JPS5814145U - Sample holder for X-ray diffraction - Google Patents

Sample holder for X-ray diffraction

Info

Publication number
JPS5814145U
JPS5814145U JP10734881U JP10734881U JPS5814145U JP S5814145 U JPS5814145 U JP S5814145U JP 10734881 U JP10734881 U JP 10734881U JP 10734881 U JP10734881 U JP 10734881U JP S5814145 U JPS5814145 U JP S5814145U
Authority
JP
Japan
Prior art keywords
sample holder
ray diffraction
abstract
sample
recorded
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10734881U
Other languages
Japanese (ja)
Inventor
八代 正昭
Original Assignee
クラリオン株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by クラリオン株式会社 filed Critical クラリオン株式会社
Priority to JP10734881U priority Critical patent/JPS5814145U/en
Publication of JPS5814145U publication Critical patent/JPS5814145U/en
Pending legal-status Critical Current

Links

Landscapes

  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のX線回折用試料ホルダの斜視図、第2図
は本考案の一実施例によるX線回折用試料ホルダの斜視
図である。 1・・・試料ホルダ、4・・・段差。
FIG. 1 is a perspective view of a conventional sample holder for X-ray diffraction, and FIG. 2 is a perspective view of a sample holder for X-ray diffraction according to an embodiment of the present invention. 1... Sample holder, 4... Step.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] X線回折用試料ホルダの一部を試料の厚さと同一に平行
に切削して試料台を設けることを特徴とするX線回折用
試料ホルダ。
A sample holder for X-ray diffraction, characterized in that a sample holder is provided by cutting a part of the sample holder parallel to the thickness of the sample.
JP10734881U 1981-07-20 1981-07-20 Sample holder for X-ray diffraction Pending JPS5814145U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10734881U JPS5814145U (en) 1981-07-20 1981-07-20 Sample holder for X-ray diffraction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10734881U JPS5814145U (en) 1981-07-20 1981-07-20 Sample holder for X-ray diffraction

Publications (1)

Publication Number Publication Date
JPS5814145U true JPS5814145U (en) 1983-01-28

Family

ID=29901789

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10734881U Pending JPS5814145U (en) 1981-07-20 1981-07-20 Sample holder for X-ray diffraction

Country Status (1)

Country Link
JP (1) JPS5814145U (en)

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