JPS58136760U - Infrared radiation gas analyzer - Google Patents
Infrared radiation gas analyzerInfo
- Publication number
- JPS58136760U JPS58136760U JP3370682U JP3370682U JPS58136760U JP S58136760 U JPS58136760 U JP S58136760U JP 3370682 U JP3370682 U JP 3370682U JP 3370682 U JP3370682 U JP 3370682U JP S58136760 U JPS58136760 U JP S58136760U
- Authority
- JP
- Japan
- Prior art keywords
- space
- component
- gas
- infrared rays
- gas analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は本考案の一実施例である赤外線輻射式ガス分析
計の構成図、第2図は本考案の別実施例の構成図である
。
1・・・第1空間、6・・・チョッパー、9・・・赤外
線検出器、12・・・第2空間。FIG. 1 is a block diagram of an infrared radiation gas analyzer which is one embodiment of the present invention, and FIG. 2 is a block diagram of another embodiment of the present invention. 1... First space, 6... Chopper, 9... Infrared detector, 12... Second space.
Claims (1)
射される赤外線を受光する赤外線検出器との間に、前記
第1空間とほぼ同寸法の光学的厚さを有する第2空間と
チョッパーを設け、前記第2空間にはサンプルガスから
測定対象成分を除いたガスを供給するように構成し、前
記第1空間内のサンプルガスから輻射される赤外線の・
うち、測定対象成分以外から輻射される赤外線を前記第
2空間内のガスに吸収させて、前記赤外線検出器による
残りの赤外線の輻射量検出により測定対象成分の濃度を
検出すべく構成してなる赤外線輻射式ガス分析計。A chopper and a second space having approximately the same optical thickness as the first space are provided between the first space and an infrared detector that receives infrared rays radiated from a high-temperature sample gas in the first space. The second space is configured to supply a gas obtained by removing the component to be measured from the sample gas, and the infrared rays radiated from the sample gas in the first space are supplied to the second space.
Among them, infrared rays radiated from a component other than the component to be measured are absorbed by the gas in the second space, and the concentration of the component to be measured is detected by detecting the amount of radiation of the remaining infrared rays by the infrared detector. Infrared radiation gas analyzer.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3370682U JPS58136760U (en) | 1982-03-09 | 1982-03-09 | Infrared radiation gas analyzer |
DE19833307132 DE3307132C2 (en) | 1982-03-09 | 1983-03-01 | Infrared gas analyzer for determining at least one component of a gas mixture |
GB8306205A GB2116317B (en) | 1982-03-09 | 1983-03-07 | Infrared radiation gas analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3370682U JPS58136760U (en) | 1982-03-09 | 1982-03-09 | Infrared radiation gas analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58136760U true JPS58136760U (en) | 1983-09-14 |
JPS6330996Y2 JPS6330996Y2 (en) | 1988-08-18 |
Family
ID=30045244
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3370682U Granted JPS58136760U (en) | 1982-03-09 | 1982-03-09 | Infrared radiation gas analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58136760U (en) |
-
1982
- 1982-03-09 JP JP3370682U patent/JPS58136760U/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6330996Y2 (en) | 1988-08-18 |
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