JPS5816549U - Differential refractometer - Google Patents
Differential refractometerInfo
- Publication number
- JPS5816549U JPS5816549U JP11016881U JP11016881U JPS5816549U JP S5816549 U JPS5816549 U JP S5816549U JP 11016881 U JP11016881 U JP 11016881U JP 11016881 U JP11016881 U JP 11016881U JP S5816549 U JPS5816549 U JP S5816549U
- Authority
- JP
- Japan
- Prior art keywords
- differential refractometer
- sample cell
- detector
- display device
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
図は本考案に係る示差屈折率計を例示ｊるフローシート
、である。
１・・・・・・光源、２・・・・・・試料セル、３・・
・・・・半導体装置検出器、５・・・・・・表示装置。
補正 昭５６． ８．２５
実用新案登録請求の範囲、図面の簡単な説明を次のよう
に補正する。
Ｏ実用新案登録請求の範囲
光源と、試料セルと、該試料セルを透過した光を受光し
その受光位置の基準位置からの距離を検出する半導体装
置検出器と、この検出器による検出結果に基き、屈折率
を演算して表示する表示装置とを設けである事を特徴と
する示差屈折率計。
図面の簡単な説明
図は本考案に係る示差屈折率計を例示するフローシート
である。
１・・・・・・光源、２・・・・・・試料セル、３・・
・・・・半導体装置検出器、５・・・・・・表示装置。The figure is a flow sheet illustrating a differential refractometer according to the present invention. 1...Light source, 2...Sample cell, 3...
... Semiconductor device detector, 5 ... Display device. Correction 1984. 8.25 The claims for utility model registration and the brief description of the drawings are amended as follows. O Utility Model Registration Claims A light source, a sample cell, a semiconductor device detector that receives the light transmitted through the sample cell and detects the distance of the light receiving position from the reference position, and based on the detection result by this detector. A differential refractometer, comprising: a display device that calculates and displays a refractive index. A simple explanatory diagram of the drawing is a flow sheet illustrating a differential refractometer according to the present invention. 1...Light source, 2...Sample cell, 3...
... Semiconductor device detector, 5 ... Display device.
Claims (1)
、その受光位置の基準位置からの距離を検出する半導体
装置検出器と、この検出器による検出結果に基き、屈折
率を演算して表示する表示゛ 装置とを設けで
ある事を特徴とする示差屈折率計。A light source, a sample cell, a semiconductor device detector that receives the light transmitted through the sample cell and detects the distance of the light receiving position from a reference position, and calculates a refractive index based on the detection result by this detector. 1. A differential refractometer characterized by being provided with a display device for displaying.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11016881U JPS5816549U (en) | 1981-07-23 | 1981-07-23 | Differential refractometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11016881U JPS5816549U (en) | 1981-07-23 | 1981-07-23 | Differential refractometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5816549U true JPS5816549U (en) | 1983-02-01 |
Family
ID=29904527
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11016881U Pending JPS5816549U (en) | 1981-07-23 | 1981-07-23 | Differential refractometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5816549U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022503442A (en) * | 2018-10-18 | 2022-01-12 | ポリマー キャラクタライゼーション，エセ．アー． | Deflection type refractometer with expanded measurement range |
-
1981
- 1981-07-23 JP JP11016881U patent/JPS5816549U/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022503442A (en) * | 2018-10-18 | 2022-01-12 | ポリマー キャラクタライゼーション，エセ．アー． | Deflection type refractometer with expanded measurement range |
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