JPS58117439A - Polarized fluorescence measuring apparatus - Google Patents
Polarized fluorescence measuring apparatusInfo
- Publication number
- JPS58117439A JPS58117439A JP21385781A JP21385781A JPS58117439A JP S58117439 A JPS58117439 A JP S58117439A JP 21385781 A JP21385781 A JP 21385781A JP 21385781 A JP21385781 A JP 21385781A JP S58117439 A JPS58117439 A JP S58117439A
- Authority
- JP
- Japan
- Prior art keywords
- fluorescence
- polarizer
- measurement
- excitation light
- excitation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6445—Measuring fluorescence polarisation
Landscapes
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は自動化された螢光偏光測定装置に関する。螢光
偏光測定を行うには試料の励起光入射側と螢光測定側と
に夫々偏光子を配置し、−回の測定の間に螢光測定側の
偏光子を垂直方向と水平方向とに切換える。又測定に先
立って螢光分光器の偏光特性を測定して補正値を求めね
ばならない。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an automated fluorescence polarimeter. To perform fluorescence polarization measurement, a polarizer is placed on the excitation light incident side and the fluorescence measurement side of the sample, and between - measurements, the polarizer on the fluorescence measurement side is moved vertically and horizontally. Switch. Furthermore, prior to measurement, it is necessary to measure the polarization characteristics of the fluorescence spectrometer and obtain a correction value.
分光器の偏光特性は波長によって異るから螢光波長を変
えながら測定を行う場合には一回の測定毎にその測定波
長での螢光分光器の偏光特性の測定を行わねばならない
から、螢光偏光測定の操作は一層繁雑となる。従来この
ような螢光偏光測定の操作を手動的に行っていたので、
螢光偏光測定は操作に時間がか\シ殊に試料の時間的変
化の追跡等は変化がかなシ遅い場合でなければ不可能で
あり、又一般に誤操作の可能性が大きいものであった。The polarization characteristics of a spectrometer vary depending on the wavelength, so when measuring while changing the fluorescence wavelength, it is necessary to measure the polarization characteristics of the fluorescence spectrometer at that measurement wavelength for each measurement. The operation of light polarization measurement becomes even more complicated. Conventionally, this type of fluorescence polarization measurement was performed manually, so
Fluorescence polarization measurements are time consuming, and in particular, tracking changes over time in a sample is only possible if the changes are slow, and there is generally a high possibility of operational errors.
本発明は螢光偏光測定における上述した問題点を解消す
るために螢光偏光測定を自動化しようとするものである
。以下実施例によって本発明を説明する。The present invention attempts to automate fluorescence polarization measurement in order to solve the above-mentioned problems in fluorescence polarization measurement. The present invention will be explained below with reference to Examples.
図は本発明の一実施例装置を示す。1は試料セル、2は
励起偏光子、3は螢光偏光子である。図では励起光光源
及び螢光分光器は図示してないが、励起光は右方から矢
印のように励起偏光子2を経て試料セルlに入射し、励
起光と直角の方向から螢光偏光子3を通して螢光を観測
する。偏光子2.3け夫々外周が歯車になっている枠に
取付けられており、夫々の榛に噛合う歯車を介してパル
スモータ4,5によって偏光子の偏光方向が変えられる
ようになっている。制御装置6は以下述べるプログラム
に従って2つの偏光子2,3の向きを切換え、螢光の測
光を行い、測光値に対して所定測定動作をスタートさせ
ると制御装置6は次のようなシーケンス制御を実行する
。The figure shows an embodiment of the invention. 1 is a sample cell, 2 is an excitation polarizer, and 3 is a fluorescence polarizer. Although the excitation light source and fluorescence spectrometer are not shown in the figure, the excitation light enters the sample cell l from the right side through the excitation polarizer 2 as shown by the arrow, and the fluorescence polarization is generated from the direction perpendicular to the excitation light. Observe the fluorescence through the lens 3. Each of the polarizers 2 and 3 is attached to a frame whose outer periphery is a gear, and the polarization direction of the polarizer can be changed by pulse motors 4 and 5 via gears meshing with the respective fins. . The control device 6 switches the orientation of the two polarizers 2 and 3 according to the program described below, performs photometry of the fluorescent light, and starts a predetermined measurement operation for the photometric value.The control device 6 then performs the following sequence control. Execute.
(1)励起偏光子2を水平(900)位置にする。(1) Place the excitation polarizer 2 in the horizontal (900) position.
この向きでは励起光の電界は水平方向図の紙面に垂直の
方向となる。この位置は励起偏光子2の枠フォトカプラ
22で検出することによって設定され、偏光子2の向き
はこの位置からのパルスモータ4の駆動パルスの計数値
によって検知される。In this orientation, the electric field of the excitation light is perpendicular to the plane of the paper in the horizontal direction. This position is set by detection by the frame photocoupler 22 of the excitation polarizer 2, and the direction of the polarizer 2 is detected by the count value of the drive pulse of the pulse motor 4 from this position.
(2)次に螢光偏光子3を垂直(0°)位置にする。(2) Next, place the fluorescent polarizer 3 in the vertical (0°) position.
この位置検出も偏光子2の場合と同様偏光子3の枠に噛
合っている歯車31に設けた一個の孔をフォトカプラ3
2で検出することによって行う。偏光子3の一般の位置
はこの位置を基準にしてパルスモータ5の駆動パルスの
計数値によって検出される。In this position detection, as in the case of the polarizer 2, one hole provided in the gear 31 meshing with the frame of the polarizer 3 is connected to the photocoupler 3.
This is done by detecting in step 2. The general position of the polarizer 3 is detected based on the count value of the drive pulses of the pulse motor 5 with this position as a reference.
(3)上記(1)、 (2)の設定が終ったら螢光測定
を行う。(3) After completing the settings in (1) and (2) above, perform fluorescence measurement.
このときの測定値をエエぞとする。Let's take a look at the measured values at this time.
(4)上記工1りを記憶する。(4) Memorize the steps above.
(5)偏光子3を90°位置にする。(5) Set the polarizer 3 to the 90° position.
(6)螢光測定を行う。このときの測定値を工1上とす
る。(6) Perform fluorescence measurement. Let the measured value at this time be 1 above.
(力 上記1工りを記憶する。(Force: Memorize step 1 above.
(8)上記記憶値工J−4とll上によって補正値Gl
上l・
ll上
を算出し記憶する。(8) Correction value Gl by the above memorized value J-4 and ll
Calculate and store upper l and ll upper.
以上の動作は螢光分光器の偏光特、性を成る一つの波長
に於て測定し補正値を算出する動作である。The above operation is an operation for measuring the polarization characteristics of the fluorescence spectrometer at one wavelength and calculating a correction value.
この動作の意味を概説する。全試料は電界が図の紙面に
垂直であるような偏光で励起されている。Let us outline the meaning of this operation. All samples are excited with polarized light such that the electric field is perpendicular to the plane of the diagram.
螢光の電界は励起光の電界と殆んど平行であるから図の
紙面内に放射され、螢光観測方向には殆んど放射されな
い。唯試料分子の運動と励起と螢光放出との間の時間お
くれにより螢光中には励起光とは多少電界の向きが異っ
た成分が含まれる。励起光の電界が図の紙面に垂直で、
螢光観測の方向がこの電界の方向と一致していると上述
した励起光と電界方向が異る螢光成分は観測方向から見
て水平方向も垂直方向も同じだけ含まれている。即ちこ
の場合観測方向から見た螢光は全く偏光していない。従
ってこの螢光を使って螢光分光器の偏光特性を測定して
いるのである。Since the electric field of the fluorescent light is almost parallel to the electric field of the excitation light, it is emitted within the plane of the drawing, and is hardly emitted in the direction in which the fluorescent light is observed. However, due to the movement of the sample molecules and the time lag between excitation and fluorescence emission, the fluorescence contains components whose electric field direction is slightly different from that of the excitation light. The electric field of the excitation light is perpendicular to the plane of the diagram,
When the direction of fluorescence observation coincides with the direction of this electric field, the fluorescence components whose electric field direction is different from the excitation light described above are included in the same amount both horizontally and vertically as viewed from the observation direction. That is, in this case, the fluorescent light seen from the observation direction is not polarized at all. Therefore, this fluorescent light is used to measure the polarization characteristics of a fluorescent spectrometer.
上述した補正値を求める動作が終了したら引続き試料の
螢光偏光測定のシーケンスに移ル。After completing the operation of calculating the correction value described above, proceed to the sequence of fluorescence polarization measurement of the sample.
(9)励起偏光子2を00に設定する。(9) Set excitation polarizer 2 to 00.
α〔螢光測定を行う。このときは前述の動作ステップ(
5)によって螢光偏光子3は900の位置にある。この
ときの測定値をll上とする。α [Perform fluorescence measurement. In this case, the operation step (
5), the fluorescent light polarizer 3 is at the 900 position. The measured value at this time is assumed to be above ll.
aυ 上記I/工を記憶する。aυ Memorize the above I/work.
αの 螢光偏光子3を00にする。Set α fluorescence polarizer 3 to 00.
031 螢光測定を行う。このときの測定値を工//
とする。031 Perform fluorescence measurements. Edit the measured value at this time//
shall be.
α荀 上記I/ノを記憶する。α荀 Memorize the above I/ノ.
(1[有] 先に求めて記憶しである補正値G及び上記
した螢光測定値工//L及び工///を用いて螢光偏光
によって求め、表示装置フに表示し、或は記録計8によ
って記録する。(1 [Existence] Determine by fluorescence polarization using the previously determined and memorized correction value G and the above-mentioned fluorescence measurement values Tech//L and Tech///, and display on a display device, or Record by recorder 8.
以上で一回の測一定のシーケンスを終る。以後上述(1
)〜a5の動作を引続き繰返すモードと、以後(9)に
戻って(9)〜a5間を繰返すモードの何れかを選択す
ることができる。前者のモードは螢光昼光器の波長を一
回の測定毎に変えて行く場合等に用いられる。或は螢光
波長を固定した場合でも特に精庸を要し、−回毎に補正
値を求め直して測定を行う場合に用いられる。ステップ
aQの演算として工Sを算出させることもできる。上の
制御動作の1シーケンスの所要時間は5〜20秒である
。This completes one measurement sequence. Hereafter mentioned above (1
It is possible to select either a mode in which the operations from ) to a5 are continuously repeated, or a mode in which the process returns to (9) and repeats the operations from (9) to a5. The former mode is used when the wavelength of a fluorescent daylight device is changed for each measurement. Alternatively, even when the wavelength of the fluorescent light is fixed, particular precision is required, and this method is used when the correction value is recalculated every time the measurement is performed. It is also possible to calculate the workpiece S as the calculation in step aQ. The time required for one sequence of the above control operations is 5 to 20 seconds.
上述した実施例では励起及び螢光の両偏光子は一回の測
定毎に00,1150°の間を往′復せしめられるが、
両偏光子を同期させて一方を他方の2倍の速さで一方向
に回転させておき、適当なタイミングで螢光測光値をサ
ンプリングする構成としてもよい。この場合螢光偏光子
を励起偏光子の2倍の速さで回転させ、スタート時に両
偏光子を共に90 にしておくと、励起偏光子の一回転
の間に1上1 、 工L/、 工1上、工上りの順
で前述(力と(3)のステップの測定を行うチャンスが
2回ずつあり、このチャンスに上の螢光測定値をサンプ
リングして記憶する。この動作を螢光分光器の波長を変
えながら行った後、各波長毎に補正値Gを計算しておく
。次にスタート時の両偏光子の関係を共にOoにしてお
くと、励起偏光子の一回転の間に工////、 Il
上、工//、A順に前述α昏+、Qt)のステップの測
定を行うチャンスがあり、このチャンスに螢光測定値を
サンプリングして記憶しておく0或は励起偏光子をO或
は9o に固定しておいて螢光偏光子だけを回転させて
もよい。この方式によると前述した実施例より一層高速
に螢光偏光の測定を行うことができる。In the embodiment described above, both the excitation and fluorescence polarizers are moved back and forth between 00 and 1150 degrees for each measurement.
A configuration may also be adopted in which both polarizers are synchronized and one is rotated in one direction at twice the speed of the other, and the fluorescence photometry value is sampled at an appropriate timing. In this case, if the fluorescence polarizer is rotated twice as fast as the excitation polarizer and both polarizers are set to 90 at the start, then during one rotation of the excitation polarizer, 1 over 1, E L/, There are two chances to measure the force and step (3) mentioned above in the order of work 1 and finish, and take this chance to sample and store the above fluorescence measurement values. After performing this while changing the wavelength of the spectrometer, calculate the correction value G for each wavelength.Next, if the relationship between both polarizers is set to Oo at the start, then during one rotation of the excitation polarizer, Niko////, Il
There is a chance to measure the above-mentioned steps α +, Qt) in the order of 1, 2, 2 and 2, and at this chance, the 0 or excitation polarizer for sampling and storing the fluorescence measurement value is set to 0 or 0. It is also possible to fix it at 9o and rotate only the fluorescent light polarizer. According to this method, fluorescence polarization can be measured at a higher speed than in the above-described embodiment.
本発明螢光偏光測定装置は上述したような構成で、測定
開始の操作だけで自動的に測定が進行し、手動的に一々
試料室の蓋を開けて偏光子を回わして測定を行うのに比
し測定装作を速かに進行させることができて、誤りがな
く、試料の経時的変化の追跡も容易となり、何よりも省
力化の効果が大である。The fluorescence polarization measuring device of the present invention has the above-described configuration, and the measurement automatically proceeds by simply starting the measurement, and the measurement can be performed manually by opening the lid of the sample chamber one by one and rotating the polarizer. Compared to the conventional method, the measurement equipment can be set up quickly, there are no errors, it is easy to track changes in the sample over time, and above all, it has a large labor-saving effect.
図面は本発明の一実施例装置の要部斜視図である。
1・・・試料セル、2・・・励起偏光子、3・・・螢光
偏光子、4.5・・・パルスモータ、6・・・制御装置
、フ・・・表示器、8・・・記針計。
代理人 弁理士 軽 浩 介The drawing is a perspective view of essential parts of an apparatus according to an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Sample cell, 2... Excitation polarizer, 3... Fluorescence polarizer, 4.5... Pulse motor, 6... Control device, F... Display device, 8...・Meeting pointer. Agent Patent Attorney Kosuke Karu
Claims (1)
光子が水平(90°)位置にあって、螢光偏光子が水平
にあるとき及び垂直(0)の各位置にあるときの螢光測
光値をサンプリン、グし記憶する動作と、励起偏光子が
垂直位置にあって、螢光偏光子が水平位置及び垂直位置
の各位置にあるときの螢光測光値をサンプリングする動
作と、上記記憶する動作によって記憶されたデータに基
き補正値を算出する動作と、上記励起偏光子が垂直位置
にあるときサンプリングされた螢光測光値に上記補正値
を導入して螢光偏光解消度等の算出を行う動作のプログ
ラムを有し、上記両偏光子を駆動すると共に上記補正、
値を算出する動作と螢光偏光解消度を求める動作とをシ
ーケンシャルに行う制御装置を備えたことを特徴とする
螢光偏光測定装置。means for rotating the excitation polarizer and the fluorescence polarizer; an operation of sampling, sampling and storing a photophotometric value; and an operation of sampling a fluorescence photometric value when the excitation polarizer is in a vertical position and the fluorescence polarizer is in a horizontal position and a vertical position; An operation of calculating a correction value based on the data stored by the above-mentioned storing operation, and an operation of introducing the above-mentioned correction value into the fluorescence photometry value sampled when the excitation polarizer is in the vertical position to calculate the degree of fluorescence depolarization, etc. It has an operation program that calculates the above, and drives both the polarizers and performs the correction
A fluorescence polarization measurement device characterized by comprising a control device that sequentially performs an operation of calculating a value and an operation of determining a degree of fluorescence depolarization.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21385781A JPS58117439A (en) | 1981-12-30 | 1981-12-30 | Polarized fluorescence measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21385781A JPS58117439A (en) | 1981-12-30 | 1981-12-30 | Polarized fluorescence measuring apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58117439A true JPS58117439A (en) | 1983-07-13 |
Family
ID=16646165
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21385781A Pending JPS58117439A (en) | 1981-12-30 | 1981-12-30 | Polarized fluorescence measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58117439A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998013676A1 (en) * | 1996-09-24 | 1998-04-02 | Laboratory Of Molecular Biophotonics | Method and instrument for polarization measurement |
JP2007139744A (en) * | 2005-11-23 | 2007-06-07 | Korea Inst Of Scinence & Technology | Method and apparatus for measuring fluorescence polarization using lab-on-a-chip |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5212881A (en) * | 1975-07-21 | 1977-01-31 | Hitachi Ltd | Device for measuring a degree of deflection of fluorescence |
JPS55109949A (en) * | 1979-02-16 | 1980-08-23 | Hitachi Ltd | Spectro-fluorophotometer |
-
1981
- 1981-12-30 JP JP21385781A patent/JPS58117439A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5212881A (en) * | 1975-07-21 | 1977-01-31 | Hitachi Ltd | Device for measuring a degree of deflection of fluorescence |
JPS55109949A (en) * | 1979-02-16 | 1980-08-23 | Hitachi Ltd | Spectro-fluorophotometer |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998013676A1 (en) * | 1996-09-24 | 1998-04-02 | Laboratory Of Molecular Biophotonics | Method and instrument for polarization measurement |
US6025917A (en) * | 1996-09-24 | 2000-02-15 | Laboratory Of Molecular Biophotonics | Polarization characteristic measuring method and apparatus |
JP2007139744A (en) * | 2005-11-23 | 2007-06-07 | Korea Inst Of Scinence & Technology | Method and apparatus for measuring fluorescence polarization using lab-on-a-chip |
JP4527080B2 (en) * | 2005-11-23 | 2010-08-18 | コリア インスティチュート オブ サイエンス アンド テクノロジー | Fluorescence polarization measurement method with lab-on-a-chip |
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