JPS578192Y2 - - Google Patents
Info
- Publication number
- JPS578192Y2 JPS578192Y2 JP1976163679U JP16367976U JPS578192Y2 JP S578192 Y2 JPS578192 Y2 JP S578192Y2 JP 1976163679 U JP1976163679 U JP 1976163679U JP 16367976 U JP16367976 U JP 16367976U JP S578192 Y2 JPS578192 Y2 JP S578192Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1976163679U JPS578192Y2 (en:Method) | 1976-12-06 | 1976-12-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1976163679U JPS578192Y2 (en:Method) | 1976-12-06 | 1976-12-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5380370U JPS5380370U (en:Method) | 1978-07-04 |
| JPS578192Y2 true JPS578192Y2 (en:Method) | 1982-02-17 |
Family
ID=28771407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1976163679U Expired JPS578192Y2 (en:Method) | 1976-12-06 | 1976-12-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS578192Y2 (en:Method) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS498168A (en:Method) * | 1972-05-10 | 1974-01-24 |
-
1976
- 1976-12-06 JP JP1976163679U patent/JPS578192Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5380370U (en:Method) | 1978-07-04 |