive shaft 2. Below the wafer mounting table 1, one or more rows of gas blowing nozzles 6 are provided around the periphery of the rotation, and air, inert gas, or the like is blown upward. A part 8 of the outer frame 7 is opened, and a semiconductor wafer 9 on which, for example, a solar cell element is to be fabricated is placed on the upper surface of the wafer mounting table 1, and the wafer 9 is moved by the suction force of the groove 3 by driving a vacuum pump. The wafer is vacuum chucked onto the upper surface of the wafer mounting table 1. The wafer 9 may be a rectangular wafer such as a semicircle or a square, and is fixedly arranged so that each side of the wafer projects outward from the wafer mounting table. wafer.

−9の上方にはウェハー9に対する拡散源を含有する拡
散溶液を滴下するだめの溶液供給管1oが垂設されてい
る。
A solution supply pipe 1o for dropping a diffusion solution containing a diffusion source to the wafer 9 is vertically provided above the wafer 9. -9.

駆動軸2を回転させてウェハー載置台1とともにウェハ
ー9を回転させながらコック11を開成して供給管10
よりウニへ−9上面に拡散溶液12を滴下し、またノズ
ル6より空気を送出してウェハー9の周囲に上昇気流を
形成する。ウェハ−9上面の拡散溶液12はウェハ−9
上面に伸展されて均一な拡散用塗布膜となる。またウェ
ハー9の縁部より側方へ飛翔される拡散溶液12の液滴
はノズル6から吹出されてきた上昇気流に附勢されて斜
上方へ放散される。ノズル6から吹出されるガスを不活
性ガスあるいは反応系ガスとし、外枠7を密閉構造とす
れば塗布膜形成時に必要な気相雰囲気を同時に形成する
ことができる。
While rotating the drive shaft 2 to rotate the wafer 9 together with the wafer mounting table 1, the cock 11 is opened and the supply pipe 10 is opened.
The diffusion solution 12 is dropped onto the upper surface of the wafer 9, and air is sent out from the nozzle 6 to form an upward air current around the wafer 9. The diffusion solution 12 on the upper surface of the wafer-9 is
It is spread over the top surface to form a uniform diffusion coating. Further, the droplets of the diffusion solution 12 that fly laterally from the edge of the wafer 9 are energized by the upward airflow blown out from the nozzle 6 and are scattered diagonally upward. If the gas blown out from the nozzle 6 is an inert gas or a reactive gas, and the outer frame 7 is of a sealed structure, a gas phase atmosphere necessary for forming the coating film can be created at the same time.

尚、上記実施例は被塗布体として半導体ウェハーを用い
て拡散溶液を塗布する場合について説明したが、本発明
はこれに限定されるものではなく、ウェハーへ反射防止
膜を形成する手段、レジストを塗布する手段その他ガラ
ス基板、プリント基板、金属板、樹脂部材等への溶液塗
布手段として用いることができる。また上昇気流はウェ
ハー載置台の下方に設ける以外に、被塗布体より面積の
大きな載置台を用い、被塗布体を載置台上面に固定する
とともに載置台上面に被塗布体の縁部に沿ってガス吹出
用溝穴を形設する構成としても同様の目的を達成するこ
とができる。
Although the above embodiment describes the case where a diffusion solution is applied using a semiconductor wafer as an object to be coated, the present invention is not limited to this, and the present invention is not limited to this, and the present invention is not limited to this, and the present invention is not limited to this. It can be used as a means for applying a solution to glass substrates, printed circuit boards, metal plates, resin members, etc. In addition to providing the rising air flow below the wafer mounting table, a mounting table with a larger area than the object to be coated is used, and the object to be coated is fixed to the upper surface of the mounting table, and the upper surface of the mounting table is placed along the edge of the object to be coated. The same purpose can also be achieved by forming a gas blowing slot.

以上詳説した如く本発明によれば、被塗布体より跳出す
る液滴が被塗布体周囲の上昇気流で吹き飛ばされて上方
へ逃散されるため、被塗布体が角形であっても縁より跳
出されだ液滴が角隅部と接触して塗布膜へ混入されるこ
とがなく、被塗布体上面へ均一な厚さの塗布膜を得るこ
とができる。
As explained in detail above, according to the present invention, the droplets that jump out from the object to be coated are blown away by the rising air current around the object and escape upward, so that even if the object to be coated is square, the droplets will not jump out from the edges. This prevents droplets from coming into contact with the corners and being mixed into the coating film, making it possible to obtain a coating film with a uniform thickness on the upper surface of the object to be coated.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の溶液塗布装置の動作説明図であるO 第2図は本発明の1実施例である溶液塗布装置の動作原
理を説明する説明図である。 第3図は本発明の1実施例を示す溶液塗布装置の構成図
である。 1・−・ウェハー載置台、2・・・駆動軸、3・・・溝
、4・・・上昇気流、5・・・真空通路、6・・・ノズ
ル、7・・・外枠、9・・・ウェハー、10・・・供給
管、12・・・拡散溶液。 代理人 弁理士 福 士 愛 彦(他2名)(−−ソ 
  篤21 第3 図
FIG. 1 is an explanatory diagram of the operation of a conventional solution coating apparatus. FIG. 2 is an explanatory diagram illustrating the operating principle of a solution coating apparatus that is an embodiment of the present invention. FIG. 3 is a configuration diagram of a solution coating apparatus showing one embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Wafer mounting table, 2... Drive shaft, 3... Groove, 4... Updraft, 5... Vacuum passage, 6... Nozzle, 7... Outer frame, 9... ... Wafer, 10... Supply tube, 12... Diffusion solution. Agent Patent attorney Aihiko Fukushi (and 2 others) (--
Atsushi 21 Figure 3

Claims (1)

【特許請求の範囲】[Claims] 1、載置台上に固定された被塗布体上に溶液を滴下する
とともに前記被塗布体の回転動作を介して前記溶液の塗
布膜を前記被塗布体の上面に形成する溶液塗布装置に於
いて、回転動作中の前記被塗布体の各線周囲に下方から
上方へ送風される上昇気流を形成する気流吹出手段を共
役したことを特徴とする溶液塗布装置。
1. In a solution coating device that drops a solution onto an object to be coated fixed on a mounting table and forms a coating film of the solution on the upper surface of the object through rotation of the object to be coated. 2. A solution coating device, characterized in that it is coupled with an airflow blowing means for forming an upward airflow that is blown from below to above around each line of the object to be coated during rotational operation.
JP5995182A 1982-04-09 1982-04-09 Liquid applicator Pending JPS58177180A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5995182A JPS58177180A (en) 1982-04-09 1982-04-09 Liquid applicator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5995182A JPS58177180A (en) 1982-04-09 1982-04-09 Liquid applicator

Publications (1)

Publication Number Publication Date
JPS58177180A true JPS58177180A (en) 1983-10-17

Family

ID=13127956

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5995182A Pending JPS58177180A (en) 1982-04-09 1982-04-09 Liquid applicator

Country Status (1)

Country Link
JP (1) JPS58177180A (en)

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