JPS58154410U - Displacement hysteresis measuring device - Google Patents
Displacement hysteresis measuring deviceInfo
- Publication number
- JPS58154410U JPS58154410U JP4988682U JP4988682U JPS58154410U JP S58154410 U JPS58154410 U JP S58154410U JP 4988682 U JP4988682 U JP 4988682U JP 4988682 U JP4988682 U JP 4988682U JP S58154410 U JPS58154410 U JP S58154410U
- Authority
- JP
- Japan
- Prior art keywords
- light
- electric signal
- displacement
- measuring device
- light beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の変位測定装置の原理を説明するための図
、第２図は光束の位置と光強度との関係を示す図、第３
図、第４図は本考案の原理を説明するための図、第５図
は本考案の一実施例を示す系統図、第６図はバイモルフ
振動子を説明するための図である。
１・・・光源、２．２’、２″・・・被測定物、３・・
・２分割フォトディテクタ、４・・・ピンホール、５・
・・受光素子、１０・・・発光ダイオード、１１・・・
光スィッチ、１２・・・フォトダイオード、１４・・・
バイモルフ振動子、１５・・・電源、１６・・・オッシ
ロスコープ、１７．２１・・・電極、１８． ２０・・
・圧電セラミック材料、１９・・・リン青銅。
東３ 図
襄４ 図Figure 1 is a diagram for explaining the principle of a conventional displacement measuring device, Figure 2 is a diagram showing the relationship between the position of the light beam and the light intensity, and Figure 3 is a diagram for explaining the principle of a conventional displacement measuring device.
4 is a diagram for explaining the principle of the present invention, FIG. 5 is a system diagram showing an embodiment of the present invention, and FIG. 6 is a diagram for explaining a bimorph resonator. 1... Light source, 2.2', 2''... Measured object, 3...
・2-split photodetector, 4...pinhole, 5.
... Light receiving element, 10... Light emitting diode, 11...
Optical switch, 12... Photodiode, 14...
Bimorph resonator, 15...power supply, 16...oscilloscope, 17.21...electrode, 18. 20...
・Piezoelectric ceramic material, 19...phosphor bronze. East 3 Figure 4
Claims (2)
被測定物にガウス分布光束を照射しかつ反射された前記
ガウス分布光束の受光素子における受光量を電気信号、
に変換し、該電気信号と前記交番電気信号とを直交座標
上に表示することにより被測定物の変位のヒステリシス
特性を測定する変位ヒステリシス測定装置において、被
測定物により反射された前記がウス分布光束の一部を受
光する手段を設け、該ガウス分布光束の一部の受光素子
における受光量を電気信号に変換し、該電気信号と前記
交番電圧とを直交座標上に表示することにより被測定物
の変位のヒステリシス特性を測定することを特徴とする
変位ヒステリシス測定装置。(1) Displace the object to be measured by an alternating electric signal, irradiate the object with a Gaussian distribution light beam, and measure the amount of reflected Gaussian distribution light beam received by the light receiving element using an electric signal;
In a displacement hysteresis measuring device that measures the hysteresis characteristic of the displacement of a measured object by converting the electric signal and the alternating electric signal into orthogonal coordinates, the alternating electric signal reflected by the measured object has a Roussian distribution. A means for receiving a part of the light flux is provided, the amount of light received by the light receiving element of the part of the Gaussian distributed light flux is converted into an electrical signal, and the electrical signal and the alternating voltage are displayed on orthogonal coordinates. A displacement hysteresis measuring device characterized by measuring hysteresis characteristics of displacement of an object.
を受光する手段として、受光素子の表面上に光束径より
十分に小さなピンホール又はスリット又は開口数の小さ
なレンズを設けたことを特徴とする実用新案登録請求の
範囲第１項に記載の装置。(2) A pinhole or slit or a lens with a small numerical aperture sufficiently smaller than the diameter of the light beam is provided on the surface of the light-receiving element as a means for receiving a part of the Gaussian distributed light beam reflected by the object to be measured. The device according to claim 1 of the utility model registration claim.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4988682U JPS58154410U (en) | 1982-04-08 | 1982-04-08 | Displacement hysteresis measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4988682U JPS58154410U (en) | 1982-04-08 | 1982-04-08 | Displacement hysteresis measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58154410U true JPS58154410U (en) | 1983-10-15 |
Family
ID=30060711
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4988682U Pending JPS58154410U (en) | 1982-04-08 | 1982-04-08 | Displacement hysteresis measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58154410U (en) |
-
1982
- 1982-04-08 JP JP4988682U patent/JPS58154410U/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS58154410U (en) | Displacement hysteresis measuring device | |
| JPS61177469U (en) | ||
| JPH0325135U (en) | ||
| JPS6144543U (en) | Semiconductor laser light beam radiation angle measuring device | |
| JPS6271511U (en) | ||
| JPS5856437U (en) | Semiconductor junction characteristic measurement device | |
| SU1499119A1 (en) | Apparatus for determining coordinate of light spot | |
| JPS5986035U (en) | Automatic tracking correction device | |
| JPS6016298U (en) | High voltage sensor | |
| JPS6046038U (en) | radiation thermometer | |
| JPS62176704U (en) | ||
| JPS645108U (en) | ||
| JPH0293746U (en) | ||
| JPS60218006A (en) | Fine gap measuring instrument | |
| JPS62104145U (en) | ||
| JPS62104207U (en) | ||
| JPS6452098U (en) | ||
| JPH0347511U (en) | ||
| JPS5989203U (en) | Light emitting element sorting device | |
| JPH01104507U (en) | ||
| JPS6049472U (en) | Light emitting diode characteristic measuring device | |
| JPS5984411U (en) | distance measuring device | |
| JPS61109163U (en) | ||
| JPH0160565U (en) | ||
| JPS58119736U (en) | Light amount measuring device |