JPS58120555U - Charged beam device - Google Patents

Charged beam device

Info

Publication number
JPS58120555U
JPS58120555U JP1787882U JP1787882U JPS58120555U JP S58120555 U JPS58120555 U JP S58120555U JP 1787882 U JP1787882 U JP 1787882U JP 1787882 U JP1787882 U JP 1787882U JP S58120555 U JPS58120555 U JP S58120555U
Authority
JP
Japan
Prior art keywords
charged beam
beam device
charged
hole
recorded
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1787882U
Other languages
Japanese (ja)
Inventor
今野 茂生
Original Assignee
日本電子株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子株式会社 filed Critical 日本電子株式会社
Priority to JP1787882U priority Critical patent/JPS58120555U/en
Publication of JPS58120555U publication Critical patent/JPS58120555U/en
Pending legal-status Critical Current

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  • Electron Beam Exposure (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の荷電ビーム装置の一部構成図、第2図は
本考案の一実施例を示した電子ビーム描画装置の概略図
、第3図はその一部詳細図である。 2:対物レンズのポールピース、3:材料、0:光軸、
6:電子計算機、7:偏向器、8:対物レンズ、9:駆
動機構、10:高さ検出器、12:孔、14:センサ一
部。
FIG. 1 is a partial block diagram of a conventional charged beam device, FIG. 2 is a schematic diagram of an electron beam lithography device showing an embodiment of the present invention, and FIG. 3 is a partially detailed diagram thereof. 2: Objective lens pole piece, 3: Material, 0: Optical axis,
6: Electronic computer, 7: Deflector, 8: Objective lens, 9: Drive mechanism, 10: Height detector, 12: Hole, 14: Part of sensor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 荷電ビームが照射される材料の上方に、該ビームが通過
する穴を大略中央部に設け、実質的に材料との間の静電
容量を検出するようになした検出手段を配置した荷電ビ
ーム装置。
A charged beam device comprising: a hole through which the charged beam passes, provided above the material to be irradiated with the charged beam, and a detecting means configured to substantially detect the capacitance between the charged beam and the material; .
JP1787882U 1982-02-10 1982-02-10 Charged beam device Pending JPS58120555U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1787882U JPS58120555U (en) 1982-02-10 1982-02-10 Charged beam device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1787882U JPS58120555U (en) 1982-02-10 1982-02-10 Charged beam device

Publications (1)

Publication Number Publication Date
JPS58120555U true JPS58120555U (en) 1983-08-17

Family

ID=30030155

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1787882U Pending JPS58120555U (en) 1982-02-10 1982-02-10 Charged beam device

Country Status (1)

Country Link
JP (1) JPS58120555U (en)

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