JPS5815138A - Gas analyzing apparatus - Google Patents
Gas analyzing apparatusInfo
- Publication number
- JPS5815138A JPS5815138A JP11406781A JP11406781A JPS5815138A JP S5815138 A JPS5815138 A JP S5815138A JP 11406781 A JP11406781 A JP 11406781A JP 11406781 A JP11406781 A JP 11406781A JP S5815138 A JPS5815138 A JP S5815138A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- measurement chamber
- gas analyzer
- measured
- ejector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims abstract description 49
- 238000005070 sampling Methods 0.000 claims description 10
- 239000011521 glass Substances 0.000 claims description 7
- 238000001514 detection method Methods 0.000 claims description 5
- 238000004458 analytical method Methods 0.000 claims description 3
- 238000004868 gas analysis Methods 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 238000012423 maintenance Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000009182 swimming Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
Description
【発明の詳細な説明】
この発明はガス分析装置に係り、とくにガスサンプリン
グ系統に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a gas analyzer, and particularly to a gas sampling system.
ガス分析装置はガスサンプリング系統とガス分析計とに
よって構成されるが、全体の構成が簡易で安価であり、
かつ測定対象ガスの存在する地域たとえばダクトに直接
取付ける場合などのような分析針の安定性を損う環境条
件下でも使用できることが望まれる。The gas analyzer consists of a gas sampling system and a gas analyzer, and the overall configuration is simple and inexpensive.
Furthermore, it is desired that the analyzer can be used even under environmental conditions that impair the stability of the analyzer needle, such as in areas where the gas to be measured exists, for example, when it is installed directly in a duct.
従来最も広く使用されているガス分析装置として第１図
のものを説明する。サンプリング系統Ｓニハサンプリン
グ機器としてフィルタ１．ドレンボット２．ポンプ（ま
たは吸引器）３．電磁弁４゜５、測定成分除去部６を有
し、図の如く配置される。すなわち測定対象ガスが矢印
の方向に流通すり
るダク鴻内に設置されたフィルタｌより採取されたガス
は、ここで混在するダストの大部分が除去され、ドレン
ボット２に至りドレン抜きされポンプ３により電磁弁４
，６へ送られる。この時電磁弁４が動作（開く）シ、電
磁弁５が不動作（閉じる）の状態では、ガスは電磁弁４
を通って測定成分除去部６を通過し、ガス分析計ムに入
るが、測定成分除去部６通過の際測定成分は除去される
のでガス分析計ムには校正用ガスとして流入し、ガス分
析計ムの調整がなされる。次に電磁弁４が不動作（閉じ
る）で電磁弁５が動作（開く）シた状態ではガスは電磁
弁３を通ってガス分析計ムに流入し、ここで測定対ガス
の検出、濃度測定が行なわれる。The gas analyzer shown in FIG. 1 will be described as the most widely used gas analyzer in the past. Filter 1 as sampling system S Niha sampling equipment. Drainbot 2. Pump (or suction device) 3. It has a solenoid valve 4.5 and a measurement component removal section 6, and is arranged as shown in the figure. In other words, the gas sampled from the filter 1 installed in the duct through which the gas to be measured flows in the direction of the arrow, has most of the mixed dust removed there, reaches the drain bot 2, and is drained by the pump 3. Solenoid valve 4
, 6. At this time, when the solenoid valve 4 is in operation (open) and the solenoid valve 5 is inoperative (closed), the gas flows through the solenoid valve 4.
The gas passes through the measurement component removal section 6 and enters the gas analyzer, but as the measurement component is removed when passing through the measurement component removal section 6, it flows into the gas analyzer as a calibration gas and is used for gas analysis. The meter is adjusted. Next, when the solenoid valve 4 is inoperative (closed) and the solenoid valve 5 is activated (open), the gas flows through the solenoid valve 3 into the gas analyzer, where it is used for gas detection and concentration measurement. will be carried out.
上記従来装置ではサンプリング機器としてドレンボット
、ポンプ（または吸引器）を使用している関係上価格が
高価であることのほか保守点検が厄介であった。またサ
ンプリング機器の大きさ。The above-mentioned conventional apparatus uses a drainbot and a pump (or suction device) as sampling equipment, and is not only expensive but also troublesome to maintain and inspect. and the size of the sampling equipment.
寸法的な問題から取付はスペースの問題およびダクトに
直接取付けできないという欠点を有していた。Due to dimensional problems, the installation had the disadvantage of space problems and the inability to be installed directly in the duct.
この発明は上述した欠点を除去して、保守点検が容易ま
たは全く不用とし、取付スペースも僅少でダクトなどの
洞室位置に直接取付は可能とし、かつ安価なガス分析装
置を提供することを目的とする。The object of the present invention is to eliminate the above-mentioned drawbacks, to provide an inexpensive gas analyzer that makes maintenance and inspection easy or unnecessary, requires little installation space, can be directly installed in a cavernous position such as a duct, and is inexpensive. shall be.
この発明によれば、上記の目的を達成するために、測定
対象ガスの存在する地域とガス分析計の測定室とを複数
６通管で連通し、各流通管にはそれぞれエジェクタを設
け、任意の１本の流通管に設けたエジェクタが作動した
時はこの任意の１本の流通管を通して前記ガス分析計の
測定室内のガスを測定対象ガスの存在する地域に排出す
るとともにこの測定対象ガスの存在する地域から他の流
通管を通して前記分析針の測定室内にガスが流入するよ
うに構成し、前記複数本の流通管のうち少なくとも一本
には測走成分を除去する測定成分除去部を設け、しかも
前記複数本の流通管のうち少なくとも一本には前記測定
成分除去部を設けない構造とした。According to the present invention, in order to achieve the above object, the area where the gas to be measured exists and the measurement chamber of the gas analyzer are communicated through a plurality of six flow pipes, each flow pipe is provided with an ejector, and an ejector is provided in each flow pipe. When the ejector installed in one of the flow pipes is activated, it discharges the gas in the measurement chamber of the gas analyzer to the region where the gas to be measured exists through this arbitrary flow pipe, and also discharges the gas in the measurement chamber of the gas analyzer to the area where the gas to be measured exists. Gas is configured to flow into the measurement chamber of the analytical needle from the existing region through another flow pipe, and at least one of the plurality of flow pipes is provided with a measurement component removal section for removing the measurement component. Moreover, at least one of the plurality of flow pipes is not provided with the measurement component removal section.
以下この発明の、実施例を図面に基づいて説明する。第
怠図はこの門の一実施例であるガス分析装置の構成図で
、サンプリング系統Ｓの構成は、測定対象ガスが矢印の
方向に流通するダク）Ｄの内に第１のフィルタ］Ｐ１が
設けられ、このフィルタ１重に第１の流通管０もの一端
が接続され、他端はガス分析計ム、の測定室ＭＯに連通
している。Embodiments of the present invention will be described below based on the drawings. Figure 2 is a configuration diagram of a gas analyzer which is an example of this gate.The configuration of the sampling system S is that a first filter P1 is installed in a duct D through which the gas to be measured flows in the direction of the arrow. One end of the first flow pipe is connected to this filter, and the other end communicates with the measurement chamber MO of the gas analyzer.
流通管ＯＨＳには第１のエジェクタＩＣ，Ｔ、が設けら
れ、エジェクタ１７．は第１の電磁弁ＳＶ、を介して圧
縮空気源に接続されている。またダク）Ｄの内に第２の
フィルタｈが設けられ、このフィルタ１Ｐｔに第２の流
通管ＯＨ！の一端が接続され、他端は測（５）
庫室ＭＯに連通している。そして流通管ＯＨ，の徐中に
は測定成分除去部００が設けられ、第１の流通管０１１
ｍの場合と同じように第２のエジェクタＥＪ。The flow pipe OHS is provided with a first ejector IC, T, and an ejector 17. is connected to a source of compressed air via a first solenoid valve SV. Also, a second filter h is provided in the duct) D, and a second flow pipe OH! is connected to this filter 1Pt. One end is connected, and the other end is connected to the storage room MO (5). A measurement component removal unit 00 is provided in the middle of the flow pipe OH, and a first flow pipe 011
The second ejector EJ as in the case of m.
が設けられる。エジェクタＩＣＪ、は第２の°電磁弁Ｓ
Ｖ、を介して圧縮空気源に接続されている。is provided. Ejector ICJ, is the second ° solenoid valve S
V, connected to a source of compressed air.
次にガス分析計ム凰には、一方何に反射鏡ＭＲ備え他方
側は赤外線を透し得るガラス板Ｗにて閉塞された測定室
ＭＯを有し、測定室ＭＯは前述したように流通管ＯＨ，
、ＯＢ、に連通している。この測定室ＭＯに赤外線を入
射する赤外線光源ＴＪ８はこの測定室ＭＯの外部にあっ
て、赤外線光源Ｌ８から出た赤外線はガラス板Ｗを透過
して測定室ＭＯ内に入り、反射鏡ＭＲにより反射され再
びガラス板Ｗを透過して外部へでて検出器ＤＴに入射す
る。この検出器Ｄ！からの出力を増幅する増幅器ＡＭＰ
が設けられており１、増幅器ＡＭＰからのれる。このガ
ス分析装置における動作について述べると、まず第２の
電磁弁ＢＶ、を不動作（閉じた）状態とし、第１の電磁
弁ＳＶ、を動作（開いた）状（６）
態にすると、圧縮空気が第１のエジェクタＩＣ，Ｔ。Next, the gas analyzer Mu-o has a measurement chamber MO which has a reflector MR on one side and is closed off with a glass plate W that can transmit infrared rays on the other side, and the measurement chamber MO has a flow pipe as described above. Oh,
, OB, is connected. An infrared light source TJ8 that inputs infrared rays into this measurement chamber MO is located outside of this measurement chamber MO, and the infrared light emitted from the infrared light source L8 passes through a glass plate W, enters the measurement chamber MO, and is reflected by a reflecting mirror MR. The light passes through the glass plate W again, exits to the outside, and enters the detector DT. This detector D! An amplifier AMP that amplifies the output from
1, which is connected to the amplifier AMP. Describing the operation of this gas analyzer, first, the second solenoid valve BV is placed in the inoperative (closed) state, and the first solenoid valve SV is placed in the activated (open) state (6). Air is the first ejector IC,T.
より噴出する。その際エジェクタＸＩ、周辺の流通管Ｏ
Ｈ，内は負気圧となりそのため測定室ＭＯ内ガスは吸引
され流通管ＯＨ，を通りフィルタ７１ を経てダク）Ｄ
内に排出され、それに伴いダク）Ｉ）内のガスはフィル
タ１！を経て流通管ＯＨ，を通り測定成分除去部ｏＯを
通過して測定室ＭＯに入る。More gushing. At that time, ejector XI, surrounding flow pipe O
There is a negative pressure inside H, so the gas in the measurement chamber MO is sucked in, passes through the flow pipe OH, and passes through the filter 71 to the duct) D
The gas in the duct) I) is discharged into the filter 1! It passes through the flow pipe OH, passes through the measurement component removal section oO, and enters the measurement chamber MO.
ガスが測定成分除去部００を通過するとき測定成分ガス
は除去されるので基準ガスとしてガス分析計に供給され
る。次に第１の電磁弁ＳＶ、を不動作（閉じた）状態に
して第２の電磁弁ＳＶ、を動作（開いた）状態にすると
、圧縮空気が第２のエジェクタ１７．より噴出する。そ
のとき測定室ＭＯ内のガスは吸引され流通管ＯＨ！、測
定成分除去部００を通りフィルタｈを経てダクトＤ内に
排出され、それに伴いダクトＤ内のガスはフィルタＩＦ
１を経て流通管ＯＨ，を通り測定室ＭＯに入る。このよ
うに電磁弁ｓｖ、 、 ｓｙ、の開閉を交互にある周期
でもって行なえば、前述の基準ガスにより測定室ＭＯで
吸収された後の赤外線の透過強度は検出器ＤＴにて検出
され、増幅話人ＭＰにて増幅されたのちデータ処理部Ｄ
Ｐで蓄えられる。次に測定対象ガスが測定室ＭＯに入っ
たときの赤外線の透過強度は検出器ＤＴにて検出され増
幅器ＡＭＰにて増幅されたのちデータ処理部ｐｐに入り
、先に入った基準値と比較処理され分析出力信号が出さ
れる。When the gas passes through the measurement component removal section 00, the measurement component gas is removed and is supplied to the gas analyzer as a reference gas. Next, when the first solenoid valve SV is put in the inoperative (closed) state and the second solenoid valve SV is put in the activated (open) state, the compressed air flows into the second ejector 17. More gushing. At that time, the gas in the measurement chamber MO is sucked into the flow pipe OH! , the gas in the duct D is discharged through the filter h through the measurement component removal unit 00, and the gas in the duct D is discharged through the filter IF.
1, and then through the flow pipe OH and into the measurement chamber MO. In this way, if the solenoid valves sv, , sy are alternately opened and closed at a certain period, the transmitted intensity of the infrared rays after being absorbed by the reference gas in the measurement chamber MO is detected by the detector DT, and is amplified. After being amplified by speaker MP, data processing unit D
It can be stored in P. Next, when the gas to be measured enters the measurement chamber MO, the transmitted intensity of infrared rays is detected by the detector DT, amplified by the amplifier AMP, and then enters the data processing section pp, where it is compared with the previously entered reference value. and an analysis output signal is output.
よる赤外光の減衰の影響を除いた測定対象ガス濃度のみ
に関係した信号成分が得られるので、安定度の高い測定
対象ガス濃度の測定が得られる。第２図においては流通
管２本を用いた場合について説明したが、流通管は３本
以上であっても構成できる。但し、この場合は複数本の
流通管のうち少なくとも１本には測定成分除去部を設け
、かつ複数本の流通管のうち少なくとも１本には測定成
分除去部を設けない構成にしなければならない。すなわ
ち、流通管をたとえば３本用いる場合に、１本に測定成
分除去部を設ける場合には、残りの２本にはそれを設け
ない。Since a signal component related only to the concentration of the gas to be measured is obtained, excluding the influence of the attenuation of the infrared light caused by the infrared light, highly stable measurement of the concentration of the gas to be measured can be obtained. In FIG. 2, a case has been described in which two flow pipes are used, but the structure can be constructed using three or more flow pipes. However, in this case, at least one of the plurality of flow pipes must be provided with a measurement component removal section, and at least one of the plurality of flow pipes must be configured without a measurement component removal section. That is, when using, for example, three flow pipes, if one is provided with a measurement component removal section, the remaining two are not provided with it.
またこの発明の他の実施例として第３図に示す構成のも
のでもよい。この場合はガスサンプリング系統Ｂは第２
図の場合と同じであって、ガス分２↑
析にム宜の構成は測定室ＭＯ’の内にガス検出器ＱＢを
設け、その検出信号は外部に導出され、増幅器ＡＭ？で
増幅されたのちデータ処理部ＤＰにて第２図の場合と同
じように基準ガスの時の検出値と、測定対象ガスの時の
検出値とが比較され測定対象ガス濃度の測定が得られる
。Further, as another embodiment of the present invention, a structure shown in FIG. 3 may be used. In this case, gas sampling system B is
The configuration for gas analysis is the same as in the case shown in the figure, and a gas detector QB is provided in the measurement chamber MO', and its detection signal is led out to the outside, and an amplifier AM? After being amplified by the data processing unit DP, the detected value for the reference gas and the detected value for the target gas are compared in the same way as in the case of Fig. 2, and a measurement of the target gas concentration is obtained. .
以上述べた構成になる本発明のガス分析装置にはドレン
ボット、ポンプなどを使用しないでエジェクタを使用し
た構造なので価格は廉価であるし、保守点検が容易（む
しろ無保守でよい）となり、サンプリング機器が小さく
なりダクトに直接取付けて使用できる効果がある。The gas analyzer of the present invention having the above-mentioned structure uses an ejector without using a drain bot or pump, so it is inexpensive, maintenance is easy (in fact, no maintenance is required), and the sampling equipment This has the effect of making it smaller and allowing it to be used by directly installing it in the duct.
第１図は従来構造のガス分析装置の構成図、第２図はこ
の発明の一実施例であるガス分析装置の構成図、第３図
はこの発明の他の実施例であるガス分析装置の構成図で
ある。
（９）
Ａ、Ｙ：ガス分析計、００：測定胞７７泳人部、０Ｈ３
−ＯＨ，：流通管、Ｄ：測定対象ガスの存在する地域（
ダクト）、！Ｊ１ 、 ｍｙ、 ：エジエクタ、ＧＳ：
ガス検知素子、ＬＳ：赤外線光源、ＭＯ，ＭＯ’＋測定
室、ＭＲ：反射鏡、Ｗニガラス板。
↑、＋、＋、３
代理人ｆ１理１−山 口 巖・ζｉ
（１０）
７１ 図
７２ 図
７３図Fig. 1 is a block diagram of a gas analyzer having a conventional structure, Fig. 2 is a block diagram of a gas analyzer which is an embodiment of the present invention, and Fig. 3 is a block diagram of a gas analyzer which is another embodiment of the present invention. FIG. (9) A, Y: Gas analyzer, 00: Measurement cell 77 swimming part, 0H3
-OH,: Flow pipe, D: Area where the gas to be measured exists (
duct),! J1, my, : Ejikuta, GS:
Gas detection element, LS: infrared light source, MO, MO'+ measurement chamber, MR: reflecting mirror, W glass plate. ↑, +, +, 3 Agent f1 Theory 1- Iwao Yamaguchi・ζi (10) 71 Figure 72 Figure 73
Claims (1)
ガス分析針の測定室に導き濃度測定を行なうガス分析装
置において、測定対象ガスの存在する地域とガス分析計
の測定室とを複数本の流通管で連通し、各流通管にはそ
れぞれエジェクタを設け、任意の１本の流通管に設けた
エジェクタが一作動した時はこの任意の１本の流通管を
通して前記ガス分析計の測定室内のガスを測定対象ガス
の存在する地域に排出するとともにこの測定対象ガスの
存在する地域から他の流通管を通して前記分析針の測定
室内にガスが流入するように構成し、前記複数本の流通
管のうち少なくとも１本には測定成分を除失する測定成
分除去部を設け、しかも前記複数本の流通管のうち少な
くとも１本には前記測定成分除去部を設けないことを特
徴とするガス分析装置。 ２、特許請求の範囲第１項記載のガス分析装置において
、ガス分析計の測定室は室内の一方側に反射鏡を備え、
他方側を赤外線を透過し得るガラス板で閉塞し、測定室
外の赤外線光源より発する赤外線が前記ガラスを透過し
て測定室内に入り、測定室内のガス層を通過して前記反
射鏡により反射され、再びガス層を通過し、前記ガラス
板を透過して測定室外に射出するように構成したことを
特徴とするガス分析装置。 ３）特許請求の範囲第１項記載のガス分析装置において
、ガス分析計の測定室は密封されたガス層にガス検知素
子を設け、検知素子からの信号を測定室外へ導出するよ
うに構成したことを特徴とするガス分析装置。[Scope of Claims] 1) In a gas analyzer in which a gas to be measured sampled from a gas sampling system is guided to a measurement chamber of a gas analysis needle and its concentration is measured, the area where the gas to be measured exists and the measurement chamber of the gas analyzer. are connected through a plurality of flow pipes, each flow pipe is provided with an ejector, and when the ejector provided on any one flow pipe is activated, the gas analyzer is connected through this arbitrary flow pipe. The gas in the measurement chamber of the analysis needle is discharged to a region where the gas to be measured exists, and the gas flows into the measurement chamber of the analysis needle from the region where the gas to be measured exists through another flow pipe, and the plurality of At least one of the flow pipes is provided with a measured component removal section for removing the measured component, and at least one of the plurality of flow pipes is not provided with the measured component removal section. Gas analyzer. 2. In the gas analyzer according to claim 1, the measurement chamber of the gas analyzer is equipped with a reflecting mirror on one side of the chamber,
The other side is closed with a glass plate that can transmit infrared rays, and infrared rays emitted from an infrared light source outside the measurement chamber pass through the glass and enter the measurement chamber, pass through a gas layer inside the measurement chamber, and are reflected by the reflecting mirror, A gas analyzer characterized in that the gas analyzer is configured to pass through the gas layer again, pass through the glass plate, and be ejected to the outside of the measurement chamber. 3) In the gas analyzer according to claim 1, the measurement chamber of the gas analyzer is configured such that a gas detection element is provided in a sealed gas layer, and a signal from the detection element is guided outside the measurement chamber. A gas analyzer characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11406781A JPS5815138A (en) | 1981-07-21 | 1981-07-21 | Gas analyzing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11406781A JPS5815138A (en) | 1981-07-21 | 1981-07-21 | Gas analyzing apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5815138A true JPS5815138A (en) | 1983-01-28 |
Family
ID=14628195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11406781A Pending JPS5815138A (en) | 1981-07-21 | 1981-07-21 | Gas analyzing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5815138A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0131877A2 (en) * | 1983-07-15 | 1985-01-23 | Cerberus Ag | Device for fire detection |
| JPS6253343U (en) * | 1985-09-24 | 1987-04-02 | ||
| JPH03249548A (en) * | 1990-02-28 | 1991-11-07 | Yokogawa Electric Corp | Sample gas leading-in device |
-
1981
- 1981-07-21 JP JP11406781A patent/JPS5815138A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0131877A2 (en) * | 1983-07-15 | 1985-01-23 | Cerberus Ag | Device for fire detection |
| JPS6253343U (en) * | 1985-09-24 | 1987-04-02 | ||
| JPH03249548A (en) * | 1990-02-28 | 1991-11-07 | Yokogawa Electric Corp | Sample gas leading-in device |
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