JPS58100300A - Cmos memory - Google Patents

Cmos memory

Info

Publication number
JPS58100300A
JPS58100300A JP56198589A JP19858981A JPS58100300A JP S58100300 A JPS58100300 A JP S58100300A JP 56198589 A JP56198589 A JP 56198589A JP 19858981 A JP19858981 A JP 19858981A JP S58100300 A JPS58100300 A JP S58100300A
Authority
JP
Japan
Prior art keywords
power supply
memory
supply voltage
circuit section
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56198589A
Other languages
Japanese (ja)
Inventor
Kiyobumi Uchibori
内堀 清文
Isao Akima
勇夫 秋間
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Ltd
Hitachi Microcomputer Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Microcomputer Engineering Ltd filed Critical Hitachi Ltd
Priority to JP56198589A priority Critical patent/JPS58100300A/en
Publication of JPS58100300A publication Critical patent/JPS58100300A/en
Pending legal-status Critical Current

Links

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  • Techniques For Improving Reliability Of Storages (AREA)
  • Stand-By Power Supply Arrangements (AREA)
  • Power Sources (AREA)
  • Static Random-Access Memory (AREA)

Abstract

PURPOSE:To simplify the design by installing a power supply voltage detecting circuit and a logical operation circuit in an IC and to float each input pin by a power supply voltage drop signal. CONSTITUTION:A logical operation circuit section 3 and a power supply voltage detecting circuit section 4 are constituted by CMOSs and they are incorporated in an IC, and, at the same time, in addition to a chip select CS, other pins, for example, pins of address ADR, data input Din, write-enable WE, etc., are made reactive by using the output of the power supply voltage detecting circuit section 4.

Description

【発明の詳細な説明】 本発明は、CMOSメモリに関し、特に電圧検出回路を
内蔵したバッテリ・バックアップ可能なCMOSメモリ
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a CMOS memory, and more particularly to a CMOS memory that has a built-in voltage detection circuit and can be backed up by a battery.

スタティック型メモリセル、アドレスデコーダ、制御回
路等を含むCMOSメモリ(Comp l emen 
ta ryMetal  0xide  Sem1co
nductor Memory)は、きわめて低消費電
力であるため、停電時にもバッテリによるバックアップ
によって、実質的にコア・メモリのような不揮発性メモ
リとして使用できろ。CMOSメモリを実質的な不揮発
性メモリとして使用する場合、CMOSメモリには、適
当なおよび周辺回路を動作させるためのシステム電源と
ともに、このシステム電源■ccが遮断したときにおい
て、バッテリからの電圧が供給されろ。
CMOS memory (Complemen) that includes static memory cells, address decoders, control circuits, etc.
taryMetal Oxide Sem1co
Since the inductor memory has extremely low power consumption, even in the event of a power outage, it can be used as a non-volatile memory like core memory with battery backup. When CMOS memory is used as a substantial nonvolatile memory, the CMOS memory is supplied with voltage from the battery when this system power supply is cut off, along with a system power supply for operating appropriate and peripheral circuits. Be it.

バッテリ・バックアップを可能にするために、CMOS
メモリに対して、専用のパワー・ダウン・コントロール
端子を設ける場合、又は特別なコントロール端子を設け
ずに、そのチップ・セレクト端子にパワー・ダウン・コ
ントロール回路Z介してチップ・セレクト信号を供給す
る場合と7考えることができる。しかしながら、前者の
場合IC(CMOSメモリ)に専用のコントロール端子
を設けなければならない。後者の場合、第1図に示すよ
うに、システム電源■。0が遮断したとき、自動的vc
cMO8メモリの電源がバッテリBAT[切り替わるよ
うな構成にするとともに、検出制御部2を外部に設ける
ことによって−システム電源のオン・オフ時に偶発的に
発生するメモリの書き込み信号により、メモリの内容が
破壊されないようにメモリを非選択状態にするため、チ
ップ・セレノ)(C8)信号な強制的に”0”レベルに
することが行なわれる。すなわち、CMO’Sメモリ1
Vc対して外付けにより検出制御部2がC8端子に接続
されており、この検出制御部2には電源電圧低下検出回
路PDと、この検出回路PDの出力Aとチップ・セレク
ト信号Bとの論理をとる回路iN Rが設けられている
。検出口13pDの出力Aとチップ・セレクト信号Bの
論理値の組み合わせに対して、検出制御部2からの論理
出力は、第2図に示すよyc1両信号A、BがwO・レ
ベルのときだけ”1”となる。つ筐り、システム電源V
。0が何らかの原因で遮断されるか、最低電圧値以下に
なったときには、A=″1″となり、チップ・セレクト
信+3(C8)の値に関係なく出力は”0”となる。−
万、システム電源■。0が最低電圧値以上のとぎで、か
つチップ・セレクト信号(CS)の値が0”のとぎには
、すなわちメモリ選択時には出力が°1”となり、メモ
リ1の読み出し。
CMOS to enable battery backup
When a dedicated power down control terminal is provided for the memory, or when a chip select signal is supplied to the chip select terminal via the power down control circuit Z without providing a special control terminal. 7. However, in the former case, a dedicated control terminal must be provided in the IC (CMOS memory). In the latter case, as shown in Figure 1, the system power supply ■. When 0 is cut off, automatic vc
By configuring the cMO8 memory's power source to switch between the battery BAT and by providing the detection control unit 2 externally, it is possible to prevent memory contents from being destroyed by memory write signals that occur accidentally when the system power is turned on or off. In order to put the memory in a non-selected state so that the chip seleno (C8) signal is not selected, the chip seleno (C8) signal is forcibly set to the "0" level. That is, CMO'S memory 1
A detection control unit 2 is externally connected to the C8 terminal for Vc, and this detection control unit 2 includes a power supply voltage drop detection circuit PD and a logic between the output A of this detection circuit PD and the chip select signal B. A circuit iNR is provided. For the combination of the logical value of the output A of the detection port 13pD and the chip select signal B, the logical output from the detection control unit 2 is only when both the yc1 signals A and B are at the wO level as shown in FIG. It becomes "1". System power supply V
. 0 is cut off for some reason or becomes lower than the minimum voltage value, A=“1” and the output becomes “0” regardless of the value of the chip select signal +3 (C8). −
10,000, system power ■. When 0 is higher than the lowest voltage value and the value of the chip select signal (CS) is 0'', that is, when memory is selected, the output becomes 1'' and memory 1 is read.

書き込みが可能となる。Writing becomes possible.

第3図は、第1図の回路におけるデータ・り子ンション
・モードの動作レベル図である。
FIG. 3 is an operational level diagram of the data relocation mode in the circuit of FIG.

例えば、第3図fa>に示すように、システム電源■c
cが5vから2■に下がって、データ・リテンション・
モードになったならば、第3図(b)に示すように、電
源電圧低下検出出力A’%”1”レベルにしてチップ・
セレクト(CS)端子t″0”レベルにする。そして、
第3図(c)K示すように、消費電流1゜0を例えば動
作吋040mAから1/jA[下ケる。すなわち、リテ
ンション・モートテハ、2VX1μA=2μWの小電力
に保持する。
For example, as shown in Figure 3 fa>, the system power supply ■c
c decreased from 5v to 2■, data retention
Once the mode is set, the power supply voltage drop detection output A'% is set to the "1" level as shown in Figure 3(b).
Set the select (CS) terminal t to ``0'' level. and,
As shown in FIG. 3(c), when the current consumption is 1°0, the operating current decreases from, for example, 040 mA to 1/jA. In other words, the power is maintained at a low power of 2 V x 1 μA = 2 μW.

上記の構成によると、バラ子り・バックアップを可能と
するためには、検出制御部2をCMOSメモリに対し外
付けする必要があり、ボード設計が複雑である。
According to the above configuration, the detection control section 2 needs to be externally attached to the CMOS memory in order to enable disassembly and backup, and the board design is complicated.

本発明の目的は、このような欠点を除去するため、パワ
ー・ダウン・コントロール機能とチップ・セレクト機能
を持つ回路’lcMO8メモリ内に組み込み、かつ機能
追加が可能なCMOSメモリを提供することにある。
SUMMARY OF THE INVENTION In order to eliminate such drawbacks, it is an object of the present invention to provide a CMOS memory having a power down control function and a chip select function, which can be incorporated into a circuit'lcMO8 memory and which can have additional functions. .

以下、本発明の実施例を、第4図により説明する。Hereinafter, an embodiment of the present invention will be described with reference to FIG.

本発明においては、第4図に示すように、論理回路部3
と電圧検出回路部4y7cMO8で構成し、IC内に組
み込むとともに、チップ・セレクト(C8)以外のビン
、例えばアドレス(A D H) 。
In the present invention, as shown in FIG.
It consists of a voltage detection circuit section 4y7cMO8, and is built into the IC, as well as a bin other than the chip select (C8), such as an address (ADH).

データ入力(Din ) 、ライト・イネーブル(WE
)等のビンも電圧検出回路部4の出力を用いて入力を無
効化する。
Data input (Din), write enable (WE)
) etc. also use the output of the voltage detection circuit section 4 to invalidate the input.

第4図の電圧検出回路部4では、電源電圧V。0を高抵
抗R,、R,で分圧した電位をCMQ8のゲートに力Ω
えろと、電源電圧■。6が王宮レベルであれば、P−M
OSFETがオンしてA点に・0・レベルが現われ、ま
た電源電圧■。Cが最低電圧値より下がったときVC+
i−cMosはオフとなって、A点にl”レベルが現わ
れるっ 論理回路部3では、チップ・セレクト信号(CS)と電
圧検出回路部4の出力Aとを、それぞれCMO8のゲー
トに加えて、ノア・ゲートを構成し、両方の入力が0”
レベルのときの一7zal力[” 1”を、それ以外の
組み合わせのとぎには出力に′0”を、それぞれ与えろ
In the voltage detection circuit section 4 of FIG. 4, the power supply voltage V. 0 divided by high resistance R,, R, is applied to the gate of CMQ8.
Well, the power supply voltage ■. If 6 is royal level, P-M
The OSFET is turned on and 0 level appears at point A, and the power supply voltage ■. When C falls below the minimum voltage value, VC+
The i-cMos is turned off and the L'' level appears at point A. In the logic circuit section 3, the chip select signal (CS) and the output A of the voltage detection circuit section 4 are applied to the gate of CMO8. , configures a Noah gate, both inputs are 0”
Give the 17zal force ["1" for the level, and give the output "0" for other combinations.

なお、第4図においては、論理回路部3はチップ・セレ
クト信号(C8)のみを電圧検出回路部4の出力によっ
て制御している。しかし、本発明ニオイては、0MO8
メモリ1の他の入力ビン、例えば、アドレス(A D 
R) 、データ・イン(Din)。
In FIG. 4, the logic circuit section 3 controls only the chip select signal (C8) by the output of the voltage detection circuit section 4. However, the odor of the present invention is 0MO8
Other input bins of memory 1, e.g. address (A D
R), Data In (Din).

ライト・イ坏−ブル(WE)の各ビンも電源電圧低下に
よってフローティング化するために、各入力ビンにそれ
ぞれ論理回路部を設けて、アドレス(ADR)yデータ
・イン(Din )等の信号と、第4図圧水f電圧検出
回路部4の出力Aとのノア・ゲートをとり、ゲート出力
信号Z各入力ビンに接続する。
In order to make each bin of the write enable (WE) floating due to a drop in the power supply voltage, each input bin is provided with a logic circuit section, and signals such as address (ADR), data in (Din), etc. , FIG. 4 A NOR gate is taken with the output A of the pressure water f voltage detection circuit section 4, and the gate output signal Z is connected to each input bin.

以上説明したように、本発明によれば、電源電圧検出回
路と論理回路とをIC内に組み込むので、設計が簡単と
なるとともに、チップ・セレクトの入力ビンだけでなく
、他のすべての入力ビンも電源電圧低下信号によりフロ
ーティングすることができろ。
As explained above, according to the present invention, the power supply voltage detection circuit and the logic circuit are incorporated into the IC, which simplifies the design, and also allows the input bins to be used not only for the chip select input bin but also for all other input bins. It can also be floated by a power supply voltage drop signal.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はバッテリ・バックアップ機能を有するcMos
メモリの構成図、第2図、第3図はそれぞれ第1図にお
ける論理動作説明図と動作レベル図、第4図は本発明の
実施例を示すCMOSメモリの構成図である− 1・・・CM □ Sメモリ、2・・・検出制御部、3
・・・論理回路部、4・・・電圧検出回路部、C8・・
・チップ・セレクト信号、■oC・・・システム電源、
TRo”データ・リテンション・モード期間。 699− 完        く          (吃   
   リ        。
Figure 1 shows a cMos with battery backup function.
The configuration diagram of the memory, FIGS. 2 and 3 are respectively a logical operation explanation diagram and an operation level diagram in FIG. 1, and FIG. 4 is a configuration diagram of a CMOS memory showing an embodiment of the present invention.-1... CM □ S memory, 2... detection control section, 3
...Logic circuit section, 4...Voltage detection circuit section, C8...
・Chip select signal, ■oC...system power supply,
TRo” data retention mode period. 699- Complete (吃
Li.

Claims (1)

【特許請求の範囲】[Claims] IC化されたCMOSメモリであって電源電圧検出回路
、および該検出回路の出力と制御入力信号との論理をと
る回路を含んでなることを特徴とするCMOSメモリり
A CMOS memory integrated into an IC, comprising a power supply voltage detection circuit and a circuit that takes logic between the output of the detection circuit and a control input signal.
JP56198589A 1981-12-11 1981-12-11 Cmos memory Pending JPS58100300A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56198589A JPS58100300A (en) 1981-12-11 1981-12-11 Cmos memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56198589A JPS58100300A (en) 1981-12-11 1981-12-11 Cmos memory

Publications (1)

Publication Number Publication Date
JPS58100300A true JPS58100300A (en) 1983-06-14

Family

ID=16393693

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56198589A Pending JPS58100300A (en) 1981-12-11 1981-12-11 Cmos memory

Country Status (1)

Country Link
JP (1) JPS58100300A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1985005475A1 (en) * 1984-05-11 1985-12-05 Fanuc Ltd Data-holding circuit in a memory
JPH01182995A (en) * 1988-01-18 1989-07-20 Oki Electric Ind Co Ltd Cmos semiconductor integrated circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1985005475A1 (en) * 1984-05-11 1985-12-05 Fanuc Ltd Data-holding circuit in a memory
US4669066A (en) * 1984-05-11 1987-05-26 Fanuc Ltd. Memory data holding circuit
JPH01182995A (en) * 1988-01-18 1989-07-20 Oki Electric Ind Co Ltd Cmos semiconductor integrated circuit

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