JPS5815105A - Ultrasonic wave thickness gage - Google Patents

Ultrasonic wave thickness gage

Info

Publication number
JPS5815105A
JPS5815105A JP11345381A JP11345381A JPS5815105A JP S5815105 A JPS5815105 A JP S5815105A JP 11345381 A JP11345381 A JP 11345381A JP 11345381 A JP11345381 A JP 11345381A JP S5815105 A JPS5815105 A JP S5815105A
Authority
JP
Japan
Prior art keywords
thickness
display
signal
probe
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11345381A
Other languages
Japanese (ja)
Other versions
JPS6356922B2 (en
Inventor
Kimio Kanda
神田 喜美雄
Hisao Hanmura
半村 久雄
Hiromasa Sakaigawa
境川 洋聖
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Engineering Co Ltd
Hitachi Ltd
Original Assignee
Hitachi Engineering Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Engineering Co Ltd, Hitachi Ltd filed Critical Hitachi Engineering Co Ltd
Priority to JP11345381A priority Critical patent/JPS5815105A/en
Publication of JPS5815105A publication Critical patent/JPS5815105A/en
Publication of JPS6356922B2 publication Critical patent/JPS6356922B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)

Abstract

PURPOSE:To obtain a thickness gage of pocket type which can display the thickness of a specimen in terms of figures and bottom shape by providing a position signal generating part in an ultrasonic probe part and providing a flat platelike display board in a digital thickness display part. CONSTITUTION:The ultrasonic waves 4 emitted in a specimen 3 by a pulser 1 and a probe 2 are reflected by a bottom surface 5, and said waves received by a probe and are inputted via a waveform forming circuit 7 via an FF circuit 9 which is applied with the signal of the pulser 1 with delay 8. After the waves are integrated 11, they are subjected to A-D conversion 12, and the thickness is displayed on a digital display device 14. The thickness signal after A-D conversion 16 is inputted to analog switches 17. The ultrasonic waves from a microphone 18 are picked up with a microphone 20, and the time difference between both microphone signals is detected 22 and is made into a position signal for the probe. The switches 17 are selected sequentially by said signal, whereby the thickness signal is stored as the bottom shape of the specimen in each position of the probe in a max. value holding circuit 23 consisting of shift registers and said shape is displayed in a two-dimensional display circuit 24.

Description

【発明の詳細な説明】 本発明は超音波厚み計に係り、特に被検体の厚みと底面
形状を表示するに好適な厚み計に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ultrasonic thickness meter, and particularly to a thickness meter suitable for displaying the thickness and bottom shape of a subject.

従来のポケット型の超音波厚み計は数字により表示する
ものであシ、厚みと底面形状を表示するものはなかった
Conventional pocket-type ultrasonic thickness gauges only display numbers, and none display thickness and bottom shape.

また、厚みを断面形状として表示するものは従来の超音
波探傷器と蓄積型のブラウン管(CRT)装置を組合せ
たものがあり、これにより底面形状を表示することが可
能であるが、これはポケット型の厚み計に比較し、大型
であり、携帯に不便であった。
In addition, there are devices that display the thickness as a cross-sectional shape that are a combination of a conventional ultrasonic flaw detector and a storage cathode ray tube (CRT) device, which can display the bottom shape, but this is not possible with a pocket Compared to the mold thickness gauge, it was large and inconvenient to carry.

本発明は上記の欠点紫なくシ、ポケット型超音波厚み計
において被検体の厚みを底面形状と数字で表示すること
のできる超音波厚み計r提供するにある。
The present invention eliminates the above-mentioned drawbacks and provides a pocket-type ultrasonic thickness meter that can display the thickness of a subject in terms of the bottom shape and numbers.

本発明は超音波探触子部に位置信号発生部を設け、厚み
表示部に平板状の表示盤を設け、被検体の底面形状と厚
みを表示するものでめる。
The present invention provides a position signal generating section in the ultrasonic probe section and a flat display panel in the thickness display section to display the bottom shape and thickness of the object.

第1図は本発明の超音波厚み計のブロック図である。l
はパルサでぃ超音波探触子2r励振する。
FIG. 1 is a block diagram of the ultrasonic thickness gauge of the present invention. l
Excites the pulsar ultrasonic probe 2r.

超音波探触子2は被検体3の上に置かれ、超音波探触子
2から発生さnた超音波4は底面5で反射され、超音波
探触子2で受信さ扛る。受信された信号は増幅回路6で
増幅され、波形整形回路7で整形される。一方、パルサ
1からは超音波探触子2の励振と同期して、遅延回路8
に信号が送られ、若干遅延されてフリップフロップ9に
加えられる。
The ultrasonic probe 2 is placed on the subject 3, and the ultrasonic waves 4 generated by the ultrasonic probe 2 are reflected by the bottom surface 5 and are received by the ultrasonic probe 2. The received signal is amplified by an amplifier circuit 6 and shaped by a waveform shaping circuit 7. On the other hand, in synchronization with the excitation of the ultrasonic probe 2, a delay circuit 8 is output from the pulser 1.
The signal is sent to the flip-flop 9 and is applied to the flip-flop 9 with a slight delay.

フリップフロップ9は遅延回路8からの信号で1”を出
力し、波形整形回路7からの信号で°0”を出力する。
The flip-flop 9 outputs a signal of 1'' from the delay circuit 8, and outputs a signal of 0'' from the waveform shaping circuit 7.

レンジ切換回路は被検体の表示範囲又は厚みに応じて切
換える必要がある場合に用いられ、°1”のレベルを変
える。
The range switching circuit is used when it is necessary to switch depending on the display range or thickness of the object, and changes the level of 1".

積分回路11はレンジ切換回路の出力を積分し、時間と
ともに変化する鋸歯状波を発生する。積分回路11の出
力をA/Dコンバータに導き、デコーダ13で数字表示
用信号に変換すると、被検体の厚みが、数字表示器14
に示される。また、積分回路11の出力を表示範囲設定
回路15に導き、ここで、任意のレベル以上や信号のみ
出力させる。
Integrating circuit 11 integrates the output of the range switching circuit and generates a sawtooth wave that changes over time. When the output of the integrating circuit 11 is led to the A/D converter and converted into a numerical display signal by the decoder 13, the thickness of the subject is displayed on the numerical display 14.
is shown. Further, the output of the integrating circuit 11 is led to a display range setting circuit 15, where only signals or signals above an arbitrary level are output.

そして、任意レベル以上の信号をA/Dコンバータ16
でディジタル信号に変換され、アナログスイッチ17に
出力される。
Then, the A/D converter 16 converts the signal higher than an arbitrary level to the A/D converter 16.
The signal is converted into a digital signal and output to the analog switch 17.

18は音波送出用マイクでるり、マイク保持具19に取
シつけられている。20は音波受信用マイクで音波送出
用マイク18からの音波を受信し、その信号は増幅回路
2Fで増幅さ扛、時間測定回路22に送ら扛る。時間測
定回路22では音波送出用マイク18への信号と音波受
信用マイク20力)らの信号の時間差を求め、この信号
をアナログスイッチ17に出力する。本時間差は超音波
探触子の位置信号である。
Reference numeral 18 denotes a microphone for transmitting sound waves, which is attached to a microphone holder 19. A sound wave receiving microphone 20 receives sound waves from the sound wave sending microphone 18, and the signal is amplified by an amplifier circuit 2F and sent to a time measuring circuit 22. The time measuring circuit 22 determines the time difference between the signal to the sound wave sending microphone 18 and the signal from the sound wave receiving microphone 20, and outputs this signal to the analog switch 17. This time difference is the position signal of the ultrasound probe.

アナログスイッチ17は平板状二次表示回路24の一軸
に対応して設けられており、超音波探触子の位置信号に
よシ選択さ扛、順次に作動する。
The analog switch 17 is provided corresponding to one axis of the flat plate-shaped secondary display circuit 24, and is selected and sequentially operated according to the position signal of the ultrasonic probe.

各アナログスイッチにはシフトレジスタから構成される
最大値保持回路23が接続さnており、6超音波探触子
位置における被検体の底面形状が記憶される。そこで、
二次元表示回路にこの最大値保持回路の出力を表示する
ことにより達成される。
A maximum value holding circuit 23 composed of a shift register is connected to each analog switch, and the bottom shape of the subject at six ultrasonic probe positions is stored. Therefore,
This is achieved by displaying the output of this maximum value holding circuit on a two-dimensional display circuit.

第2図は2次元表示回路の表示例である。第3図は厚み
が表示面よりも大きい場合であり、表示範囲25で囲ん
だ部分が表示きれる。このように、表示範囲を設定する
場合に表示設定回路15が使用される。
FIG. 2 is a display example of a two-dimensional display circuit. FIG. 3 shows a case where the thickness is larger than the display surface, and the area surrounded by the display range 25 can be displayed completely. In this way, the display setting circuit 15 is used when setting the display range.

本発明はポケット形超音波厚み計に底面形状表示機能を
付加したものである。底面形状表示に平板状二次元表示
回路を設けたが、本表示回路は液晶表示装置以外の表示
装置を用いても本発明に含1れるものとする。超音波探
触子の位置検出に音波を用いたが、音波以外の位置検出
手段を用いても本発明に含まれるものとする。
The present invention is a pocket-type ultrasonic thickness gauge with a bottom shape display function added. Although a flat two-dimensional display circuit is provided to display the bottom shape, the present invention also includes the use of a display device other than a liquid crystal display device as the display circuit. Although sound waves are used to detect the position of the ultrasonic probe, the present invention also includes the use of position detection means other than sound waves.

本発明によればポケット型厚み計により被検体の底面形
状を表示でき、原子力発電所、石油プラント等をはじめ
、多くの分野における腐食等の診断、破壊事故防止に大
きく寄与できる。
According to the present invention, the shape of the bottom surface of the object can be displayed using a pocket-type thickness gauge, which can greatly contribute to diagnosis of corrosion and prevention of destruction accidents in many fields including nuclear power plants, petroleum plants, etc.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の超音波厚み計の実施例のブロック図、
第2図は第1図の2次元表示回路の表示例説明図である
FIG. 1 is a block diagram of an embodiment of the ultrasonic thickness gauge of the present invention.
FIG. 2 is an explanatory diagram of a display example of the two-dimensional display circuit of FIG. 1.

Claims (1)

【特許請求の範囲】 1、超音波を送受信して、その伝ばん時間から被検体の
厚みを測定する厚み計において、探触子部に位置検出手
段を設け、表示部に平板状二次元表示手段及び数字表示
手段を設け、底面形状と厚みを表示することを特徴とす
る超音波厚み計。 2、特許請求の範囲第1項において、平板状二次元表示
手段に液晶表示装置が用いられている超音波厚み計。 3、特許請求の範囲第1項において、アナログ信号のし
きい値レベルを可変することにより、厚肉の場合におい
ても縮尺することなく、底面形状を画像として表示する
ように形成されている超音波厚み計。
[Claims] 1. In a thickness meter that transmits and receives ultrasonic waves and measures the thickness of a subject from the propagation time thereof, the probe section is provided with a position detection means, and the display section is provided with a flat two-dimensional display. 1. An ultrasonic thickness gauge characterized by being provided with means and numerical display means to display the bottom shape and thickness. 2. The ultrasonic thickness gauge according to claim 1, wherein a liquid crystal display device is used as the flat two-dimensional display means. 3. In claim 1, the ultrasonic wave is formed so as to display the shape of the bottom surface as an image without being scaled even in the case of a thick wall by varying the threshold level of the analog signal. Thickness gauge.
JP11345381A 1981-07-22 1981-07-22 Ultrasonic wave thickness gage Granted JPS5815105A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11345381A JPS5815105A (en) 1981-07-22 1981-07-22 Ultrasonic wave thickness gage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11345381A JPS5815105A (en) 1981-07-22 1981-07-22 Ultrasonic wave thickness gage

Publications (2)

Publication Number Publication Date
JPS5815105A true JPS5815105A (en) 1983-01-28
JPS6356922B2 JPS6356922B2 (en) 1988-11-09

Family

ID=14612611

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11345381A Granted JPS5815105A (en) 1981-07-22 1981-07-22 Ultrasonic wave thickness gage

Country Status (1)

Country Link
JP (1) JPS5815105A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0231494U (en) * 1988-08-22 1990-02-27

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5166855A (en) * 1974-12-05 1976-06-09 Sumitomo Metal Ind Kannaiidobutsutaino ichikenchihoho
JPS51134175A (en) * 1975-05-16 1976-11-20 Hitachi Ltd Supersonic inspection device
JPS5550109A (en) * 1978-10-06 1980-04-11 Idemitsu Petrochem Co Ltd Corrosion locating method and device for bottom plate of container

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5166855A (en) * 1974-12-05 1976-06-09 Sumitomo Metal Ind Kannaiidobutsutaino ichikenchihoho
JPS51134175A (en) * 1975-05-16 1976-11-20 Hitachi Ltd Supersonic inspection device
JPS5550109A (en) * 1978-10-06 1980-04-11 Idemitsu Petrochem Co Ltd Corrosion locating method and device for bottom plate of container

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0231494U (en) * 1988-08-22 1990-02-27

Also Published As

Publication number Publication date
JPS6356922B2 (en) 1988-11-09

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