JPS58174944A - Formation of pattern - Google Patents

Formation of pattern

Info

Publication number
JPS58174944A
JPS58174944A JP5671882A JP5671882A JPS58174944A JP S58174944 A JPS58174944 A JP S58174944A JP 5671882 A JP5671882 A JP 5671882A JP 5671882 A JP5671882 A JP 5671882A JP S58174944 A JPS58174944 A JP S58174944A
Authority
JP
Japan
Prior art keywords
film
exposed
water soluble
cross
water
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5671882A
Other languages
Japanese (ja)
Inventor
Kunihiro Isori
五十里 邦弘
Norio Koike
小池 教雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP5671882A priority Critical patent/JPS58174944A/en
Publication of JPS58174944A publication Critical patent/JPS58174944A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/008Azides
    • G03F7/0085Azides characterised by the non-macromolecular additives

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)

Abstract

PURPOSE:To form a easily positive type resist pattern with superior resolving power by forming a water soluble photoresist film contg. a water soluble bisazido compound on a substrate, exposing the film by a specified system, and developing it. CONSTITUTION:A water soluble photoresist film of a water soluble polymer such as polyvinylpyrrolidone blended with about 1-50wt% water soluble bisazide compound such as 4,4'-diazidostilbene-2,2'-disulfonic acid as a photo-cross-linking agent is formed on a substrate. The photoresist film is imagewise exposed under conditions which decompose the photo-cross-linking agent in the exposed part without producing the cross-linking action, e.g. at <=120 deg.C high temp. in the presence of oxygen, the film is uniformly exposed under conditions which cross- link the film on the imagewise unexposed part, e.g. in a gaseous nitrogen atmosphere, and the exposed film is developed to selectively remove only the film of the imagewise exposed part.

Description

【発明の詳細な説明】 〔発明の属する技術分針〕 本発明は水溶性のフォトレジストを用いたパターン形成
性■二係り、詳しくは曹露光部分のレジスト族を溶解除
去し、非像露光部分Cニレジスト膜を残存させるパター
ン形成法葛二係る0 〔発明の技術的背景とその問題点〕 従来、フォトレジスト製版用、フォトエツチング用ある
いはカラーブラウン管の螢光面形成用などに広く使用さ
れており、これらの目的g:使用するに操り、一般偽二
次のような性能をもつことが心安とされている。
DETAILED DESCRIPTION OF THE INVENTION [Technology to which the invention pertains] The present invention relates to pattern formation using a water-soluble photoresist. [Technical background of the invention and its problems] Hitherto, it has been widely used for photoresist plate making, photoetching, and for forming fluorescent surfaces of color cathode ray tubes. These objectives g: It is said that it is safe to use and has performance similar to general pseudo-quadratic.

1、解像力がすぐれていること、 2、保存性のよいこと、 3、 使用されるフォトレジストおよび現像液などは公
害の心配のないこと、 4、光C二対する感度が高いこと、 従来、これらの目的に使用される水溶性フォトレジスト
として、ニカワ、ゼラチン、卵白、ポリビニルアルコー
ルなどの水浴性ポリマーに重クロム酸塩類を混合した重
クロム成環系フォトレジストが広く用いられていた。こ
れはこのフォトレジストが極めて安価なこと一光C二対
する感度が比較的商いためであった。しかしながら、重
クロム酸雀糸のフォトレジストは、保存性が極めて悪く
1. Excellent resolution; 2. Good storage stability; 3. The photoresist and developer used are free from pollution; 4. High sensitivity to light C2. As water-soluble photoresists used for this purpose, dichromium ring-forming photoresists, which are made by mixing dichromates with water-bathable polymers such as glue, gelatin, egg white, and polyvinyl alcohol, have been widely used. This is because this photoresist is extremely cheap and its sensitivity to one light C2 is relatively low. However, dichromate sparrow photoresists have extremely poor storage stability.

感光液の形で一週間、乾燥した感光層の形では、10〜
20分間が限度であった0史Cニクロム化合−を光架橋
剤とするため、lA光液、IA像液の取り扱いは公害面
、安全衛生面から慎重を景しり。
One week in the form of a photosensitive solution, 10 to 10 days in the form of a dry photosensitive layer
Since the 0 history C nichrome compound, which was limited to 20 minutes, is used as a photocrosslinking agent, care must be taken when handling the IA light solution and IA image solution from the standpoint of pollution and health and safety.

これらの欠点を改善し次フオトルジストとして有機系の
光架橋剤を用い九一連のフォトレジストが開発されたQ
その一例として、光架橋剤として、水溶性のビスアジド
化合物を用い、架橋される水浴性高分子として、ポリビ
ニルピロリドン、ポリアクリルアミドなどを使用した水
浴性のフォトレジストが知られている。このフォトレジ
ストは。
To improve these shortcomings, a series of nine photoresists were developed using an organic photocrosslinking agent as a photoresist.
As an example, water-bath photoresists are known that use a water-soluble bisazide compound as a photo-crosslinking agent and polyvinylpyrrolidone, polyacrylamide, or the like as a water-bath polymer to be crosslinked. This photoresist.

上記の要求性能の2.3.4を満足するも、1の解像力
は満足できる−のでなかった。
Although the above-mentioned performance requirements 2.3.4 were satisfied, the resolution of 1 was not satisfactory.

ところで有機溶剤を使用した一連の7オトレジストが主
として、中導体tL8工などのll&tl加工部門で使
用されており%(二、キノンジアジド化合物を、ノボラ
ックuフェノールIt脂に配合したフォトレジストは、
解像力が極めて優れていることが知られている。上記フ
ォトレジストは像露光部分が溶剤に可溶となる所謂るポ
ジ型7オトレジストと呼はれるものでめる0上記フオト
レジスに眠らず、一般(二、ポジ型フォトレジストは解
L・性に浚れていることが知られている。ところで、ポ
ジ型フォトレジストの種類は極めて少く上記?−ノンジ
アジド系の7オトレジストの他には電子馴感応性フォト
レジストとして、ポリメチルメタアクレートなど叙撫C
二限られる。tP!11二水溶性二本トレジストとして
はポジ型のものは従来皆無であった0不発#4+:従っ
た水浴性とは感光液が基本的≦二本を上体とした浴液状
態であり、基板籠二塗布したのち、沫旙光部分が水を生
体とした現像液で溶解除去されることを意味している。
By the way, a series of 7 photoresists using organic solvents are mainly used in ll&tl processing departments such as medium conductor tL8 processing.
It is known for its extremely high resolution. The above photoresist is a so-called positive-type photoresist in which the exposed image area is soluble in a solvent. By the way, there are very few types of positive photoresists.In addition to the non-diazide type 7 photoresists mentioned above, there are other electron-sensitive photoresists such as polymethyl methacrylate.
limited to two. tP! 112 There have been no positive types of water-soluble two-layer photoresists. This means that after the coating is applied, the glaucoma area is dissolved and removed using a developer containing water as a living substance.

このことは像形成プロセスで基本的≦二人体直二南害な
有機溶媒を使用しなイ立場から極めて望ましいプロセス
であるカ、現惇工程で非像露光部分のフォトレジスト膜
も必然的C−除去されてしまう喪め、原理的C二このよ
うな像形成プロセスは不可能である0 〔発明の目的〕 本発明者らFi感光液が水解液状態であり、像露光部分
が水で除去できるノくターン形成方法を種々検討した結
果、不発#4に至った。
This is an extremely desirable process from the standpoint of not using organic solvents that are fundamentally harmful to the human body in the image forming process. Principle C2 Such an image forming process is impossible. [Objective of the Invention] The inventors have discovered that the Fi photosensitive solution is in an aqueous solution state, and that the image-exposed area can be removed with water. As a result of examining various ways to form a turn, we arrived at failure #4.

〔弁明の漿要〕[Summary of the defense]

本発明は基板上に光架橋剤として水溶性のビスアンド化
合物を含む水溶性の7オトレジスト膜を設け、像露光部
分の光架橋剤を架橋作用をさせることなく光分解したの
ち、全面露光して非像露光部分の光架橋剤を光分解、架
橋さts fA像して−m元部分のフォトレジスト族の
みを選択的に除去することを%徴とするパターン形成法
および像露光の際に少なくとも■基板を常温から120
℃未満の温度で加熱するか、または■酸素を存在させる
ことをt#依とするパターン形成法である。
In the present invention, a water-soluble 7-photoresist film containing a water-soluble bis-and compound as a photo-crosslinking agent is provided on a substrate, and after the photo-crosslinking agent in the image-exposed area is photodecomposed without cross-linking, the entire surface is exposed to light. A pattern forming method in which the photocrosslinking agent in the image-exposed area is photolyzed and cross-linked to selectively remove only the photoresist group in the -m element part, and at least Heat the board from room temperature to 120℃
This is a pattern forming method that relies on heating at a temperature below .degree. C. or on the presence of oxygen.

本発明な畦細l二胱明すると、本発明に、本来光架憤剤
としての作用を有る水溶性のビスアジド化合物が特殊な
条件の下で露光すると、水解性高分子を架橋させること
なく光分解して、しかも無光芒れたC二もか\わらず7
オトレジスト躾は露光前の水浴性の性質を維持している
ことを見いだしたこと≦二基づいている0従来からこの
埃象は、光架橋剤として、ビスアジド化合物を用いたフ
ォトレジス)−二関して、膜減税象として知られており
、現渾工程で本来付層されるべき像露光部分の7オトレ
ジストの膜厚が減少するものである。これを1−!I避
するため?lJえはIk!i素雰囲気で像寓光するな′
どの厄介な1札を必要とした。本発明はこの境象を逆C
二検健的4二利用したもので、フォトレジストを1永l
I!光する除に、本来光架橋剤として作用する水浴性ビ
スアジド化合物を、光架橋させることなく光分解させた
のち、次に全1tlII光して非1絞島光部分の水浴性
ビスアジド化合物を光分解、架橋させる。水で担保する
と光架橋しなかった像露光部分のフォトレジストのみが
選択的に除去され、ポジ型のレジストパターンが形成さ
れる。像盲光の際ζ−1元架橋剤を架橋させることなく
光分解させるi二は、■通常の光架橋が生じる以下の露
光照度を使用して褌露光する04ノ基板を120℃未満
の温度f二昇温して像露光する。■li!素の存在下で
像露光する手法などが適用できる。非像露光部分のフォ
トレジスト膜を架橋させるC:は、上記■〜■の逆の榮
件を使用する。一般的に#′i常温の空気中で強い無光
を与えるか、窒素ガス雰囲気で全fi1m党すればよい
To clarify, in the present invention, when a water-soluble bisazide compound, which originally acts as a photocrosslinking agent, is exposed to light under special conditions, the water-soluble polymer is exposed to light without crosslinking. C2, which has been disassembled and has a non-glossy color, is still 7
It was found that the photoresist maintains the bathing property before exposure. This phenomenon is known as a film reduction phenomenon, in which the film thickness of the 7 photoresist in the image-exposed area to which it should originally be deposited during the development process is reduced. This is 1-! To avoid it? lJeha Ik! Don't light up images in a simple atmosphere.
Which troublesome one bill did you need? The present invention solves this situation by
It uses photoresist for 14 hours.
I! The water-bathable bis-azide compound, which originally acts as a photo-crosslinking agent, is photolyzed without photo-crosslinking, and then the water-bathable bis-azide compound in the non-1-diaphragm portion is photolyzed with 1 tlII light. , crosslinking. When secured with water, only the image-exposed portions of the photoresist that have not been photo-crosslinked are selectively removed, forming a positive resist pattern. Photodecomposition of the ζ-1 element crosslinking agent without crosslinking during image-blinding light is as follows: 1. Exposure the 04 substrate to loincloth exposure using the following exposure illuminance at which normal photocrosslinking occurs at a temperature below 120°C. The temperature is raised to f2 and imagewise exposed. ■li! A method such as image exposure in the presence of an element can be applied. For C: crosslinking the photoresist film in non-image exposed areas, the reverse conditions of (1) to (2) above are used. In general, it is sufficient to provide a strong achromatic effect in air at room temperature, or to perform a complete irradiation in a nitrogen gas atmosphere.

上記■〜■の条件で露光した際架橋剤である水浴性のビ
スアジド化合物が架橋作用を示さない理由は明らかでな
いが、膜減り現像について、従来力・ら説明されている
以下の機構が■〜■の条件で史に助長されると推定され
る。即ち、元架橋剤であるビスアジド化合物Fi露光さ
れた時、光分解して反応活性の強い中間物質(ナイトレ
ン)に変化する。通常このナイトレンが2分子の高分子
と反応して架II膜が形成されるが、この他ナイトレン
はフォトレジスト膜中に存在するlIi!素分子とも反
応し、この場合は高分子との架橋反応が阻害される。即
ち、#R素分子が存在する場合には、架橋反応と挿架1
1反応が競争し、架橋反応は単位体積中に存在するナイ
トレン密度(露光照度1二依存)と敵累分圧に依存する
。■の条件である基板の温度を120℃未満の温度で加
熱状態区−維持することは。
It is not clear why the water-bathable bisazide compound, which is a crosslinking agent, does not exhibit crosslinking action when exposed under the conditions of ■ to ■ above, but the following mechanism, which has been previously explained by It is presumed that history will be encouraged under the conditions of ■. That is, when the bisazide compound Fi, which is the original crosslinking agent, is exposed to light, it photodecomposes and changes into an intermediate substance (nitrene) with strong reaction activity. Normally, this nitrene reacts with two polymer molecules to form a frame II film, but in addition, nitrene exists in the photoresist film. It also reacts with elementary molecules, and in this case, the crosslinking reaction with polymers is inhibited. That is, when #R elementary molecules exist, crosslinking reaction and insertion 1
One reaction competes with the other, and the crosslinking reaction depends on the nitrene density present in a unit volume (depending on the exposure illuminance) and the cumulative partial pressure. The condition (2) is to maintain the temperature of the substrate at a temperature below 120° C. in the heated state.

極めて有効である。加熱温度が120℃未満に限定さ!
しる理由は、120℃以上ではアジド化合物が熱分瑣し
やすいためでるる。
Extremely effective. Heating temperature is limited to less than 120℃!
The reason for this is that the azide compound is easily degraded by heat at temperatures above 120°C.

本発明に従って使用される水浴性のビスアジド1じ合物
としては4.4′−ジアジドスチルベン−2゜2′−シ
スルアオンaL4+4’−−)アシドベンザルアセトフ
ェノン−2−スルフオンR+4+4’−ジアジドスチル
ベン−α−カルボン酸、及びそれらの塩などが等けられ
る。また水浴性、−分子とし一〇は、ポリビニルピロリ
ドン、ホリビニルアルコ−−ルZとの合成^分子、ゼラ
チン、カゼイン、アフビアゴムなどの天然高分子、メチ
ルビニルエーテル−マレイン酸、アクリルアミドータ゛
イアセトンアクリルアミドカどの共貞合体、アクリルニ
トリルグラフト化ポリビニルアルコール、グリシジルメ
タクリレートグラ7ト化ポリビニルアルコールなどのグ
ラフト化高分子、及びカルボキシメチルセルローズ、ヒ
ドロキシメチルセルローズなどの半合成高分子などが挙
けられる。
The water-bathable bisazide compound used according to the invention is 4,4'-diazidostilbene-2'-2'-cisuraone aL4+4'--)acidobenzalacetophenone-2-sulfone R+4+4'-diazidostilbene. -α-carboxylic acids, salts thereof, and the like. In addition, water-bathable molecules are synthesized with polyvinylpyrrolidone, polyvinyl alcohol Z, natural polymers such as gelatin, casein, and gum afbia, methyl vinyl ether, maleic acid, acrylamide, acetone, and acrylamide. Examples include grafted polymers such as any conjugated polyvinyl alcohol, acrylonitrile grafted polyvinyl alcohol, glycidyl methacrylate grafted polyvinyl alcohol, and semi-synthetic polymers such as carboxymethyl cellulose and hydroxymethyl cellulose.

水浴性ビスアジド化合物の水浴性側分子(巳対する配合
割り合いは、1童比で1〜50%、好しくに5〜20チ
の範白である。
The mixing ratio of the water-bathable side molecules of the water-bathable bisazide compound is 1 to 50%, preferably 5 to 20%, based on the child's ratio.

〔発明の実施例〕 以下に具体的な実施例を述べる。[Embodiments of the invention] Specific examples will be described below.

実施例1 表面が平滑なガラス基板上に下記組成の感光液を回転塗
布法で塗布し、so”cで乾燥して乾lI!jll!犀
が5600Xからなるフォトレジスト膜を設けた。次い
でガラス基板の裏側がら加熱してフォトレジスト赤面の
温度を、80℃に保ちながら、#索雰囲気中原画を暑。
Example 1 A photosensitive solution having the following composition was coated on a glass substrate with a smooth surface by a spin coating method, dried with SO"C, and a photoresist film of 5600X was provided on the glass. While heating the back side of the substrate and keeping the temperature of the photoresist at 80℃, heat the original image in a hot atmosphere.

に縮小して投影露光法を使用して像膳光を行った。電光
条件t′i7オトレジスト(3)でC照度: 1.3 
mw/ad +露光時間:3分間であった。
It was reduced in size and image exposure was performed using the projection exposure method. C illuminance under lightning condition t'i7 otoresist (3): 1.3
mw/ad + exposure time: 3 minutes.

次いでフォトレジスト面上での温度をrial(22u
)普で冷却してから、全面露光を与えた。この時の電光
条件は照11 : 3 my/al 、露光時間:5秒
であった。露光後のガラス基板な%  40’Cの純水
中に1゜分間浸漬静置して現像し次。乾燥後C二、レジ
ストパターンを観察した結果、健露光部分のフォトレジ
ストが完全に除去されており、2μの鮮明なパターンが
得られた。得られたパターンの体質は。
Next, the temperature on the photoresist surface was set to real (22u
) After cooling at room temperature, the entire surface was exposed to light. The lighting conditions at this time were 11:3 my/al and exposure time: 5 seconds. After exposure, the glass substrate was immersed in pure water at 40'C for 1 minute and developed. After drying, C2, the resist pattern was observed, and it was found that the photoresist in the exposed areas was completely removed, and a clear pattern of 2μ was obtained. What is the nature of the pattern obtained?

従来から使用されているキノンジアジド型のポジ緘レジ
ストの像質C二比較遜色ないものでめった。
The image quality C2 was comparable to that of the quinone diazide type positive resist that has been used in the past.

ポリビニルピロリドン              4
.714.4’−ジアジドスチルベン−2,2′−ジス
ルフォン酸=ナトリウム塩             
    0.47fポリアミン系シラン化合物A−11
06(日本ユニ力(株)製。部品名)        
o、asr界面活性剤           0.07
5Fエチルアルコール               
 1.1f’純水              195
.5f実施?+j2 表面に輩属クロム膜を塗布したガラス基板な使jliす
る以外、実施?lJ 1と同様の手法で2μの鮮明なパ
ターンを得た。然る仮、ホットプレート上で用分局ベー
クし、硝酸第二セリウムアンモン溶液申に浸漬してフォ
トレジスト膜で嶺われてぃない部分のクロム展をエツチ
ング除去した。得られたパターンは極めて鮮明でめった
Polyvinylpyrrolidone 4
.. 714.4'-Diazidostilbene-2,2'-disulfonic acid = sodium salt
0.47f polyamine-based silane compound A-11
06 (manufactured by Nihon Uniriki Co., Ltd. Part name)
o, asr surfactant 0.07
5F ethyl alcohol
1.1f' pure water 195
.. 5f implementation? +j2 Other than using a glass substrate with a chromium film coated on the surface, is it implemented? A clear pattern of 2μ was obtained using the same method as lJ1. However, it was temporarily baked on a hot plate and immersed in a ceric ammonium nitrate solution to etch away the chromium layer in the areas not covered by the photoresist film. The pattern obtained was extremely clear and rare.

〔発明の効果〕〔Effect of the invention〕

Claims (2)

【特許請求の範囲】[Claims] (1)基板上に光架橋剤として水溶性のビスアジド化合
物を含む水溶性のフォトレジスト膜を設け、像露光して
、像露光部分の光架橋剤を架橋作用な妊せることなく光
分解したのち、全面露光して非像露光部分の光架橋剤を
光分解架橋させ、現像して像露光部分のフォトレジスト
膜のみを選択的に除去することを%像とするパターン形
成法。
(1) A water-soluble photoresist film containing a water-soluble bisazide compound as a photo-crosslinking agent is provided on a substrate, imagewise exposed, and the photo-crosslinking agent in the image-exposed area is photodecomposed without crosslinking. , a pattern forming method in which the entire surface is exposed to light to photodecompose and crosslink the photocrosslinking agent in the non-image exposed areas, and developed to selectively remove only the photoresist film in the image exposed areas.
(2)  *jl光の際1二、少なくとも■基板を、常
温から120℃未満の温度で加熱するか、または酸素を
存在させることを特徴とする特許請求の範囲第1項記載
のパターン形成法。
(2) The pattern forming method according to claim 1, characterized in that the substrate is heated at a temperature from room temperature to less than 120° C. or in the presence of oxygen. .
JP5671882A 1982-04-07 1982-04-07 Formation of pattern Pending JPS58174944A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5671882A JPS58174944A (en) 1982-04-07 1982-04-07 Formation of pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5671882A JPS58174944A (en) 1982-04-07 1982-04-07 Formation of pattern

Publications (1)

Publication Number Publication Date
JPS58174944A true JPS58174944A (en) 1983-10-14

Family

ID=13035260

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5671882A Pending JPS58174944A (en) 1982-04-07 1982-04-07 Formation of pattern

Country Status (1)

Country Link
JP (1) JPS58174944A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5955606A (en) * 1995-09-14 1999-09-21 Hyundai Electronics Industries Co., Ltd. N-vinyllactam derivatives and polymer thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5955606A (en) * 1995-09-14 1999-09-21 Hyundai Electronics Industries Co., Ltd. N-vinyllactam derivatives and polymer thereof

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