JPS58131639A - Measuring method of potential distribution in tube of fluorescent lamp - Google Patents

Measuring method of potential distribution in tube of fluorescent lamp

Info

Publication number
JPS58131639A
JPS58131639A JP1418682A JP1418682A JPS58131639A JP S58131639 A JPS58131639 A JP S58131639A JP 1418682 A JP1418682 A JP 1418682A JP 1418682 A JP1418682 A JP 1418682A JP S58131639 A JPS58131639 A JP S58131639A
Authority
JP
Japan
Prior art keywords
tube
fluorescent lamp
potential distribution
lamp
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1418682A
Other languages
Japanese (ja)
Inventor
Masahiro Tokawa
雅弘 東川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP1418682A priority Critical patent/JPS58131639A/en
Publication of JPS58131639A publication Critical patent/JPS58131639A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/44Factory adjustment of completed discharge tubes or lamps to comply with desired tolerances

Abstract

PURPOSE:To measure distribution of potential in a tube of a general fluorescent lamp from the outside with simple operation, by both adapting a measuring terminal of a voltmeter to an external wall of the glass tube of the fluorescent lamp under its normally turned-on condition and moving the measuring terminal along the axial direction of the lamp tube. CONSTITUTION:A general fluorescent lamp 3 is turned on by a power source 9 through a turn-on circuit 10, and one probe 12 of an A, B two-channel oscilloscope 11 is contacted between lamp electrodes while the other probe 13 is contacted to an optional point on an external wall of a glass tube 2. Further use of the oscilloscope 11 having a memory function, in which measurement data can be stored, is convenient, however, a measuring device of circuit testers or the like may be used.

Description

【発明の詳細な説明】 本発明は螢光ランプの管内電位分布測定方法に関する。[Detailed description of the invention] The present invention relates to a method for measuring the potential distribution inside a fluorescent lamp.

螢光ラングの管内電位分布を測定する方法としては、I
I針法あるいは導体筒を用いた間接測定法が知られてい
る。探針法はJ@1図に示すように、螢光体lを内面に
塗布したfラス管20遍所に数本の探針畠を挿入した特
殊ランデを用いて測定する方法であるが、かかる方法に
よると特殊ラングを試作する手間を要するのは勿論のこ
と、探針lを挿入する部分のガラス管突出部4の存在の
ため忙、管壁温度が通常のものと異り、戟いは導体であ
る探針8が管内に挿入されるために管内電位分布が変化
する等olK象が生じ、電位分布測定のだめの手段を付
加するが故に1本来のあるべき測定値が得られないとい
う欠点があつた。また、4体幣を用いた関接測走法は第
意図に示すように、螢光フン1iのガラス管IK導体箔
を巻回取付けし導体箔りング6を形成し、wI導体箔り
ング6に。
As a method for measuring the potential distribution inside the fluorescent rung tube, I
The I-needle method or the indirect measurement method using a conductor tube is known. The probe method, as shown in Figure J@1, is a method of measuring using a special lande in which several probe holes are inserted into 20 locations of an f-lass tube whose inner surface is coated with fluorophore. According to this method, not only does it take time and effort to prototype a special rung, but also the presence of the protruding portion 4 of the glass tube where the probe l is inserted makes the tube wall temperature different from that of a normal one. Because the probe 8, which is a conductor, is inserted into the tube, an olK phenomenon occurs, such as the potential distribution inside the tube changing, and because a means to measure the potential distribution is added, the measured value that should be obtained cannot be obtained. There were flaws. In addition, in the joint measurement method using four bills, as shown in the first intention, the glass tube IK conductor foil of the fluorescent tube 1i is wound and attached to form the conductor foil ring 6, and the wI conductor foil ring is attached. To 6.

抵抗コンデン雫より成る積分回路iを接続し、その積分
出力をオツνロスコープ、デスタ等の信号検出器8で捉
え、導電箔ダング6をfフス管2上で移動させて電位分
布を測定する専決であるが、かかる方法では前述の如き
特殊ラングを必要とせず、一般の螢光フン1によって測
定可能とな・りたが、導体筒りング・や積分回路7等を
必要とする欠点がありた。
An integral circuit i consisting of a resistor capacitor is connected, and its integral output is detected by a signal detector 8 such as an Otsuvroscope or a desta, and a conductive foil dangling 6 is moved on the FSS tube 2 to measure the potential distribution. However, although this method does not require the special rung mentioned above and can be measured using a general fluorescent tube 1, it has the drawback of requiring a conductor ring, an integrating circuit 7, etc. Ta.

本発明Fi、かかる欠点を除去する九めになされ九もの
で、その目的とするところは、一般の螢光ラングの管内
電位分布を外部から非常に簡単な操作によって測定しう
る方法を提供するにある。
The present invention has been made to eliminate such drawbacks, and its purpose is to provide a method for measuring the potential distribution inside a general fluorescent rung tube from the outside with a very simple operation. be.

第1図は本発明にかかる測定方法を説明する概念図で、
電源9によって1点灯回路膣を介して、一般の螢光ラン
グ8を点灯させ、ム・B2現象tVロスコーグUの一方
のグローブ認はランプ電極間に、ま九他方のプローブI
3はガラス管鵞外11上任意の点に接触させる。なお、
オVロスコーfnとしては、測定データを記憶できるメ
モリー機能を有するものを用いると便利であるが、テス
ター等の計測器でもよいのけ勿論である。
FIG. 1 is a conceptual diagram explaining the measurement method according to the present invention.
A general fluorescent rung 8 is lit by a power supply 9 through one lighting circuit vagina, and one globe of the Mu-B2 phenomenon tV Roskog U is connected between the lamp electrodes, and the other probe I
3 is brought into contact with an arbitrary point on the glass tube outer 11. In addition,
It is convenient to use a Roscoe fn having a memory function that can store measurement data, but it is of course possible to use a measuring instrument such as a tester.

第4図は上記測定方法によりオンロスツー1uKW4測
される信号波形で、図において波形息は上記グロープロ
によって検出されたラング管軸方向の任意の点における
信号電圧波形で、波形−は上記グローブνによって検出
され九電圧波形である。
Figure 4 shows the signal waveform measured by the above-mentioned measurement method. In the figure, the waveform is the signal voltage waveform at an arbitrary point in the axial direction of the lung tube detected by the glow pro, and the waveform - is detected by the globe ν. There are nine voltage waveforms.

この信号電圧波形aid、ガラス管2の管壁における容
1に接合による微分波形と考えられ、ラング管軸方向に
沿った各点での信号電圧波形iの実効値あるいはピーク
値を、ランプ全長に亘りてプ0?トすると15図に示す
ようなグラフが得られた。
This signal voltage waveform aid is considered to be a differential waveform due to junction with the capacitor 1 on the tube wall of the glass tube 2, and the effective value or peak value of the signal voltage waveform i at each point along the Lang tube axis direction is expressed as the total length of the lamp. Watarate Pu 0? A graph as shown in Figure 15 was obtained.

なお、第6図において横軸下方に示し九螢光うング器は
、上記測定点とラング位置関係を対比するためのもので
ある。
In addition, in FIG. 6, the nine fluorescent Ununglers shown below the horizontal axis are for comparing the above-mentioned measurement points and the rung positional relationship.

而して、第6図におけるグラフ中央部の直線とみなし得
る部分の傾きと、v4−のラング6を前述し九他の測定
方法によって求めた陽光柱電位傾度とけ、はは一致した
値となることが確認された。
Therefore, the slope of the part that can be regarded as a straight line in the center of the graph in Figure 6 and the positive column potential gradient obtained using the above-mentioned and other measurement methods for rung 6 of v4- are the same values. This was confirmed.

従って、第6図に示す電位分布はランプ管内電位分布を
表わすものと考えられる。更に、第6図から明らかなよ
うに%両電極部分に対応する位置において、上に凸のピ
ーク値を示す、これを利用してラング外部から電極位置
を知ること4可能となる。
Therefore, the potential distribution shown in FIG. 6 is considered to represent the potential distribution within the lamp tube. Furthermore, as is clear from FIG. 6, an upwardly convex peak value is shown at a position corresponding to both electrode portions, and by utilizing this, it is possible to know the electrode position from outside the rung.

このように1本発明によれば一般の螢光ラングの管内電
位分布を、#Vロスコープの如き電圧計測器のみで非常
Kll単に測定できた。
As described above, according to the present invention, the potential distribution inside the tube of a general fluorescent rung can be very easily measured using only a voltage measuring instrument such as a #V rososcope.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来O電位分布測定用の特殊な螢光ラングを示
す一部切欠断面図、第意図は従来の異なる電位分布測定
方法を説明する概念図、第8図は本発明にかかる測定方
法の一実施例を示す概念図。 44図は同上の方法によりオVロスコーグに観測される
信号電圧波形、l1IJi−は同上の測定方法により実
測された電位分布の例である一 特許出願人 松f電工株式会社 代理人弁理士  竹 元 敏 丸 (ほか2名) 第3図 第4図 第5図
Fig. 1 is a partially cutaway sectional view showing a special fluorescent rung for conventional O potential distribution measurement, the first intention is a conceptual diagram explaining a different conventional potential distribution measurement method, and Fig. 8 is a measurement method according to the present invention. FIG. 2 is a conceptual diagram showing one embodiment of the invention. Figure 44 shows the signal voltage waveform observed in OV Roscog by the above method, and l1IJi- is an example of the potential distribution actually measured by the above measurement method.One patent applicant: Takemoto, patent attorney Matsu F Electric Co., Ltd. Toshimaru (and 2 others) Figure 3 Figure 4 Figure 5

Claims (1)

【特許請求の範囲】[Claims] よりラング全長にIる管内電位分布を測定して成る螢光
ラングの管内電位分布測定方法。
A method for measuring the potential distribution inside a fluorescent rung tube, which comprises measuring the potential distribution inside the tube over the entire length of the rung.
JP1418682A 1982-01-29 1982-01-29 Measuring method of potential distribution in tube of fluorescent lamp Pending JPS58131639A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1418682A JPS58131639A (en) 1982-01-29 1982-01-29 Measuring method of potential distribution in tube of fluorescent lamp

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1418682A JPS58131639A (en) 1982-01-29 1982-01-29 Measuring method of potential distribution in tube of fluorescent lamp

Publications (1)

Publication Number Publication Date
JPS58131639A true JPS58131639A (en) 1983-08-05

Family

ID=11854088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1418682A Pending JPS58131639A (en) 1982-01-29 1982-01-29 Measuring method of potential distribution in tube of fluorescent lamp

Country Status (1)

Country Link
JP (1) JPS58131639A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104569759A (en) * 2014-12-31 2015-04-29 爱彼思(苏州)自动化科技有限公司 Modulator tube testing and film pasting equipment

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55414A (en) * 1978-04-28 1980-01-05 Matsushita Electric Works Ltd Measurement of potential distribution of fluorescent lamp

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55414A (en) * 1978-04-28 1980-01-05 Matsushita Electric Works Ltd Measurement of potential distribution of fluorescent lamp

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104569759A (en) * 2014-12-31 2015-04-29 爱彼思(苏州)自动化科技有限公司 Modulator tube testing and film pasting equipment

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