JPS5817304A - Method for measuring surface roughness - Google Patents
Method for measuring surface roughnessInfo
- Publication number
- JPS5817304A JPS5817304A JP11547681A JP11547681A JPS5817304A JP S5817304 A JPS5817304 A JP S5817304A JP 11547681 A JP11547681 A JP 11547681A JP 11547681 A JP11547681 A JP 11547681A JP S5817304 A JPS5817304 A JP S5817304A
- Authority
- JP
- Japan
- Prior art keywords
- pressure
- pair
- voltage
- sensitive plate
- changed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
Description
【発明の詳細な説明】
不発@社、物体の表面番らさtIII定する方法に関す
るものである。DETAILED DESCRIPTION OF THE INVENTION This invention relates to a method for determining the surface roughness of an object.
現在、物体0表面あらさを測定する種々の方法一
が提案され且つ実施されているか、それらの中にFi測
測定子手順煩雑なだけでなく、実施に轟)非常に複雑で
高価な装置を必要とする一〇が少なくない。Currently, various methods for measuring the surface roughness of objects have been proposed and implemented, some of them not only have a fiery measuring probe procedure that is cumbersome, but also require very complicated and expensive equipment to carry out. There are quite a few 10 people.
本発明は、簡単且つ安価な装置を用いて物体の被一定面
におけるあらさな極めて容晶に測定することのできる方
法を提供しようとするもので、物体の被測定面を弾性O
ある感圧板に圧接したとき、感圧板に直接的KII触す
る被測定面上の微小凸部の総面積が被測定面のあらさに
応じた変化を示すと共に、上記接触する凸部によりて感
圧板に加えられる荷重分布の悌乗値の総和も被測定面の
あらさに応じて変化するとiう事実に着目し、物体の接
触によ)抵抗がオン・オフ的に変化する感圧板及び抵抗
が接触圧力の1乗に比例して変化すゐ感圧板をそれぞれ
一対の可撓性導電板で挟着して構成した面積検出器及び
荷重検出器を用−1上記画積検出器及び荷重検出器のそ
れぞれK>ける一方の導電板の一対の対辺に設けた電4
1iKそれ(れ抵抗を介して電圧+6を印加すると共に
、上記一対の検出器のそれぞれにシける他方の導電板O
他の一対の対辺に設けた電極にそれでれ抵抗を介して電
圧−6を印加し、上記両横出量に物体の被一定面を圧接
したときの各電極の電圧に基づ−て、被欄定mlO表曲
心らさを求めることを特徴とするものである。The present invention aims to provide a method that can measure extremely rough crystals on a certain surface of an object using a simple and inexpensive device.
When pressed against a certain pressure-sensitive plate, the total area of minute protrusions on the surface to be measured that directly touch the pressure-sensitive plate changes depending on the roughness of the surface to be measured, and the contacting protrusions cause the pressure-sensitive plate to Focusing on the fact that the sum of the squared values of the load distribution applied to the surface changes depending on the roughness of the surface to be measured, we focused on the fact that the sum of the squared values of the load distribution applied to the surface changes depending on the roughness of the surface being measured. An area detector and a load detector are used, each of which is constructed by sandwiching a pressure sensitive plate whose pressure changes in proportion to the first power of the pressure between a pair of flexible conductive plates. A conductor 4 provided on a pair of opposite sides of one conductive plate, respectively
A voltage +6 is applied through the resistor, and the other conductive plate O is applied to each of the pair of detectors.
A voltage of -6 is applied to the other pair of electrodes provided on the opposite sides through the resistors, and the applied voltage is calculated based on the voltage of each electrode when the fixed surface of the object is pressed against the above-mentioned both lateral extensions. This method is characterized by determining the column constant mlO table curvature.
図面な−1,して不発@07j法なさらに詳a#c説明
すると、第1図に&−て、本発明に使用する面積検出器
1れ IIコ図t)(eoに示すように、圧力Pを加え
ること・ζよ抄紙wLRが略無隈大から零に近い値まで
オン参オフ的に変化する感圧板11を備え、その感圧板
nk一対の1q撓性導電板6.uによ)挟着し、一方の
導電板12における8方肉の一対の対辺に電極14.臘
を設けると共に1弛方の導電板13におけるν方向の一
対の対辺に電極11 、17を設けている。To explain the details of the unfired @07j method in more detail, as shown in Fig. 1, the area detector 1 used in the present invention is shown in Fig. By applying a pressure P and ζ, the paper making wLR is provided with a pressure sensitive plate 11 that changes on and off from a value of approximately zero to a value close to zero, and a pair of 1q flexible conductive plates 6.u of the pressure sensitive plate nk are used. ), and electrodes 14. A stand is provided, and electrodes 11 and 17 are provided on a pair of opposite sides in the ν direction of the conductive plate 13 in one direction.
また、纂3a紘本11ijiK使用する荷重検ai器2
を示してiる。仁の検出器2における感圧板21社、I
s、2図のに)に示すように、抵抗風が圧力Pの襲乗に
反比丙して変化する特性な備えるものである。In addition, load tester 2 used by 3a Hiromoto 11ijiK
Show i. Pressure sensitive plate 21 companies in Jin's detector 2, I
As shown in Fig. s and 2), the resistance wind has a characteristic that changes inversely to the attack of the pressure P.
その他の具体的な構成は、第7図の面積検出器lと略同
様で、電極腕、25及び電極26.27vt有する可撓
性導電板22.23により感圧板21を挟着してiる。The other specific configuration is almost the same as that of the area detector l shown in FIG. .
上記構成の面積検出器l及び荷重検出器2な使用するに
は、先ず、それぞれの検出−i 、2において、一方向
に対向する一対の電極14 、 is 、 24 。To use the area detector 1 and the load detector 2 having the above configurations, first, in each detection-i, 2, a pair of electrodes 14, is, 24 facing each other in one direction is used.
25に抵抗Vを介して電圧瞥十県を印加し、V方向にれ
O検出器1,2の導電@Am 、 11J−に411体
AO被欄定ifiを一定圧の下Kll触さ破1面積検出
器1の電1i 14〜17 K > elf b 電1
i ’IR圧VAI t Vlll m VCI eV
Dt及び荷重検出器2の電極腕〜rIKおける電極電圧
Vat e VB2 e Vat v VDI を検出
すれけ、それらの電圧及び上記印加電圧十g、−+sK
基づ−て、面積検出器IK接触する被測定iiO凸部O
11積8及び上記接触面の凸部によ〕荷重検出@意に加
えられる荷重分布O襲乗値OI! IIWsを求めるこ
とができる。25 through a resistor V, the conductivity of the O detectors 1 and 2 is applied in the V direction @Am, and the 411 body AO field ifi is touched under a constant pressure to 11J-. Electron 1i of area detector 1 14-17 K > elf b Electron 1
i 'IR pressure VAI t Vllll m VCI eV
Detect Dt and the electrode voltage Vat e VB2 e Vat v VDI at the electrode arm ~ rIK of the load detector 2, and these voltages and the above applied voltage 10g, -+sK
Based on the area detector IK, the convex portion O to be measured iiO
11 Product 8 and the convex portion of the contact surface] Load detection @Load distribution O applied to the force OI! IIWs can be obtained.
第Z図祉、上記8及びW襲を求めるための回路構成を示
し、電極電圧Vム1 * VBI及び印加電圧+・を減
算回路31.32に入力し、それに基づく減算回路31
、32からの出力を加算回路33に印加して、上記8
を加算回路おからの出力として。FIG.
, 32 is applied to the adder circuit 33, and the output from the above 8
as the output of the adding circuit okara.
5=J@−VAI −VBI
によりて求めろものである。またま記Ws91g電極電
圧VAt e VBz t’ 用Vh テ第ダ図と同一
〇m1m1Kよ)%Wvh= z a −VAt −V
y**として求める仁とかで自る。5=J@-VAI-VBI. Also, Vh for Ws91g electrode voltage VAt e VBz t' (same as in Figure 1 〇m1m1K) %Wvh= za -VAt -V
I am self-reliant with the jin that I seek as y**.
gj図a上記a1ヒWs&電[電JEVc1. Vca
。gj diagram a above a1 hi Ws & electric [Electric JEVc1. Vca
.
VDI e Vptを用−て求めるためOI回路構成を
示しそれらの電極電圧及び印加電圧−・な減算回路U。A subtraction circuit U that shows the OI circuit configuration for obtaining VDI e Vpt using the electrode voltage and applied voltage.
3!6に入力し、それに基づく減算回路34.35から
の出力な加算回路菖に印加して、上記8及びWsを加算
回路菖かもの出力として、
8 = 2a−VCl−Vl)t
Ws=28− Vat−VI)z
によ)求める一〇”t”Toる。3!6, and apply it to the addition circuit iris which is the output from the subtraction circuit 34.35 based on it, and make the above 8 and Ws the output of the addition circuit iris, 8 = 2a - VCl - Vl)t Ws = 28- Vat-VI) z) Find 10”t”Toru.
而して、上記Oようにして求めた8及び−を用いること
によ〕物体O被測定面における表面あらさを知得するこ
とがて自る。即ち、例えば被測定面の断固が纂6図(I
I)K示すような場合に社、Sが大きく且つ癩が小さく
、また断面が同図(&)K示すような場合に杜、8が小
さく且つWsが大金−値をとる。従うて、ヤれらO8及
び%VsO値を予め測定して求めた標準値と比較するこ
とによ)表両あらさを求めることができる。Therefore, by using 8 and - obtained as described above, it is possible to obtain the surface roughness of the surface to be measured of the object O. That is, for example, if the surface to be measured is firmly
I) In the case shown by K, S is large and the leprosy is small, and when the cross section is shown in the figure (&)K, D, 8 is small and Ws takes a large value. Therefore, the surface roughness can be determined by comparing the O8 and %VsO values with standard values determined in advance.
なお、上記面積検出器1及び荷重検出−2を可撓性絶縁
板を介して重設することもでき、それによシ8及び−の
同時検出が可能となる。Incidentally, the area detector 1 and the load detector -2 can be installed one on top of the other with a flexible insulating plate interposed therebetween, thereby making it possible to detect the loads 8 and -2 simultaneously.
以上に詳述したよう罠、本発明によれと簡単且つ安価に
得ることのできる装置な用−て極めて容易に物体の被測
定面にかけるあらさを知得することができる。As described in detail above, the roughness of the surface to be measured of an object can be very easily determined by using the trap, which is a device that can be easily and inexpensively obtained according to the present invention.
第1図及び第3図は本発明の実施に用iる面積検出器及
び荷重検出器の使用状履の斜視図、112図はそれらに
用いた感圧板の特性図、II4を図及び第!図は上記各
検出器に接続する演算回路の構成図、1RL6図(6)
、φ)はそれぞれ異なる被橢定面の拡大断面図である。
1・・・面積検出器、 2・・・荷重検出器、11 、
21・・・感圧板、
14〜17 、 u N27−、、電極。
指定代理人
工業技術院製品科学研究所長
用土 違也FIGS. 1 and 3 are perspective views of the area detector and load detector used in the practice of the present invention, FIG. The figure is a block diagram of the arithmetic circuit connected to each of the above detectors, 1RL6 diagram (6)
, φ) are enlarged cross-sectional views of different surface surfaces. 1...Area detector, 2...Load detector, 11,
21... Pressure sensitive plate, 14-17, u N27-,, electrode. Designated Agent Ichiya Yodo, Director, Product Science Research Institute, Agency of Industrial Science and Technology
Claims (1)
圧板及び抵抗が接触圧力の鵠最に比例して変化する感圧
板をそれぞれ一対O可am導電板で挟着して構成した面
積検出器及び荷重検出器を用い、上記面積検出器及び荷
重検aSsoそれヤれにおける一方の導電板の一対の対
辺Klkけた電極にそれぞれ抵抗を介して電圧+−を印
加すると共に、上記一対の検出器のそれヤれにおける他
方O導電板の他の一対の対辺に設けた電極にそれぞれ抵
抗な介して電圧−6を印加し、上記両横出量に物体の被
測定面を圧接したときの各電極の電圧に基づいて、被測
定面の表面あらさt−求めることを特徴とする表面あら
さ測定方法。L An area detector constructed by sandwiching a pressure-sensitive plate whose resistance changes on and off depending on the contact with an object and a pressure-sensitive plate whose resistance changes in proportion to the contact pressure between a pair of conductive plates. Using the area detector and the load detector, voltage +- is applied to the electrodes of the pair of opposite sides Klk of one of the conductive plates in the area detector and the load detector aSso through the respective resistors, and the A voltage of -6 is applied to the electrodes provided on the other pair of opposite sides of the other O conductive plate through the respective resistors, and when the surface to be measured of the object is brought into pressure contact with the above-mentioned both lateral extensions, the voltage of each electrode is A surface roughness measuring method characterized in that the surface roughness t- of a surface to be measured is determined based on a voltage.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11547681A JPS6035607B2 (en) | 1981-07-22 | 1981-07-22 | Surface roughness measurement method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11547681A JPS6035607B2 (en) | 1981-07-22 | 1981-07-22 | Surface roughness measurement method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5817304A true JPS5817304A (en) | 1983-02-01 |
JPS6035607B2 JPS6035607B2 (en) | 1985-08-15 |
Family
ID=14663469
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11547681A Expired JPS6035607B2 (en) | 1981-07-22 | 1981-07-22 | Surface roughness measurement method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6035607B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002056262A1 (en) * | 2001-01-16 | 2002-07-18 | Rossisky Federalny Jaderny Tsentr-Vserossisky Nauchno-Issledovatelsky Institut Tekhnicheskoi Fiziki (Rfyats-Vniitf) | Method for controlling the identity of an object |
WO2012050033A1 (en) * | 2010-10-14 | 2012-04-19 | シャープ株式会社 | Inspection device for plate material |
CN103499276A (en) * | 2013-10-12 | 2014-01-08 | 四川虹欧显示器件有限公司 | Detection system, detection method and adjustment method for uniformity of cutting edge of printing scraper |
-
1981
- 1981-07-22 JP JP11547681A patent/JPS6035607B2/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002056262A1 (en) * | 2001-01-16 | 2002-07-18 | Rossisky Federalny Jaderny Tsentr-Vserossisky Nauchno-Issledovatelsky Institut Tekhnicheskoi Fiziki (Rfyats-Vniitf) | Method for controlling the identity of an object |
WO2012050033A1 (en) * | 2010-10-14 | 2012-04-19 | シャープ株式会社 | Inspection device for plate material |
CN103499276A (en) * | 2013-10-12 | 2014-01-08 | 四川虹欧显示器件有限公司 | Detection system, detection method and adjustment method for uniformity of cutting edge of printing scraper |
Also Published As
Publication number | Publication date |
---|---|
JPS6035607B2 (en) | 1985-08-15 |
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