JPS58131737A - Liquid phase epitaxial growing method - Google Patents
Liquid phase epitaxial growing methodInfo
- Publication number
- JPS58131737A JPS58131737A JP57013847A JP1384782A JPS58131737A JP S58131737 A JPS58131737 A JP S58131737A JP 57013847 A JP57013847 A JP 57013847A JP 1384782 A JP1384782 A JP 1384782A JP S58131737 A JPS58131737 A JP S58131737A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- liquid reservoir
- crystal layer
- slide member
- liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B19/00—Liquid-phase epitaxial-layer growth
- C30B19/02—Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux
- C30B19/04—Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux the solvent being a component of the crystal composition
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/46—Sulfur-, selenium- or tellurium-containing compounds
- C30B29/48—AIIBVI compounds wherein A is Zn, Cd or Hg, and B is S, Se or Te
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Light Receiving Elements (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【発明の詳細な説明】
蛛)発明の技術分野
本発明はスライディング法を用いた液相エビタ(至)技
術の背景
赤外線検知素子のような光電変換素子の形成用材料とし
て一般にエネμギーギャップの狭い水銀、カドミウム、
テルル(Hgs−zcdxTe)のような化合物半導体
結晶が用いられている。Detailed Description of the Invention Technical Field of the Invention The present invention is a background of liquid phase Evita technology using a sliding method. narrow mercury, cadmium,
Compound semiconductor crystals such as tellurium (Hgs-zcdxTe) are used.
ところでこのような化合物半導体結晶を光電変換素子形
成に都合が良いように大面積でかつ薄層状に得るために
は、一般に大面積の大きい結晶が得られやすいチルμ化
カドiウム(CdTe )の基板上にHg1−xc+1
4T6の結晶層を液相エピタキシャル成長方法で形成し
ている。By the way, in order to obtain such compound semiconductor crystals in a large area and in a thin layer form, which is convenient for forming photoelectric conversion elements, chilled cadmium oxide (CdTe), which is generally easy to obtain large crystals with a large area, is used. Hg1-xc+1 on the substrate
A 4T6 crystal layer is formed using a liquid phase epitaxial growth method.
(Q) 従来技術と問題点
このような液相エピタキシャA/a長の従来の方法につ
いて第1図を用い慶から説明する。(Q) Prior Art and Problems The conventional method of determining the A/a length of liquid phase epitaxy will be explained with reference to FIG. 1, starting with Kei.
図示するように直方体形状のカーボンよシなる支持台l
の凹所2にエピタキVヤル結晶を形成するためのテA/
μ化カドiウム(CdTe )の基板8を埋設するつそ
の後支持台上をスライドして移動するスライド部材4に
設けた貫通孔状の液だめ5内の形成用材料を充填する。As shown in the figure, a rectangular parallelepiped-shaped support made of carbon
Te A/ for forming an epitaxial V-shaped crystal in the recess 2 of
After embedding the substrate 8 of cadmium chloride (CdTe 2 ), a liquid reservoir 5 in the form of a through hole provided in a slide member 4 that slides on a support table is filled with a forming material.
次にこのような支持台とスライド部材とからなる液相1
エピタキシヤル成長装置を水銀(Ha )ガス雰囲気内
の反応管内に挿入したのち、該反応管を加熱炉にて加熱
する。Next, liquid phase 1 consisting of such a support base and slide member
After the epitaxial growth apparatus is inserted into a reaction tube in a mercury (Ha) gas atmosphere, the reaction tube is heated in a heating furnace.
次いでスライド部材の液だめ内の結晶層形成用材料が溶
融して液相となった時点で、該スフイド部材を矢印A方
向に移動させて基板上に液だめを静置する。その後加熱
炉の温度を低下させて基板上にHg1−xc(11Te
のエピタキシャル結晶層を形成する。その後更にスライ
ド部材を矢印A方向に移動させて液だめを基板より左側
に移動させてから、加熱炉の電源を切断して基板上にH
g1−xcdxTeの結晶層を形成している。しかしこ
のような方法であるとHg1−xCdxTeの結晶層の
うちHgが特に易蒸発性成分であるので電源を切断して
加熱炉を放冷している間にも該基板上に置かれているス
ライド部材のカーボン材が多孔性であるので、その孔を
通じて基板に形成したHgl−1cdz’reの結晶層
よりHgが蒸発してこのHgの蒸発によって成長した結
晶層の表面に窪みが生じ表面に凹凸状の形状が形成され
る欠点を生じる。Next, when the crystal layer forming material in the liquid reservoir of the slide member melts into a liquid phase, the sulfide member is moved in the direction of arrow A to leave the liquid reservoir still on the substrate. After that, the temperature of the heating furnace was lowered and Hg1-xc (11Te) was deposited on the substrate.
form an epitaxial crystal layer. After that, further move the slide member in the direction of arrow A to move the liquid reservoir to the left side of the substrate, then turn off the power to the heating furnace and place H on the substrate.
A crystal layer of g1-xcdxTe is formed. However, with this method, since Hg in the Hg1-xCdxTe crystal layer is a particularly easily evaporable component, it remains on the substrate even when the power is turned off and the heating furnace is left to cool. Since the carbon material of the slide member is porous, Hg evaporates from the Hgl-1cdz're crystal layer formed on the substrate through the pores, and the evaporation of Hg creates depressions on the surface of the grown crystal layer. This results in the disadvantage that an uneven shape is formed.
そしてこのような凹凸状の形状は赤外線検知素子等、特
に結晶層の表面を利用する素子の製造歩留を低下させる
不都合を生じる。Such an uneven shape causes an inconvenience in that it reduces the manufacturing yield of devices such as infrared sensing devices, especially devices that utilize the surface of the crystal layer.
■ 発明の目的
本発明社上述した欠点を除去しエビタキシャμ結晶の成
長の際にHgのような易蒸発性成分が蒸発してエピタキ
シャル結晶層の表面に窪みが生じないようにして平滑な
表面が得られるようなスライディング法を用いた液相エ
ピタキシャル成長方法の提供を目的とするものである。■ Purpose of the Invention The present invention has a method that eliminates the above-mentioned drawbacks and prevents the formation of depressions on the surface of the epitaxial crystal layer due to the evaporation of easily evaporable components such as Hg during the growth of epitaxial μ crystals, thereby creating a smooth surface. The object of the present invention is to provide a liquid phase epitaxial growth method using a sliding method that can be obtained.
(θ)発明の構成
かかる目的を達成するための本発明の液相エピタキシャ
ル成長方法は基板を埋設すべき凹所をそなえた支持台の
前記凹所に基板を埋設し、該基板上をスライドして移動
するスフイド部材の貫通孔状の液だめと、該液だめに隣
接する有底の液だめ内とに1基板上に形成すべき結晶層
の材料を充填したのち、前記支持台とスライド部材とを
加熱して前記それぞれの液だめ内の材料を溶融して液相
としたのち、基板上に貫通孔状の液だめを静置して該基
板上に結晶層を形成したのち、スライド部材を移動させ
て、該基板上に有底の液だめを静置してから加熱炉を放
冷して基板上にエピタキシャル結晶層を形成することを
特徴とするものである。(θ) Structure of the Invention In order to achieve the above object, the liquid phase epitaxial growth method of the present invention includes embedding a substrate in the recess of a support base provided with a recess in which the substrate is to be buried, and sliding the substrate over the recess. After filling the through-hole-shaped liquid reservoir of the movable sphoid member and the bottomed liquid reservoir adjacent to the liquid reservoir with the material for the crystal layer to be formed on one substrate, the supporting table and the slide member are After heating the materials in each of the liquid reservoirs to melt them into a liquid phase, the through-hole-shaped liquid reservoirs are left on the substrate to form a crystal layer on the substrate, and then the slide member is The method is characterized in that an epitaxial crystal layer is formed on the substrate by moving the substrate, leaving a bottomed liquid reservoir still on the substrate, and then allowing the heating furnace to cool.
(0発明の実施例
以下図面を用いながら本発明の一実施例につき詳細に説
明する。(Embodiment of the invention) An embodiment of the invention will be described below in detail with reference to the drawings.
第Q@図は本発明の方法に用いる液相エピタキシャル成
長装置の平面図で第2(a)図はそのX−7断面図であ
る。Figure Q@ is a plan view of a liquid phase epitaxial growth apparatus used in the method of the present invention, and Figure 2(a) is a sectional view taken along the line X-7.
図示するように本発明の方法に用いる液相エピタキシャ
ル成長装置のスライド部材11には、該基板上に形成す
べきHg1−IO(14Teの結晶層の液相12を収容
する貫通孔状の液だめ18の他に該液だめに隣接して、
液だめ18に収容されている液相12と同一組成のHg
1−XCdXTeの液相14を収容する有底の液だめ1
5を設けている。また支持台16のCdTeの基板8を
設置する凹所2の周辺部には、該基板上にHgt−XC
(IXTeの結晶層を形成する際の液だめ18を静置し
たときにHg1−xcdxTeの液相が入シ込むような
溝17を設けておく。As shown in the figure, a slide member 11 of a liquid phase epitaxial growth apparatus used in the method of the present invention has a liquid reservoir 18 in the form of a through hole for accommodating a liquid phase 12 of a crystal layer of Hg1-IO (14Te) to be formed on the substrate. In addition, adjacent to the liquid reservoir,
Hg having the same composition as the liquid phase 12 contained in the liquid reservoir 18
A bottomed liquid reservoir 1 containing a liquid phase 14 of 1-XCdXTe
5 is set. In addition, around the recess 2 in which the CdTe substrate 8 of the support stand 16 is installed, Hgt-XC is placed on the substrate.
(A groove 17 is provided so that the liquid phase of Hg1-xcdxTe can enter when the liquid reservoir 18 used to form the IXTe crystal layer is left still.
このような液相エピタキシャル成長装置の液だめ18に
Hgl−1CdxTeの材料を、また有底の液だめ15
内には同一組成のHgl−1Cd4Teの材料を収容し
、また支持台の凹所2にCdTeの基板8を埋設した状
態で、該装置をH8ガス雰囲気内の反応管中に導入して
から該装置を加熱炉にて加熱する。The Hgl-1CdxTe material is placed in the liquid reservoir 18 of such a liquid phase epitaxial growth apparatus, and the bottomed liquid reservoir 15 is
A material of Hgl-1Cd4Te having the same composition is housed in the chamber, and a CdTe substrate 8 is buried in the recess 2 of the support, and the apparatus is introduced into a reaction tube in an H8 gas atmosphere. Heat the device in a heating furnace.
そして液だめ18.15内の材料が溶融した時点で、ス
ライド部材を矢印B方向に移動させて基板上に液だめ1
8を静置させたのち、加熱炉の温度を低下させて基板上
にHJKx−xc(1xTeの結晶層をエビタキVヤ〃
成長させる。その後更にスライド部材をB方向に移動さ
せて有底の液だめ15を基板上に静置する。このように
すれば前述した基板上の有底の液だめ内のHg1XCd
XTθの液相によって前記スライド部材の多孔性のカー
ボン材よシ前述したエピタキシャル層内の易蒸発性成分
のHgが逃散するのが防止されて形成されるエピタキシ
ャル結晶層の表面が窪みを生じることなく平滑な状■と
なる。When the material in the liquid reservoir 18.15 is melted, the slide member is moved in the direction of arrow B and the liquid reservoir 1 is placed on the substrate.
8 was allowed to stand still, the temperature of the heating furnace was lowered, and a crystal layer of HJKx-xc (1xTe) was deposited on the substrate using an Evitaki V-ya.
Make it grow. Thereafter, the slide member is further moved in the direction B to place the bottomed liquid reservoir 15 on the substrate. In this way, Hg1XCd in the bottomed liquid reservoir on the substrate mentioned above.
The liquid phase of XTθ prevents Hg, which is an easily evaporable component in the epitaxial layer, from escaping through the porous carbon material of the slide member, so that the surface of the epitaxial crystal layer formed is free from depressions. It becomes smooth.
(2)発明の効果
以上述べたように本発明の方法によればエピタキシャル
結晶層から易蒸発性成分のHgがエピタキシャル成長の
過程で蒸発しなくな)したがって窪みを生じない平滑な
表面を有するエピタキシャル結晶層が得られる利点を生
じる。また本発明の実施例においては易蒸発性成分のH
gを含む化合物半導体結晶のエピタキシャル成長につい
て述べ九が、この他Hg以外の易蒸発性成分を含む化合
物半導体結晶を液相エピタキシャル成長させる場合にお
いても本発明の方法が適用できることは勿論である。(2) Effects of the Invention As described above, according to the method of the present invention, Hg, which is an easily evaporable component, does not evaporate from the epitaxial crystal layer during the epitaxial growth process. Therefore, an epitaxial crystal having a smooth surface without forming a depression is produced. The layers give rise to advantages. In addition, in the examples of the present invention, the easily evaporable component H
Although the epitaxial growth of a compound semiconductor crystal containing Hg has been described above, it goes without saying that the method of the present invention can also be applied to the liquid phase epitaxial growth of a compound semiconductor crystal containing easily evaporable components other than Hg.
第1図は従来の液相エピタキシャル成長方法に用いる装
置の断面図、第2(lL)図、第2@図は本発明の液相
エピタキシャル成長方法に用いる装置の断面図である。
図において1.16は支持台、2は凹所、8はCdTe
基板、4.11はス?イド部材、5.18゜15は液だ
め、6.12.14はHgt 1Cd4Teの材料、1
7は溝を示す。
+−9FIG. 1 is a sectional view of an apparatus used in a conventional liquid phase epitaxial growth method, and FIG. 2 (1L) and 2@ are sectional views of an apparatus used in a liquid phase epitaxial growth method of the present invention. In the figure, 1.16 is a support base, 2 is a recess, and 8 is a CdTe
Is the board 4.11 compatible? id member, 5.18°15 is a liquid reservoir, 6.12.14 is Hgt 1Cd4Te material, 1
7 indicates a groove. +-9
Claims (1)
板を埋設し、該基板上をスライドして移動するスライド
部材の貫通孔状の液だめと、該液だめに隣接せる有底の
液だめ内とに、基板上に形成すべき結晶層の材料を充填
したのち、前記支持台とスライド部材とを加熱して前記
それぞれの液だめ内の材料を溶融して液相としたのち、
基板上に貫通孔状の液だめを静置して該基板上に結晶層
全形成したのち、スライド部材を移動させて、該基板上
に有底の液だめを静置してから加熱炉を放冷して基板上
にエピタキシャル結晶層を形成することを特徴とする液
相エピタキシャル成長方法。A substrate is buried in the recess of a support base having a recess in which the substrate is to be buried, and a through-hole shaped liquid reservoir of a slide member that slides and moves on the substrate, and a bottomed liquid reservoir adjacent to the liquid reservoir. After filling the liquid reservoirs with materials for the crystal layer to be formed on the substrate, heating the support base and the slide member to melt the materials in the respective liquid reservoirs into a liquid phase. ,
After a liquid reservoir with a through hole is placed on the substrate and the entire crystal layer is formed on the substrate, the slide member is moved and a liquid reservoir with a bottom is placed on the substrate, and then the heating furnace is heated. A liquid phase epitaxial growth method characterized by forming an epitaxial crystal layer on a substrate by allowing it to cool.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57013847A JPS58131737A (en) | 1982-01-29 | 1982-01-29 | Liquid phase epitaxial growing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57013847A JPS58131737A (en) | 1982-01-29 | 1982-01-29 | Liquid phase epitaxial growing method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58131737A true JPS58131737A (en) | 1983-08-05 |
Family
ID=11844663
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57013847A Pending JPS58131737A (en) | 1982-01-29 | 1982-01-29 | Liquid phase epitaxial growing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58131737A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5130270A (en) * | 1990-04-19 | 1992-07-14 | Mitsubishi Denki Kabushiki Kaisha | Hetero-epitaxial liquid phase growth method |
US5264190A (en) * | 1990-04-19 | 1993-11-23 | Mitsubishi Denki Kabushiki Kaisha | Liquid phase epitaxial film growth apparatus |
-
1982
- 1982-01-29 JP JP57013847A patent/JPS58131737A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5130270A (en) * | 1990-04-19 | 1992-07-14 | Mitsubishi Denki Kabushiki Kaisha | Hetero-epitaxial liquid phase growth method |
US5264190A (en) * | 1990-04-19 | 1993-11-23 | Mitsubishi Denki Kabushiki Kaisha | Liquid phase epitaxial film growth apparatus |
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